Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
06/2011
06/23/2011WO2010134018A3 Pattern data conversion for lithography system
06/23/2011US20110152810 Elastic fiber containing an anti-tack additive
06/23/2011US20110151597 Analysis method for semiconductor device
06/23/2011US20110147587 Diagnosis device of recipe used for scanning electron microscope
06/23/2011US20110147586 Charged Particle Beam Device
06/23/2011US20110147585 Charged particle energy analysers
06/23/2011US20110147200 Ion Beam Generator, and Substrate Processing Apparatus and Production Method of Electronic Device Using The Ion Beam Generator
06/23/2011US20110146911 Plasma processing system with locally-efficient inductive plasma coupling
06/22/2011EP2336830A1 Lithography system
06/22/2011EP2336384A1 Film-forming method
06/22/2011EP2122657B8 Method for controlling ion energy in radio frequency plasmas
06/22/2011EP1557869B1 Exposure transfer mask and exposure transfer mask pattern exchange method
06/22/2011CN201877401U Lower electrode thimble of chip etching equipment
06/22/2011CN1909147B Emitter for an ion source and method of producing same
06/22/2011CN1691505B Plasma power generator
06/22/2011CN1638014B Ion beam monitoring arrangement
06/22/2011CN102105960A Imaging system
06/22/2011CN102104016A Substrate holder and clipping device
06/22/2011CN102103968A Particle beam passable nonmetal vacuum isolation window
06/22/2011CN102103967A Particle-optical component
06/22/2011CN102103966A Particle-optical component
06/22/2011CN101620972B Plasma processing apparatus
06/22/2011CN101587813B A loading station mechanism, a plasma processing apparatus and a pressure exertion method
06/22/2011CN101582364B Double cup cover ion source filament seat structure for preventing metal spraying
06/22/2011CN101529551B Method and apparatus for preventing instabilities in radio-frequency plasma processing
06/22/2011CN101276724B Transmission electron microscope micro grid and preparing method thereof
06/22/2011CN101110334B Beam stop for an ion implanter
06/21/2011US7964845 Charged particle beam device
06/21/2011US7964844 Sample inspection apparatus
06/21/2011US7964135 Method and apparatus for imprinting energy ray-setting resin, and discs and semiconductor devices with imprinted resin layer
06/16/2011WO2011071579A2 Photon induced near field electron microscope and biological imaging system
06/16/2011WO2011071015A1 Electron beam biprism device and electron beam device
06/16/2011WO2011071008A1 Transmission electron microscope and test sample observation method
06/16/2011WO2011070890A1 Inspection device and inspection method
06/16/2011WO2011070727A1 Focused ion beam device and focused ion beam processing method
06/16/2011WO2011070704A1 Electron microscope
06/16/2011WO2011070309A1 X-ray analyser
06/16/2011WO2011070156A2 Device and method for the ion beam modification of a semiconductor substrate
06/16/2011WO2011069908A1 Ecr plasma source with coating protection and use of the coating protection
06/16/2011WO2011069493A1 Deflecting device for electron beams, magnetic deflecting unit for such a deflecting device, and device for vapor coating a planar substrate using such a deflecting device
06/16/2011US20110143527 Techniques for generating uniform ion beam
06/16/2011US20110140007 Semiconductor manufacturing apparatus
06/16/2011US20110140006 Method and apparatus for specimen fabrication
06/16/2011US20110139979 Isotope ion microscope methods and systems
06/16/2011US20110139613 Repeller structure and ion source
06/16/2011DE102009057486A1 Ablenkvorrichtung für Elektronenstrahlen, magnetische Ablenkeinheit für eine solche Ablenkvorrichtung und Vorrichtung zum Bedampfen eines flächigen Substrates mit einer solchen Ablenkvorrichtung For deflecting electron beams, magnetic deflection unit for deflecting and such a device for the vapor deposition of a planar substrate with such deflector
06/16/2011DE102009051374A1 Vorrichtung zum Refelektieren beschleunigter Elektronen Apparatus for efficiently reflect accelerated electrons
06/15/2011EP2333809A1 Electron microscope
06/15/2011EP2333808A1 Charged particle beam device, method of operating a charged particle beam device
06/15/2011EP2332164A1 Low pressure high frequency pulsed plasma reactor for producing nanoparticles
06/15/2011EP2332163A1 Radiofrequency plasma reactor and method for manufacturing vacuum process treated substrates
06/15/2011EP2332162A2 High accuracy beam placement for local area navigation
06/15/2011EP2331946A2 Ion beam stabilization
06/15/2011EP1803141B1 Microreactor for a transmission electron microscope and heating element and method for the manufacture thereof
06/15/2011EP1316104B1 Bulk gas delivery system for ion implanters
06/15/2011CN201868389U Etching device for effective controlling critical size of edge part of wafer
06/15/2011CN1809911B A high density plasma reactor
06/15/2011CN1668915B Method and apparatus for determining characteristics of structural element interface having sub-micron cross-sectional area
06/15/2011CN102099891A Plasma process and reactor for treating metallic pieces
06/15/2011CN102099890A Method and apparatus for measurement of beam angle in ion implantation
06/15/2011CN102099889A Electron beam emitter with slotted gun
06/15/2011CN102097273A Apparatus and method for controlling plasma density profile
06/15/2011CN102097270A Magnet group for magnetron sputtering electrode and sputtering apparatus
06/15/2011CN101667533B Plasma processing method and plasma processing apparatus
06/15/2011CN101661862B Ion source
06/15/2011CN101652498B Plasma generation device, and method and apparatus for forming film using the same
06/15/2011CN101378031B Substrate carrier plateform and substrate processing device
06/15/2011CN101251463B Control system for micro-nano sample in electronic microscope
06/15/2011CN101223624B Ion source and plasma processing device
06/14/2011US7960709 Ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions
06/14/2011US7960703 Charged-particle beam lithography apparatus and device manufacturing method
06/14/2011US7960696 Method for inspecting and measuring sample and scanning electron microscope
06/09/2011WO2011068101A1 Filament supporting method, electron gun, and processing apparatus
06/09/2011WO2011068056A1 Method for defect inspection and apparatus for defect inspection
06/09/2011WO2011068011A1 Charged particle beam device and image quality improvement method therefor
06/09/2011WO2011047142A3 A technique for processing a substrate having a non-planar surface
06/09/2011WO2011017314A3 Closed drift ion source with symmetric magnetic field
06/09/2011US20110133082 Scanning electron microscope
06/09/2011US20110133066 Pattern inspection device and method
06/09/2011DE202011002844U1 Erweiterungselektrode einer Plasmaschrägkantenätzvorrichtung Extension electrode of a Plasmaschrägkantenätzvorrichtung
06/09/2011DE102009057357A1 Electron emitter for producing planar radiation field to sterilize polyethylene terephthalate preforms used in e.g. food industry, has grid element including positionally varying electron penetrability to apply intensity profile to field
06/09/2011DE102009057334A1 Electron radiating unit for generating radiation field, has grid arrangement with grid elements for distributing and accelerating electrons from cathode, where one of elements has electron-permeable recesses with any preset geometrical form
06/09/2011DE102009056241A1 Stützeinrichtung für eine Magnetronanordnung mit einem rotierenden Target Support device for a magnetron with a rotating target
06/09/2011DE102009056240A1 Antriebsendblock für eine Magnetronanordnung mit einem rotierenden Target Drive end block for a magnetron with a rotating target
06/09/2011DE102009052807A1 Verfahren und Vorrichtung zum thermischen Bearbeiten von Werkstoffen Method and apparatus for thermally processing materials
06/09/2011DE10066358B4 Einrichtung zur Behandlung von Werkstücken mit Elektronenstrahlen Apparatus for the treatment of work pieces using electron beams
06/08/2011EP2329521A2 Adjustable thermal contact between an electrostatic chuck and a hot edge ring by clocking a coupling ring
06/08/2011EP2329510A1 Plasma power supply arrangement
06/08/2011EP2033206B1 Slider bearing for use with an apparatus comprising a vacuum chamber
06/08/2011CN201859831U Dielectric window of plasma etching reactor
06/08/2011CN1983518B Plasma processing apparatus and method
06/08/2011CN102089848A Remote plasma cleaning method and apparatus for applying said method
06/08/2011CN101469887B Air conditioner
06/08/2011CN101194339B Gas controlling device
06/08/2011CN101131909B Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods
06/08/2011CN101018884B Plasma processing apparatus including gas distribution member supplying process gas and radio frequency (RF) power
06/07/2011US7956336 Focused ion beam apparatus
06/07/2011US7956324 Charged particle beam apparatus for forming a specimen image
06/07/2011US7955986 Capacitively coupled plasma reactor with magnetic plasma control
06/03/2011WO2011065240A1 Scanning electron microscope
1 ... 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 ... 469