Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
03/1999
03/03/1999EP0899772A2 Cathodic arc vapor deposition apparatus
03/03/1999EP0899771A2 Energy filter, particularly for electron microscope
03/03/1999EP0899561A1 Microscope system equipped with an electron microscope and a scanning probe microscope
03/02/1999US5878074 Evaporator crucible and improved method for performing electron-beam evaporation
03/02/1999US5877505 Apparatus for determining mark position on wafer
03/02/1999US5877496 Apparatus and method for analysis of surface impurities in a very small region
03/02/1999US5877032 Process for device fabrication in which the plasma etch is controlled by monitoring optical emission
03/02/1999US5876902 Hybrid exposure technique for pattern generation
03/02/1999US5876838 Semiconductor integrated circuit processing wafer having a PECVD material layer of improved thickness uniformity
03/02/1999US5876576 Apparatus for sputtering magnetic target materials
03/02/1999US5876574 Magnet design for a sputtering chamber
03/02/1999US5876573 High magnetic flux cathode apparatus and method for high productivity physical-vapor deposition
02/1999
02/25/1999WO1999009583A1 Method and device for plasma etching
02/25/1999WO1999009582A1 Object observation device and object observation method
02/25/1999WO1999009581A1 Scanning system with linear gas bearings and active counter-balance options
02/25/1999WO1998053486A3 Aluminum deposition shield
02/24/1999EP0897591A1 Magnet array
02/24/1999CN1208954A Method of implanting low doses of ions into substrate
02/24/1999CN1208948A Method of preparing charged particle beam drawing data and recording medium on which program thereof is recorded
02/23/1999US5874807 Large area plasma processing system (LAPPS)
02/23/1999US5874739 Arrangement for shadow-casting lithography
02/23/1999US5874735 Scanning electron microscope
02/23/1999US5874734 Atomic force microscope for measuring properties of dielectric and insulating layers
02/23/1999US5874705 Method of and apparatus for microwave-plasma production
02/23/1999US5874704 Low inductance large area coil for an inductively coupled plasma source
02/23/1999US5874198 Charged particle beam transfer method
02/23/1999US5874014 Durable plasma treatment apparatus and method
02/23/1999US5874012 Plasma processing apparatus and plasma processing method
02/23/1999US5873989 Methods and apparatus for linear scan magnetron sputtering
02/18/1999WO1999008308A1 Plasma vapor deposition with coil sputtering
02/18/1999WO1999008307A1 Method for monitoring the performance of an ion implanter using reusable wafers
02/18/1999WO1999008306A1 Semiconductor process compensation utilizing non-uniform ion implantation methodology
02/18/1999WO1999007914A1 Multi-spectroscopic emission line control for thin film sputtering process
02/18/1999WO1999007913A1 Modulated power for ionized metal plasma deposition
02/18/1999DE19733520A1 Verfahren zur Nanostrukturierung von amorphen Kohlenstoffschichten Method for nanostructuring of amorphous carbon films
02/17/1999EP0897189A2 High pressure magnetron cathode and device comprising same
02/17/1999EP0896732A1 Sputtering installation with two longitudinally placed magnetrons
02/17/1999CN1208245A Dose control for use in ion implanter
02/16/1999US5872426 For generating and maintaining a glow plasma discharge
02/16/1999US5872366 Charged-particle-beam exposure device and charged-particle-beam exposure method
02/16/1999US5872358 For producing a two-dimensional scan image of a sample
02/16/1999US5871874 Mask pattern forming method capable of correcting errors by proximity effect and developing process
02/16/1999US5871609 Electrode plate and jig for use in plasma etching
02/11/1999WO1999007009A1 Method of and machine for pattern writing by an electron beam
02/11/1999WO1999006996A1 Method for nano-structuring amorphous carbon layers
02/11/1999WO1999006610A1 Method and apparatus for detecting the endpoint of a chamber cleaning
02/11/1999WO1998052207A3 Central coil design for ionized metal plasma deposition
02/11/1999DE19818868A1 Method and apparatus for filtering material vapours containing macro particles
02/11/1999DE19734079A1 Cathode for a unit for target sputtering
02/11/1999DE19730855C1 Beam generation system for electron gun
02/10/1999EP0896201A1 Scanning probe microscope
02/10/1999EP0895652A1 Method and apparatus for run-time correction of proximity effects in pattern generation
02/10/1999EP0895651A1 Raster shaped beam writing strategy system and method for pattern generation
02/09/1999US5869838 For focusing charged particle beams
02/09/1999US5869833 For imaging a specimen with a scanning electron microscope
02/09/1999US5868914 Magnetron sputtering system
02/09/1999US5868897 Device and method for processing a plasma to alter the surface of a substrate using neutrals
02/09/1999US5868854 Method and apparatus for processing samples
02/09/1999US5868848 Plasma processing apparatus
02/04/1999WO1999005506A1 Method and apparatus for preparing samples
02/04/1999WO1999005417A1 Hall-current ion source apparatus and method for processing materials
02/04/1999DE19728698A1 Method of detecting element in sample
02/03/1999EP0895279A1 Manufacture of semiconductor device
02/03/1999EP0895266A1 Electron gun with photocathode
02/03/1999EP0894332A1 Use of a cleaning process, a cleaning process, a connecting process and work piece pair
02/03/1999EP0894320A1 Thin-film magnetic recording heads and systems and methods for manufacturing the same
02/03/1999CN1041972C Electric discharge element
02/02/1999US5866986 Microwave gas phase plasma source
02/02/1999US5866974 Electron beam generator with magnetic cathode-protection unit
02/02/1999US5866913 Proximity correction dose modulation for E-beam projection lithography
02/02/1999US5866909 Generator of ribbon-shaped ion beam
02/02/1999US5866905 Electron microscope
02/02/1999US5866904 Scanning electron microscope and method for dimension measuring by using the same
02/02/1999US5866903 Equipment and process for quantitative x-ray analysis and medium with quantitative x-ray analysis program recorded
02/02/1999US5866300 Method of and system for exposing pattern on object by charged particle beam
02/02/1999US5865970 Permanent magnet strucure for use in a sputtering magnetron
02/02/1999US5865937 Broad-band adjustable power ratio phase-inverting plasma reactor
02/02/1999US5865896 High density plasma CVD reactor with combined inductive and capacitive coupling
01/1999
01/28/1999WO1999004608A1 Device for exciting a gas by surface wave plasma
01/28/1999WO1999004606A2 Compact microwave downstream plasma system
01/28/1999WO1999004412A2 Target cathode assembly
01/28/1999WO1999004411A1 Plasma treater systems and treatment methods
01/28/1999WO1999004410A1 Scanning wheel for ion implantation process chamber
01/28/1999WO1999004409A1 Power control apparatus for an ion source having an indirectly heated cathode
01/28/1999WO1999004058A1 Sheet-form magnetron sputtering device
01/28/1999DE19732002A1 Magnetron cathode for a target sputtering unit
01/28/1999DE19731025A1 Magnetron Magnetron
01/28/1999DE19726663A1 Vorrichtung zur Erzeugung von homogenen Mikrowellenplasmen Device for generating microwave plasmas homogeneous
01/28/1999CA2295729A1 Plasma treater systems and treatment methods
01/27/1999EP0893944A1 System and method for neutralizing an ion beam using water vapor
01/27/1999EP0893816A2 Corpuscular beam apparatus
01/27/1999EP0892984A1 Magnet array for magnetrons
01/27/1999EP0892860A1 Cathodic sputtering device
01/27/1999CN1206220A Accelerator-decelerator electrostatic lens for variably focusing and mass resolving ion beam in ion implanter
01/26/1999US5864143 High current ion implanter and method of ion implant by the implanter
01/26/1999US5864142 Electron beam exposure apparatus and method of controlling same
01/26/1999US5864138 Electron Microscope
01/26/1999US5863841 Plasma diffusion control apparatus
01/26/1999US5863682 Charged particle beam writing method for determining optimal exposure dose prior to pattern drawing
01/26/1999US5863399 Device for cathode sputtering