Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
03/1997
03/04/1997US5607509 High impedance plasma ion implantation apparatus
02/1997
02/27/1997WO1997007527A1 Method and apparatus for determining crystallographic characteristics
02/27/1997WO1997007526A1 High temperature specimen stage and detector for an environmental scanning electron microscope
02/27/1997WO1997007525A1 Field emission environmental scanning electron microscope
02/27/1997DE3790816C2 Translational manipulation appts. using shape memory alloy blades
02/27/1997DE19603037C1 Electron beam multi-chamber unit, e.g. for welding and hardening
02/26/1997EP0759632A1 Plasma processing apparatus
02/26/1997EP0759536A1 Atomic force microscope and measuring head thereof
02/26/1997CN1143690A Spattering filming device
02/25/1997US5606261 Retarding field electron-optical apparatus
02/25/1997US5606168 In situ tensile testing machine and sample for a scanning electron microscope
02/25/1997US5605640 Reactor for the treatment of particulate matter by electrical discharge
02/25/1997US5605637 Adjustable dc bias control in a plasma reactor
02/25/1997US5605609 Method for forming low refractive index film comprising silicon dioxide
02/25/1997US5605599 Method of generating plasma having high ion density for substrate processing operation
02/25/1997US5605576 High frequency magnetron plasma apparatus
02/20/1997DE19623359A1 Device for coating a substrate by vaporisation of a rotary tubular target
02/19/1997EP0758756A1 Transparent heating plate and transparent heating device
02/19/1997EP0758688A1 Apparatuses for deposition or etching
02/19/1997EP0758485A1 Selectively shaped field emission electron beam source, and phosphor array for use therewith
02/19/1997EP0758409A1 Multi-frequency inductive method and apparatus for the processing of material
02/19/1997EP0758408A1 Rectangular vacuum-arc plasma source
02/18/1997US5604143 Method for producing nonvolatile memory used as read-only storage media
02/18/1997US5603816 Sputtering device and target with cover to hold cooling fluid
02/18/1997CA1338918C Hollow cathode type magnetron apparatus construction
02/13/1997WO1997005644A1 Process and device for ion thinning in a high-resolution transmission electron microscope
02/12/1997EP0758140A2 Electron microscope
02/12/1997EP0757598A1 Pulsed ion beam assisted deposition
02/12/1997EP0724652A4 Method and apparatus for sputtering magnetic target materials
02/11/1997US5602390 Electrostatic repulsion ion microscope
02/11/1997US5601653 Apparatus for performing plasma process on semiconductor wafers and the like and method of performing plasma process
02/06/1997WO1997004478A2 Plasma treatment apparatus for large area substrates
02/06/1997WO1997004476A2 Method and apparatus for semiconductor etching and stripping
02/06/1997WO1997004475A1 Xy displacement device
02/06/1997WO1997004474A1 An ion beam apparatus
02/06/1997WO1997004335A1 Transparent position-sensitive particle detector
02/05/1997EP0757374A1 Etching electrode and manufacturing process thereof
02/05/1997EP0757373A2 In situ removal of contaminants from the interior surfaces of an ion beam implanter
02/05/1997EP0757291A2 Processing method and processing apparatus using fast atom beam
02/04/1997US5600146 Charged particle beam multiple-pole deflection control circuitry
02/04/1997US5600136 Single potential ion source
02/04/1997US5599396 High density inductively and capacitively coupled plasma chamber
02/04/1997US5598622 Temperature clamping method for anti-contamination and collimating devices for thin film processes
01/1997
01/30/1997WO1997003453A2 Electron sources utilizing negative electron affinity photocathodes with ultra-small emission areas
01/30/1997WO1997003224A1 A plasma enhanced chemical processing reactor and method
01/30/1997WO1997003221A1 Magnetron cathode apparatus and method for sputtering
01/30/1997WO1997003220A1 Permanent magnet array apparatus and method
01/29/1997EP0756309A1 Plasma systems for processing substrates
01/29/1997EP0755547A1 Ultrahigh vacuum focused ion beam micromill and articles therefrom
01/29/1997EP0755461A1 Process and device for ion-supported vacuum coating
01/29/1997EP0605534B1 Apparatus for rapid plasma treatments and method
01/28/1997US5598002 Electron beam apparatus
01/28/1997US5597624 Optical fibers
01/28/1997US5597623 Vapor deposition of films on substrate
01/28/1997US5597462 Condensing device for sputtering device
01/28/1997US5597459 Compact disks, aluminum on polycarbonate
01/28/1997US5597439 Process gas inlet and distribution passages
01/28/1997US5597438 Etch chamber having three independently controlled electrodes
01/28/1997CA2052543C Ion implantation and surface processing method and apparatus
01/23/1997WO1997002593A1 An improved method and apparatus for detecting optimal endpoints in plasma etch processes
01/23/1997WO1997002590A1 Sample analyzer
01/23/1997WO1997002589A1 Power segmented electrode
01/23/1997WO1997002588A1 Low inductance large area coil for an inductively coupled plasma source
01/22/1997EP0755064A2 Cathode having a reservoir and method of manufacturing the same
01/22/1997EP0754289A1 Cantilever deflection sensor and use thereof
01/22/1997EP0722376A4 Treatment of particulate matter by electrical discharge
01/21/1997US5596195 Method and apparatus for measuring the distribution of elements contained in sample
01/21/1997US5595942 Method of fabricating cantilever for atomic force microscope having piezoresistive deflection detector
01/21/1997US5595337 Sputtering device and target with cover to hold cooling fluid
01/18/1997CA2177872A1 In situ removal of contaminants from the interior surfaces of an ion beam implanter
01/16/1997WO1997001862A1 Electron microscope and electron microscopy
01/16/1997WO1997001655A1 A scalable helicon wave plasma processing device with a non-cylindrical source chamber
01/16/1997WO1997001653A2 Sputtering shield
01/15/1997EP0753882A1 Cathode assembly for a target sputtering device
01/15/1997EP0753881A1 Plasma etching apparatus utilising plasma confinement
01/15/1997EP0753880A1 A scanning microscope and a method of operating such a scanning microscope
01/15/1997EP0753601A2 Coating apparatus
01/15/1997EP0753201A1 Sputtering target erosion profile control for collimated deposition
01/15/1997EP0753200A1 Improved environmental scanning electron microscope
01/15/1997EP0753081A1 An electron jet vapor deposition system
01/15/1997EP0721514A4 Magnetically enhanced multiple capacitive plasma generation apparatus and related method
01/15/1997EP0700578A4 Intraoperative electron beam therapy system and facility
01/15/1997CN1140206A Apparatus for deposition of film on substrate
01/14/1997US5594246 Method and apparatus for x-ray analyses
01/14/1997US5594245 Scanning electron microscope and method for dimension measuring by using the same
01/14/1997US5594243 For measuring the mass of organic molecules
01/14/1997US5594166 Cantilever for use with atomic force microscope and process for the production thereof
01/14/1997US5593761 Electron beam shaping mask for an electron beam system with pattern writing capability
01/14/1997US5593551 Magnetron sputtering source for low pressure operation
01/14/1997US5593541 Semiconductors
01/14/1997US5593540 Gas flow through small holes in a shower electrode
01/14/1997US5593539 Plasma source for etching
01/14/1997US5593123 Vacuum system components
01/14/1997CA2052080C Plasma source arrangement for ion implantation
01/08/1997EP0752757A1 Rf match detector circuit with dual directional coupler
01/08/1997EP0752715A1 Charged particle beam apparatus
01/08/1997EP0752482A2 Method and equipment for the application of wear resistant coatings by high vacuum physical vapour deposition
01/08/1997EP0751972A1 Polymer surface treatment with pulsed particle beams
01/07/1997US5591980 Bi-axial-tilting specimen fine motion device and method of correcting image shifting
01/07/1997US5591971 Shielding device for improving measurement accuracy and speed in scanning electron microscopy