| Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524) |
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| 03/08/2007 | US20070053230 Semiconductor device including fuse and method for testing the same capable of supressing erroneous determination |
| 03/08/2007 | US20070052791 Methods and systems for thermal-based laser processing a multi-material device |
| 03/08/2007 | US20070052438 Methods and apparatus for testing electronic circuits |
| 03/08/2007 | DE19807739B4 Kombinierter Integrierter Speicher- und Logikschaltkreis und Testverfahren hierfür Combined Integrated memory and logic circuit and test method therefor |
| 03/08/2007 | DE112004002836T5 Nichtflüchtige Halbleitervorrichtung und Verfahren zum automatischen Beheben eines Löschfehlers in der Vorrichtung Non-volatile semiconductor device and method for automatically resolve an erase error in the device |
| 03/08/2007 | DE102005041614A1 Halbleiter-Bauelement-Testsystem mit Test-Schnittstellen-Einrichtung The semiconductor device testing system with the test interface device |
| 03/07/2007 | EP1428225B1 Concept for reliable data transmission between electronic modules |
| 03/07/2007 | CN1926638A DFT technique for stressing self-timed semiconductor memories to detect delay faults |
| 03/06/2007 | US7188299 Data-recording/reproduction apparatus and data-recording/reproduction method |
| 03/06/2007 | US7188291 Circuit and method for testing a circuit having memory array and addressing and control unit |
| 03/06/2007 | US7188282 Tamper resistant shadow memory |
| 03/06/2007 | US7188274 Memory repair analysis method and circuit |
| 03/06/2007 | US7188210 Method of writing, erasing, and controlling memory for memory device |
| 03/06/2007 | US7187613 Method and apparatus for dynamically configuring redundant area of non-volatile memory |
| 03/06/2007 | US7187607 Semiconductor memory device and method for manufacturing same |
| 03/06/2007 | US7187604 Semiconductor memory |
| 03/06/2007 | US7187603 Semiconductor memory device, repair search method, and self-repair method |
| 03/06/2007 | US7187602 Reducing memory failures in integrated circuits |
| 03/01/2007 | WO2007023545A1 Memory device having redundancy repairing function |
| 03/01/2007 | WO2006134308A3 Integrated circuit protected against short circuits and operating errors following the passage on an ionizing radiation |
| 03/01/2007 | WO2006083402A3 Toggle memory burst |
| 03/01/2007 | US20070050690 Circuit and method for component communication |
| 03/01/2007 | US20070050689 Storage system comprising logical circuit configured in accordance with information in memory on PLD |
| 03/01/2007 | US20070047348 Semiconductor memory device |
| 03/01/2007 | US20070047347 Semiconductor memory devices and a method thereof |
| 03/01/2007 | US20070047346 Semiconductor integrated circuit |
| 03/01/2007 | US20070047345 Semiconductor device, testing and manufacturing methods thereof |
| 03/01/2007 | US20070047344 Hierarchical memory correction system and method |
| 03/01/2007 | US20070047343 Automation of fuse compression for an asic design system |
| 03/01/2007 | US20070047341 Ferroelectric random access memory |
| 03/01/2007 | US20070047305 Zone Boundary Adjustments for Defects in Non-Volatile Memories |
| 03/01/2007 | DE102006031862A1 Strombegrenzungsschaltung und Halbleiterspeichervorrichtung Current limiting circuit and semiconductor memory device |
| 02/28/2007 | EP1758027A2 Non-volatile memory and method with control data management |
| 02/28/2007 | EP1756832A1 Pipelined data relocation and improved chip architectures |
| 02/28/2007 | EP1756739A2 Efficient modeling of embedded memories in bounded memory checking |
| 02/28/2007 | CN1922586A Non-volatile memory and method with memory planes alignment |
| 02/28/2007 | CN1922585A Non-volatile memory and method with non-sequential update block management |
| 02/28/2007 | CN1922580A Non-volatile memory and method with phased program failure handling |
| 02/28/2007 | CN1921020A Test mode and test method for increased stress duty cycles during burn in |
| 02/28/2007 | CN1921019A Method for testing storage by data compressing treatment |
| 02/28/2007 | CN1921011A Non-volatile storage and its related limit voltage verification method and semiconductor device |
| 02/28/2007 | CN1920783A Method of testing memory |
| 02/28/2007 | CN1302482C Magnetic film memory device with redundant repair function |
| 02/27/2007 | US7185265 Disk array system and its control method |
| 02/27/2007 | US7185264 Image processing apparatus and method therefor |
| 02/27/2007 | US7185246 Monitoring of solid state memory devices in active memory system utilizing redundant devices |
| 02/27/2007 | US7185245 Test reading apparatus for memories |
| 02/27/2007 | US7185244 Semiconductor integrated circuit and electronic system |
| 02/27/2007 | US7185243 Testing implementation suitable for built-in self-repair (BISR) memories |
| 02/27/2007 | US7185225 Self-reparable semiconductor and method thereof |
| 02/27/2007 | US7184916 Apparatus and method for testing memory cards |
| 02/27/2007 | US7184915 Tiered built-in self-test (BIST) architecture for testing distributed memory modules |
| 02/27/2007 | US7184545 Semiconductor integrated circuit and method of testing semiconductor integrated circuit |
| 02/27/2007 | US7184356 Semiconductor memory device |
| 02/27/2007 | US7184340 Circuit and method for test mode entry of a semiconductor memory device |
| 02/27/2007 | US7184339 Semi-conductor component, as well as a process for the in-or output of test data |
| 02/27/2007 | US7184338 Semiconductor device, semiconductor device testing method, and programming method |
| 02/27/2007 | US7184337 Method for testing an integrated semiconductor memory |
| 02/27/2007 | US7184336 Method and test structure for evaluating threshold voltage distribution in a memory array |
| 02/27/2007 | US7184335 Electronic memory apparatus, and method for deactivating redundant bit lines or word lines |
| 02/27/2007 | US7184334 Semiconductor memory device and method of testing semiconductor memory device |
| 02/27/2007 | US7184333 Semiconductor memory having a dummy signal line connected to dummy memory cell |
| 02/27/2007 | US7184332 Memory circuit and method for processing a code to be loaded into a memory circuit |
| 02/27/2007 | US7184331 Redundancy fuse control circuit and semiconductor memory device having the same and redundancy process method |
| 02/27/2007 | US7184330 Semiconductor memory device |
| 02/27/2007 | US7184324 Semiconductor memory device having a single input terminal to select a buffer and method of testing the same |
| 02/27/2007 | US7184320 Storage device employing a flash memory |
| 02/27/2007 | US7184319 Method for erasing non-volatile memory cells and corresponding memory device |
| 02/27/2007 | US7184310 Sequential program-verify method with result buffering |
| 02/27/2007 | US7184305 Nonvolatile semiconductor storage device and row-line short defect detection method |
| 02/27/2007 | US7183792 Method and system for detecting a mode of operation of an integrated circuit, and a memory device including same |
| 02/27/2007 | US7183671 Semiconductor device and method for producing the same |
| 02/22/2007 | US20070044004 Cache memory device, semiconductor integrated circuit, and cache control method |
| 02/22/2007 | US20070044003 Method and apparatus of detecting and correcting soft error |
| 02/22/2007 | US20070043984 Nonvolatile semiconductor memory device and signal processing system |
| 02/22/2007 | US20070043983 Sample screening method for system soft error rate evaluation |
| 02/22/2007 | US20070041232 Access circuit and method for allowing external test voltage to be applied to isolated wells |
| 02/22/2007 | DE112005000745T5 Testgerät, Phaseneinstellverfahren und Speichersteuerung Test device, memory controller and Phaseneinstellverfahren |
| 02/22/2007 | DE102006035815A1 Halbleiterspeichervorrichtung A semiconductor memory device |
| 02/22/2007 | DE102006034495A1 Verfahren zum Durchführen einer Programmieroperation eines nicht-flüchtigen Speicherbauelements und nicht-flüchtigen Speicherbauelement A method for performing a programming operation of a nonvolatile memory device and non-volatile memory device |
| 02/21/2007 | EP1620859A4 Reference current generator, and method of programming, adjusting and/or operating same |
| 02/21/2007 | EP1327193B1 Burst read incorporating output based redundancy |
| 02/21/2007 | CN1301464C Fault-tolerant memory module circuit |
| 02/20/2007 | US7181673 Codeword for use in digital optical media and a method of generating therefor |
| 02/20/2007 | US7181672 Method, system, and apparatus for supporting power loss recovery in ECC enabled memory devices |
| 02/20/2007 | US7181663 Wireless no-touch testing of integrated circuits |
| 02/20/2007 | US7181659 Memory built-in self test engine apparatus and method with trigger on failure and multiple patterns per load capability |
| 02/20/2007 | US7181658 Method for testing semiconductor memory device and test circuit for semiconductor memory device |
| 02/20/2007 | US7181655 Method and circuit arrangement for memory error processing |
| 02/20/2007 | US7181650 Fault tolerant data storage circuit |
| 02/20/2007 | US7181643 Method for comparing the address of a memory access with an already known address of a faulty memory cell |
| 02/20/2007 | US7181579 Integrated memory having redundant units of memory cells and method for testing an integrated memory |
| 02/20/2007 | US7181570 Diskarray system for suppressing disk fault |
| 02/20/2007 | US7181566 Scratch control memory array in a flash memory device |
| 02/20/2007 | US7180824 Semiconductor memory device with a page mode |
| 02/20/2007 | US7180820 Integrated semiconductor memory comprising at least one word line and comprising a multiplicity of memory cells |
| 02/20/2007 | US7180807 Semiconductor memory device having a delay circuit |
| 02/20/2007 | US7180803 Data compression read mode for memory testing |
| 02/20/2007 | US7180802 Method of stress-testing an isolation gate in a dynamic random access memory |
| 02/20/2007 | US7180801 Memory circuit with shared redundancy |