Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
11/2004
11/18/2004WO2004077894A3 Method and system for providing impedance matching network and network assembly
11/18/2004US20040229419 Gas processing device and method of fabricating a semiconductor device
11/18/2004US20040227937 Test slide for microscopes and method for the production of such a slide
11/18/2004US20040227531 Semiconductor device test method and semiconductor device tester
11/18/2004US20040227470 Thin magnetron structures for plasma generation in ion implantation systems
11/18/2004US20040227106 System and methods for ion beam containment using localized electrostatic fields in an ion beam passageway
11/18/2004US20040227105 Hybrid magnetic/electrostatic deflector for ion implantation systems
11/18/2004US20040227100 Vibration-Isolating Coupling Including An Elastomer Diaphragm For Scanning Electron Microscope And The Like
11/18/2004US20040227099 Charged-particle optical system
11/18/2004US20040227082 TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope
11/18/2004US20040227081 Electron beam apparatus
11/18/2004US20040227080 Particle detectors
11/18/2004US20040227079 Inspection apparatus for circuit pattern
11/18/2004US20040227078 Defect inspection instrument and positron beam apparatus
11/18/2004US20040227077 Electron microscopes exhibiting improved imaging of specimen having chargeable bodies
11/18/2004US20040227074 High mass resolution magnet for ribbon beam ion implanters
11/18/2004US20040226831 Providing a substrate, electrodes that reside within a target area; passing a gas mixture comprising a reducing gas through the target area; supplying an amount of energy toand/or electrodes to generate electrons; contacting substrate with negatively charged reducing gas to reduce metal oxides
11/18/2004US20040226815 Plasma processing apparatus and control method thereof
11/18/2004US20040226658 Multi-core transformer plasma source
11/18/2004US20040226657 Plasma density, energy and etch rate measurements at bias power input and real time feedback control of plasma source and bias power
11/18/2004US20040226512 Multi-core transformer plasma source
11/18/2004US20040226511 Multi-core transformer plasma source
11/18/2004DE10318364A1 Einrichtung zum Beschichten eines stationär angeordneten Substrats durch Puls-Magnetron-Sputtern Means for coating a stationarily arranged substrate by pulsed magnetron sputtering
11/18/2004DE10318363A1 Process for the plasma-activated high rate vaporization of a large surface substrate in a vacuum comprises producing a magnetic field diverging in the direction of the substrate, and further processing
11/18/2004DE10317894A1 Fokussiersystem für geladene Teilchen, Elektronenmikroskopiesystem und Elektronenmikroskopieverfahren Focusing of charged particles, electron microscopy and electron microscopy system method
11/17/2004EP1476891A1 Sputtering cathode and device and method for coating a substrate with several layers
11/17/2004EP1476890A2 Phase plate for electron microscopy and electron microscopic imaging
11/17/2004EP1476588A1 Method of cleaning the surface of a material coated with an organic substance and a generator and device for carrying out said method
11/17/2004CN1547240A Ion implantation machine
11/17/2004CN1176405C Emission photoetching method and device using transmitter with pattern
11/17/2004CN1176369C Charge testing method for insulating material
11/16/2004US6819096 Power measurement mechanism for a transformer coupled plasma source
11/16/2004US6819052 Coaxial type impedance matching device and impedance detecting method for plasma generation
11/16/2004US6818941 Thin film electron emitter, display device using the same and applied machine
11/16/2004US6818911 Array structure and method of manufacturing the same, charged particle beam exposure apparatus, and device manufacturing method
11/16/2004US6818910 Writing methodology to reduce write time, and system for performing same
11/16/2004US6818909 Ion sources for ion implantation apparatus
11/16/2004US6818906 Electron beam position reference system
11/16/2004US6818902 Positron source
11/16/2004US6818852 Microwave plasma processing device, plasma processing method, and microwave radiating member
11/16/2004US6818562 Method and apparatus for tuning an RF matching network in a plasma enhanced semiconductor wafer processing system
11/16/2004US6818560 Plasma processing apparatus and plasma processing method
11/16/2004US6818364 Charged particle beam exposure apparatus and exposure method
11/16/2004US6818140 Low ceiling temperature process for a plasma reactor with heated source of a polymer-hardening precursor material
11/16/2004US6818097 Highly heat-resistant plasma etching electrode and dry etching device including the same
11/16/2004US6818096 Heat conductivity; uniform cooling
11/16/2004US6818067 Processing chamber for atomic layer deposition processes
11/11/2004WO2004097919A1 Process gas introducng mechanism and plasma processing device
11/11/2004WO2004097909A2 Method and apparatus for deep trench silicon etch
11/11/2004WO2004097890A2 Objective lens arrangement for use in a charged particle beam column
11/11/2004WO2004097881A2 Beam uniformity and angular distribution measurement system
11/11/2004WO2004097378A1 Apparatus and method for inspecting a sample of a specimen by means of an electron beam
11/11/2004WO2004077502A3 Ecr-plasma source and methods for treatment of semiconductor structures
11/11/2004WO2004068559A3 Helix coupled remote plasma source
11/11/2004WO2004051695A3 Arc evaporation device
11/11/2004WO2001073940A3 Circuit arrangement for impedance compensation
11/11/2004US20040224237 photomasks/photoresists; scanning electron microscopy; microelectronics
11/11/2004US20040224128 Low contamination plasma chamber components and methods for making the same
11/11/2004US20040223579 Antenna structure for inductively coupled plasma generator
11/11/2004US20040222806 Semiconductor device test method and semiconductor device tester
11/11/2004US20040222745 Generation of Uniformly-Distributed Plasma
11/11/2004US20040222391 Device and process for switching and controlling an electron dose emitted by a micro-emitter
11/11/2004US20040222390 Adjustable implantation angle workpiece support structure for an ion beam implanter
11/11/2004US20040222389 Method of and apparatus for measurement and control of a gas cluster ion beam
11/11/2004US20040222388 Surface processing apparatus
11/11/2004US20040222386 Method for detecting and compensating for positional displacements in photolithographic mask units and apparatus for carrying out the method
11/11/2004US20040222385 Substrate testing device and substrate testing method
11/11/2004US20040222382 Devices incorporating soft ionization membrane
11/11/2004US20040222377 Patterned wafer inspection method and apparatus therefor
11/11/2004US20040222376 Charged particle beam apparatus
11/11/2004US20040222375 Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus
11/11/2004US20040222371 Soft ionization device and applications thereof
11/11/2004US20040222367 Beam source and beam processing apparatus
11/11/2004US20040222189 Apparatus and method for radio frequency decoupling and bias voltage control in a plasma reactor
11/11/2004US20040222188 Method of cleaning a deposition chamber and apparatus for depositing a metal on a substrate
11/11/2004US20040222184 High frequency power source and its control method, and plasma processing apparatus
11/11/2004US20040222090 Carbon fiber and copper support for physical vapor deposition target assemblies
11/11/2004US20040222087 Magnetron executing planetary motion adjacent a sputtering target
11/11/2004US20040222082 sputter etching of only selected portions of material deposited in and around high aspect-ratio holes; new tool at controlling the sputtering profile into challenging geometries; Ion sources may be specially designed for semiconductor processing to provide superior performance and fabricational results
11/11/2004US20040221959 Anodized substrate support
11/11/2004US20040221958 RF pulsing of a narrow gap capacitively coupled reactor
11/11/2004US20040221957 Method system and computer readable medium for monitoring the status of a chamber process
11/11/2004US20040221816 Plasma processing apparatus
11/11/2004US20040221815 Beam source and beam processing apparatus
11/11/2004US20040221814 Inductively coupled plasma processing apparatus having internal linear antenna for large area processing
11/11/2004US20040221809 Plasma processing apparatus
11/11/2004US20040221800 Method and apparatus for plasma processing
11/11/2004DE10317027A1 Hochfrequenz-Plasmastrahlquelle und Verfahren zum Bestrahlen einer Oberfläche High-frequency plasma jet source and method for irradiating a surface
11/11/2004DE10141142B4 Einrichtung zur reaktiven Plasmabehandlung von Substraten und Verfahren zur Anwendung Means for reactive plasma treatment of substrates and methods of using
11/10/2004EP1475824A1 Plasma film forming system
11/10/2004EP1475820A1 Electrode for plasma processes and method for manufacture and use thereof
11/10/2004EP1475460A1 Anodized substrate support
11/10/2004EP1475458A1 Apparatus for coating a substrate.
11/10/2004EP1475179A2 Electrode assembly for the removal of surface oxides by electron attachment
11/10/2004EP1474958A1 Microwave plasma source
11/10/2004EP1474264A1 A plasma processing apparatus and method
11/10/2004CN1545722A Plasma reactor coil magnet
11/10/2004CN1545721A Method and apparatus for improved ion bunching in an ion implantation system
11/10/2004CN1545720A Slit double gap buncher and method for improved ion bunching in an ion implantation system
11/10/2004CN1175477C Plasma treatment device and plasma treatment method