Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
04/2007
04/12/2007US20070083799 Method for defect management of an optical storage medium with a sorting process
04/12/2007US20070083698 Automated Wear Leveling in Non-Volatile Storage Systems
04/12/2007US20070081403 Semiconductor memory device
04/12/2007US20070081402 Repair circuit of semiconductor memory device
04/12/2007DE102005047159A1 High speed integrated logic test circuit for self test use has output feedback and integrated core with test pattern generator and analysis logic
04/11/2007EP1436815A4 Semiconductor memory cell and memory array using a breakdown phenomena in an ultra-thin dielectric
04/11/2007EP1389336B1 Test method for testing a data memory
04/11/2007EP1226585B1 Device for analysis of a signal from a ferroelectric storage capacitor
04/11/2007CN1945747A Detecting method and system for storage unit
04/11/2007CN1945746A Test circuit for multi-port memory device
04/11/2007CN1945745A System and method for multi-use eFuse macro
04/11/2007CN1945744A Apparatus and method for using fuse to store PLL configuration data
04/11/2007CN1945734A Multi-port memory device with serial input/output interface
04/11/2007CN1310326C Self-reparable semiconductor and method thereof
04/10/2007US7203892 Row-diagonal parity technique for enabling efficient recovery from double failures in a storage array
04/10/2007US7203891 Information storage medium on which drive data is recorded, and method of recording information on the information storage medium
04/10/2007US7203890 Address error detection by merging a polynomial-based CRC code of address bits with two nibbles of data or data ECC bits
04/10/2007US7203889 Error correction for memory
04/10/2007US7203888 System and method for correcting linear block code
04/10/2007US7203883 Integrated circuit
04/10/2007US7203875 Test systems and methods with compensation techniques
04/10/2007US7203874 Error detection, documentation, and correction in a flash memory device
04/10/2007US7203873 Asynchronous control of memory self test
04/10/2007US7203871 Arrangement in a network node for secure storage and retrieval of encoded data distributed among multiple network nodes
04/10/2007US7203870 Semiconductor memory unit with repair circuit
04/10/2007US7203855 Power-saving control circuitry of electronic device and operating method thereof
04/10/2007US7203115 Semiconductor memory and method for operating the same
04/10/2007US7203107 Device and method for compensating defect in semiconductor memory
04/10/2007US7203091 Semiconductor integrated circuit device and non-volatile memory system using the same
04/10/2007US7202681 Motherboard memory slot ribbon cable and apparatus
04/10/2007US7202545 Memory module and method for operating a memory module
04/05/2007WO2005072287A3 Remote bist for high speed test and redundancy calculation
04/05/2007US20070079221 Circuit and method for checking and recovering a disk array
04/05/2007US20070079220 Audio player
04/05/2007US20070079219 Semiconductor memory device having data holding mode using ecc function
04/05/2007US20070079218 Semiconductor memory device having data holding mode using ECC function
04/05/2007US20070079217 Method and apparatus for implementing error correction coding in a random access memory
04/05/2007US20070079216 Fault tolerant encoding of directory states for stuck bits
04/05/2007US20070079203 Testing a multibank memory module
04/05/2007US20070079188 Signal integrity self-test architecture
04/05/2007US20070079187 System for testing memory modules using a rotating-type module mounting portion
04/05/2007US20070079186 Memory device and method of operating memory device
04/05/2007US20070079185 Memory scrubbing of expanded memory
04/05/2007US20070079184 System and method for avoiding attempts to access a defective portion of memory
04/05/2007US20070079183 Recording medium having spare area defect management and information on defect management, and method of allocating spare area and method of managing defects
04/05/2007US20070076507 Storage device employing a flash memory
04/05/2007US20070076495 Wafer-level burn-in test method, wafer-level burn-in test apparatus and semiconductor memory device
04/05/2007US20070076494 Semiconductor integrated circuit device
04/05/2007US20070076488 Non-volatile memory device capable of changing increment of program voltage according to mode of operation
04/05/2007US20070075058 High-speed, precision, laser-based method and system for processing material of one or more targets within a field
04/05/2007DE102006034754A1 Vorrichtung und Verfahren zum Testen eines Halbleiterbauelements und Eye-Mask-Generator Apparatus and method for testing a semiconductor device and Eye Mask Generator
04/05/2007DE102006029747A1 Halbleiterspeicherchip und Verfahren für den Schutz seines Speicherkerns Semiconductor memory chip and procedures for the protection of his memory core
04/05/2007DE102005046981A1 Memory e.g. dynamic random access memory, formation method, involves replacing defective memory unit in used memory region by memory unit in unused memory region, where both memory regions are subjected with respective stress sequences
04/05/2007DE102005000841B4 Integrierter Halbleiterspeicher mit Anpassung des Bewertungsverhaltens von Leseverstärkern Integrated semiconductor memory with adjustment of the evaluation behavior of sense amplifiers
04/04/2007CN1942977A Dll circuit
04/04/2007CN1942976A Semiconductor memory
04/04/2007CN1941210A 半导体存储器件 A semiconductor memory device
04/04/2007CN1941209A Operation guiding electricity saver of embedded memory
04/04/2007CN1941167A Multi-port memory device with serial input/output interface
04/04/2007CN1940943A Method, module and system for dynamically updating each memory in fast photographing device
04/03/2007US7200800 Platform independent file manipulation
04/03/2007US7200793 Error checking and correcting for content addressable memories (CAMs)
04/03/2007US7200786 Built-in self-analyzer for embedded memory
04/03/2007US7200780 Semiconductor memory including error correction function
04/03/2007US7200710 Buffer device and method of operation in a buffer device
04/03/2007US7200059 Semiconductor memory and burn-in test method of semiconductor memory
04/03/2007US7200057 Test for weak SRAM cells
04/03/2007US7200056 Memory row/column replacement in an integrated circuit
04/03/2007US7200055 Memory module with termination component
04/03/2007US7199605 Method and apparatus for low capacitance, high output impedance driver
04/03/2007US7199573 Electronic circuit with test unit
04/03/2007US7199307 Structure and method for embedding capacitors in z-connected multi-chip modules
04/03/2007CA2482631C Memory cells enhanced for resistance to single event upset
03/2007
03/29/2007WO2007034481A2 A nand flash memory controller exporting a nand interface
03/29/2007US20070074094 Method for detecting code error
03/29/2007US20070074093 NAND flash memory controller exporting and NAND interface
03/29/2007US20070074092 Techniques to determine integrity of information
03/29/2007US20070074089 Optical disk recorder
03/29/2007US20070074088 Disk reproducing apparatus and disk reproducing method
03/29/2007US20070074087 System and method for writing information to an optical medium with predicting of defect characteristics
03/29/2007US20070074070 Repairable block redundancy scheme
03/29/2007US20070070743 Multi-port semiconductor memory device
03/29/2007US20070070742 Test mode controller
03/29/2007US20070070741 Semiconductor memory device for measuring internal voltage
03/29/2007US20070070740 Semiconductor memory device having data-compress test mode
03/29/2007US20070070739 Semiconductor memory device and its test method
03/29/2007US20070070738 Motor and controller inversion: commanding torque to position-controlled robot
03/29/2007US20070070737 Method and auxiliary device for creating and checking the circuit diagram for a circuit which is to be integrated
03/29/2007US20070070736 Semiconductor device
03/29/2007US20070070735 Redundant circuit for semiconductor memory device
03/29/2007US20070070734 Reconfigurable memory block redundancy to repair defective input/output lines
03/29/2007US20070070694 Storage device employing a flash memory
03/29/2007DE102006044301A1 Technik zum Unterdrücken von Bitleitungsleckstrom Technology for suppressing Bitleitungsleckstrom
03/29/2007DE102006033649A1 Speicherbauelement und Verfahren zum Konfigurieren eines Speicherbauelements Memory device and method for configuring a memory device
03/28/2007EP1766632A1 System and method for testing a data storage device without revealing memory content
03/28/2007EP1766529A1 Multiple-core processor with support for multiple virtual processors
03/28/2007CN1938788A Test apparatus, phase adjusting method and memory controller
03/28/2007CN1937088A Method for screening sample of system soft mistake
03/28/2007CN1937086A Fuse trimming circuit
03/28/2007CN1937080A NAND FLASH memory device