Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
03/2002
03/21/2002US20020033449 Inspection system by charged particle beam and method of manufacturing devices using the system
03/21/2002US20020033446 Neutral beam processing apparatus and method
03/21/2002US20020033328 Use of variable RF generator to control coil voltage distribution
03/21/2002US20020033233 Icp reactor having a conically-shaped plasma-generating section
03/21/2002US20020033231 Apparatus and method for plasma etching
03/21/2002US20020033229 Apparatus for etching semiconductor samples and a source for providing a gas by sublimination thereto
03/20/2002EP1189493A2 Plasma processing apparatus provided with microwave applicator having annular waveguide and processing method
03/20/2002EP1189491A1 Apparatus for detecting plasma anomalous discharge and method of detecting the same
03/20/2002EP1189258A2 Vacuum arc evaporation apparatus
03/20/2002EP1189240A1 Multi-probe measuring device and method of use
03/20/2002EP1188847A2 Plasma processing method and apparatus
03/20/2002CN1340913A Method for heat conversion plasma tuner
03/20/2002CN1340634A Sputtering equipment
03/19/2002US6359388 Cold cathode ion beam deposition apparatus with segregated gas flow
03/19/2002US6359250 RF matching network with distributed outputs
03/19/2002US6358573 Mixed frequency CVD process
03/19/2002US6358481 Electrically safe dual electrode plasma treatment chamber system
03/19/2002US6358382 Retaining ring and target and method for producing same
03/19/2002US6358376 Biased shield in a magnetron sputter reactor
03/19/2002US6358362 Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process
03/19/2002US6358361 Plasma processor
03/19/2002US6358359 Apparatus for detecting plasma etch endpoint in semiconductor fabrication and associated method
03/19/2002US6358324 Microwave plasma processing apparatus having a vacuum pump located under a susceptor
03/19/2002US6357385 Plasma device
03/14/2002WO2002021585A1 Magnetic field generator for magnetron plasma, and plasma etching apparatus and method comprising the magnetic field generator
03/14/2002WO2002021567A1 Plasma enhanced gas reactor
03/14/2002WO2002021566A2 Bulk gas delivery system for ion implanters
03/14/2002WO2002021565A2 Apparatus for magnetically scanning and/or switching a charged-particle beam
03/14/2002WO2002020866A1 Cylindrical target and method of manufacturing the cylindrical target
03/14/2002WO2002005315A3 System and method for improving thin films by gas cluster ion be am processing
03/14/2002WO2001075932A3 An enhanced resist strip in a dielectric etcher using downstream plasma
03/14/2002WO2001073813A3 Method and apparatus for varying a magnetic field to control a volume of a plasma
03/14/2002WO2001045135A3 Plasma reactor cooled ceiling with an array of thermally isolated plasma heated mini-gas distribution plates
03/14/2002WO2001027964A3 Electron impact ion source
03/14/2002US20020030167 Dose monitor for plasma doping system
03/14/2002US20020030166 Pattern inspection method and apparatus using electron beam
03/14/2002US20020029960 Sputtering apparatus and film manufacturing method
03/14/2002US20020029959 Suitable for film deposition using a plurality of targets of different materials; uniform film without need for rotation of the substrate; sputtering device rotates the target
03/14/2002US20020029851 Plasma processing method and apparatus using dynamic sensing of a plasma environment
03/14/2002US20020029850 System for the plasma treatment of large area substrates
03/14/2002US20020029746 Operation method of ion source and ion beam irradiation apparatus
03/14/2002US20020029745 Worktable device and plasma processing apparatus for semiconductor process
03/14/2002DE10042098A1 Gasversorgung für Additive Lithographie Gas supply for additives lithography
03/14/2002CA2418807A1 Cylindrical target and its production method
03/13/2002EP1187250A2 Microwave device
03/13/2002EP1187187A1 Plasma processing apparatus
03/13/2002EP1187172A2 Sputtering apparatus and film manufacturing method
03/13/2002EP1187171A2 Processor and method for processing
03/13/2002EP1187170A2 Plasma resistant quartz glass jig
03/13/2002EP1187169A2 Corpuscular optical components and assembly using same
03/13/2002EP1187121A2 Substrate rotating device, and manufacturing method and apparatus of recording medium master
03/13/2002EP1186682A2 Cylindrical sputtering target and process for its manufacture
03/13/2002EP1186681A1 Vacuum treatment apparatus having dockable substrate holder
03/13/2002EP1185857A2 Method and apparatus for enhancing yield of secondary ions
03/13/2002EP1185617A2 Method for decontaminating yeast
03/13/2002EP1185248A2 Supercritical fluid-assisted nebulization and bubble drying
03/13/2002EP0886880B1 Method and apparatus for the coating of workpieces
03/12/2002US6356097 Capacitive probe for in situ measurement of wafer DC bias voltage
03/12/2002US6356026 Ion implant source with multiple indirectly-heated electron sources
03/12/2002US6356025 Shielded rf antenna
03/12/2002US6355994 Precision stage
03/12/2002US6355933 Ion source and method for using same
03/12/2002US6355574 Method and device for treating a semiconductor surface
03/12/2002US6355573 Plasma processing method and apparatus
03/12/2002US6355384 Lithographic mask
03/12/2002US6355383 Electron-beam exposure system, a mask for electron-beam exposure and a method for electron-beam exposure
03/12/2002US6355350 Tetracarbon
03/12/2002US6355183 Apparatus and method for plasma etching
03/12/2002US6355109 Vacuum processing apparatus
03/12/2002US6355108 Film deposition using a finger type shadow frame
03/12/2002US6354438 Focused ion beam apparatus for forming thin-film magnetic recording heads
03/12/2002US6354240 Plasma etch reactor having a plurality of magnets
03/12/2002CA2065581C Plasma enhancement apparatus and method for physical vapor deposition
03/07/2002WO2002019395A1 Ion-ion plasma processing with bias modulation sychronized to time-modulated discharges
03/07/2002WO2002019387A2 Transmission line based inductively coupled plasma source with stable impedance
03/07/2002WO2002019380A1 Plasma processing
03/07/2002WO2002019379A1 Device and process for producing dc glow discharge
03/07/2002WO2002019378A2 System and method for removing particles entrained in an ion beam
03/07/2002WO2002019377A2 Electrostatic trap for particles entrained in an ion beam
03/07/2002WO2002019376A2 System and method for removing contaminant particles relative to an ion beam
03/07/2002WO2002019375A1 Device, set and method for carrying a gas or a liquid to a surface through a tube
03/07/2002WO2002019374A2 Methods and apparatus for adjusting beam parallelism in ion implanters
03/07/2002WO2002019366A2 Cold cathode ion beam deposition apparatus with segregated gas flow
03/07/2002WO2002019364A2 Inductively coupled plasma using an internal inductive element
03/07/2002WO2001078101A3 Method and apparatus for plasma processing
03/07/2002WO2001073812A3 Method and apparatus for forming inner magnetic bucket to control a volume of a plasma
03/07/2002WO2000075393A3 Carbon plasma pulsed source
03/07/2002US20020029093 Method and apparatus for depositing a tantalum-containing layer on a substrate
03/07/2002US20020028399 Detecting defects using scanning radiation
03/07/2002US20020028398 Charged particle beam exposure method and charged particle beam exposure apparatus
03/07/2002US20020028290 Rotation in gas flow; forming polycrystalline silicon
03/07/2002US20020027440 Method and apparatus for inspecting integrated circuit pattern
03/07/2002US20020027205 Enhanced plasma mode and system for plasma immersion ion implantation
03/07/2002US20020027204 Electron beam exposure apparatus, device for shaping a beam of charged particles and method for manufacturing the device
03/07/2002US20020027199 Method and device for observing a specimen in a field of view of an electron microscope
03/07/2002US20020027198 Method and apparatus for charged particle beam exposure
03/07/2002US20020026983 Method and apparatus for controlling the temperature of a gas distribution plate in a process reactor
03/07/2002DE10041065A1 Device for exciting and generating ionized gas or plasma using high frequency resonance to trigger or excite ionization, comprises resonant circuit for generating trigger or excitation voltage in capacitor
03/07/2002DE10041040A1 Vorrichtung und Verfahren zur Belichtung einer strahlungsempfindlichen Schicht mittels geladener Teilchen sowie Maske hierfür Apparatus and method for exposing a radiation-sensitive layer by means of charged particles as well as mask for this
03/06/2002EP1184891A1 Electron beam lithography