Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
05/2004
05/06/2004US20040083975 Apparatus for reducing polymer deposition on a substrate and substrate support
05/06/2004US20040083974 Hermetically-evacuated reaction vessel, substrate holders, gas source supply , and a high-frequency power supply; an end covering provided at an end of each of the substrate holders, the the source gas supply and the power supply; quality
05/06/2004US20040083971 Plasma reactor having a symmetric parallel conductor coil antenna
05/06/2004US20040083970 Vacuum processing device
05/06/2004US20040083967 Plasma CVD apparatus for large area CVD film
05/06/2004EP1416513A2 Apparatus and method for image optimization of samples in a scanning electron microscope
05/06/2004EP1416247A1 Interferometric endpoint determination in a substrate etching process
05/06/2004EP1415595A1 Method and apparatus for correcting spherical aberration of an electron beam
05/06/2004EP1415322A2 Dual frequency plasma etch reactor with independent plasma density/chemistry and ion energy control
05/06/2004EP1415321A1 Device for the coating of objects
05/06/2004EP1415320A1 Method of measuring the performance of a scanning electron microscope
05/06/2004EP1415015A1 Method and device for the coating and blow moulding of a body
05/06/2004EP1332511B1 Device for treating gas with plasma
05/06/2004EP1133652B1 Manifold system of removable components for distribution of fluids
05/06/2004EP0906637B1 Gas delivery systems for particle beam processing
05/06/2004DE19952316B4 Verfahren zum Herstellen einer Gateisolierung und einer Trennisolierung in einem Dünnfilmtransistor A method for forming a gate insulation and a release isolation in a thin film transistor
05/06/2004CA2502667A1 Method for magnetron sputtering
05/05/2004CN1494737A Plasma processor and plasma processing method
05/05/2004CN1494603A Arc evaporator with powerful magnetic guide for targets having large surface area
05/05/2004CN1494601A Physical vapor deposition target/backing plate assemblies, and methods of forming same
05/05/2004CN1148789C Method and apparatus for etching semiconductor wafer
05/04/2004US6732295 Method and system of frequency modulated end-point detection
05/04/2004US6732054 Process for identifying single crystals by electron diffraction
05/04/2004US6730922 Anti-electron reflector arrangement
05/04/2004US6730921 Ion beam system for irradiating tumor tissues
05/04/2004US6730916 Electron beam lithography apparatus
05/04/2004US6730907 Charged particle device
05/04/2004US6730906 Method and apparatus for testing a substrate
05/04/2004US6730443 Patterning methods and systems using reflected interference patterns
05/04/2004US6730197 Oblique deposition apparatus
05/04/2004US6730196 Auxiliary electromagnets in a magnetron sputter reactor
05/04/2004US6730174 Unitary removable shield assembly
05/04/2004US6729850 Applied plasma duct system
05/04/2004US6729261 Plasma processing apparatus
04/2004
04/29/2004WO2004036639A1 Etching system and method for fabricating semiconductor device using it
04/29/2004WO2004036616A1 Method for the production of a substrate with a magnetron sputter coating and unit for the same
04/29/2004WO2004036611A2 Neutral particle beam processing apparatus with enhanced conversion performance from plasma ions to neutral particles
04/29/2004WO2003095058A3 Plasma-assisted multi-part processing
04/29/2004US20040082251 Apparatus for adjustable gas distribution for semiconductor substrate processing
04/29/2004US20040082187 High-power pulsed magnetically enhanced plasma processing
04/29/2004US20040081916 Scattering-reticle assemblies for electron-beam microlithography including a scattering-stencil reticle portion and a scattering-membrane reticle portion
04/29/2004US20040081283 Method and apparatus for correcting spherical aberration of an electron beam
04/29/2004US20040079901 Method and structure for reducing effects of noise and resonance associated with an e-beam lithography tool
04/29/2004US20040079897 Apparatus and method for testing substrate
04/29/2004US20040079896 Method and structure for detection of electromechanical problems using variance statistics in an E-beam lithography device
04/29/2004US20040079895 Method and structure for detection and measurement of electrical and mechanical resonance associated with an E-beam lithography tool
04/29/2004US20040079892 Tip for nanoscanning electron microscope
04/29/2004US20040079884 Converting scanning electron microscopes
04/29/2004US20040079883 Electron beam irradiation apparatus, electron beam exposure apparatus, and defect detection method
04/29/2004US20040079733 Plasma processing method
04/29/2004US20040079725 Dry etching apparatus, dry etching method, and plate and tray used therein
04/29/2004US20040079485 Inductively coupled plasma generating apparatus incorporating serpentine coil antenna
04/29/2004US20040079484 Method and apparatus for gas injection system with minimum particulate contamination
04/29/2004US20040079288 Apparatus and process for forming a deposited film
04/29/2004US20040079287 Toroidal low-field reactive gas source
04/29/2004DE19509284B4 Vorrichtung zur Erzeugung eines ebenen Plasmas unter Verwendung variierender Magnetpole A device for generating a planar plasma using varying magnetic poles
04/29/2004DE10295954T5 Belichtungsverfahren unter Verwendung einer komplementär unterteilten Maske, Belichtungsvorrichtung, Halbleiterbauteil und Verfahren zum Herstellen desselben Of the same exposure method using a complementarily divided mask, exposure apparatus, semiconductor device and methods for making
04/28/2004EP1412964A1 Sputtering magnetron arrangements with adjustable magnetic field strength
04/28/2004EP1412963A2 Method and apparatus for producing uniform process rates
04/28/2004EP1412962A2 Pattern generation method and apparatus using cached cells of hierarchical data
04/28/2004EP1412796A1 Electron microscope and spectroscopy system
04/28/2004EP1412061A2 Field ionizing elements and applications thereof
04/28/2004EP1038306B1 Method and device for improving surfaces
04/28/2004EP0995342A4 Method for improved cleaning of substrate processing systems
04/28/2004EP0914669B1 Detector devices
04/28/2004CN1492236A Charging voltage detector for substrate and ion beam radiator
04/28/2004CN1147919C Resin molder article for chamber liner
04/28/2004CN1147619C Spattring filming device and spattering filming method
04/28/2004CN1147618C Thin-film deposition apparatus using cathodic arc discharge
04/27/2004US6727911 Method and apparatus for observing specimen image on scanning charged-particle beam instrument
04/27/2004US6727658 Electron beam generating apparatus and electron beam exposure apparatus
04/27/2004US6727655 Method and apparatus to monitor electrical states at a workpiece in a semiconductor processing chamber
04/27/2004US6727654 Plasma processing apparatus
04/27/2004US6727509 Wafer pedestal tilt mechanism
04/27/2004US6727507 Electron beam proximity exposure apparatus and method
04/27/2004US6727500 System for imaging a cross-section of a substrate
04/27/2004US6726805 Pedestal with integral shield
04/27/2004US6726804 RF power delivery for plasma processing using modulated power signal
04/27/2004US6726803 Multi-sectional plasma generator with discharge gaps between multiple elements forming a plasma discharge cavity
04/27/2004US6726802 Plasma processing apparatus
04/27/2004US6726801 Dry etching apparatus for manufacturing semiconductor devices
04/27/2004US6726799 Plasma etching apparatus with focus ring and plasma etching method
04/27/2004CA2145570C Magnetron atomization source and method of use thereof
04/22/2004WO2004034471A1 Image pickup device and manufacturing method thereof
04/22/2004WO2004034461A1 Electrode configuration for retaining cooling gas on electrostatic wafer clamp
04/22/2004WO2004034455A1 Plasma processing apparatus, processing vessel used in plasma processing apparatus, dielectric plate used in plasma processing apparatus
04/22/2004WO2004033753A1 Method of forming metal oxide film and microwave power source unit for use in the method
04/22/2004WO2004033750A1 Plasma-assisted micro-scale material deposition
04/22/2004WO2004010454A3 Plasma reactor for carrying out gas reactions and method for the plasma-supported reaction of gases
04/22/2004US20040076763 Apparatus capable of forming a thin film of high quality having a uniform thickness at a high deposition rate at an increased plasma density without increase of plasma potential
04/22/2004US20040076762 Plasma processor and plasma processing method
04/22/2004US20040076529 Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device
04/22/2004US20040075064 Method for correcting a proximity effect, an exposure method, a manufacturing method of a semiconductor device and a proximity correction module
04/22/2004US20040075054 Electron microscopy system and electron microscopy method
04/22/2004US20040075053 Particle-optical arrangements and particle-optical systems
04/22/2004US20040075051 Apparatus and method for image optimization of samples in a scanning electron microscope
04/22/2004US20040074770 Rotary target
04/22/2004US20040074609 Multi-part electrode for a semiconductor processing plasma reactor and method of replacing a portion of a multi-part electrode
04/22/2004US20040074606 Electrode-built-in susceptor and a manufacturing method therefor
04/22/2004US20040074605 Focus ring for semiconductor treatment and plasma treatment device