Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
03/2001
03/06/2001US6198224 Microwave plasma generator with the short cross-sectional side of the resonator parallel to the chamber axis
03/06/2001US6198109 Aperture apparatus used for photolithography and method of fabricating the same
03/06/2001US6198095 Apparatus and method for imaging a particle beam
03/06/2001US6198067 Plasma processing device for circuit supports
03/06/2001US6197699 In situ dry cleaning process for poly gate etch
03/06/2001US6197246 Hot-press sintering ceramic molding and electrostatic chucking electrode comprising a planar bulk metal under pressure applied in a thickness direction of said electrode, embedding electrode in dense substrate made of a monolithic sinter
03/06/2001US6197166 Method for inductively-coupled-plasma-enhanced ionized physical-vapor deposition
03/06/2001US6197165 Method and apparatus for ionized physical vapor deposition
03/06/2001US6197151 Plasma processing apparatus and plasma processing method
03/06/2001US6197116 Plasma processing system
03/06/2001US6196889 Method and apparatus for use an electron gun employing a thermionic source of electrons
03/06/2001US6196155 Plasma processing apparatus and method of cleaning the apparatus
03/01/2001WO2001015212A1 Plasma processing apparatus and method of plasma processing
03/01/2001WO2001015209A1 Plasma polymerizing apparatus having an electrode with a lot of uniform edges
03/01/2001WO2001015200A1 Implanting system and method
03/01/2001WO2001015192A1 Schottky emitter having extended life
03/01/2001WO2000079579A3 Device and method for the high-frequency etching of a substrate using a plasma etching installation and device and method for igniting a plasma and for pulsing the plasma output or adjusting the same upwards
03/01/2001WO2000058995B1 Apparatus for improving plasma distribution and performance in an inductively coupled plasma
03/01/2001DE10036217A1 Coordinate table mechanism for semiconductor lithography device has sliding shafts fitted with table surface within vacuum chamber supported by pressurized gas bearings
02/2001
02/28/2001EP1079671A2 Antenna device for generating inductively coupled plasma
02/28/2001EP1079425A1 Process and device for vacuum plasma treatment of substrate
02/28/2001EP1079423A1 Apparatus for gas processing
02/28/2001EP1079415A1 Substrate (plasma) processing taking account of optical instabilities
02/28/2001EP1078389A1 Reduction of metal oxide in dual frequency plasma etch chamber
02/28/2001EP1078388A1 Method and installation for correcting integrated circuit faults with an ion beam
02/28/2001EP1078387A1 Ion beam apparatus and a method for neutralising space charge in an ion beam
02/28/2001EP1078301A1 Retaining device for photo blanks
02/28/2001EP1078111A1 Apparatus for sputter deposition
02/28/2001CN1285612A Electronic Beam exposure mask, Exposure method and equipment and method for making semiconductor device
02/28/2001CN1285419A Electric arc type evaparation source
02/28/2001CN1285253A Electric arc type ion plating device
02/27/2001US6195214 Microcolumn assembly using laser spot welding
02/27/2001US6194835 Device for producing plasma
02/27/2001US6194734 Method and system for operating a variable aperture in an ion implanter
02/27/2001US6194732 Charged-particle-beam exposure methods with beam parallelism detection and correction
02/27/2001US6194730 Electrostatic lens
02/27/2001US6194729 Particle beam apparatus
02/27/2001US6194719 Methods and apparatus for improving resolution and reducing noise in an image detector for an electron microscope
02/27/2001US6194718 Method for reducing aliasing effects in scanning beam microscopy
02/27/2001US6194680 Microwave plasma processing method
02/27/2001US6194322 Electrode for plasma processes and method for a manufacture and use thereof
02/27/2001US6194102 Mask for transferring a pattern to a substrate, comprising sub-fields including pattern lines and interconnection patterns which include transmitting pattern segments with widths that change monotonically in a longitudinal direction
02/27/2001US6194038 Variations in gas flow concentration
02/27/2001US6193855 Use of modulated inductive power and bias power to reduce overhang and improve bottom coverage
02/27/2001US6193854 Extended plasma is formed over a very high percentage of the surface of the target, thereby creating an erosion profile that is highly uniform and encompasses essentially the entire face of the target; maximizes utilization of target
02/27/2001US6193836 Center gas feed apparatus for a high density plasma reactor
02/27/2001US6193802 Parallel plate apparatus for in-situ vacuum line cleaning for substrate processing equipment
02/27/2001US6192938 Gas panel
02/27/2001US6192898 Method and apparatus for cleaning a chamber
02/27/2001US6192829 Antenna coil assemblies for substrate processing chambers
02/27/2001US6192828 Thin film forming device for forming silicon thin film having crystallinity
02/27/2001US6192827 Double slit-valve doors for plasma processing
02/22/2001WO2001013419A1 Processing apparatus and processing method
02/22/2001WO2001013410A1 Wafer holder assembly
02/22/2001WO2001013404A1 Diamond coated parts in a plasma reactor
02/22/2001WO2001013403A1 Inductively coupled plasma process chamber with shield electrode interposed between antenna and dielectric window
02/22/2001WO2001013402A1 Electric supply unit for plasma installations
02/22/2001WO2001012873A1 Pulsed plasma processing method and apparatus
02/22/2001WO2001012863A1 Steel sheet for heat shrink band and method for producing the same
02/22/2001WO2001012350A1 Cleaning surfaces with a thermal-non-equilibrium glow discharge plasma at high pressure
02/22/2001WO2000075281A9 Supercritical fluid-assisted nebulization and bubble drying
02/22/2001DE19939687A1 Large-area electron beam radiation exposure dose determination for microelectronics layout, involves dividing the total surface area into several disjunctive part-areas with different structural widths
02/21/2001EP1076911A1 Method and apparatus for ionized physical vapor deposition
02/21/2001CN1285008A PCVD apparatus and a method of manufacturing optical flber, preform rod and jacket tube as well as the optical fiber manufactured therewith
02/20/2001US6192510 Method of preparing a partial one-shot electron beam exposure mask and method of direct-writing patterns by use of a partial one-shot electron beam exposure mask
02/20/2001US6192287 Method and apparatus for fault detection and control
02/20/2001US6191598 High resolution analytical probe station
02/20/2001US6191532 Arrangement for producing plasma
02/20/2001US6191427 Ion implantation system and method suitable for low energy ion beam implantation
02/20/2001US6191423 Correction device for correcting the spherical aberration in particle-optical apparatus
02/20/2001US6190927 Method and apparatus for detecting optimal endpoints in plasma etch processes
02/20/2001US6190609 High intensity light source; killing viruses in blood
02/20/2001US6190517 Magnet array
02/20/2001US6190513 Coupling radio frequency energy from coil-shield into plasma to ionize material; reducing eddy currents using slitted shield
02/20/2001US6190512 Soft plasma ignition in plasma processing chambers
02/20/2001US6190496 Plasma etch reactor and method for emerging films
02/20/2001US6190495 Magnetron plasma processing apparatus
02/20/2001US6190062 Cleaning chamber built into SEM for plasma or gaseous phase cleaning
02/20/2001US6189570 Gas panel
02/20/2001US6189485 Plasma CVD apparatus suitable for manufacturing solar cell and the like
02/20/2001US6189484 Plasma reactor having a helicon wave high density plasma source
02/20/2001US6189483 Process kit
02/20/2001US6189482 High temperature, high flow rate chemical vapor deposition apparatus and related methods
02/20/2001US6189481 Microwave plasma processing apparatus
02/20/2001CA1341184C Method and apparatus for the plasma etching substrate cleaning or deposition of materials by d.c. glow discharge
02/15/2001WO2001011659A1 System and method for providing implant dose uniformity across the surface of a substrate
02/15/2001WO2001011658A1 Plasma reactor for treating substrates having large surfaces
02/15/2001WO2001011657A1 Correction for systematic, low spatial frequency critical dimension variations in lithography
02/15/2001WO2001011656A1 Calibration of a scanning electron microscope
02/15/2001WO2001011655A1 Methods and apparatus for mounting an x-ray detecting unit to an electron microscope
02/15/2001WO2001011650A1 Inductively coupled ring-plasma source apparatus for processing gases and materials and method thereof
02/15/2001WO2001011108A1 Electron beam physical vapor deposition apparatus and method
02/15/2001WO2000065632A3 Method for decontaminating yeast
02/15/2001WO2000065631A3 Apparatus and method for exposing a substrate to plasma radicals
02/15/2001WO2000062324A3 System and method to correct for distortion caused by bulk heating in a substrate
02/14/2001EP1076352A2 High-density plasma source for ionized metal deposition
02/14/2001EP1075707A1 Apparatus for improved biasing and retaining of a workpiece in a workpiece processing system
02/13/2001US6189135 Method of generating electron-beam data for creating a mask
02/13/2001US6188564 Method and apparatus for compensating non-uniform wafer processing in plasma processing chamber
02/13/2001US6188074 Charged particle beam exposure apparatus