Patents
Patents for G03F 1 - Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof (24,849)
02/2012
02/22/2012CN102360157A Device for removing tiny dust and stains from photomask surface and method thereof
02/22/2012CN101276140B 灰阶掩模的缺陷修正方法和制造方法、灰阶掩模及图案转印方法 Grayscale mask defect correction method and manufacturing method, gray mask and pattern transfer method
02/21/2012US8122388 Phase-shifting masks with sub-wavelength diffractive optical elements
02/21/2012US8122386 Dummy pattern placement apparatus, method and program and semiconductor device
02/21/2012US8122385 Mask pattern correcting method
02/21/2012US8121387 Mask pattern verifying method
02/21/2012US8119309 Reflective photomask and method of fabricating, reflective illumination system and method of process using the same
02/21/2012US8119308 Photomask, apparatus for manufacturing semiconductor device having the photomask, and method of manufacturing semiconductor device using the photomask
02/16/2012US20120040293 Reflective mask, manufacturing method for reflective mask, and manufacturing method for semiconductor device
02/16/2012US20120040279 Method, device, and system for forming circular patterns on a surface
02/16/2012US20120040278 Intensity selective exposure photomask
02/16/2012US20120040277 Damascene reticle and method of manufacture thereof
02/16/2012US20120040276 Method of forming and using photolithography mask having a scattering bar structure
02/16/2012US20120039522 Mask inspection apparatus and method
02/16/2012US20120038866 Color filter and liquid crystal display device, and exposure mask
02/16/2012US20120038863 Color filter, liquid crystal display device,and color filter production method
02/16/2012DE112006001768B4 Verwendung eines superkritischen Fluids zum Trocknen der Schreiben und zum Reinigen der Linsen in einer Immersionslithographie Using a supercritical fluid to dry the letter and for cleaning the lenses in an immersion lithography
02/15/2012EP2418542A2 Binary photomask blank and binary photomask making method
02/15/2012CN101923281B 提高Si/Ge发射极窗口图形保真度的方法 Improving methods for Si / Ge emitter window graphics fidelity
02/15/2012CN101551587B 平板印刷用防护薄膜组件 Lithographic pellicle
02/15/2012CN101258442B 图案复制掩模、焦距变动测定方法及装置、半导体器件的制造方法 Replication method for producing a mask pattern, a method and apparatus for measuring the focal length changes, the semiconductor device
02/15/2012CN101120245B 透光性物品的检查方法 Inspection methods translucent objects
02/14/2012US8114557 Method for optical proximity correction
02/14/2012US8114556 Photomask blank and production method thereof, and photomask production method, and semiconductor device production method
02/09/2012US20120034554 Method for Fracturing and Forming a Pattern Using Circular Characters with Charged Particle Beam Lithography
02/09/2012US20120034553 Photomask Blank, Photomask, and Pattern Transfer Method Using Photomask
02/09/2012US20120034552 Method of manufacturing a photomask
02/09/2012US20120034551 Binary photomask blank and binary photomask making method
02/09/2012US20120034434 Mask blank, transfer mask, and film density evaluation method
02/09/2012DE102006043895B9 Elektronenmikroskop zum Inspizieren und Bearbeiten eines Objekts mit miniaturisierten Strukturen Electron microscope for inspecting and editing of an object with miniaturized structures
02/08/2012EP2416347A1 Reflective photomask and reflective photomask blank
02/08/2012EP2416217A1 Member for masking film, process for producing masking film using same, and process for producing photosensitive resin printing plate
02/08/2012CN1637593B 掩模 Mask
02/08/2012CN102347279A Silicon groove lithography process and mask suitable for same
02/08/2012CN102346378A Exposure method, exposure apparatus, photomask and method for manufacturing photomask
02/08/2012CN102346368A Method for manufacturing double pattern exposure mask and double pattern exposure method
02/08/2012CN101989035B 光掩膜的铬金属膜去除方法 Chrome photomask film removal method
02/08/2012CN101620375B 修正凸块光掩膜图案的方法 Projection light correction method for a mask pattern
02/08/2012CN101025576B 激光加工装置及其加工方法 The laser processing apparatus and processing method
02/07/2012US8112726 Phase-shifting masks with sub-wavelength diffractive optical elements
02/07/2012US8112725 Writing pattern producing method, photomask manufacturing method, and semiconductor device manufacturing method
02/07/2012US8112183 Substrate processing apparatus and substrate processing method
02/07/2012US8111898 Method for facilitating automatic analysis of defect printability
02/07/2012US8111428 Halftone image generation method, threshold matrix generation method, threshold matrix, printing plate manufacturing method, and printing plate
02/07/2012US8110800 Scanning electron microscope system and method for measuring dimensions of patterns formed on semiconductor device by using the system
02/07/2012US8110413 Mask pattern verification apparatus, mask pattern verification method and method of fabricating a semiconductor device
02/07/2012US8110323 Optically semitransmissive film, photomask blank and photomask, and method for designing optically semitransmissive film
02/07/2012US8109753 Double-sided nano-imprint lithography system
02/02/2012WO2012014520A1 Photomask correcting method and laser processing device
02/02/2012US20120028194 Pattern formation method using levenson-type mask and method of manufacturing levenson-type mask
02/02/2012US20120026578 Radiation source apparatus and duv beam generation method
02/01/2012EP2413192A1 Polymerizable monomers
02/01/2012EP2413189A1 A method for spreading a conformable material between a substrate and a template
02/01/2012EP2412733A1 Polymer, chemically amplified negative resist composition, and patterning process
02/01/2012EP2412686A2 Highly reflective, hardened silica-titania article and method of making
02/01/2012EP1810078B1 Method for thermally processing photosensitive printing sleeves
02/01/2012CN1955840B 光掩膜基板的制造方法 The method of manufacturing a photomask substrate
02/01/2012CN102338992A Assembly of a reticle holder and a reticle
02/01/2012CN101555097B 玻璃数据设计系统、方法 Glass data design systems, methods
02/01/2012CN101273302B 光掩模和使用该光掩模的曝光方法 Use of the photomask and a photomask exposure method
02/01/2012CN101221355B 有机电致发光元件制程中的光刻掩膜板的清洗方法及装置 Organic electroluminescent light emitting element method of cleaning process of lithography masks and apparatus
02/01/2012CN101171584B 光掩模和设计、制作与检查光掩模的方法 Photomask and design, photomask production and inspection methods
01/2012
01/31/2012US8108824 Pattern verification method, method of manufacturing semiconductor device, and recording media
01/31/2012US8108806 Contrast-based resolution enhancement for photolithographic processing
01/31/2012US8107063 Transparent article
01/31/2012US8105765 Method of manufacturing a semiconductor device
01/31/2012US8105757 Method of making a semiconductor device
01/31/2012US8105735 Reflective mask blank for EUV lithography and reflective mask for EUV lithography
01/31/2012US8105734 Titania-doped quartz glass member and making method
01/26/2012WO2012010459A1 Method for producing flexographic printing plates using uv-led irradiation
01/26/2012US20120021344 Reflective photomask and reflective photomask blank
01/26/2012US20120021343 Process Window Signature Patterns for Lithography Process Control
01/26/2012US20120019916 Multilayer reflective film coated substrate for a reflective mask, reflective mask blank, and methods of manufacturing the same
01/26/2012US20120019805 Calculation method, generation method, program, exposure method, and mask fabrication method
01/26/2012CA2804841A1 Method for producing flexographic printing plates using uv-led irradiation
01/25/2012EP2410379A2 Substrate to be processed having laminated thereon resist film for electron beam and organic conductive film, method for manufacturing the same, and resist pattering process
01/25/2012CN1983024B Pattern formation method using levenson-type mask and method of manufacturing levenson-type mask
01/25/2012CN102328265A Method for manufacturing electronic grade synthetic quartz glass substrate
01/25/2012CN101788759B Method for correcting auxiliary figure with low resolution
01/25/2012CN101634805B Peripheral shading mask structure used for manufacturing semiconductor wafer and manufacturing method thereof
01/24/2012US8103984 System and method for compressed design phase contour data
01/24/2012US8103980 Beam dose computing method and writing method and record carrier body and writing apparatus
01/24/2012US8103977 Semiconductor device and its manufacturing method, semiconductor manufacturing mask, and optical proximity processing method
01/24/2012US8103976 Photo mask set for forming multi-layered interconnection lines and semiconductor device fabricated using the same
01/24/2012US8102541 Apparatus and method for measuring structures on a mask and or for calculating structures in a photoresist resulting from the structures
01/24/2012US8101324 Photomask manufacturing method, photomask manufacturing apparatus and photomask
01/19/2012US20120015288 Member for masking film, process for producing masking film using the same, and process for producing photosensitive resin printing plate
01/19/2012US20120015287 Method of fabricating a half tone mask having a shielding pattern and plural overlapping halftone patterns of different widths
01/19/2012US20120015286 Mask blank substrate, mask blank, photomask, and methods of manufacturing the same
01/19/2012US20120014646 Optical fiber, method of preparation thereof and device
01/19/2012DE19946447B4 Teilchenoptisches Abbildungssystem für Lithographiezwecke A particle imaging system for lithography purposes
01/19/2012DE112009002348T5 Fotomaskenrohling, Fotomaske, Verfahren zu deren Herstellung und Verfahren zur Herstellung eines Halbleiterbauelements Photomask blank photomask, to processes for their preparation and process for the production of a semiconductor device
01/18/2012EP1543384B1 Composition which forms an electrically-conducting protective coat and a method for structuring a photoresist using the protective layer
01/18/2012EP1055153B1 Photomask with a mask edge provided with a ring-shaped esd protection area
01/18/2012CN102323723A Optimization method of optical proximity effect correction based on Abbe vector imaging model
01/18/2012CN102323715A Light cover plate for preventing atomization and manufacturing method thereof
01/18/2012CN101373326B Photo mask layout
01/17/2012CA2416412C Dry multilayer inorganic alloy thermal resist for lithographic processing and image creation
01/12/2012WO2012004950A1 Pellicle film
01/12/2012US20120009842 Display device, method of manufacturing the same and mask for manufacturing the same
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