Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
10/2004
10/14/2004WO2004087991A1 Thin film forming apparatus and method for forming thin film
10/14/2004WO2004087990A1 Plasma cvd method using ultrashort wave and plasma cvd apparatus
10/14/2004WO2004087987A1 Electric arc evaporation source
10/14/2004WO2004087986A1 Method and apparatus for depositing material on a substrate
10/14/2004WO2004061902A3 Method and apparatus for monitoring a material processing system
10/14/2004WO2004051696A3 One dimensional beam blanker array
10/14/2004WO2004030021A3 Sputter-coating interior surfaces
10/14/2004WO2004015736A3 Low loss rf bias electrode for a plasma reactor with enhanced wafer edge rf coupling and highly efficient wafer cooling
10/14/2004US20040205686 Fracturing polygons used in a lithography process for fabricating an integrated circuit
10/14/2004US20040203249 Dummy copper deprocessing
10/14/2004US20040203177 Method and system for monitoring an etch process
10/14/2004US20040201834 Stage apparatus and its driving method, exposure apparatus and device manufacturing method
10/14/2004US20040200718 Plasma processing method and apparatus
10/14/2004US20040200419 Explosion welded design for cooling components
10/14/2004US20040200417 Very low temperature CVD process with independently variable conformality, stress and composition of the CVD layer
10/14/2004DE10310518A1 Dreidimensionale Abbildung der chemischen Oberflächenzusammensetzung von Objekten Three-dimensional imaging of the surface chemical composition of objects
10/14/2004DE10296931T5 Plasmabehandlungseinrichtung, Plasmabehandlungsverfahren, und Verfahren zur Herstellung eines Halbleiterbauelements Plasma processing apparatus, plasma processing method, and process for producing a semiconductor device
10/13/2004EP1466999A1 Method for connecting magnetic substance target to backing plate and magnetic substance target
10/13/2004CN1537406A 等离子体装置及等离子体生成方法 Plasma apparatus and method for generating plasma
10/13/2004CN1537405A Antenna structure for inductively coupled plasma generator
10/13/2004CN1537318A Sputtering magnetron arrangements with adjustable magnetic field strength
10/13/2004CN1536626A Clamping chuck equipment
10/13/2004CN1536625A Plasma etching method and equipment for making semiconductor device
10/13/2004CN1536345A Scanning electronic microscope standard substance and its making method
10/13/2004CN1171275C Method for structured energy transmission using electron beams
10/13/2004CN1170957C Processing chamber for atomic layer deposition processes
10/12/2004US6804572 Enhanced process and profile simulator algorithms
10/12/2004US6804288 Electron beam exposure apparatus and electron beam deflection apparatus
10/12/2004US6803590 Ion beam mass separation filter, mass separation method thereof and ion source using the same
10/12/2004US6803589 Apparatus and method applied to exposure by charged beam
10/12/2004US6803584 Electron beam control device
10/12/2004US6803583 Scintillator for electron microscope and method of making
10/12/2004US6803582 One dimensional beam blanker array
10/12/2004US6803573 Scanning electron microscope
10/12/2004US6803572 Apparatus and methods for secondary electron emission microscope with dual beam
10/12/2004US6803571 Method and apparatus for dual-energy e-beam inspector
10/12/2004US6803570 Electron transmissive window usable with high pressure electron spectrometry
10/12/2004US6802986 Low-aberration deflectors for use in charged-particle-beam optical systems, and methods for fabricating such deflectors
10/12/2004US6802949 Method for manufacturing half-metallic magnetic oxide and plasma sputtering apparatus used in the same
10/12/2004CA2370337C Device for treating a container with microwave plasma
10/07/2004WO2004086483A1 Plasma film-forming method and plasma film-forming apparatus
10/07/2004WO2004086480A1 Method for cleaning plasma processing apparatus and plasma processing apparatus
10/07/2004WO2004086452A2 Charged particle beam device
10/07/2004WO2004086451A2 Plasma generation using multi-step ionization
10/07/2004WO2004085959A1 Sample observing apparatus, edge position calculating device, and program
10/07/2004WO2004085902A1 Universal vacuum coupling for cylindrical target
10/07/2004WO2004085704A1 Processor
10/07/2004WO2004085693A2 Nonthermal plasma processor utilizing additive-gas injection and/or gas extraction
10/07/2004WO2004042772A3 Methods and apparatus for ion beam neutralization in magnets
10/07/2004WO2004030013A8 Baffle plate in a plasma processing system
10/07/2004US20040197938 Monitoring method of processing state and processing unit
10/07/2004US20040196127 Variable field magnet apparatus
10/07/2004US20040195972 Plasma generator useful for ion beam generation
10/07/2004US20040195528 Ion beam incident angle detector for ion implant systems
10/07/2004US20040195526 Energy beam irradiating apparatus
10/07/2004US20040195525 Apparatus and method for reducing the electron-beam-induced deposition of contamination products
10/07/2004US20040195524 Ion doping apparatus, and multi-apertured electrode for the same
10/07/2004US20040195523 Device for reducing the impact of distortions in a microscope
10/07/2004US20040195522 Charged particle beam microscope with minicolumn
10/07/2004US20040195520 Ion detector
10/07/2004US20040195506 Electron holography method
10/07/2004US20040195216 Apparatus and method for plasma processing
10/07/2004US20040195208 Method and apparatus for performing hydrogen optical emission endpoint detection for photoresist strip and residue removal
10/07/2004US20040194890 Hybrid plasma processing apparatus
10/07/2004US20040194709 Plasma treatment apparatus
10/07/2004DE4418930B4 Verfahren zum Erzeugen von Mustern auf Substraten mittels Korpuskularstrahl-Lithographie The method for generating patterns on substrates by means of corpuscular beam lithography
10/07/2004DE10313644A1 Vorrichtung und Verfahren zum Reduzieren der elektronenstrahlinduzierten Abscheidung von Kontaminationsprodukten Apparatus and method for reducing the electron beam induced deposition of contamination products
10/07/2004DE10312632A1 Magnetron for coating flat glass by sputtering comprises a longitudinal hollow target construction which rotates in a vacuum chamber, a magnet construction arranged within the target construction, and a coolant cycle
10/07/2004DE10312631A1 Magnetron mit Kühlmittelschutz Magnetron with coolant protection
10/07/2004DE10156615B4 Einrichtung zur Erzeugung eines örtlich variierbaren Elektron-Zyklotron-Resonanz-Mikrowellen-Niederdruckplasmas Means for generating a locally variable electron cyclotron resonance microwave plasma low pressure
10/06/2004EP1465243A2 Dummy copper deprocessing
10/06/2004EP1465229A1 Apparatus and method for controlling the beam current of a charged particle beam
10/06/2004EP1464067A1 Uniformity control for plasma doping systems
10/06/2004EP1280192B1 Device for forming nanostructures on the surface of a semiconductor wafer by means of ion beams
10/06/2004EP0938634A4 Gas panel
10/06/2004CN1535470A Adjustable conductance limiting aperture for ion implanters
10/06/2004CN1535327A Sputtering device
10/06/2004CN1534737A 干式蚀刻装置及干式蚀刻方法 The dry etching apparatus and a dry etching method
10/06/2004CN1169998C Magnet device with high target utilization ratio used for sputtering target with conical butt
10/05/2004US6800989 Method of forming filament for electron beam emitter
10/05/2004US6800864 Method and structure for reducing effects of noise and resonance associated with an e-beam lithography tool
10/05/2004US6800863 Method for monitoring an ion implanter and ion implanter having a shadow jig for performing the same
10/05/2004US6800862 Ion implanting apparatus and ion implanting method
10/05/2004US6800853 Electron microscope and method of photographing TEM images
10/05/2004US6800256 Scaleable inter-digitized tine non-thermal plasma reactor
10/05/2004US6800183 Sputtering device
10/05/2004US6800177 Apparatus and method for fabricating carbon thin film
10/05/2004US6800173 Variable gas conductance control for a process chamber
10/05/2004US6799531 Method for making films utilizing a pulsed laser for ion injection and deposition
09/2004
09/30/2004WO2004084588A1 Magnetron comprising a coolant shield
09/30/2004WO2004084394A1 Power supply unit for a gas discharge process
09/30/2004WO2004084254A1 Wien-type monochromator with aberration correction
09/30/2004WO2004083486A1 Method and apparatus for plasma cdv by use of ultrashort wave
09/30/2004WO2004082830A2 Sample manipulation system
09/30/2004WO2004053921A3 Current-stabilizing illumination of photocathode electron beam source
09/30/2004WO2004031435A3 High-power pulsed magnetron sputtering
09/30/2004WO2004027448A3 Methods and apparatus for precise measurement of time delay between two signals
09/30/2004US20040191936 Real-time in-line testing of semiconductor wafers
09/30/2004US20040191931 Method of implanting a substrate and an ion implanter for performing the method
09/30/2004US20040191545 Electroplating a layer of yttrium onto the surface, then electroplating a second layer of aluminum or zirconium onto the first layer, and annealing the first and second layers to form mixed oxide; corrosion resistance