Patents
Patents for G11C 29 - Checking stores for correct operation; Testing stores during standby or offline operation (30,524)
02/2015
02/10/2015US8953393 Semiconductor device and operating method thereof
02/10/2015US8953391 Semiconductor apparatus
02/10/2015US8953372 Memory device readout using multiple sense times
02/10/2015US8952739 Input circuit
02/10/2015US8952716 Method of detecting defects in a semiconductor device and semiconductor device using the same
02/05/2015WO2015016883A1 Off-memory-module ecc-supplemental memory system
02/05/2015WO2015015556A1 Semiconductor storage device, and testing method for semiconductor storage device
02/05/2015US20150039953 System for simultaneously determining memory test result
02/05/2015US20150039952 Circuit arrangement and method with modified error syndrome for error detection of permanent errors in memories
02/05/2015US20150039951 Apparatus and method for acquiring data of fast fail memory
02/05/2015US20150036447 Flip-flop with zero-delay bypass mux
02/05/2015US20150036438 Semiconductor apparatus
02/05/2015DE112012006154T5 Speicher, die Hybrid-Fehlerkorrekturcode-Techniken verwenden Memory, use the hybrid error correction code techniques
02/05/2015DE102013215055A1 Schaltungsanordnung und Verfahren mit modifiziertem Fehlersyndrom zur Fehlererkennung von permanenten Fehlern in Speichern Circuit arrangement and method with modified error syndrome for error detection of permanent errors in memories
02/05/2015DE102005031524B4 Redundanzprogrammierschaltung und Verfahren Redundancy programming circuit and method
02/04/2015EP2831887A1 Trimmable reference generator for sense amplifier
02/04/2015EP2831886A1 Non-volatile memory assemblies
02/04/2015CN102881334B 核探测机器人控制系统中数据存储的纠错方法 Nuclear detection robot control system error correction method of data storage
02/04/2015CN101923903B 检测对存储器的故障注入式攻击的方法及相应的存储器 The method of detection of memory fault injection attacks and the corresponding memory
02/03/2015US8949698 Method, apparatus and system for handling data faults
02/03/2015US8949695 Method and apparatus for nested dispersed storage
02/03/2015US8949694 Address error detection
02/03/2015US8949693 Antipodal-mapping-based encoders and decoders
02/03/2015US8949692 Method and system for service-aware parity placement in a storage system
02/03/2015US8949691 Data processing device and data processing method
02/03/2015US8949690 Memory controller
02/03/2015US8949689 Storage control system with data management mechanism and method of operation thereof
02/03/2015US8949688 Updating error recovery information in a dispersed storage network
02/03/2015US8949687 Memory device and memory system
02/03/2015US8949686 Protection against word line failure in memory devices
02/03/2015US8949685 Soft error protection in individual memory devices
02/03/2015US8949684 Segmented data storage
02/03/2015US8949679 Memory buffer for buffer-on-board applications
02/03/2015US8949519 Simulating a memory circuit
02/03/2015US8949507 Method for performing block management, and associated memory device and controller thereof
02/03/2015US8947962 On-die termination of address and command signals
02/03/2015US8947961 Management of non-volatile memory
02/03/2015US8947960 Semiconductor storage with a floating detection circuitry and floating detection method thereof
02/03/2015US8947959 Memory device and compressive test method for the same
02/03/2015US8947957 Built-in self repair for memory
02/03/2015US8947955 Semiconductor memory, memory system, and operation method thereof
02/03/2015US8947946 Leakage measurement systems
02/03/2015US8947929 Flash-based soft information generation
01/2015
01/29/2015WO2015013153A2 Self-identifying memory errors
01/29/2015WO2015011052A1 Multicomponent magnetic field sensor
01/29/2015US20150033064 Self-identifying memory errors
01/29/2015US20150029802 Apparatuses, integrated circuits, and methods for measuring leakage current
01/29/2015US20150029801 Device and method for memory repair using test logic
01/29/2015US20150029799 Canary circuit with passgate transistor variation
01/29/2015US20150029796 Memory device, memory system, and method of controlling read voltage of the memory device
01/29/2015DE10231419B4 Vorrichtung und Verfahren zur Kalibrierung von Signalen Apparatus and method for calibrating signals
01/28/2015EP2828860A2 Wash-off resistant epoxy adhesive composition and pre-gelled adhesive
01/28/2015CN104321824A 存储器i/o接口的非接触应力测试 Memory i / o non-contact stress test interface
01/28/2015CN104318960A 一种硬盘坏道的修复方法及装置 A hard disk damage repair method and apparatus
01/28/2015CN104317528A micro SD卡的检测系统及其检测方法 detection system and method for detecting micro SD card
01/28/2015CN102420015B 用于一记忆体阵列中制造缺陷的检测的方法及测试装置 For a memory array test method and apparatus for detecting manufacturing defects
01/28/2015CN102165533B 半导体存储器件 A semiconductor memory device
01/28/2015CN102110479B 包括数据压缩测试电路的半导体存储装置 The semiconductor memory device includes a data compression circuit under test
01/27/2015US8943387 Programming management data for a memory
01/27/2015US8943386 Generating soft read values which optimize dynamic range
01/27/2015US8943384 Using a soft decoder with hard data
01/27/2015US8943377 On-chip detection of types of operations tested by an LBIST
01/27/2015US8943375 Combo static flop with full test
01/27/2015US8943374 Writing scheme for phase change material-content addressable memory
01/27/2015US8942056 Protocol for memory power-mode control
01/27/2015US8942054 Systems, memories, and methods for operating memory arrays
01/27/2015US8942051 Mechanisms for built-in self test and repair for memory devices
01/27/2015US8942050 Method of inspecting variable resistance nonvolatile memory device and variable resistance nonvolatile memory device
01/27/2015US8942040 Non-volatile semiconductor memory device capable of improving failure-relief efficiency
01/27/2015US8942028 Data reprogramming for a data storage device
01/27/2015CA2638421C Content data recording apparatus and method
01/22/2015US20150026530 Controller based memory evaluation
01/22/2015US20150026529 Semiconductor device and method of evaluating semiconductor device
01/22/2015US20150026528 Controller based memory evaluation
01/22/2015US20150026513 Memory buffer having accessible information after a program-fail
01/22/2015US20150026512 Integrated circuit and memory device
01/22/2015US20150023104 Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information
01/22/2015US20150023088 Apparatuses and methods for sensing fuse states
01/22/2015US20150022232 Reconfigurable semiconductor device
01/21/2015EP2825960A1 Physical page, logical page, and codeword correspondence
01/21/2015CN204117602U 一种砂浆锚杆锚固注浆数据检测存储系统 One kind of anchor bolt grouting mortar store data detection system
01/21/2015CN104303235A 用于存储器设备的上电检测系统 Power-detection systems for memory devices
01/21/2015CN104303155A 用于组合错误译码与调制方案的设备及方法 Apparatus and method for coding and modulation scheme combination error for
01/21/2015CN104299653A 半导体装置及其测试方法 Semiconductor device and test methods
01/21/2015CN102664043B 实现移动支付的智能sd卡测试的装置及方法 Apparatus and method for mobile payments to achieve smart sd card test
01/21/2015CN102568602B 闪速存储器发展系统 Flash memory development system
01/21/2015CN102543215B 一种基于ARM控制器的Nand FLASH智能检测方法 Nand FLASH intelligent detection method based on ARM controller
01/21/2015CN102543208B 快速确定闪存错误分布的方法及装置 Flash Error quickly determine the distribution method and apparatus
01/21/2015CN102292778B 用于管理错误区域的存储器装置及方法 Memory device and method for managing errors area
01/20/2015US8938659 Low-density parity-check decoder disparity preprocessing
01/20/2015US8938658 Statistical read comparison signal generation for memory systems
01/20/2015US8938657 Data and error correction code mixing device and method
01/20/2015US8938656 Data storage device with intermediate ECC stage
01/20/2015US8938655 Extending flash memory data retension via rewrite refresh
01/20/2015US8937845 Memory device redundancy management system
01/20/2015US8937844 Apparatus for generating write data and readout data
01/20/2015US8937841 Driver for semiconductor memory and method thereof
01/15/2015WO2015006231A1 Method and device for estimating damage to magnetic tunnel junction (mtj) elements
01/15/2015US20150019926 Manufacturing testing for ldpc codes
01/15/2015US20150019925 Data storage device and flash memory control method
1 2 3 4 5 6 7 8 9 10 11 12 ... 306