Patents for G03F 1 - Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof (24,849) |
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01/02/1996 | US5480764 Gray scale microfabrication for integrated optical devices |
01/02/1996 | US5480747 Attenuated phase shifting mask with buried absorbers |
01/02/1996 | US5480746 Photomask and method of forming resist pattern using the same |
01/02/1996 | US5480529 Apparatus for depositing low stress films |
01/02/1996 | US5480047 Method for forming a fine resist pattern |
12/27/1995 | EP0689094A1 Bleaching mask |
12/26/1995 | US5478679 Half-tone self-aligning phase shifting mask |
12/26/1995 | US5478678 A pattern multilayer of partial transmitting layer, phase shifting layer and opaque layer having pattern edges formed on each layer extending beyond |
12/21/1995 | WO1995034608A1 Substrate coated with water-soluble salt |
12/20/1995 | EP0687568A2 Image dye for laser ablative recording element |
12/20/1995 | EP0687567A2 Barrier layer for laser ablative imaging |
12/19/1995 | US5477466 Method of fabricating an integrated circuit |
12/19/1995 | US5477344 Duplicating radiographic, medical or other black and white images using laser thermal digital halftone printing |
12/19/1995 | US5477283 For projecting guide lines on a work surface |
12/19/1995 | US5477058 Attenuated phase-shifting mask with opaque reticle alignment marks |
12/19/1995 | US5476575 Flowing sodium nitrate between mask and cathode while applying voltage |
12/13/1995 | EP0687102A2 Method of and apparatus for generating halftone image |
12/13/1995 | EP0686999A2 Pattern formation in the fabrication of microelectronic devices |
12/13/1995 | EP0686876A2 Attenuated phase shift mask and process for fabricating such a mask |
12/12/1995 | US5475509 Method and apparatus for setting image processing conditions |
12/12/1995 | US5474865 Globally planarized binary optical mask using buried absorbers |
12/12/1995 | US5474864 Substrate transmitting exposure light, phase shift pattern formed on surface with first portion of exposed substrate, second portion of material having light phase converted by 180 degrees made of metal oxide, nitride oxide, silicide oxide |
12/12/1995 | US5474807 Method for applying or removing coatings at a confined peripheral region of a substrate |
12/05/1995 | US5473748 Method and apparatus for automatically selecting process information for execution during printing of a page |
12/05/1995 | US5473413 Simplified process and apparatus for making plates used in printing |
12/05/1995 | US5473407 Sheet fixing device for a drum of a scanner |
12/05/1995 | US5472814 Orthogonally separated phase shifted and unphase shifted mask patterns for image improvement |
12/05/1995 | US5472813 Exposing resist layer by use of phase shift of light transmitted through a reticle, developing, exposing corresponding pattern on resist layer using edge parts, patterns exposed to edge parts overlapping |
12/05/1995 | US5472812 Forming a polysilicon and silicon nitride film on a substrate, patterning both layers by photolithography into desired shape, edge portion of silicon film is oxidized to silicon oxide transluscent region, while removing silicon nitride film |
12/05/1995 | US5472811 Phase shifting mask structure with multilayer optical coating for improved transmission |
12/05/1995 | US5472488 Coating solution for forming glassy layers |
11/28/1995 | US5470681 Phase shift mask using liquid phase oxide deposition |
11/28/1995 | US5470661 Coating a diamond with a film of carbon for heat resistance |
11/28/1995 | US5470621 Frames with coatings and transparent films |
11/22/1995 | EP0627123A4 Laser generated i.c. mask. |
11/21/1995 | US5469489 Production method of an x-ray mask structure, an x-ray mask structure produced thereby, and a device fabricated by using the x-ray mask structure |
11/21/1995 | US5468591 Barrier layer for laser ablative imaging |
11/21/1995 | US5468578 Method of making masks for phase shifting lithography to avoid phase conflicts |
11/21/1995 | US5468577 Photomask having patterns to reduce power of a stepper |
11/21/1995 | US5468576 Immersing substrate with resist layers in solution containing phase shifter by prescribed thickness by deposition from solution |
11/21/1995 | US5468337 Method of mending a defect in a phase shift pattern |
11/21/1995 | US5468324 Spin-on and peel polymer film method of data recording duplication and micro-structure fabrication |
11/16/1995 | WO1995030932A1 High power phase masks for imaging systems |
11/15/1995 | CN1111761A Laser imaged printing plate |
11/14/1995 | US5465859 Dual phase and hybrid phase shifting mask fabrication using a surface etch monitoring technique |
11/08/1995 | EP0680624A1 Phase shifting mask structure with absorbing/attenuating sidewalls for improved imaging and method of fabricating phase shifters with absorbing/attenuating sidewalls. |
11/08/1995 | EP0664033A4 Rasterizer for a pattern generation apparatus. |
11/08/1995 | CN1111292A Method for fabricating a half-tone type phase shift mask |
11/07/1995 | US5464729 Trannsferring images and washing |
11/07/1995 | US5464713 Light transmitting portion exposing a surface, phase shifting and repairing a member |
11/07/1995 | US5464712 Method for fabricating a phase shifting mask |
11/07/1995 | US5464711 Semiconductors with silicon substrates, membranes, x-ray absorber layers of hafnium or rhenium or iron alloys |
11/07/1995 | CA1337512C Chemical mat film and photosensitive film using same |
11/02/1995 | WO1995029505A1 Method and device for ion implantation |
11/02/1995 | EP0679948A2 Dual phase and hybrid phase shifting mask fabrication using a surface etch monitoring technique |
10/31/1995 | US5463730 Method and apparatus for selecting and displaying a process during prepress processing of an image |
10/31/1995 | US5462841 Tone rendition of halfstone images by projection exposure |
10/26/1995 | DE19510564A1 Attenuation type phase shifting mask |
10/24/1995 | US5460920 Photochemical or mechanical production of flexible printing plates |
10/24/1995 | US5460908 Semiconductors |
10/24/1995 | US5460693 Dry microlithography process |
10/19/1995 | WO1995027924A1 Method of photolithographically metallizing at least the inside of holes arranged in accordance with a pattern in a plate of an electrically insulating material |
10/19/1995 | WO1995022083A3 Photomask blanks |
10/18/1995 | EP0677787A2 Mask and mask supporting mechanism |
10/17/1995 | US5459013 Identifying defective area, applying an image reversal photoresist,exposing photoresist, removing portions of photoresist, depositing material on photoresist and defective area and removing photoresist |
10/17/1995 | US5459002 Gradients |
10/17/1995 | US5459001 X-ray lithography of integrated circuits |
10/17/1995 | US5458999 Interferometric phase shifting method for high resolution microlithography |
10/17/1995 | US5458998 Method of making mask pattern data and process for manufacturing the mask |
10/17/1995 | US5458084 X-ray wave diffraction optics constructed by atomic layer epitaxy |
10/11/1995 | EP0664015A4 Method and apparatus for converting image color values from a first to a second color space. |
10/10/1995 | US5457006 Adhesion of non-light transmitting thin film |
10/10/1995 | US5456798 Methods and apparatus for processing curved surface |
10/05/1995 | DE19512245A1 Illuminating device resolution measuring photomask for semiconductor process |
10/05/1995 | DE19511533A1 Fine measuring appts. for properties in semiconductor mfr |
10/04/1995 | EP0675384A1 Color filter repair method and apparatus |
10/04/1995 | EP0517923B1 Method of forming minute resist pattern |
10/03/1995 | US5455144 Reduction projection exposure of pattern onto positive photosensitive resist film, then transferring second pattern onto negative resist film, for improving resolution of fine patterns |
10/03/1995 | US5455131 Depositing phase shifting and opaque layer on transparent substrate; selective removal |
10/03/1995 | US5455130 Photomask comprising an optical path adjusting film |
09/28/1995 | WO1995026043A1 Group iv semiconductor thin films formed at low temperature using nanocrystal precursors |
09/27/1995 | EP0674342A1 Pattern and method for evaluating focal point |
09/27/1995 | EP0674223A2 An attenuating phase-shift mask structure and fabrication method |
09/26/1995 | US5454050 Cut mask preparation method and apparatus |
09/26/1995 | US5453816 Protective mask for pellicle |
09/19/1995 | US5451111 Method of and apparatus for automatically outputting the image of a page |
09/14/1995 | WO1995024672A1 Light-sensitive material for photographic and reprographic applications |
09/14/1995 | DE4407622A1 Lichtempfindliches Material für reprographische Anwendungen The light-sensitive material for reprographic applications |
09/14/1995 | DE4407539A1 Printing plate prodn. |
09/14/1995 | DE19508749A1 Phase shift mask fabrication |
09/14/1995 | DE19508497A1 Aperture for use in optical appts. e.g. for semiconductor mfr. |
09/13/1995 | EP0671658A2 Exposure apparatus and reflection type mask to be used in the same |
09/13/1995 | EP0671025A1 Metal ion reduction in bottom anti-reflective coatings for photoresists. |
09/13/1995 | EP0671024A1 Method and apparatus for fabricating microlenses |
09/12/1995 | US5450533 Method and apparatus for printing continuous pattern |
09/12/1995 | US5449578 Method of manufacturing a mask for forming a pattern in a semiconductor device |
09/12/1995 | US5449545 Ceramic device |
09/08/1995 | WO1995023710A1 Light control material and method for making same |
09/06/1995 | EP0670055A1 Method of deposition. |
09/06/1995 | EP0670054A1 Photomask blanks |