Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
05/2013
05/16/2013WO2013069722A1 Sample positioning apparatus, sample stage, and charged particle beam apparatus
05/16/2013WO2013069636A1 Charged particle beam apparatus and method of measuring and correcting landing angle of charged particle beam
05/16/2013WO2013069410A1 Cooling device, ion microscope, and observation device or inspection device
05/16/2013WO2013068524A1 Assembly for feeding in hf current for tubular cathodes
05/16/2013WO2013068321A1 Armored device for electronic scanning microscope
05/16/2013WO2013068080A1 Hipims layering
05/16/2013WO2013067902A1 Broadband ion beam analyzer
05/16/2013WO2013067854A1 Multi-electrode beam focusing regulation device and method
05/16/2013WO2013067851A1 Method for modulating arc current balancing of double-filament ion source
05/16/2013WO2013039891A4 Glancing angle mill
05/16/2013US20130119252 Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same
05/16/2013US20130119251 Method and apparatus for charged particle beam inspection
05/16/2013US20130119250 Defect inspection method, and device thereof
05/16/2013US20130118686 Temperature controlled chamber liner
05/16/2013DE102012109941A1 Verfahren zur Herstellung eines Halbleiterbauelements und Halbleiterfertigungssystem A process for producing a semiconductor device, and semiconductor manufacturing system
05/16/2013DE102011086111A1 Anordnung zur Einspeisung von HF-Strom für Rohrkathoden Arrangement for supply of RF power for tube cathodes
05/16/2013CA2854976A1 Hipims layering
05/15/2013EP2592645A2 Substrate processing apparatus
05/15/2013EP2592644A2 Plasma processing apparatus
05/15/2013EP2592643A1 Charged particle beam device and sample production method
05/15/2013EP2592642A2 Charged particle energy filter
05/15/2013EP2592641A1 Scanning transmission type electron microscope
05/15/2013EP2591491A1 Magnetron sputtering apparatus
05/15/2013EP2591490A2 Charged particle beam processing system with visual and infrared imaging
05/15/2013EP2591139A1 Method for treating a surface of a polymeric part by multi-energy ions
05/15/2013EP2590802A1 Method and device for atmospheric pressure plasma treatment
05/15/2013CN103109344A Magnetron sputtering apparatus
05/15/2013CN103109343A Electrode for producing a plasma, plasma chamber having said electrode, and method for analyzing or processing a layer or the plasma in situ
05/15/2013CN103109342A Techniques for plasma processing a substrate
05/15/2013CN103108981A Method for the surface treatment of a fluid product dispensing device
05/15/2013CN103108980A Method for treating a surface of a device for dispensing a fluid product
05/15/2013CN103108978A Coating substrates with an alloy by means of cathode sputtering
05/15/2013CN103107113A Etching apparatus and methods
05/15/2013CN103107059A Plasma treatment device
05/15/2013CN103107058A Substrate processing apparatus
05/15/2013CN103107057A Air guide electrode plate
05/15/2013CN103107056A 宽带离子束分析器 Broadband ion beam analyzer
05/15/2013CN103107055A Internal split faraday shield for an inductively coupled plasma source
05/15/2013CN102263000B Plasma microwave cavity
05/14/2013US8440982 Cryo transfer holder for transmission electron microscope
05/14/2013US8440981 Compact pyroelectric sealed electron beam
05/14/2013US8440969 Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images
05/14/2013US8440061 System and method for plasma arc detection, isolation and prevention
05/10/2013WO2013067317A1 High-throughput ion implanter
05/10/2013WO2013065605A1 Solid scintillator and electron beam detector employing same
05/10/2013WO2013065531A1 Ion beam etching method for magnetic films and ion beam etching apparatus
05/10/2013WO2013065475A1 Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen
05/10/2013WO2013065399A1 Scanning electron microscope
05/10/2013WO2013064782A1 Method for avoiding charge effects for lithography and electron microscopy
05/10/2013WO2013028227A3 Improved uniformity of a scanned ion beam
05/09/2013US20130112875 Scanning transmission electron microscope and axial adjustment method thereof
05/09/2013US20130112873 Aberration Correction Device and Charged Particle Beam Device Employing Same
05/09/2013US20130112872 Inspection method for semiconductor wafer and apparatus for reviewing defects
05/09/2013US20130112871 Inspection Method and Device
05/09/2013US20130112666 Plasma processing apparatus
05/08/2013EP2590205A2 Transmission electron microscope and method of observing TEM images
05/08/2013EP2590204A1 Charged-particle microscopy
05/08/2013EP2590203A2 Charged particle beam system aperture
05/08/2013EP2589680A1 Apparatus for the deposition of diamondlike carbon as protective coating on an inner surface of a shaped object
05/08/2013EP2589542A1 Device for sterilising plastic containers by means of media-controlled electron beams
05/08/2013EP2589063A1 Handling beam glitches during ion implantation of workpieces
05/08/2013EP2588642A2 Method for the surface treatment of a fluid product dispensing device
05/08/2013EP2588641A2 Method for the surface treatment of a fluid product dispensing device
05/08/2013EP2588640A2 Method for treating a surface of a device for dispensing a fluid product
05/08/2013EP2588639A2 Method for the surface treatment of a fluid product dispensing device
05/08/2013EP2588638A2 Method for treating an elastomeric surface of a device for dispensing a fluid product
05/08/2013DE112012000015T5 Vorrichtung für die Anregung eines Hochfrequenz-Gasplasmas Device for the excitation of a high-frequency gas plasma
05/08/2013DE102011085888A1 Coating a substrate with a mixing layer or an alloy layer by magnetron sputtering, by depositing two tube magnetrons that are arranged next to each other in a coating chamber, whose outer surfaces comprise a sputterable target material
05/08/2013DE102011085789A1 Plant, useful for continuous vacuum coating of substrates, comprises vacuum chamber, and transport device that is arranged in chamber, is configured for transporting substrate along transport path by chamber and comprises transport rollers
05/08/2013CN202930354U Plasma supply device
05/08/2013CN202930353U SEM sample bench allowing same-plane testing of samples with different thickness
05/08/2013CN103098167A Method for improving implant uniformity during photoresist outgassing
05/08/2013CN103097573A Method for the surface treatment of a fluid product dispensing device
05/08/2013CN103097572A Method for treating an elastomeric surface of a device for dispensing a fluid product
05/08/2013CN103097571A Method for the surface treatment of a fluid product dispensing device
05/08/2013CN103094143A Ion implantation monitoring method
05/08/2013CN103094080A Ion layer preparation method and device of graphene semiconductor
05/08/2013CN103094053A Charged particle energy filter
05/08/2013CN103094048A Device capable of adjusting magnetron displacements
05/08/2013CN103094047A Inductively coupled plasma processing apparatus
05/08/2013CN103094046A Plasma processing apparatus and top panel for the same
05/08/2013CN103094045A Symmetric plasma process chamber
05/08/2013CN103094044A Symmetric plasma process chamber
05/08/2013CN103094043A Plasma processing unit
05/08/2013CN103094042A Substrate Processing Device And Impedance Matching Method
05/08/2013CN103094041A Methods For Mixed Acid Cleaning Of Showerhead Electrodes
05/08/2013CN103094040A Systems comprising silicon coated gas supply conduits and methods for applying coatings
05/08/2013CN103094039A Plasma processing apparatus and plasma processing method
05/08/2013CN103094038A Plasma processing apparatus and plasma processing method
05/08/2013CN103094037A Holding device and plasma processing device using the same
05/08/2013CN103094036A Method and device of broadband bundle beam current detecting
05/08/2013CN103094035A Method and device of broadband bundle uniformity controlling
05/08/2013CN103094034A Ion source uniform air supply structure device
05/08/2013CN103094033A Double-filament ion source arc current balance adjustment method
05/08/2013CN103094032A Device and method of multi-electrode beam focusing adjusting
05/08/2013CN103094031A Charged particle beam system aperture
05/08/2013CN103094029A Ion Beam Extraction Electrode And Ion Source
05/08/2013CN103094028A Cleaning apparatus of ion source extraction electrode system
05/08/2013CN103094027A Extraction electrode system and slit electrodes
05/08/2013CN103094021A Negative electrode preparation pretreatment device and cleaning method
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