Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
08/1997
08/19/1997US5658440 Sputter etching patterned photoresists
08/19/1997US5658423 Monitoring and controlling plasma processes via optical emission using principal component analysis
08/19/1997US5658418 Apparatus for monitoring the dry etching of a dielectric film to a given thickness in an integrated circuit
08/19/1997US5658389 Thin film forming method and apparatus
08/19/1997US5658114 Modular vacuum system for the treatment of disk-shaped workpieces
08/19/1997CA2057619C Cantilever probe and apparatus using the same
08/19/1997CA2045878C Method for forming probe and apparatus therefor
08/14/1997DE19605226A1 Verfahren zur Herstellung eines Plasmas sowie Verwendung eines derart hergestellten Plasmas A process for producing a plasma, and using a plasma so produced
08/14/1997DE19604454A1 Apparatus with two sputter cathodes for coating planar substrates
08/13/1997EP0789506A1 Apparatus for generating and utilizing magnetically neutral line discharge type plasma
08/13/1997EP0789280A2 Holding mechanism, and exposure apparatus using the mechanism
08/13/1997EP0788654A1 Inductively coupled plasma sputter chamber with conductive material sputtering capabilities
08/13/1997EP0788653A1 High temperature specimen stage and detector for an environmental scanning electron microscope
08/12/1997US5656820 Ion generation device, ion irradiation device, and method of manufacturing a semiconductor device
08/12/1997US5656812 Electron probe microanalyzer and X-ray analysis using same
08/12/1997US5656811 Method for making specimen and apparatus thereof
08/12/1997US5656809 Atomic force microscope and measuring head thereof with linearly polarized reflected light
08/12/1997US5656334 Preventing deposition in interior of container by preheating the container surface
08/12/1997US5656141 Apparatus for coating substrates
08/12/1997US5656138 Very high vacuum magnetron sputtering method and apparatus for precision optical coatings
08/12/1997US5656123 Dual-frequency capacitively-coupled plasma reactor for materials processing
08/12/1997US5656092 Apparatus for capturing and removing contaminant particles from an interior region of an ion implanter
08/12/1997US5656091 Electric arc vapor deposition apparatus and method
08/07/1997WO1997028555A1 Electromagnetic high-frequency or microwave apparatus
08/07/1997CA2244956A1 Electromagnetic high-frequency or microwave apparatus
08/06/1997EP0788147A2 Plasma process for etching multicomponent alloys
08/06/1997EP0788139A1 Cathodic spulter coating method and device using a target heated at high temperature
08/06/1997EP0788138A2 Plasma reactors for processing substrates
08/06/1997EP0788137A2 Plasma processing equipment
08/06/1997CN1156327A Electronic beam unit projection stamp mark system
08/05/1997US5654903 Method and apparatus for real time monitoring of wafer attributes in a plasma etch process
08/05/1997US5654548 Source for intense coherent electron pulses
08/05/1997US5654547 Method for particle wave reconstruction in a particle-optical apparatus
08/05/1997US5654546 For examining the surface properties of a sample surface
08/05/1997US5654043 Pulsed plate plasma implantation system and method
08/05/1997US5653894 Active neural network determination of endpoint in a plasma etch process
08/05/1997US5653812 Method and apparatus for deposition of diamond-like carbon coatings on drills
08/05/1997US5653811 System for the plasma treatment of large area substrates
08/05/1997US5653810 Apparatus for forming metal film and process for forming metal film
08/05/1997CA2052882C Cantilever type probe, scanning tunnel microscope and information processing apparatus using the same
07/1997
07/31/1997WO1997027614A1 Method and apparatus for controlling dust particle agglomerates
07/31/1997WO1997027613A1 Ion source for an ion beam arrangement
07/31/1997DE19703048A1 Control method of scanning electron microscope lens system
07/31/1997DE19609804C1 Einrichtung, ihre Verwendung und ihr Betrieb zum Vakuumbeschichten von Schüttgut Organization, its use and operation of vacuum coating of bulk
07/31/1997DE19602389A1 Sputter target manufacturing method for surface coating installations
07/30/1997EP0786804A2 Apparatus and method for processing substrates
07/30/1997EP0786795A2 Method for manufacturing thin film, and deposition apparatus
07/30/1997EP0786794A2 Plasma reactors for processing semiconductor wafers
07/30/1997EP0786792A1 Ion implantation process in conductive or semi-conductive workpieces by means of Plasma Immersion Ion Implantation and implantation chamber for performing said process
07/30/1997EP0786145A1 Field emission environmental scanning electron microscope
07/30/1997CN1155748A Apparatus for coating substrates in vacuum
07/29/1997US5652428 Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere
07/29/1997US5652377 Scanning method with scanning probe microscope
07/29/1997US5651867 Plasma processing method and apparatus
07/29/1997US5651865 Preferential sputtering of insulators from conductive targets
07/29/1997US5651826 Plasma processing apparatus
07/29/1997US5651825 Plasma generating apparatus and plasma processing apparatus
07/24/1997DE19635669C1 Coating large area substrate by gas flow sputtering
07/24/1997DE19631401A1 Mask apparatus for electron beam exposure in manufacture of integrated circuit
07/24/1997DE19618734A1 Ion source for implantation of semiconductors or for surface treatment
07/23/1997EP0785569A2 Plasma reactor
07/23/1997EP0785568A2 Method and apparatus for ion beam transport
07/23/1997EP0785567A2 Charged particle beam slit assembly
07/23/1997EP0784861A1 Apparatus and method for magnetron in-situ cleaning of plasma reaction chamber
07/23/1997EP0500774B1 Rotating cylindrical magnetron structure for large area coating
07/23/1997CN1155228A Method for triggering-igniting CVD-plasma, and apparatus thereof
07/22/1997US5650631 Electron beam writing system
07/22/1997US5650629 Field-symmetric beam detector for semiconductors
07/22/1997US5650628 Simultaneous deflections in charged-particle beams
07/22/1997US5650621 Electron microscope
07/22/1997US5650052 Variable cell size collimator
07/22/1997US5650038 Method for dry etching
07/22/1997US5650032 Apparatus for producing an inductive plasma for plasma processes
07/17/1997WO1997025837A1 Device for the production of plasmas by microwaves
07/17/1997WO1997025735A1 Electron beam pattern-writing column
07/17/1997WO1997025078A2 Tetracarbon
07/17/1997DE19600240A1 Raster scan force microscope with mechanical coarse setting also sensor and evaluator
07/17/1997DE19600223A1 Vorrichtung zur Erzeugung von Plasmen mittels Mikrowellen A device for generating plasma by means of microwaves
07/16/1997EP0784102A1 Process and apparatus for coating a substrate surface
07/16/1997EP0729640A4 Methods and apparatus for altering material using ion beams
07/16/1997CN1154644A Chamber etching of plasma processing apparatus
07/16/1997CN1154569A Method and device for introducing foreign substance, and method for mfg. semiconductor device
07/16/1997CN1154421A Arc control and switching element protection for pulsed DC power supply
07/15/1997US5648188 Real time alignment system for a projection electron beam lithographic system
07/15/1997US5647964 Diamond film synthesizing apparatus and method thereof using direct current glow discharge plasma enhanced chemical vapor deposition
07/15/1997US5647944 Microwave plasma treatment apparatus
07/15/1997US5647913 Plasma reactors
07/15/1997US5647912 Plasma processing apparatus
07/10/1997WO1997024751A1 Electron beam lithography
07/10/1997WO1997024748A1 Apparatus for controlling matching network of a vacuum plasma processor and memory for same
07/10/1997DE19601586C1 Ferroelectric printing form production method
07/09/1997EP0783174A2 Apparatus for coating a substrate
07/09/1997EP0782763A1 An ion beam apparatus
07/09/1997EP0782744A2 Apparatus and method for sputtering carbon
07/09/1997EP0408602B1 Focused ion beam imaging and process control
07/09/1997CN1154179A Fast magnetic scanning of heavy ion beams
07/08/1997US5646489 Plasma generator with mode restricting means
07/08/1997US5646403 Scanning electron microscope
07/08/1997US5645897 Process and device for surface-modification by physico-chemical reactions of gases or vapors on surfaces, using highly-charged ions
07/08/1997US5645699 Dual cylindrical target magnetron with multiple anodes