Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
05/2006
05/03/2006EP1651378A2 Method and device for non-vacuum electron beam welding metallic materials
05/03/2006EP1218919B1 Electron image detector coupled by optical fibers with absorbing outer cladding to reduce blurring
05/03/2006EP1105917B1 Elastomer bonded parts for plasma processes and method for manufacture and use thereof
05/03/2006EP1019942B1 Electron beam microscope using electron beam patterns
05/03/2006CN1768341A A method for adjoining adjacent coatings on a processing element
05/03/2006CN1254844C Method and device for separating ion mass, and ion doping device
05/02/2006US7039487 Exposure apparatus and exposure method
05/02/2006US7038767 Three-dimensional micropattern profile measuring system and method
05/02/2006US7038389 Magnetron plasma source
05/02/2006US7038364 Processor and method for processing
05/02/2006US7038226 Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method
05/02/2006US7038225 Method and apparatus for electron beam processing of substrates
05/02/2006US7038224 Contact opening metrology
05/02/2006US7038223 Controlled charge neutralization of ion-implanted articles
05/02/2006US7038218 Inspection by a transmission electron microscope of a sample
05/02/2006US7038204 Method for reducing proximity effects in electron beam lithography
05/02/2006US7037846 Method and apparatus for micro-jet enabled, low energy ion generation and transport in plasma processing
05/02/2006US7037813 Plasma immersion ion implantation process using a capacitively coupled plasma source having low dissociation and low minimum plasma voltage
05/02/2006US7037735 Apparatus and method for testing defects
05/02/2006US7036980 Apparatus and method for forming pattern
04/2006
04/27/2006WO2006044722A2 Apparatus and methods for improving the stability of rf power delivery to a plasma load
04/27/2006WO2006044419A2 Magnetic-field concentration in inductively coupled plasma reactors
04/27/2006WO2006044021A1 Substrate carrier for parallel wafer processing reactor
04/27/2006WO2006043366A1 Voltage division resistor for acceleration tubes, acceleration tube, and accelerator
04/27/2006WO2005123979A3 Method and device for plasma-treating workpieces
04/27/2006WO2005099320A3 Method and device for producing low-pressure plasma and the use thereof
04/27/2006US20060088989 Method of introducing impurity, device and element
04/27/2006US20060086605 Method for magnetron sputtering
04/27/2006US20060086322 Device for production of a plasma sheet
04/27/2006DE4405747B4 Magnetfeldunterstützte Zerstäubungsanordnung und hiermit ausgerüstete Vakuumbehandlungsanlage Magnetic field-assisted atomization system and hereby equipped vacuum treatment plant
04/27/2006DE102004019741B4 Plasmareaktor zur Oberflächenmodifikation von Gegenständen A plasma reactor for surface modification of articles
04/27/2006DE102004010535B4 Movement drive for use in e.g. ion processing equipment, has pendulum holding devices with axles that intersect at right angles, such that oscillating motion of torque motors, arranged outside vacuum container, is directly realized at axles
04/26/2006EP1650326A2 Plasma processing apparatus
04/26/2006EP1650324A2 Sputter coating system and method of sputter coating
04/26/2006EP1650321A2 A sputtering system
04/26/2006EP1649485A2 Laser stimulated atom probe characterization of semiconductor and dielectric structures
04/26/2006EP1649484A1 Sliding anode for a magnetron sputtering source
04/26/2006EP1649483A1 A method for manufacturing a lens assembly of microcolumn and a lens assembly of microcolumn manufactured by the same
04/26/2006EP1649269A2 Method for measuring physical parameters of at least one micrometric or nanometric dimensional phase in a composite system
04/26/2006EP1626433A9 Magnetron sputtering device, cylinder cathode and a method of applying thin multi-component films to a substrate
04/26/2006EP1012865A4 Method and apparatus for controlling a workpiece in a vacuum chamber
04/26/2006CN1765008A Plasma igniting method and substrate processing method
04/26/2006CN1765007A Production method for antenna and production device for antenna
04/26/2006CN1764738A Apparatus and method for depositing large area coating on explanate surface
04/26/2006CN1764736A Apparatus and methods for ionized deposition of a film or thin layer
04/26/2006CN1764596A Method for fabricating three-dimensional microstructure by fib-cvd and drawing system for three-dimensional microstructure
04/26/2006CN1253918C Plasma processing system and method therefor
04/26/2006CN1253917C Vacuum circuit for device for treating receptacle with low pressure plasma
04/25/2006US7034543 Method of predicting a lifetime of filament in ion source and ion source device
04/25/2006US7034321 Electron beam exposure apparatus and electron beam measurement module
04/25/2006US7034319 Electron beam irradiation apparatus, electron beam irradiation method, original disk, stamper, and recording medium
04/25/2006US7034318 Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and stencil mask
04/25/2006US7034316 Sample carrier for carrying a sample to be irradiated with an electron beam
04/25/2006US7034315 Particle source with selectable beam current and energy spread
04/25/2006US7034314 Projection apparatus for projecting a pattern formed on a mask onto a substrate and a control method for a projection apparatus
04/25/2006US7034299 Transmission electron microscope system and method of inspecting a specimen using the same
04/25/2006US7034298 Inspection method and apparatus using an electron beam
04/25/2006US7034297 Method and system for use in the monitoring of samples with a charged particle beam
04/25/2006US7034296 Method of forming a sample image and charged particle beam apparatus
04/25/2006US7034295 Photoemission electron microscopy and measuring method using the microscopy
04/25/2006US7034285 Beam source and beam processing apparatus
04/25/2006US7033937 Apparatus and method for use in manufacturing a semiconductor device
04/25/2006US7033462 Generation and control of a magnetic field by a magnetic filter.
04/25/2006US7032536 Thin film formation apparatus including engagement members for support during thermal expansion
04/20/2006WO2006042167A1 Ion beam implant current, spot width and position tuning
04/20/2006WO2006040559A1 A particle beam generating device
04/20/2006WO2006014632A3 Improved magnet for scanning ion beams
04/20/2006WO2005048284A3 Rotating sputtering magnetron
04/20/2006US20060084269 Apparatus for generating gas plasma, gas composition for generating plasma and method for manufacturing semiconductor device using the same
04/20/2006US20060082755 Stage system, exposure apparatus, and device manufacturing method
04/20/2006US20060082225 Linear motor, moving stage system, exposure apparatus, and device manufacturing method
04/20/2006US20060081564 Method and system for arc suppression in a plasma processing system
04/20/2006US20060081558 Plasma immersion ion implantation process
04/20/2006US20060081183 Plasma treatment processing apparatus
04/20/2006US20060080851 Process for monitoring measuring device performance
04/20/2006DE19853943B4 Katode zur Zerstäubung oder Bogenaufdampfung sowie Vorrichtung zur Beschichtung oder Ionenimplantation mit einer solchen Katode Cathode atomization or Bogenaufdampfung and apparatus for coating or ion implantation with such a cathode
04/20/2006DE102005049233A1 Verfahren und Vorrichtung zum Zerstäuben Method and apparatus for atomizing
04/20/2006DE102005049066A1 Elektronenstrahl-Einrichtung und Verfahren zum Herstellen einer Halbleitervorrichtung Electron beam device and method of manufacturing a semiconductor device
04/20/2006DE102005048677A1 Transmissionselektronenmikroskop und Bildbetrachtungsverfahren unter Verwendung desselben The same transmission electron microscope and image viewing method using
04/20/2006DE102004048892A1 Beleuchtungssystem für eine Korpuskularstrahleinrichtung und Verfahren zur Beleuchtung mit einem Korpuskularstrahl An illumination system for a corpuscular beam device and method of illuminating with a particle beam
04/20/2006DE102004014430A1 Vorrichtung und Verfahren zur nasschemischen Präparation von hochreinen Festkörperoberflächen Apparatus and method for wet chemical preparation of highly pure solid surfaces
04/20/2006DE10038145B4 Einrichtung zur Behandlung von Werkstücken mit Elektronenstrahlen Apparatus for the treatment of work pieces using electron beams
04/19/2006EP1648018A1 Focussing lens and charged particle beam device for non zero landing angle operation
04/19/2006EP1647054A2 Plasma processing apparatus
04/19/2006EP1647049A2 Method and system for electronic spatial filtering of spectral reflectometer optical signals
04/19/2006EP1579027B1 Plasma-enhanced film deposition
04/19/2006EP1392883A4 Assemblies comprising molybdenum and aluminum; and methods of utilizing interlayers in forming target/backing plate assemblies
04/19/2006CN1762087A Power supply unit for gas discharge processes
04/19/2006CN1762044A Substrate processor and method of manufacturing device
04/19/2006CN1762039A Method and apparatus for cleaning of native oxide with hydrogen-containing radicals
04/19/2006CN1761832A Universal vacuum coupling for cylindrical target
04/19/2006CN1252792C Electrode assembly
04/19/2006CN1252544C Proximity effect correction method of electronic beam exposure and use thereof
04/19/2006CN1252313C Method of cleaning and conditioning plasma reaction chamber
04/18/2006USRE39064 Electronic device manufacturing apparatus and method for manufacturing electronic device
04/18/2006US7030979 Microwave plasma source
04/18/2006US7030964 Stage system, exposure apparatus, and device manufacturing method
04/18/2006US7030396 Medical particle irradiation apparatus
04/18/2006US7030395 Workpiece support structure for an ion beam implanter featuring spherical sliding seal vacuum feedthrough
04/18/2006US7030394 Charged particle beam apparatus and automatic astigmatism adjustment method