Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
02/1995
02/07/1995US5387893 Permanent magnet magnetic circuit and magnetron plasma processing apparatus
02/07/1995US5387843 Ion source having plasma chamber, an electron source, and a plasma power supply
02/07/1995US5387842 Steady-state, glow discharge plasma
02/07/1995US5387799 Electron beam writing system
02/07/1995US5387797 Detector having selective photon and neutral particle absorbent coating
02/07/1995US5387794 Detector for diffracted electrons
02/07/1995US5387793 Scanning electron microscope
02/07/1995US5387777 Methods and apparatus for contamination control in plasma processing
02/07/1995US5387326 Method and arrangement for stabilizing an arc between an anode and a cathode particularly for vacuum coating devices
02/07/1995US5387288 Apparatus for depositing diamond and refractory materials comprising rotating antenna
02/02/1995WO1995003682A1 Method for matching the generator in dipolar low-pressure glow processes
02/02/1995WO1995003622A1 Methods and apparatus for water desorption of vacuum chambers
02/02/1995WO1995003436A1 Stationary aperture plate for reactive sputter deposition
02/02/1995DE4325724A1 Device and method for examining an object and for affecting the object
02/02/1995CA2164975A1 Stationary aperture plate for reactive sputter deposition
02/01/1995EP0637055A1 Plasma processing apparatus
02/01/1995EP0637054A1 Discharge plasma processing device
02/01/1995EP0637052A1 Method for producing a stream of ionic aluminum
02/01/1995EP0636703A1 Method for deposition of a layer on a substrate-disk using sputtering procedure
02/01/1995EP0636285A1 Stabilizer for switch-mode powered rf plasma processing.
02/01/1995CN1098243A Microwave enhanced cvd system under magnetic field
02/01/1995CN1027549C Microwave enhanced CVD system under magnetic field
01/1995
01/31/1995US5386445 Method and apparatus for electron beam focusing adjustment by electrostatic control of the distribution of beam-generated positive ions in a scanning electron beam computed tomography scanner
01/31/1995US5386110 Method of making cantilever chip for scanning probe microscope
01/31/1995US5385624 Apparatus and method for treating substrates
01/31/1995CA1334155C Process for restoring locally damaged parts, particularly anticathodes
01/26/1995WO1995002894A1 Superhard tips for micro-probe microscopy and field emission
01/24/1995US5384466 Electron beam lithography apparatus and a method thereof
01/24/1995US5384465 Spectrum analyzer in an ion implanter
01/24/1995US5384464 Process and apparatus for optical near field microlithography
01/24/1995US5384463 Pattern inspection apparatus and electron beam apparatus
01/24/1995US5384021 Sputtering apparatus
01/24/1995US5384018 Process and apparatus for generating and igniting a low-voltage
01/24/1995US5383984 Plasma processing apparatus etching tunnel-type
01/19/1995WO1995001843A1 Method for the improved microwave deposition of thin films
01/19/1995DE4423407A1 Device for scanning with a focused ion beam, an observation method which uses focused ion beams, and a treatment method which uses focused ion beams
01/18/1995EP0634779A1 Collimation chamber with rotatable pedestal
01/18/1995EP0634778A1 Hollow cathode array
01/18/1995EP0634777A1 Electrode assembly useful in confined plasma assisted chemical etching
01/18/1995EP0634575A2 Device for distributing a gaseous component in ionization chambers, for space thrusters
01/18/1995EP0634500A1 Planar magnetron sputtering apparatus
01/17/1995US5382911 Reaction chamber interelectrode gap monitoring by capacitance measurement
01/17/1995US5382895 System for tomographic determination of the power distribution in electron beams
01/17/1995US5382800 Charged particle beam exposure method and apparatus
01/17/1995US5382796 Apparatus for morphological observation of a sample
01/17/1995US5382795 Ultrafine silicon tips for AFM/STM profilometry
01/17/1995US5382793 Laser desorption ionization mass monitor (LDIM)
01/17/1995US5382498 Processes for electron lithography
01/17/1995US5382344 Sputtering apparatus
01/17/1995US5382339 Shield and collimator pasting deposition chamber with a side pocket for pasting the bottom of the collimator
01/14/1995CA2125532A1 Planar magnetron sputtering apparatus
01/13/1995CA2126731A1 Hollow cathode array and method of cleaning sheet stock therewith
01/12/1995WO1995001647A1 Enhanced imaging mode for transmission electron microscopy
01/12/1995WO1995001646A1 Method for imaging an atomic-level of semiconductor
01/12/1995WO1994025846A3 In situ tensile testing machine and specimen for a scanning electron microscope
01/12/1995DE4321639A1 Plasma-supported, chemical vacuum-coating installation
01/11/1995EP0633713A1 Plasma reactor for a deposition and etching method
01/11/1995EP0633600A1 Method and apparatus for forming thin films
01/11/1995EP0633599A1 Thin-film forming apparatus
01/11/1995EP0633593A1 Electrom beam source and electron beam application apparatus and electronic apparatus using the same
01/11/1995EP0632929A1 Producing magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
01/11/1995EP0576559A4 Interfacial plasma bars for photovoltaic deposition apparatus.
01/11/1995CN1097223A Surface-treatment method for material by use of impulse high energy-density plasma
01/10/1995US5381072 Linear accelerator with improved input cavity structure and including tapered drift tubes
01/10/1995US5381004 Particle analysis of notched wafers
01/10/1995US5381003 Auger electron spectroscopy
01/10/1995US5380421 Vacuum-arc plasma source
01/10/1995US5380420 Arc ion plating system
01/10/1995US5380419 Cathode-sputtering apparatus comprising a device for measuring critical target consumption
01/10/1995US5380414 Noncracking
01/05/1995WO1995000835A1 Method and apparatus for adjusting electron-beam device
01/05/1995WO1995000677A1 Sputtering device
01/05/1995WO1995000676A1 Ultrasonic enhancement of aluminum step coverage and apparatus
01/05/1995DE4421517A1 Method for removing or depositing material by means of a particle beam and device for carrying out the method
01/05/1995CA2165440A1 Method and apparatus for adjusting electron beam apparatus
01/05/1995CA2162596A1 Ultrasonic enhancement of aluminum step coverage and apparatus
01/04/1995EP0632142A1 Magnetron sputtering apparatus and systems
01/04/1995EP0631712A1 Process for accelerting electrically charged particles
01/04/1995EP0631711A1 System for characterizing ac properties of a processing plasma
01/03/1995US5378917 Particle-beam imaging system
01/03/1995US5378899 Ion implantation target charge control system
01/03/1995US5378507 Smoothness
01/03/1995US5378498 Antistatic solution for microlithic measurement
01/03/1995US5378341 Conical magnetron sputter source
01/03/1995US5378311 Method of producing semiconductor device
01/03/1995CA2050857C Apparatus for treating the surface of workpieces by means of a plasma torch
12/1994
12/28/1994EP0631358A2 Device for producing magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
12/28/1994EP0473574B1 Process for molding target electrode used in the application of electrostatic charge to a fibrous structure
12/28/1994EP0451247B1 Method and apparatus relating to ion implantation
12/27/1994US5376883 Analysis of integrated circuit operability using a focused ion beam
12/27/1994US5376802 Stencil mask and charge particle beam exposure method and apparatus using the stencil mask
12/27/1994US5376799 Turbo-pumped scanning electron microscope
12/27/1994US5376792 Scanning electron microscope
12/27/1994US5376505 Device fabrication entailing submicron imaging
12/27/1994US5376224 Method and apparatus for non-contact plasma polishing and smoothing of uniformly thinned substrates
12/27/1994US5376211 Magnetron plasma processing apparatus and processing method
12/22/1994WO1994029894A1 Piezoresistive cantilever with integral tip
12/22/1994WO1994029494A1 Microwave plasma reactor
12/21/1994EP0630040A1 Electron microscope for specimen composition and strain analysis and observation method thereof
12/21/1994EP0629313A1 Laser desorption ionization mass monitor (ldim)