Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
01/2000
01/06/2000WO2000000741A1 Plasma vacuum pumping cell
01/05/2000EP0969495A2 Particle beam apparatus with secondary electron detector
01/05/2000EP0969494A1 Apparatus and method for examining specimen with a charged particle beam
01/05/2000EP0969493A1 Apparatus and method for examining specimen with a charged particle beam
01/05/2000EP0969325A2 Lithographic projection apparatus
01/05/2000EP0969238A1 Vacuum tight coupling for tube sections
01/05/2000EP0969123A1 Plasma etching device
01/05/2000EP0968524A1 Atmospheric-pressure plasma jet
01/05/2000EP0968517A1 Sem provided with an electrostatic objective and an electrical scanning device
01/05/2000DE4126236C2 Rotierende Magnetron-Kathode und Verwendung einer rotierenden Magnetron-Kathode Rotating magnetron cathode and using a rotating magnetron cathode
01/05/2000DE19829760A1 Device for application of microwaves to generate plasmas in vacuum environment with and without use of electron resonance
01/04/2000US6011269 Shaped shadow projection for an electron beam column
01/04/2000US6011268 Demagnifying projection-optical system for electron beam lithography with aberration control
01/04/2000US6011262 Object observing apparatus and method for adjusting the same
01/04/2000US6011261 Probe formed of mono-crystalline SI, the manufacturing method thereof, and an information processing device using the probe
01/04/2000US6010755 Method and apparatus for forming thin films using dual ECR plasma generators
01/04/2000US6010636 Electrode with domes for plasma focusing
01/04/2000US6010133 Chamber interfacing O-rings and method for implementing same
01/04/2000US6009830 Independent gas feeds in a plasma reactor
01/04/2000US6009829 Apparatus for driving the arc in a cathodic arc coater
12/1999
12/30/1999DE19930234A1 Electrostatic deflector used as a subsidiary deflector for an electron beam illumination unit useful for forming fine structure patterns in high density integrated circuits
12/30/1999DE19927036A1 Four-pole electron gun for an electron beam exposure apparatus used for drawing patterns on a material to be exposed, particularly a wafer
12/30/1999DE19828741A1 Elektronenmikroskop mit einem abbildenden magnetischen Energiefilter Electron microscope with an imaging magnetic energy filter
12/30/1999DE19828476A1 Teilchenstrahlgerät Particle beam
12/29/1999WO1999067808A1 High sputter, etch resistant window for plasma processing chambers
12/29/1999WO1999067807A1 Cam-based arrangement for positioning confinement rings in a plasma processing chamber
12/29/1999EP0967844A1 Method for ECR plasma deposition of electron emitting carbon layers under the effect of an applied electric field
12/29/1999EP0967630A2 Electron microscope with imaging magnetic filter
12/29/1999EP0966756A2 Ion implantation process
12/29/1999EP0966753A1 Ultra-high tilt specimen cryotransfer holder for electron microscope
12/29/1999EP0966752A1 Correction device for correcting the lens defects in particle-optical apparatus
12/29/1999CN1240051A Method for structured energy transmission using electron beams
12/28/1999US6008498 Charged particle beam apparatus and method of using the same
12/28/1999US6008495 Electron beam exposure device
12/28/1999US6008133 Method and apparatus for dry etching
12/28/1999US6008130 Polymer adhesive plasma confinement ring
12/28/1999US6008060 Detecting registration marks with a low energy electron beam
12/28/1999US6007879 Supplying solid material in coating chamber; creating processing plasma by utilizing switch-mode power supply; establishing operating power environment; switching to second operating power environment to achieve non-arc processing
12/28/1999US6007674 Stabilizing apparatus for a dry etcher system
12/28/1999US6007673 Apparatus and method of producing an electronic device
12/28/1999US6007672 Dustless process using an electrode having a specific flatess and a camber of the front surface side of the being recessed and the back is projecting; fine patterns for semiconductor wafers for integrated circuits and optical apparatus
12/28/1999US6007671 Having a vacuum chamber where part of an inside wall is silicon oxide; controlling the temperature of the silicon dioxide to prevent hydrogen atoms from deposit and recombining on the internal wall
12/28/1999US6006694 Plasma reactor with a deposition shield
12/23/1999WO1999066769A1 Plasma processor
12/23/1999WO1999066535A2 Apparatus and method relating to charged particles
12/23/1999WO1999066533A1 Semiconductor process chamber electrode and method for making the same
12/23/1999WO1999066532A1 Cleaning process end point determination using throttle valve position
12/23/1999WO1999066531A1 Plasma processing apparatus
12/23/1999WO1999066530A1 Method and device for correcting proximity effects
12/23/1999WO1999066529A1 Transmission electron microscope ccd camera
12/23/1999WO1999066528A1 Methods and apparatus for scanning and focusing an ion beam
12/23/1999WO1999066221A1 Static pressure gas bearing, stage device using it, and optical device using it
12/23/1999WO1999065821A1 Free-standing and aligned carbon nanotubes and synthesis thereof
12/23/1999DE19860704A1 Semiconductor wafer inspecting method using a scanning electron microscope (SEM)
12/23/1999DE19827587A1 Double-magnetron sputtering unit for large area reactive plasma-enhanced deposition of e.g. light absorbing layers on metal strips for solar absorbers or heat reflective layers on window glass
12/23/1999DE19827461A1 Vorrichtung zum Beschichten von Substraten in einer Vakuumkammer Device for coating substrates in a vacuum chamber
12/23/1999CA2335449A1 Free-standing and aligned carbon nanotubes and synthesis thereof
12/22/1999EP0966021A2 Device for coating substrates in a vacuum chamber
12/22/1999EP0966020A2 Method and apparatus for monitoring charge neutralization operation
12/22/1999CN1239587A Plasma etch system
12/22/1999CN1239321A Apparatus and method for contact failure inspection in semiconductor devices
12/21/1999US6005910 Holding mechanism, and exposure apparatus using the mechanism
12/21/1999US6005349 Method for generating and maintaining a glow plasma discharge
12/21/1999US6005253 Scanning energy implantation
12/21/1999US6005250 Illumination deflection system for E-beam projection
12/21/1999US6005247 Electron beam microscope using electron beam patterns
12/21/1999US6005218 Process and circuit for the bipolar pulse-shaped feeding of energy into low-pressure plasmas
12/21/1999US6005217 Microwave plasma processing method for preventing the production of etch residue
12/21/1999US6004726 Method of forming a lithographic pattern utilizing charged beam particles between 0.1 and 5.0 ev
12/21/1999US6004437 Thin-film magnetic recording head manufacturing method
12/21/1999US6003526 Cleaning a plasma etch chamber
12/16/1999WO1999065057A1 Gas distribution system
12/16/1999WO1999065056A1 Chamber having improved process monitoring window
12/16/1999WO1999065050A1 Planar electron emitter (pee)
12/16/1999WO1999064644A1 Ion energy attenuation
12/16/1999DE19826297A1 Apparatus and method for avoiding arcing by active arc suppression during sputtering
12/16/1999DE19824783A1 Vorrichtung zur Formung eines Elektronenstrahls, Verfahren zur Herstellung der Vorrichtung und Anwendung Device for shaping an electron beam, methods of manufacture of the device and application
12/16/1999CA2332556A1 Planar electron emitter (pee)
12/15/1999EP0964426A2 Ion dosage measurement apparatus for an ion beam implanter and method
12/15/1999EP0964425A2 Apparatus for processing a work piece with a uniformly neutralised ion beam
12/15/1999EP0964074A2 Ion implantation control using optical emission spectroscopy
12/15/1999EP0830708B1 Plasma processing system with reduced particle contamination
12/15/1999EP0792571B1 Method and device for measuring ion flow in a plasma
12/15/1999CN1238552A Auxiliary device for testing electronic microscope
12/15/1999CN1238551A Beam generation apparatus
12/14/1999US6002988 Method for optimizing the magnetic field of a periodic permanent magnet focusing device
12/14/1999US6002136 Microscope specimen holder and grid arrangement for in-situ and ex-situ repeated analysis
12/14/1999US6002135 Magnetic lens and deflector with inner and outer pole pieces with conical inner pole piece
12/14/1999US6002128 Sample analyzer
12/14/1999US6001432 Apparatus for forming films on a substrate
12/14/1999US6001267 Plasma enchanced chemical method
12/14/1999US6001224 Enhanced reactive DC sputtering system
12/14/1999US6000360 Plasma processing apparatus
12/14/1999CA2048470C Plasma processing apparatus having an electrode enclosing the space between cathode and anode
12/09/1999WO1999063586A1 Plasma processing apparatus
12/09/1999WO1999063584A1 Resin molded article for chamber liner
12/09/1999WO1999063572A1 Acceleration and analysis architecture for ion implanter
12/09/1999WO1999063571A1 Pedestal insulator for a pre-clean chamber
12/09/1999WO1999063566A2 Device for shaping an electron beam, method for producing said device and use thereof
12/09/1999WO1999048130A9 Distributed inductively-coupled plasma source