Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
03/2013
03/21/2013DE102011083139A1 Substrate processing system such as vacuum coating equipment, has substrate carriers that mesh with each other in substrate transfer position such that they are pivoted back and forth between two tilt positions, in inclined manner
03/21/2013DE102011082956A1 Transfermasken zur lokalen Bedampfung von Substraten und Verfahren zu deren Herstellung Transfer masks for local vapor deposition of substrates and processes for their preparation
03/21/2013DE102011082939A1 Microstructured transfer mask for locally differentiated transmission of organic materials on substrate, has intermediate carrier, textured light-reflecting layer, and light absorbing layer having anisotropic thermal conductivity
03/21/2013DE102011082900A1 Vacuum coating apparatus useful for coating disc-shaped substrates, comprises a plant chamber limited by chamber walls, having opening that is closable by a vacuum-tight chamber lid, a transport device and coating device with tubular target
03/20/2013EP2571041A1 Electron source
03/20/2013EP2569798A1 Methods and apparatus for applying periodic voltage using direct current
03/20/2013CN202816866U Compound plasma surface treatment device
03/20/2013CN202816865U A top electrode in an etching electrode mechanism
03/20/2013CN202816864U A bottom electrode device in an etching electrode machine
03/20/2013CN102985996A Methods and apparatus for applying periodic voltage using direct current
03/20/2013CN102985995A Handling beam glitches during ion implantation of workpieces
03/20/2013CN102985590A Method for treating a surface of a polymeric part by multi-energy ions
03/20/2013CN102983099A Semiconductor integrated circuit manufacturing method
03/20/2013CN102983052A Etch process for 3D flash structures
03/20/2013CN102983051A Plasma treatment device with adjustable plasma concentration distribution and processing method thereof
03/20/2013CN102983050A Ion injection device
03/20/2013CN102983049A Transmission electron microscope sample bearing device
03/20/2013CN102983048A Beam current regulating mechanism and ion implantation system
03/20/2013CN102148115B Manufacturing method for transmission electron microscope micro-gate
03/20/2013CN101528369B Method and apparatus for manufacturing cleaned substrates or clean substrates which are further processed
03/19/2013US8399865 Method and apparatus for enhanced lifetime and performance of ion source in an ion implantation system
03/19/2013US8399864 Dual beam system
03/19/2013US8399863 Charged particle beam apparatus using an electrostatic lens gun
03/19/2013US8399854 Combination scale and germicidal sterilization apparatus
03/19/2013US8399853 UV sterilizer
03/19/2013US8399851 Systems and methods for scanning a beam of charged particles
03/19/2013US8399834 Isotope ion microscope methods and systems
03/19/2013US8399833 Charged particle beam writing method, method for detecting position of reference mark for charged particle beam writing, and charged particle beam writing apparatus
03/19/2013US8399831 Forming an image while milling a work piece
03/19/2013US8398813 Processing apparatus and processing method
03/14/2013WO2013036125A1 Projection system with flexible coupling
03/14/2013WO2013035983A1 Apparatus and method for plasma ion implantation
03/14/2013WO2013035866A1 Electron-microscopic examination method for examining biosample while keeping said biosample unchanged, and composition for evaporation inhibition under vacuum, scanning electron microscope, and transmission electron microscope for use in said method
03/14/2013WO2013035411A1 Emitter, gas field ionization ion source, and ion beam device
03/14/2013WO2013035389A1 Scanning electron microscope
03/14/2013WO2013035386A1 Multipole measurement apparatus
03/14/2013WO2013035221A1 Ion beam device
03/14/2013WO2013035220A1 Charged particle beam apparatus
03/14/2013WO2013034920A2 Surface coatings
03/14/2013WO2013034258A1 Plasma source
03/14/2013WO2013011147A3 Plasma immersion ion implantation into a non-conductive substrate
03/14/2013US20130065396 Apparatus including gas distribution member supplying process gas and radio frequency (rf) power for plasma processing
03/14/2013US20130062520 Distortion Free Stigmation of a TEM
03/14/2013US20130062519 Electron microscope, and method for adjustng optical axis of electron microscope
03/14/2013US20130062198 Apparatus for processing work piece by pulsed electric discharges in solid-gas plasma
03/14/2013DE102011112759A1 Plasmaquelle Plasma source
03/14/2013CA2846679A1 Plasma source
03/13/2013EP2568777A1 Microwave processing apparatus and control method thereof
03/13/2013EP2567392A1 Plasma reactor
03/13/2013EP2567012A1 Methods for improving the bioactivity characteristics of a surface and objects with surfaces improved thereby
03/13/2013EP2566999A1 Method for spark deposition using ceramic targets
03/13/2013CN202796849U Shielding disc and ion implantation device
03/13/2013CN202796848U Power supply circuit for heater
03/13/2013CN202796847U Vacuum plasma cavity with dustproof structure
03/13/2013CN202796846U Dry etching device
03/13/2013CN102971825A Apparatus and method for controllably implanting workpieces
03/13/2013CN102971824A Improved contrast for scanning confocal electron microscope
03/13/2013CN102971823A Charged particle beam processing system with visual and infrared imaging
03/13/2013CN102971822A Manipulator carrier for electron microscopes
03/13/2013CN102969216A Etching endpoint detection window, detector and etching chamber
03/13/2013CN102969215A Low sloped edge ring for plasma processing chamber
03/13/2013CN102969214A Subtrate processing device and substrate processing system equipped with the same
03/13/2013CN102965610A Thermal spray powder, method for forming thermal spray coating, and plasma resistant member
03/13/2013CN101996842B 等离子蚀刻装置 Plasma etching apparatus
03/13/2013CN101908473B Method of manufacturing CMOS devices by the implantation of N- and P-type cluster ions and negative ions
03/13/2013CN101887829B Preparation method of transmission electron microscope micro-grid
03/13/2013CN101866803B TEM micro grid
03/13/2013CN101807507B Ion implanter system with beam decelerator
03/13/2013CN101305443B Ion implanter with contaminant collecting surface
03/12/2013US8395130 Holder for an electron microscopy sample carrier
03/12/2013US8394231 Plasma process device and plasma process method
03/07/2013WO2012159620A3 Method for impedance matching the output impedance of a high-frequency power supply arrangement to the impedance of a plasma load, and high frequency power supply arrangement
03/07/2013US20130059071 Low contamination components for semiconductor processsing apparatus and methods for making components
03/07/2013US20130056636 Scanning electron microscope
03/07/2013US20130056635 Xy-coordinate compensation apparatus and method in sample pattern inspection apparatus
03/07/2013US20130056634 Charged Particle Detector System Comprising a Conversion Electrode
03/07/2013US20130056022 Bare aluminum baffles for resist stripping chambers
03/07/2013DE102011113294A1 Vakuumbeschichtungsvorrichtung The vacuum deposition apparatus
03/07/2013DE102011113293A1 Vakuumbeschichtungsvorrichtung The vacuum deposition apparatus
03/07/2013DE102011113292A1 Vakuumdurchführung und Vakuumbeschichtungsvorrichtung mit Vakuumdurchführungen Vacuum feedthrough and vacuum coating apparatus with vacuum feedthroughs
03/07/2013DE102011113274A1 Beschichtungsanlage Coating machine
03/07/2013DE102011111613B4 Sensoranordnung zur Charakterisierung von Plasmabeschichtungs-, Plasmaätz- und Plasmabehandlungsprozessen sowie Verfahren zur Ermittlung von Kenngrößen in diesen Prozessen Sensor arrangement for the characterization of plasma coating, plasma etching and plasma treatment processes and procedures for the determination of parameters in these processes
03/07/2013DE102006030837B4 Elektronenstrahlschreibverfahren Electron beam writing method
03/06/2013EP2565909A1 Method for checking ion implantation state, and method for manufacturing semiconductor wafer
03/06/2013EP2565903A2 Plasma generator
03/06/2013EP2565902A2 Electron beam exposure system
03/06/2013EP2565901A1 Sample observation method and transmission electron microscope
03/06/2013EP2565900A2 Beam device and system comprising a particle beam device and an optical microscope
03/06/2013EP2565292A1 Apparatus and method for coating substrates using the eb/pvd process
03/06/2013EP2565291A1 Vaccum coating apparatus and method for depositing nanocomposite coatings
03/06/2013EP2564412A1 Electrode for a dbd plasma process
03/06/2013CN202771895U Vacuum treatment device and radio-frequency filter of vacuum treatment device and radio-frequency filter box thereof
03/06/2013CN1645548B Charged particle beam device
03/06/2013CN102959675A Control apparatus for plasma immersion ion implantation of dielectric substrate
03/06/2013CN102956533A Electrostatic chuck and semiconductor/liquid crystal manufacturing equipment
03/06/2013CN102956432A Atmospheric-pressure plasma processing device of display substrate
03/06/2013CN102956431A Ring-shaped shield member, components thereof and substrate mounting table
03/06/2013CN102956430A Method for replacing helium atoms on film layer
03/06/2013CN102956429A Extraction electrode system for wide-beam ion implanter
03/06/2013CN102956428A Ion implanter
1 ... 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 ... 469