Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
04/1987
04/22/1987EP0218920A2 Omega-type electron energy filter
04/22/1987EP0218829A2 Arrangement for the detection of secondary and/or back-scattering electrons in an electron beam apparatus
04/22/1987EP0113983B1 Fabricating a semiconductor device by means of molecular beam epitaxy
04/22/1987EP0069750B1 Emission-electron microscope
04/22/1987CN86105616A Method and apparatus for clearing short-circuited, high-voltage cathodes in a sputtering chamber
04/21/1987US4659449 Apparatus for carrying out dry etching
04/21/1987US4659413 Automated single slice cassette load lock plasma reactor
04/21/1987CA1220879A1 Method and apparatus for surface diagnostics
04/15/1987EP0218105A2 Mounting arrangement for a spiral-shaped wire cathode
04/15/1987CN85107255A Controlling form of the electron-beam unit
04/14/1987US4658143 Ion source
04/14/1987US4658138 Scanning electron microscope
04/14/1987US4658137 Electron detector
04/14/1987US4658136 Secondary electron detecting apparatus
04/14/1987US4657654 Targets for magnetron sputter device having separate confining magnetic fields to separate targets subject to separate discharges
04/14/1987US4657620 Automated single slice powered load lock plasma reactor
04/14/1987US4657619 Semiconductor production
04/14/1987US4657618 Powered load lock electrode/substrate assembly including robot arm, optimized for plasma process uniformity and rate
04/14/1987US4657617 Anodized aluminum substrate for plasma etch reactor
04/08/1987EP0217616A2 Substrate processing apparatus
04/08/1987EP0217361A2 Ion source
04/08/1987EP0217210A2 Electron beam gun with directly and indirectly heated cathodes
04/08/1987EP0216919A1 Method and target for sputter depositing thin films.
04/02/1987DE3532888A1 Arrangement for controlling the deflection of an electron beam
04/01/1987EP0216750A1 Ion beam apparatus and process for realizing modifications, especially corrections, on substrates, using an ion beam apparatus
04/01/1987EP0216603A2 Microwave apparatus for generating plasma afterglows
03/1987
03/31/1987US4654506 Method and apparatus for detecting and regulating position of welding electron beam
03/31/1987US4654106 Semiconductors; processing one slice at a time
03/31/1987CA1219975A1 Plasma etching reactor with reduced plasma potential
03/26/1987WO1987001865A1 Ion beam apparatus and method of modifying substrates
03/26/1987WO1987001738A1 Method and device for chemical treatment, particularly thermochemical treatment and chemical deposition in a large volume homogeneous plasma
03/25/1987EP0215679A2 Semiconductor etching apparatus with magnetic array and vertical shield
03/25/1987EP0215626A2 Systems and methods for ion source control in ion implanters
03/25/1987EP0215618A2 Ion sources
03/25/1987EP0215532A2 An electron emissive mask for an electron beam image projector, its manufacture, and the manufacture of a solid state device using such a mask
03/24/1987US4652795 External plasma gun
03/24/1987US4652762 Electron lithography mask manufacture
03/24/1987US4652753 Mass spectrometer capable of analyzing an insulator
03/24/1987US4652358 Sputtering cathode
03/17/1987US4651220 Method of recording and reproducing images produced by an electron microscope
03/17/1987US4651171 Vacuum system for a charged particle beam recording system
03/17/1987US4651052 Device for picking up or displaying images having an externally-mounted semiconductor cathode
03/17/1987US4651003 For use in a beam generating system
03/17/1987CA1219240A1 Method of making amorphous semiconductor alloys and devices using microwave energy
03/12/1987WO1987001452A1 Mass spectroscope
03/12/1987DE3629054A1 Apparatus for plasma etching of printed circuit boards or the like
03/11/1987EP0213922A2 Planar magnetron sputtering device with combined circumferential and radial movement of magnetic fields
03/11/1987EP0213920A2 Method of drawing a pattern on wafer with charged beam
03/11/1987EP0213871A1 Strobo electron beam apparatus
03/11/1987EP0213839A2 Flat electron control device utilizing a uniform space-charge cloud of free electrons as a virtual cathode
03/11/1987EP0213716A2 Method and apparatus for removing short-circuiting deposits from high-voltage cathodes in a sputtering chamber
03/11/1987EP0213664A1 Beam of charged particles divided up into thin component beams
03/11/1987EP0213438A2 Method and arrangement for operating a scanning microscope
03/11/1987EP0079931B1 Focused ion beam microfabrication column
03/11/1987CN86105020A Arc ignition device
03/10/1987US4649316 Ion beam species filter and blanker
03/10/1987US4648952 Nitriding
03/10/1987US4648348 Plasma CVD apparatus
03/04/1987EP0212924A2 Plasma processing apparatus
03/03/1987US4647818 Nonthermionic hollow anode gas discharge electron beam source
03/03/1987US4647782 Charged particle beam exposure apparatus
03/03/1987CA1218709A1 Electron beam welder control
03/02/1987EP0198908A4 Focused substrate alteration.
02/1987
02/26/1987DE3530087A1 Appliance for high-capacity cathode sputtering
02/26/1987DE3530074A1 Appliance for producing a plurality of successive layers by high-capacity cathode sputtering
02/25/1987EP0211413A2 Arc ignition device
02/25/1987EP0211412A2 Planar magnetron sputtering apparatus and its magnetic source
02/25/1987EP0211403A1 Electron-beam welding apparatus
02/25/1987EP0211057A1 Sputtering installation for reactive coating of a substrate with hard materials.
02/25/1987EP0211002A1 Method and apparatus for spot shaping and blanking a focused beam.
02/24/1987US4645981 Process and apparatus for the surface treatment of workpieces by glow discharge
02/24/1987US4645977 Vapor deposition using vacuum enclosure, accelerating means, and second vacuum chamber where accelerated plasma forms uniform film;
02/24/1987US4645929 Method and apparatus for the compensation of charges in secondary ion mass spectrometry (SIMS) of specimens exhibiting poor electrical conductivity
02/24/1987US4645895 Method and apparatus for surface-treating workpieces
02/24/1987CA1218473A1 Process and apparatus for changing the energy of charged particles contained in a gaseous medium
02/18/1987CN86105201A Flat electron control device utilizing uniform space-charge cloud of free electrons as virtual cathode
02/17/1987US4644170 Method of electron beam exposure
02/12/1987EP0174977A4 Controlled vacuum arc material deposition, method and apparatus.
02/12/1987DE3620908A1 Target plate for cathode sputtering
02/10/1987US4642522 Wire-ion-plasma electron gun employing auxiliary grid
02/10/1987US4642518 Installation of electron beam metalworking
02/10/1987US4642468 Position detecting method for detecting the relative positions of the first and second members
02/10/1987US4642467 Electron beam irradiation apparatus
02/10/1987US4642461 Field emission type electron microscope using a multi-stage acceleration tube
02/10/1987US4642438 Workpiece mounting and clamping system having submicron positioning repeatability
02/10/1987US4642243 Electrode ionization
02/04/1987EP0210858A2 Reactive ion etching deposition apparatus and method of using it
02/04/1987EP0210631A2 Method and apparatus for charged particle beam exposure
02/04/1987EP0210605A2 Plasma processing method and apparatus
02/04/1987EP0210473A2 Sputtering cathode according to the magnetron principle
02/03/1987US4641313 Room temperature metal vapour laser
02/03/1987US4641034 Ion implantation apparatus and method for maskless processing
02/03/1987US4641002 Titanium and zirconium nitride
02/03/1987US4640845 Semiconductor photoelectric conversion devices; solar cells
02/03/1987US4640756 Method of making a piezoelectric shear wave resonator
02/03/1987CA1217532A1 Ion beam machining device
01/1987
01/31/1987CN85101374A Glow-discharge tube for analysis
01/29/1987WO1987000682A1 Improvements in atom probes
01/28/1987EP0209969A2 Ion-implanting method and apparatus with improved ion-dose accuracy
01/28/1987EP0086816B1 Plasma etching apparatus and method including end point detection