Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
04/1991
04/02/1991US5004925 Method and apparatus for detecting alignment mark of semiconductor device
04/02/1991US5004919 Transmission electron microscope
04/02/1991US5004918 Differential phase contrast scanning transmission electron microscope
04/02/1991US5003815 Spectroscopic apparatus
03/1991
03/27/1991EP0419369A1 Optical near-field method for microlithography and microlithography devices using this method
03/27/1991EP0419287A2 Method of correcting astigmatism of variable shaped beam
03/27/1991EP0418894A2 A scanning electron microscope and a method of displaying cross sectional profiles using the same
03/27/1991EP0418438A1 Method and apparatus for the plasma etching, substrate cleaning or deposition of materials by D.C. glow discharge
03/27/1991CN1050267A Double tongue scanning tunnel microscope regulating device
03/27/1991CA2026175A1 Microwave plasma generating apparatus and process for the preparation of diamond thin film utilizing same
03/26/1991US5003183 Ion implantation apparatus and method of controlling the same
03/26/1991US5003178 Large-area uniform electron source
03/26/1991US5003173 Electron beam apparatus with dynamic focussing
03/26/1991US5003172 Examining object
03/26/1991US5003152 Microwave transforming method and plasma processing
03/26/1991US5003151 Method and control arrangement for the evaporation rate of an electron beam
03/26/1991US5002632 Reaction of a metastable with etchant gas in activation zone
03/26/1991US5002631 Plasma etching apparatus and method
03/26/1991CA1282191C Apparatus for automatically controlling the magnification factor of a scanning electron microscope
03/23/1991WO1991004513A1 Method of optical near field microlithography and microlithography devices implementing same
03/23/1991CA2066586A1 Method of optical near field microlithography and microlithography devices implementing same
03/21/1991WO1991003832A1 Electron microscope with an asymmetrical immersion lens
03/21/1991WO1991003733A1 Method and apparatus for imaging dislocations in materials using a scanning electron microscope
03/21/1991DE3930400A1 Observing work position of electron beam gun - using mirror inside vacuum which deflects reflected light perpendicular towards microscope
03/20/1991EP0417780A2 Method and device for evaporating an arc discharge cathode with cathode spots with reduced macroparticle emission
03/20/1991EP0417643A2 Electron beam producing device, particularly for an electron gun
03/20/1991EP0417642A2 Device for producing electron beams, particularly for an electron gun
03/20/1991EP0417641A2 Device for producing electron beams, particularly for an electron gun
03/20/1991EP0417640A2 Cathode support for election beam producing device
03/20/1991EP0417639A1 Electron bream producing device for electron gun
03/20/1991EP0417638A2 Electron beam producing device, particularly for an electron gun
03/20/1991EP0417354A1 Electron beam apparatus with charge-up compensation
03/20/1991EP0417340A1 Electron source
03/20/1991EP0417221A1 Process for detecting the attainment of a predetermined depth in target body erosion and target body therefor
03/19/1991US5001403 Method and apparatus for centering an electron beam
03/19/1991US5001385 Electron beam apparatus with adjusting mechanism for a thermally emitting cathod tip
03/19/1991US5001350 Electron microscope
03/19/1991US5001349 Charged-particle beam apparatus
03/19/1991US5001345 Transmission electron microscope
03/19/1991US5001344 Scanning electron microscope and method of processing the same
03/19/1991US5000834 Facing targets sputtering device
03/14/1991DE3930201A1 Current transfer contact for electron gun - has separate relatively movable connecting and contact element components
03/13/1991EP0416787A1 Plasma processing of III-V semiconductors, controlled by photoluminescence spectroscopy
03/13/1991EP0416549A2 Ion implantation equipment
03/13/1991EP0416414A2 Procedure and device for deviating a beam
03/13/1991EP0416241A2 Apparatus for coating a substrate
03/13/1991CN1049870A Process for continuously forming large area functional deposited film by microwave pcvd method and apparatus suitable for practicing same
03/12/1991US4999496 Magnification compensation apparatus
03/12/1991US4999494 System for scanning large sample areas with a scanning probe microscope
03/12/1991US4999320 Method for suppressing ionization avalanches in a helium wafer cooling assembly
03/12/1991US4999096 Method of and apparatus for sputtering
03/12/1991US4998968 Plasma CVD apparatus
03/12/1991US4998788 Reflection electron holography apparatus
03/12/1991US4998503 Apparatus for forming functional deposited film by microwave plasma CVD process
03/12/1991CA1281439C Plasma reactor and method for removing photoresist
03/08/1991CA2021112A1 Process for preventing contamination for high temperatures melts
03/07/1991WO1991003143A1 Special ion emitter tip materials and coatings
03/07/1991DE3929774A1 Corpuscular beam optical device - compensates for illumination and imaging errors in irradiation of flat sample slide
03/06/1991EP0415764A2 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading
03/06/1991EP0415227A2 Apparatus and method for inhibiting the generation of excessive radiation
03/06/1991EP0415122A2 Method and apparatus for film formation by high pressure microwave plasma chemical vapour deposition
03/06/1991EP0414859A1 Improved etch chamber with gas dispersing membrane.
03/06/1991EP0216919B1 Method and target for sputter depositing thin films
03/06/1991CN1011933B Device and method for treatment of magnetic controlled tube gas discharging
03/05/1991US4998020 Electron beam exposure evaluation method
03/05/1991US4998016 Probe unit, driving method thereof, and scanning device for detecting tunnel current having said probe unit
03/05/1991US4998004 Electron beam gun
03/05/1991CA1281082C Apparatus for producing a plasma and for the treatment of substrates therein
03/01/1991CA2022407A1 Scanning tunneling microscope memory utilizing optical fluorescence of substrate for reading
02/1991
02/27/1991EP0140979B1 Alloy containing liquid metal ion species
02/27/1991CN1049530A Method and apparatus for continuously forming functional deposited films with large area by microwave plasma cvd method
02/27/1991CN1011767B Plasma generating device with adjustable cathode
02/26/1991US4996441 Lithographic apparatus for structuring a subject
02/26/1991US4996434 Electron-beam lithographic apparatus
02/26/1991US4996433 Specimen heating holder for electron microscopes
02/26/1991US4996077 Electron cyclotron resonance apparatus; multiple energy/ excitation source; intergrated circuits
02/26/1991US4995958 Sputtering apparatus with a rotating magnet array having a geometry for specified target erosion profile
02/26/1991CA1280630C Stereoscopic optical viewing system
02/21/1991WO1991002374A1 Charged particle ray apparatus and method of observing samples
02/20/1991EP0413397A1 Electro-mechanical transducer and positioning device comprising such an electro-mechanical transducer
02/20/1991EP0413366A2 Ion implantation apparatus
02/20/1991EP0413291A2 Method and device for sputtering of films
02/20/1991EP0413282A2 Method and apparatus for producing magnetically-coupled planar plasma
02/20/1991EP0413239A2 Gas distribution system and method of using said system
02/20/1991EP0413042A1 Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head
02/20/1991EP0413041A1 Method of producing micromechanical sensors for the AFM/STM profilometry and micromechanical AFM/STM sensor head
02/20/1991EP0413040A1 Method of producing ultrafine silicon tips for the AFM/STM profilometry
02/19/1991US4994674 Ion implantation apparatus capable of avoiding electrification of a substrate
02/19/1991US4994336 Method for manufacturing a control plate for a lithographic device
02/19/1991US4994164 Metal ion implantation apparatus
02/15/1991CA2023092A1 Method and device for sputtering of films
02/13/1991EP0412690A2 Device manufacture involving lithographic processing
02/13/1991EP0412393A2 Electron-detector diode biassing scheme for improved writing by an electron beam lithography machine
02/12/1991US4992744 Radio frequency linear accelerator control system
02/12/1991US4992728 Electrical probe incorporating scanning proximity microscope
02/12/1991US4992668 Electron beam pattern generator control
02/12/1991US4992665 Filamentless magnetron-ion source and a process using it
02/12/1991US4992662 Scanning
02/12/1991US4992661 Method and apparatus for neutralizing an accumulated charge on a specimen by means of a conductive lattice deposited on the specimen
02/12/1991US4992660 Scanning tunneling microscope