Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
08/1999
08/03/1999US5932884 Charged-beam exposure system and charged-beam exposure method
08/03/1999US5932883 Ion implanter for implanting ion on wafer with low contamination
08/03/1999US5932882 Ion implanter with post mass selection deceleration
08/03/1999US5932880 Scintillator device and image pickup apparatus using the same
08/03/1999US5932116 Power supply for multi-electrode discharge
08/03/1999US5932078 Cathodic arc vapor deposition apparatus
08/03/1999CA2092756C Plasma cvd method and apparatus therefor
08/03/1999CA2034032C Ozone generation by corona discharge at elevated pressures
07/1999
07/29/1999WO1999038189A1 Plasma reactor
07/29/1999WO1999038188A1 Device for correcting third-order spherical aberration in a lens, especially the objective lens of an electronic microscope
07/29/1999WO1999038187A1 Electronic low energy scanning microscope and electronic beam-operated recorder based on an integrated planar microlens
07/29/1999WO1999019537A9 Dual frequency excitation of plasma for film deposition
07/29/1999DE19809663C1 Vacuum plasma coating installation and its application
07/29/1999DE19802971A1 Plasma reactor for chemical vapor deposition plasma surface treatment or plasma etching
07/29/1999DE19802482A1 Sputter cathode target casting apparatus has a two-layer base plate
07/29/1999DE19802409A1 Lens aperture error correction device for electron microscope objective lens
07/28/1999EP0932183A1 Linear microwave plasma source with permanent magnets
07/28/1999EP0932182A2 Method and an apparatus for testing a substrate
07/28/1999EP0932022A1 Method and apparatus for dimension measurement and inspection of structures
07/28/1999EP0931853A2 Method of depositing barrier coatings by plasma assisted chemical vapour deposition
07/28/1999EP0931851A1 Method for obtaining functional metallic, ceramic or ceramic/metallic layers on the internal wall of hollow bodies
07/28/1999EP0931329A1 Rf plasma etch reactor with internal inductive coil antenna and electrically conductive chamber walls
07/28/1999EP0931328A1 Method for structured energy transmission using electron beams
07/28/1999CA2260510A1 Focused ion beam imaging method
07/27/1999US5929717 In a vacuum plasma chamber processing a workpiece
07/27/1999US5929457 Charged particle beam transfer apparatus
07/27/1999US5929456 Ion implantation system and method adapted for serial wafer processing
07/27/1999US5929454 Position detection apparatus, electron beam exposure apparatus, and methods associated with them
07/27/1999US5929452 Electrostatic deflecting electrode unit for use in charged beam lithography apparatus and method of manufacture the same
07/27/1999US5929451 Symmetric magnetic doublet for charged particle beam lithography
07/27/1999US5929439 Scanning microscope
07/27/1999US5929373 To supply power to a device through a wall passage in a vacuum chamber
07/27/1999US5928532 Method of detecting end point of plasma processing and apparatus for the same
07/27/1999US5928528 Plasma treatment method and plasma treatment system
07/27/1999US5927994 Method for manufacturing thin film
07/27/1999US5926945 Method for forming a free wound electromagnetic deflection yoke
07/27/1999CA2225063A1 Pulsed plate plasma implantation system
07/22/1999WO1999036931A2 Low ceiling temperature process for a plasma reactor with heated source of a polymer-hardening precursor material
07/22/1999WO1999036586A1 Apparatus and method for plasma enhanced chemical vapor deposition (pecvd) in a single wafer reactor
07/22/1999WO1999022398A3 Cathode arc source with target feeding apparatus
07/22/1999WO1999022395A3 Cathode arc source for metallic and dielectric coatings
07/22/1999DE19816220C1 Photomask blank earthing monitoring method for DRAM or logic circuit mfr.
07/21/1999EP0930642A1 Apparatus and method for plasma-treating of a substrate
07/21/1999EP0930638A1 Scanning electron microscope, production method for semiconductor device by using the same, image forming method
07/21/1999EP0930376A1 Method of processing substrate
07/21/1999EP0929906A1 An arc chamber for an ion implantation system
07/21/1999EP0876677B1 Ion source for an ion beam arrangement
07/20/1999US5926743 Process for chlorine trifluoride chamber cleaning
07/20/1999US5925886 Ion source and an ion implanting apparatus using it
07/20/1999US5925265 Exerting the actions of an electric field and a magnetic field on a processing gas; high etch selectivity between a mask and an underlying layer
07/20/1999US5925212 Apparatus and method for attaining repeatable temperature versus time profiles for plasma heated interactive parts used in mass production plasma processing
07/15/1999WO1999035667A1 Plasma treatment for producing electron emitters
07/15/1999WO1999035666A1 Method of and apparatus for minimizing plasma instability in an rf processor
07/15/1999WO1999035657A1 Magnetic engraving method, in particular for magnetic or magneto-optical recording
07/15/1999WO1999035304A1 Pcvd apparatus and a method of manufacturing an optical fiber, a preform rod and a jacket tube as well as the optical fiber manufactured therewith
07/15/1999WO1999035302A1 Coaxial resonant multiport microwave applicator for an ecr plasma source
07/15/1999WO1999028520A3 Device for processing workpieces in low pressured plasma
07/15/1999CA2318350A1 Magnetic engraving method, in particular for magnetic or magneto-optical recording
07/14/1999EP0929093A2 Plasma processor for large workpieces
07/14/1999EP0928495A1 Ion source for generating ions of a gas or vapour
07/14/1999CN1222981A Apertured nonplanar electrodes and forming methods
07/13/1999US5923678 Pattern data generating system
07/13/1999US5923040 Wafer sample retainer for an electron microscope
07/13/1999US5923034 Pattern transfer mask, mask inspection method and a mask inspection apparatus
07/13/1999US5922278 Method and apparatus for inactivating contaminants in biological fluid
07/13/1999US5922223 Plasma processing method and apparatus
07/13/1999US5922182 Apparatus for coating substrates especially with magnetizable materials
07/13/1999US5922180 Targets, shielding plate, emitters
07/13/1999US5922179 Apparatus for etching and coating sample specimens for microscopic analysis
07/13/1999US5922176 Spark eliminating sputtering target and method for using and making same
07/13/1999US5922134 Simultaneous discharge device
07/10/1999WO1999050651A1 Pattern inspection device
07/08/1999WO1999034418A1 Exposure apparatus, method of producing the apparatus, and exposure method, and device and method of manufacturing the device
07/08/1999WO1999034401A1 Wien filter
07/08/1999WO1999034399A1 Plasma device including a powered non-magnetic metal member between a plasma ac excitation source and the plasma
07/08/1999WO1999034398A1 Vacuum treatment system
07/08/1999WO1999034397A1 Sem provided with an electrostatic objective and an electrical scanning device
07/08/1999WO1999034396A2 Installation with an electron-cyclotron resonance ion source for doping stents with radioactive and non-radioactive atoms
07/08/1999WO1999034229A1 Method for optimizing the magnetic field of a periodic permanent magnet focusing device
07/08/1999WO1999034030A1 A novel approach to optimizing an ild argon sputter process
07/08/1999WO1999033673A1 Plasma discharge device and method with dynamic tuning
07/08/1999WO1999020087A3 System for plasma ignition by fast voltage rise
07/08/1999DE19757852A1 Implantation von radioaktiven ·3··2·P-Atomen Implantation of radioactive · 3 · · 2 · P atoms
07/08/1999CA2314953A1 Implantation of radioactive p32 atoms
07/07/1999EP0928012A2 Optical proximity correction method and apparatus
07/07/1999EP0927880A1 Method and apparatus for preparing samples
07/07/1999CN1222204A Reactive magnetron sputtering appts. and method
07/07/1999CN1221807A In-situ monitoring plasma etching apparatus, its in-situ monitoring method, and in-situ cleaning method for removing residues in plasma ething chamber
07/07/1999CN1221804A Ion chemical heat treatment appts.
07/06/1999US5920077 Charged particle beam exposure system
07/06/1999US5920076 Ion beam apparatus
07/06/1999US5920073 For a particle beam device
07/06/1999US5920068 Analysis of semiconductor surfaces by secondary ion mass spectrometry
07/06/1999US5919382 Automatic frequency tuning of an RF power source of an inductively coupled plasma reactor
07/06/1999US5919345 Uniform film thickness deposition of sputtered materials
07/06/1999US5919336 Apparatus for fabricating semiconductor device and method for fabricating semiconductor device
07/06/1999US5919332 Plasma processing apparatus
07/06/1999CA2123479C Anode structure for magnetron sputtering systems
07/01/1999WO1999033088A1 Device for using a low pressure discharge
07/01/1999WO1999033087A1 Focus rings and methods therefor