Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
09/2003
09/30/2003US6627888 Scanning electron microscope
09/30/2003US6627886 Secondary electron spectroscopy method and system
09/30/2003US6627885 Method of focused ion beam pattern transfer using a smart dynamic template
09/30/2003US6627884 Simultaneous flooding and inspection for charge control in an electron beam inspection machine
09/30/2003US6627545 Method of forming silicon oxide layer and method of manufacturing thin film transistor thereby
09/30/2003US6627366 Electron beam exposure method having good linearity with respect to producing fine patterns
09/30/2003US6627056 Method and apparatus for ionized plasma deposition
09/30/2003US6627050 Method and apparatus for depositing a tantalum-containing layer on a substrate
09/30/2003US6626998 Plasma generator assembly for use in CVD and PECVD processes
09/25/2003WO2003079740A1 Plasma device
09/25/2003WO2003079427A1 Plasma processing method
09/25/2003WO2003079404A2 An improved substrate holder for plasma processing
09/25/2003WO2003079397A1 Vacuum plasma generator
09/25/2003WO2003079116A1 Direct write lithography system
09/25/2003WO2003078692A1 Method of cleaning the surface of a material coated with an organic substance and a generator and device for carrying out said method
09/25/2003WO2003078680A1 Method of surface texturizing
09/25/2003WO2003030240A3 Etching method and apparatus
09/25/2003WO2003015123A3 Dual frequency plasma etch reactor with independent plasma density/chemistry and ion energy control
09/25/2003US20030181065 Low contamination components for semiconductor processing apparatus and methods for making components
09/25/2003US20030181026 Radiation-enhanced particle beams and related applications
09/25/2003US20030180971 Plasma etching method and apparatus for manufacturing a semiconductor device
09/25/2003US20030180450 Plasma plating; vacuum exposure; applying direct current signal; then radio frequency; heating, controlling temperature
09/25/2003US20030179054 Radio frequency resonator and method for producing the same
09/25/2003US20030178583 Field emission photo-cathode array for lithography system and lithography system provided with such an array
09/25/2003US20030178582 System and method for electron beam irradiation
09/25/2003US20030178581 Electron beam irradiation apparatus and electron beam irradiating method
09/25/2003US20030178580 Method for defect and conductivity engineering of a conducting nanoscaled structure
09/25/2003US20030178579 Stage devices exhibiting reduced deformation, and microlithography systems comprising same
09/25/2003US20030178576 Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focus
09/25/2003US20030178390 System and method for enhanced monitoring of an etch process
09/25/2003US20030178301 Planar magnetron targets having target material affixed to non-planar backing plates
09/25/2003US20030178300 Method of manufacturing an object in a vacuum recipient
09/25/2003US20030178299 Rotation-magnetron-in-magnetron (RMIM) electrode, method of manufacturing the RMIM electrode, and sputtering apparatus including the RMIM electrode
09/25/2003US20030178144 Plasma processing device
09/25/2003US20030178143 Plasma reactor with plural independently driven concentric coaxial waveguides
09/25/2003US20030178140 Plasma processing apparatus capable of evaluating process performance
09/24/2003EP1347673A1 Plasma generating apparatus using microwave
09/24/2003EP1347491A1 Apparatus for driving the arc in a cathodic arc coater
09/24/2003EP1347490A2 Diaphragm accessory unit for scanning electron microscope
09/24/2003EP1346394A1 Electrode for plasma processes and method for manufacture and use thereof
09/24/2003EP1346085A1 Methods and apparatus for producing m'n based materials
09/24/2003EP1346080A1 Injector and method for prolonged introduction of reagents into plasma
09/24/2003EP1346078A1 Fullerene coated component of semiconductor processing equipment
09/24/2003EP1346076A2 Low contamination plasma chamber components and methods for making the same
09/24/2003EP1345703A1 Corrosion resistant component of semiconductor processing equipment and method of manufacture thereof
09/24/2003EP1345701A2 Centrifugal type contaminant collector trap for ion implanter
09/24/2003CN1444257A Method and system for processing radio-frequency plasma
09/24/2003CN1122117C Plasma reactor with a deposition shield plate
09/23/2003US6624584 Particle source for producing excited particles
09/23/2003US6624582 Method of an apparatus for performing circuit-processing, method of and apparatus for controlling the motion of the circuit-processing performance apparatus, and information storage medium
09/23/2003US6624430 Phase shifting using an apparatus having electron generators, focusing lenses and deflection controllers for adjustment of radiation beams
09/23/2003US6624429 Exposure of concave photoresists using uniform radiation intensity, to form images distributed on the surfaces
09/23/2003US6624426 Split magnetic lens for controlling a charged particle beam
09/23/2003US6624412 Energy filter
09/23/2003US6624084 Plasma processing equipment and plasma processing method using the same
09/23/2003US6624082 Systems and methods for two-sided etch of a semiconductor substrate
09/23/2003US6624081 Enhanced etching/smoothing of dielectric surfaces
09/23/2003US6623610 Magnetron sputtering target for magnetic materials
09/23/2003US6623606 Method and apparatus for sputter coating with variable target to substrate spacing
09/23/2003US6623597 Focus ring and apparatus for processing a semiconductor wafer comprising the same
09/23/2003US6623596 Plasma reactor having an inductive antenna coupling power through a parallel plate electrode
09/23/2003US6623595 Wavy and roughened dome in plasma processing reactor
09/23/2003US6622650 Plasma processing apparatus
09/18/2003WO2003077304A1 Plasma processing system and method for interrupting plasma processing
09/18/2003WO2003077302A1 Plasma processing device and plasma generating method
09/18/2003WO2003077300A1 Plasma processing apparatus
09/18/2003WO2003077299A1 Plasma device
09/18/2003WO2003077294A1 Plasma processor
09/18/2003WO2003077293A1 High-frequency power supply structure and plasma cvd device using the same
09/18/2003WO2003077279A2 Device for activating gases in a vacuum, using a hollow cathode discharge
09/18/2003WO2003077278A2 Ion-implantation device
09/18/2003WO2003076683A1 Unitary removable shield assembly
09/18/2003WO2003075965A1 Device for sterilizing objects
09/18/2003WO2003075964A1 Portable radiant energy sterilizer
09/18/2003WO2003041109A3 Spot grid array electron imagine system
09/18/2003WO2003018185A3 Method of producing powder with composite grains and the device for carrying out said method
09/18/2003WO2003015121A3 Slit lens arrangement for particle beams
09/18/2003WO2002041356A3 Sputter cathode with magnetic shunt
09/18/2003US20030176069 Plasma processing apparatus and plasma processing method
09/18/2003US20030175181 Plasma enhanced gas reactor
09/18/2003US20030173914 Electrostatic accelerator and ion implanting apparatus with the same
09/18/2003US20030173527 Focused ion beam system and machining method using it
09/18/2003US20030173526 Method of surface texturizing
09/18/2003US20030173516 Semiconductor inspection system
09/18/2003US20030173338 Processes for nanomachining using carbon nanotubes
09/18/2003US20030173217 High-power ion sputtering magnetron
09/18/2003US20030173215 Sputtering target with a partially enclosed vault
09/18/2003US20030173207 Biased pulse DC reactive sputtering of oxide films
09/18/2003US20030173030 Plasma processing apparatus
09/18/2003US20030173028 Plasma processing apparatus for adjusting plasma processing through detecting plasma processing state within chamber
09/18/2003US20030172953 Of a vacuum apparatus, especially one that forms films on the surface of an optical element for use in a semiconductor exposure system, etc.
09/18/2003US20030172872 Apparatus for cyclical deposition of thin films
09/18/2003US20030172772 High energy microwaves ionize a plasma gas, thus releasing large amounts of energy, which is utilized to initiate and sustain chemical reactions between the desired elements being pumped in a spiral pattern into the plasmatron
09/18/2003DE20310614U1 Composite electrode for plasma etching system, e.g. for semiconductor substrate processing has locking ring for anchoring composite electrode
09/18/2003CA2477678A1 Portable radiant energy sterilizer
09/17/2003EP1344842A2 Method and apparatus for production of metal film
09/17/2003EP1344242A2 In-process wafer charge monitor and control system for ion implanter
09/17/2003EP1344018A1 Particle-optical inspection device especially for semiconductor wafers
09/17/2003EP1019946B1 Device for coating panel-shaped substrates
09/16/2003US6622286 Integrated electronic hardware for wafer processing control and diagnostic