Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
07/2004
07/22/2004WO2004003963A3 Plasma processor with electrode simultaneously responsive to plural frequencies
07/22/2004WO2003096383A3 Cavity shapes for plasma-assisted processing
07/22/2004WO2003049141A3 Device for applying an electromagnetic microwave to a plasma container
07/22/2004US20040143356 Multi-electron beam exposure method and apparatus
07/22/2004US20040141278 Device and method for charge removal from dielectric surfaces
07/22/2004US20040141169 Electron beam exposure system
07/22/2004US20040140778 Plasma generation system
07/22/2004US20040140516 Electromagnetic-wave shielding and light transmitting plate, manufacturing method thereof and display panel
07/22/2004US20040140438 Angular aperture shaped beam system and method
07/22/2004US20040140437 Electron beam array write head system and method
07/22/2004US20040140436 Transfer method and apparatus, exposure method and apparatus, method of manufacturing exposure apparatus, and device manufacturing method
07/22/2004US20040140432 Generating electrons with an activated photocathode
07/22/2004US20040140426 Scanning probe microscope with improved probe head mount
07/22/2004US20040140424 Scanning probe microscope with improved probe tip mount
07/22/2004US20040140208 Alternating current rotatable sputter cathode
07/22/2004US20040140205 Rotational and reciprocal radial movement of a sputtering magnetron
07/22/2004US20040140204 Magnetron cathode and magnetron sputtering apparatus comprising the same
07/22/2004US20040140054 Variable aspect ratio plasma source
07/22/2004US20040140053 Method and apparatus for micro-jet enabled, low-energy ion generation and transport in plasma processing
07/22/2004US20040140036 Plasma processing method and apparatus
07/22/2004US20040139916 Applying the particles to be separated on a substrate supported membrane, such that the particles are mobile across the surface of the substrate supported membrane; providing an electrical field; temporarily modifying the electrical field and/or adding a substrate supported membrane
07/22/2004US20040139915 Plasma CVD apparatus and dry cleaning method of the same
07/22/2004DE19955671B4 Vorrichtung zur Erzeugung von Plasma A device for generating plasma
07/22/2004DE19830404B4 Vorrichtung zur Sputterbeschichtung mit variierbarem Plasmapotential Apparatus for sputter coating with variierbarem plasma potential
07/22/2004DE10300734A1 Plasma treatment of workpieces involves positioning plasma chamber along closed path with carrying device that can be driven with rotary motion about essentially horizontal axis of rotation
07/22/2004DE10300439A1 Assembly to treat material surface, e.g. degrease metal foil, has electrodes tightly against surface to give homogenous surface discharge
07/22/2004DE102004001316A1 Elektronenstrahlschweißverfahren und damit gefertigte geschweißte Komponenten Electron beam welding process and thus made welded components
07/22/2004CA2509643A1 Magnetron sputtering systems including anodic gas distribution systems
07/21/2004EP1439571A1 DEVICE AND METHOD FOR MICROWAVE PLASMA PROCESSING, AND MICROWAVE POWER SUPPLY DEVICE
07/21/2004EP1439566A1 Charged particle beam apparatus and method for operating the same
07/21/2004EP1439565A2 Electron beam apparatus and detector arrangement
07/21/2004EP1439564A1 Charged particle beam device for inspecting or structuring a specimen
07/21/2004EP1438735A2 Methods and apparatus for plasma doping by anode pulsing
07/21/2004EP1438734A2 Methods and apparatus for plasma doping and ion implantation in an integrated processing system
07/21/2004EP1438733A2 Wafer pedestal tilt mechanism and cooling system
07/21/2004EP1438732A1 Methods and apparatus for defect localization
07/21/2004EP1438636A2 Real-time prediction of and correction of proyimity resist heating in raster scan particle beam lithography
07/21/2004EP1438443A1 Method and apparatus for sputter deposition of epilayers with high deposition rate
07/21/2004EP1438442A1 Dual-source, single-chamber method and apparatus for sputter deposition
07/21/2004EP1145269B1 Method for generating a pulsed electron beam and a trigger plasma source for carrying out said method
07/21/2004EP0885455B1 Device for generating powerful microwave plasmas
07/21/2004CN1515019A Gas distribution plate electrode for plasma reactor
07/21/2004CN1515018A Plasma processor
07/21/2004CN1158405C Device for treating container with microwave plasma
07/21/2004CN1158404C Plasma processing system and method
07/20/2004US6765466 Magnetic field generator for magnetron plasma
07/20/2004US6765219 Hybrid scanning system and methods for ion implantation
07/20/2004US6765217 Charged-particle-beam mapping projection-optical systems and methods for adjusting same
07/20/2004US6765205 Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same
07/20/2004US6765202 Microscope having an electron beam for illumination
07/20/2004US6764925 Semiconductor device manufacturing system and electron beam exposure apparatus
07/20/2004US6764743 Honeycomb structure; automobile exhaust system; air pollution control
07/20/2004US6764658 Electrocconductive, monolithic electrode overcoated with dielectric; positioning within gas passageways
07/20/2004US6764606 Method and apparatus for plasma processing
07/20/2004US6764575 Magnetron plasma processing apparatus
07/20/2004US6764550 Apparatus for evaluating plasma polymerized polymer layer using UV spectrometer
07/20/2004US6764383 Methods and apparatuses for processing microfeature workpiece samples
07/15/2004WO2004059716A1 A system and method for controlling plasma with an adjustable coupling to ground circuit
07/15/2004WO2004059712A1 Method, apparatus and magnet assembly for enhancing and localizing a capacitively coupled plasma
07/15/2004WO2004059702A2 Method and apparatus for monitoring a material processing system
07/15/2004WO2004059691A1 Secondary electron detector, especially in a scanning electron microscope
07/15/2004WO2004059690A1 An extractor for an microcoloum, an alignment method for an extractor aperture to an electon emitter, and a measuring method and an alignment method using thereof
07/15/2004WO2004059689A2 Method and apparatus for monitoring a plasma in a material processing system
07/15/2004WO2004059405A2 Method and apparatus for monitoring parts in a material processing system
07/15/2004WO2004059033A2 Blocker plate bypass arrangement to improve clean rate at the edge of a processing chamber
07/15/2004WO2004042788A3 Method and apparatus for determining an etch property using an endpoint signal
07/15/2004WO2004042770A3 Energy filter image generator for electrically charged particles and the use thereof
07/15/2004WO2004032194A3 Method and system for analyzing data from a plasma process
07/15/2004WO2003096382A3 Methods and apparatus for plasma processing control
07/15/2004WO2003073448A3 Control of semiconductor fabrication process using scanning electron microscopy and a focused ion beam device
07/15/2004WO1999041766A9 Reactor for chemical vapor deposition of titanium
07/15/2004US20040137760 Thin film processing method and system
07/15/2004US20040137746 Semiconductor device manufacturing system for etching a semiconductor by plasma discharge
07/15/2004US20040137647 Electronic device, production method thereof, and plasma process apparatus
07/15/2004US20040137519 Method for localizing and identifying epitopes
07/15/2004US20040137147 improved corrosion resistance within plasma chambers; chemical vapor deposition
07/15/2004US20040135983 Lithography system
07/15/2004US20040135590 Impedance monitoring system and method
07/15/2004US20040135526 Device and method for controlling focussed electron beams
07/15/2004US20040135519 Electronic device with wide lens for small emission spot size
07/15/2004US20040135518 Hot electron emission array for e-beam photolitography and display screens
07/15/2004US20040135515 Electron beam apparatus and device manufacturing method using same
07/15/2004US20040135102 Charged-particle-beam exposure apparatus and method of controlling same
07/15/2004US20040135101 Pattern drawing method by scanning beam and pattern drawing apparatus
07/15/2004US20040135096 Microfabrication apparatus and microfabrication method
07/15/2004US20040135083 Bio electron microscope and observation method of specimen
07/15/2004US20040135082 Electron beam apparatus and method for production of its specimen chamber
07/15/2004US20040134776 Assemblies comprising molybdenum and aluminum; and methods of utilizing interlayers in forming target/backing plate assemblies
07/15/2004US20040134771 Vacuum arc deposition apparatus
07/15/2004US20040134770 for applying one or more thin film materials into or onto a substrate by selectively controlling the depositing plasma constituents that will reach a substrate from a cathode using cathodic arc deposition
07/15/2004US20040134618 Plasma processing apparatus and focus ring
07/15/2004US20040134616 High-frequency plasma processing apparatus
07/15/2004US20040134614 Apparatus and method of improving impedance matching between an rf signal and a multi- segmented electrode
07/15/2004US20040134613 Device and method for plasma processing, and slow-wave plate
07/15/2004US20040134612 processed seed fiber suitable for other uses in papermaking or as a food additive for human consumption; corn, oats, soybeans; slurrying fiber in a dilute acid solution and washing; modifying agent step preferably includes an acid chlorite solution or a peroxide solution for improved brightness
07/15/2004US20040134611 Plasma process system and plasma process method
07/15/2004US20040134610 Semiconductor device manufacturing system for etching a semiconductor by plasma discharge
07/15/2004US20040134609 Semiconductor device manufacturing system for etching a semiconductor by plasma discharge
07/15/2004US20040134431 Diamond film depositing apparatus using microwaves and plasma
07/15/2004US20040134427 Deposition chamber surface enhancement and resulting deposition chambers