Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
08/1990
08/22/1990EP0382803A1 Process and device for supplying processing gas to a reactor located in a zone subjected to intense electric and/or electromagnetic fields.
08/21/1990US4950956 Plasma processing apparatus
08/21/1990US4950910 For depicting a pattern on a sample
08/21/1990US4950909 Sample tilting device in electron microscope
08/21/1990US4950901 Specimen cooling holder for side entry transmission electron microscopes
08/21/1990US4950498 Process for repairing pattern film
08/21/1990US4950377 High ion density, narrow spectrum of energies
08/21/1990US4950376 Method of gas reaction process control
08/21/1990US4949671 Processing apparatus and method
08/21/1990US4949670 Method and apparatus for low pressure plasma
08/21/1990CA1272910A1 Arc coating of refractory metal compounds
08/16/1990EP0382249A2 Electron beam exposure data processing method, electron beam exposure method and apparatus
08/16/1990EP0382065A2 Apparatus for plasma processing
08/16/1990EP0381912A1 Method to centre an electron beam
08/16/1990DE3904280A1 Sub-picosecond electron-beam blanking system
08/14/1990US4948979 Vacuum device for handling workpieces
08/14/1990US4948971 Vibration cancellation system for scanning electron microscopes
08/14/1990US4948962 Plasma ion source mass spectrometer
08/14/1990US4948750 Method and apparatus for producing semiconductor layers composed of amorphous silicon-germanium alloys through glow discharge technique, particularly for solar cells
08/14/1990US4948458 Radiofrequency resonant current induced in a planar coil; uniform flux; semiconductor wafer processing
08/14/1990US4948259 Method and apparatus for monitoring layer erosion in a dry-etching process
08/09/1990WO1990009030A1 A method of producing high-energy electtron curtains with high performance
08/08/1990EP0381437A2 Magnetron sputtering apparatus
08/08/1990EP0381337A2 Apparatus and method for simultaneously effecting electro-chemical measurement and measurement of tunnelling current and tunnel probe therefor
08/08/1990CN1009145B Field-emission scanning auger electron microscope
08/07/1990US4947404 Magnet structure for electron-beam heated evaporation source
08/07/1990US4947085 Plasma processor
08/07/1990US4947042 Tunnel unit and scanning head for scanning tunneling microscope
08/07/1990US4947041 Analyzer tube for mass spectrometry
08/07/1990US4946706 Method of ion implantation
08/07/1990US4946576 Apparatus for the application of thin layers to a substrate
08/07/1990US4946537 Plasma reactor
08/02/1990DE4000941A1 Magnetron vaporising system - includes magnetic circuit in plasma-producing vaporiser giving more even target consumption in plasma-coating system
08/02/1990DE3902348A1 Plate-shaped specimen slide (microscope slide) for microscopy
08/01/1990EP0380119A2 Microwave plasma processing apparatus
08/01/1990EP0379865A2 Specimen examination method for a corpuscular-beam apparatus
08/01/1990EP0379828A2 Radio frequency induction/multipole plasma processing tool
08/01/1990EP0379739A2 Device for determining the point of impact on a target of a charged-particles beam
08/01/1990EP0379690A1 Multi-pole element
07/1990
07/31/1990US4945247 Field emission electron gun system
07/31/1990US4945246 Tri-deflection electron beam system
07/31/1990US4945237 Transmission electron microscope
07/31/1990US4945235 Fine adjustment mechanism for a scanning tunneling microscope
07/31/1990US4944645 Method and apparatus for loading objects into evacuated treating chamber
07/30/1990CA2202801A1 Magnetron sputtering apparatus
07/26/1990WO1990008397A1 Microminiature cantilever stylus
07/26/1990WO1990008312A1 Holding method for specimen of electric insulation
07/25/1990EP0379442A2 Deflection compensating device for converging lens
07/25/1990EP0379403A1 Electron gun comprising a device producing a magnetic field in the proximity of the cathode
07/25/1990EP0378970A2 Cold-cathode, ion-generating and ion-accelerating universal device
07/25/1990EP0378793A2 Electron emission cathode, its manufacturing process, electron beam supply with such a cathode and vacuum-processing apparatus
07/25/1990EP0378782A2 Ion implantation apparatus for uniformly injecting an ion beam into a substrate
07/24/1990USRE33275 Electron Spectrometer
07/24/1990US4943730 Charged particle beam lithography method
07/24/1990US4943729 Electron beam lithography system
07/24/1990US4943728 Beam pattern control system for an ion implanter
07/24/1990US4943722 To display two views of a surface for stereoscopic viewing
07/24/1990US4943720 Electronic probe
07/24/1990US4943719 Microminiature cantilever stylus
07/24/1990US4943361 Cyclotronic motion of electrons, semiconductor wafers
07/24/1990US4943345 Plasma reactor apparatus and method for treating a substrate
07/24/1990CA1271997A1 Electron beam test probe for integrated circuit testing
07/18/1990EP0378237A2 Reflection electron holography apparatus
07/18/1990EP0378077A2 Ion mass-spectroscopic analysis method and apparatus
07/17/1990US4942342 Parallel sweeping system for electrostatic sweeping ion implanter
07/17/1990US4942339 Intense steady state electron beam generator
07/17/1990US4942304 Ion implantation
07/17/1990US4942300 Electron beam image recording using stimulable phosphor sheet of reduced thickness and/or with no protective layer
07/17/1990US4942299 Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy
07/17/1990US4941980 System for measuring a topographical feature on a specimen
07/17/1990US4941915 Thin film forming apparatus and ion source utilizing plasma sputtering
07/17/1990US4941753 Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control
07/17/1990CA1271849A1 Electron beam testing of semiconductor wafers
07/12/1990DE3941915A1 Suppressor for electronic equipment electromagnetic interference - uses magnetic material ring located or connecting cable to unit
07/11/1990EP0377298A2 Uniform cross section ion beam system
07/11/1990EP0377224A2 Method and vacuum chamber for ion implantation
07/11/1990CN1043826A Vacuum chamber for ionic implantation
07/10/1990US4941068 Portable ion generator
07/10/1990US4940893 Method and apparatus for forming coherent clusters
07/10/1990US4940015 Microwave decomposition of methane and hydrogen reaction gas
07/04/1990EP0376546A2 Processes depending on plasma generation
07/04/1990EP0376392A1 Electron beam apparatus with dynamic focussing
07/04/1990EP0376286A2 Method and apparatus for fine movement of specimen stage of electron microscope
07/04/1990EP0376045A2 Method and apparatus for processing a fine pattern
07/04/1990EP0376017A2 Magnetron-cathodic sputtering device with a hollow cathode and a cylindrical target
07/04/1990EP0375716A1 Electrode for use in a scanning electron microscope
07/03/1990US4939493 Magnetic field generator
07/03/1990US4939425 Four-electrode ion source
07/03/1990US4939424 Apparatus for producing a plasma and for the treatment of substrates
07/03/1990US4939373 Electron image projector
07/03/1990US4939371 Charged particle beam device
07/03/1990US4939365 Automatic preliminary irradiation apparatus in transmission electron microscope
07/03/1990US4939364 Specimen or substrate cutting method using focused charged particle beam and secondary ion spectroscopic analysis method utilizing the cutting method
07/03/1990US4939363 Scanning tunneling microscope
07/03/1990US4939360 Particle beam irradiating apparatus having charge suppressing device which applies a bias voltage between a change suppressing particle beam source and the specimen
07/03/1990US4938859 Ion bombardment device with high frequency
06/1990
06/28/1990EP0322419A4 Point projection photoelectron microscope with hollow needle.
06/27/1990EP0375169A1 External resonance circuit type radio frequency quadrupole acceleration
06/26/1990US4937531 External ion injection apparatus for a cyclotron
06/26/1990US4937458 Electron beam lithography apparatus including a beam blanking device utilizing a reference comparator