Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
06/1999
06/01/1999US5909658 Pattern data processing system
06/01/1999US5909086 Plasma generator for generating unipolar plasma
06/01/1999US5909032 Apparatus and method for a modular electron beam system for the treatment of surfaces
06/01/1999US5909031 Ion implanter electron shower having enhanced secondary electron emission
06/01/1999US5908733 The present invention relates to electron beam exposure, and more particularly to that for drawing such a pattern as an ic (integrated circuit) directly on a semiconductor wafer.
06/01/1999US5908565 Line plasma vapor phase deposition apparatus and method
06/01/1999US5908539 Plasma polymerization
06/01/1999CA2129403C Ion implanting apparatus and ion implanting method
05/1999
05/27/1999WO1999026277A1 Systems and methods for plasma enhanced processing of semiconductor wafers
05/27/1999WO1999026274A1 Planar magnetron with moving magnet assembly
05/27/1999WO1999026273A1 Secondary particle detector
05/27/1999WO1999026272A1 Particle beam device
05/27/1999WO1999026267A1 A plasma generating apparatus having an electrostatic shield
05/27/1999WO1999025494A1 All-surface biasable and/or temperature-controlled electrostatically-shielded rf plasma source
05/27/1999WO1999012184A3 Microwave power applicator for generating reactive chemical species from gaseous reagent species
05/27/1999WO1999004606A9 Compact microwave downstream plasma system
05/27/1999CA2310678A1 Planar magnetron with moving magnet assembly
05/26/1999EP0918351A1 Improved planar magnetron with moving magnet assembly
05/26/1999EP0918350A1 A scanning electron microscope and method for controlling a scanning electron microscope
05/26/1999EP0917725A1 Automated adjustment of an energy filtering transmissiion electron microscope
05/26/1999EP0753201B1 A sputter method and a sputtering target
05/26/1999CN1217390A Sputting film-plating apparatus
05/25/1999US5907221 Inductively coupled plasma reactor with an inductive coil antenna having independent loops
05/25/1999US5907220 Magnetron for low pressure full face erosion
05/25/1999US5907158 Broad range ion implanter
05/25/1999US5907157 Method and apparatus for preparing specimen
05/25/1999US5907154 Ionization device
05/25/1999US5906902 Manufacturing system error detection
05/25/1999US5906688 Heating to oxidize stainless steel surface preteated by purging surface moisture using anhydrous inert gas
05/25/1999CA2131669C Reticle having a number of subfields
05/25/1999CA2114020C Color synthesizing scanning electron microscope
05/20/1999WO1999025000A1 Ion implantation apparatus and method of implanting ions to prevent charge build up on a substrate
05/20/1999WO1999024640A1 Method for monitoring foreign matter of plasma treating device
05/20/1999DE19750270A1 Sputtering cathode
05/19/1999EP0917178A1 Secondary corpuscule detector and its arrangement in a corpuscular beam apparatus
05/19/1999EP0917177A1 Corpuscular beam apparatus
05/19/1999EP0916154A1 Double window exhaust arrangement for wafer plasma processor
05/19/1999EP0916153A1 Device for producing plasma
05/18/1999US5905267 Electron beam exposure apparatus and method of controlling same
05/18/1999US5905266 Charged particle beam system with optical microscope
05/18/1999US5904800 Semiconductor wafer processing chamber for reducing particles deposited onto the semiconductor wafer
05/18/1999US5904799 Method and apparatus for improving etch uniformity in remote source plasma reactors with powered wafer chucks
05/18/1999US5904780 Plasma etching apparatus for semiconductors
05/18/1999US5904779 Wafer electrical discharge control by wafer lifter system
05/18/1999US5904778 Silicon carbide composite article particularly useful for plasma reactors
05/18/1999US5904571 Methods and apparatus for reducing charging during plasma processing
05/14/1999WO1999023685A1 Method and apparatus for ion beam scanning in an ion implanter
05/14/1999WO1999023684A1 Apparatus and method for secondary electron emission microscope
05/14/1999WO1999023472A1 Method and apparatus employing external light source for endpoint detection
05/12/1999EP0914670A2 Cathode arc source and graphite target
05/12/1999EP0914669A1 Detector devices
05/12/1999EP0914496A1 Microwave applicator for an electron cyclotron resonance plasma source
05/12/1999EP0914495A1 Target arrangement with a circular disk
05/12/1999DE19755902C1 Plasma surface treatment process involves hollow cathode self-cleaning
05/11/1999US5903106 Plasma generating apparatus having an electrostatic shield
05/11/1999US5903009 Biased and serrated extension tube for ion implanter electron shower
05/11/1999US5902494 Method and apparatus for reducing particle generation by limiting DC bias spike
05/11/1999US5902466 Sputtering apparatus with magnetic orienting device for thin film deposition
05/11/1999US5902462 Useful for producing highly dense, wear resistance coatings which are free of macroparticles
05/11/1999US5902461 Apparatus and method for enhancing uniformity of a metal film formed on a substrate with the aid of an inductively coupled plasma
05/11/1999US5902405 Plasma processing apparatus
05/11/1999US5902404 Resonant chamber applicator for remote plasma source
05/11/1999US5902403 Method and apparatus for cleaning a chamber
05/06/1999WO1999022398A2 Cathode arc source with target feeding apparatus
05/06/1999WO1999022397A1 Arc monitoring
05/06/1999WO1999022396A2 Enhanced macroparticle filter and cathode arc source
05/06/1999WO1999022395A2 Cathode arc source for metallic and dielectric coatings
05/06/1999WO1999022165A1 Gas panel
05/06/1999WO1999014787A3 Method for producing plasma by microwave irradiation
05/06/1999WO1999013489A3 Apparatus for improving etch uniformity and methods therefor
05/06/1999EP0913074A1 Plasma etch reactor and method for emerging films
05/06/1999EP0462209B1 Electron cyclotron resonance plasma source and method of operation
05/06/1999DE19851097A1 Mechanically adjustable electrostatic lens
05/06/1999DE19747923A1 Sputtering cathode
05/06/1999DE19747164A1 Substrate disc processing apparatus for simulation of silicon micro process
05/06/1999CA2307663A1 Gas panel
05/05/1999CN1215912A Plasm processing device and method
05/04/1999US5900937 Optical interferometer using beam energy modulation to measure surface topology
05/04/1999US5900667 Operating a solid state particle detector within a magnetic deflection field so as to minimize eddy currents
05/04/1999US5900629 Scanning electron microscope
05/04/1999US5900284 Plasma generating device and method
05/04/1999US5900162 Plasma etching method and apparatus
05/04/1999US5900161 Apparatus and method for detecting end point of post treatment
05/04/1999US5900104 Plasma system for enhancing the surface of a material
05/04/1999US5900103 Plasma treatment method and apparatus
05/04/1999US5900065 Apparatus for the plasma-chemical deposition of polycrystalline diamond
05/04/1999US5900064 Plasma process chamber
05/04/1999US5900063 Method and apparatus for coating a substrate
04/1999
04/29/1999WO1999021210A1 Monitor of plasma processes with multivariate statistical analysis of plasma emission spectra
04/29/1999WO1999020812A1 Method for cleaning an etching chamber
04/29/1999WO1998059087A9 Method for bias sputtering
04/29/1999WO1998050938A3 Imaging and/or scanning system with compensation of image degradations resulting from environmental factors
04/29/1999DE19818840A1 Electron beam exposure method in LSI manufacture
04/28/1999EP0911863A2 Plasma process control system comprising a programmable process controller and an external computer for downloading a control program to the process controller
04/28/1999EP0911862A2 Apparatus and method for microwave plasma process
04/28/1999EP0911861A1 Filament for ion implanter plasma shower
04/28/1999EP0911860A2 Particle beam apparatus with energy filter
04/28/1999EP0910686A1 Temperature controlling method and apparatus for a plasma processing chamber
04/28/1999EP0792381B1 Process for coating substrates and a device for carrying out said process
04/28/1999EP0769202B1 Liquid metal ion source