Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
02/2007
02/27/2007US7183514 Helix coupled remote plasma source
02/27/2007US7183177 Silicon-on-insulator wafer transfer method using surface activation plasma immersion ion implantation for wafer-to-wafer adhesion enhancement
02/27/2007US7182880 Process for reducing particle formation during etching
02/27/2007US7182843 Rotating sputtering magnetron
02/27/2007US7182842 Device for amplifying the current of an abnormal electrical discharge and system for using an abnormal electrical discharge comprising one such device
02/27/2007US7182816 Particulate reduction using temperature-controlled chamber shield
02/22/2007WO2007022144A1 Optical emission interferometry for pecvd using a gas injection hole
02/22/2007WO2007021522A1 Thermal management of inductively coupled plasma reactors
02/22/2007WO2007021521A2 Two-piece dome with separate rf coils for inductively coupled plasma reactors
02/22/2007WO2007021520A2 Substrate support for increasing substrate temperature in plasma reactors
02/22/2007WO2007021176A1 Movement platform for carrier with 5 degrees of freedom
02/22/2007WO2007021163A1 Detector for electron column and method for detecting electrons for electron column
02/22/2007WO2007021162A1 Method for changing energy of electron beam in electron column
02/22/2007WO2007020866A1 Detection device and inspection device
02/22/2007WO2007020374A1 Method of treating a gas stream
02/22/2007WO2007020373A1 Microwave plasma reactor
02/22/2007WO2007020212A1 Treatment station for particle bombardment of a patient and a particle therapy installation
02/22/2007WO2006135924A9 Improvement of etch rate uniformity using the independent movement of electrode pieces
02/22/2007US20070040131 Super alloy ionization chamber for reactive samples
02/22/2007US20070040128 Processing apparatus using focused charged particle beam
02/21/2007EP1755131A2 Electron beam irradiating apparatus
02/21/2007EP1755001A1 Electron beam position fluctuation measurement method, electron beam position fluctuation measurement device, and electron beam recording device
02/21/2007EP1754243A1 Device and method for atomising with the aid of a displaceable planar target
02/21/2007EP1753891A2 Msvd coating process
02/21/2007EP1753549A2 Methods for wet cleaning quartz surfaces of components for plasma processing chambers
02/21/2007CN1918484A Beam measuring equipment and beam measuring method using the same
02/21/2007CN1917164A Electrostatically clamped edge ring for plasma processing
02/21/2007CN1917131A Filament of neutralization cathode in Kaufman ion source, and method
02/20/2007US7180317 High resolution analytical probe station
02/20/2007US7180231 Electron beam emitter
02/20/2007US7180062 Pattern measuring method
02/20/2007US7179663 CDA controller and method for stabilizing dome temperature
02/20/2007US7179569 Method for manufacturing a semiconductor device, stencil mask and method for manufacturing the same
02/20/2007US7179352 Vacuum treatment system and process for manufacturing workpieces
02/20/2007US7179350 Reactive sputtering of silicon nitride films by RF supported DC magnetron
02/20/2007US7179148 Cathode with improved work function and method for making the same
02/20/2007US7178387 Method and apparatus for scanning in scanning probe microscopy and presenting results
02/15/2007WO2007017528A1 Cathodic arc evaporation device and method of igniting said arc
02/15/2007WO2007017255A1 Particle-optical system
02/15/2007WO2006135939A3 Microsystem manipulation apparatus
02/15/2007WO2006097804B1 System and process for high-density,low-energy plasma enhanced vapor phase epitaxy
02/15/2007WO2006089021A3 Ion beam measurement apparatus and method
02/15/2007US20070037532 Radio frequency excitation arrangement including a limiting circuit
02/15/2007US20070037367 Apparatus for plasma doping
02/15/2007US20070037071 Method for removing defect material of a lithography mask
02/15/2007US20070036895 Deposition methods utilizing microwave excitation
02/15/2007US20070034812 Method of modulating laser-accelerated protons for radiation therapy
02/15/2007US20070034797 Electron beam apparatus, and inspection instrument and inspection process thereof
02/15/2007US20070034498 Pulsed magnetron sputtering deposition with preionization
02/15/2007US20070034497 High-density plasma source
02/15/2007US20070034337 Method and apparatus for an improved upper electrode plate with deposition shield in a plasma processing system
02/15/2007US20070034157 Plasma processing apparatus and plasma processing method
02/15/2007US20070034156 Method and apparatus for precision coating of molecules on the surfaces of materials and devices
02/15/2007US20070034154 Plasma source assembly and method of manufacture
02/14/2007EP1753122A1 Movement platform for carrier with five degrees of freedom
02/14/2007EP1753011A1 Method for providing control signals for high frequency power generators
02/14/2007EP1753010A1 Particle-optical system
02/14/2007EP1753009A1 Charge neutralizing device
02/14/2007EP1752992A1 Apparatus for the adaption of a particle beam parameter of a particle beam in a particle beam accelerator and particle beam accelerator with such an apparatus
02/14/2007EP1752558A1 Film forming apparatus
02/14/2007EP1752557A1 Vacuum coating apparatus with powered rotating cathode
02/14/2007EP1752556A1 Tubular cathode for use in sputtering.
02/14/2007EP1751784A2 Apparatus for blanking a charged particle beam
02/14/2007EP1751783A1 Charged particle gun
02/14/2007EP1266412B1 Method and device for transferring spin-polarized charge carriers
02/14/2007EP1125002A4 Systems and methods for two-sided etch of a semiconductor substrate
02/14/2007EP0914496A4 Microwave applicator for an electron cyclotron resonance plasma source
02/14/2007CN1914716A Method for cleaning process chamber of substrate processing apparatus, substrate processing apparatus, and method for processing substrate
02/14/2007CN1914714A Substrate processing system and process for fabricating semiconductor device
02/14/2007CN1914712A Temperature controlled hot edge ring assembly for reducing plasma reactor etch rate drift
02/14/2007CN1914351A Selectable dual position magnetron
02/14/2007CN1912175A Vacuum-coating machine with motor-driven rotary cathode
02/14/2007CN1300374C Cerium oxide containing ceramic components and coatings in semiconductor processing equipment
02/13/2007US7177781 Method and system for electron density measurement
02/13/2007US7177020 Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process
02/13/2007US7176634 Coaxial type impedance matching device and impedance detecting method for plasma generation
02/13/2007US7176610 High brightness thermionic cathode
02/13/2007US7176471 Electron beam exposure method and electron beam exposure apparatus
02/13/2007US7176468 Method for charging substrate to a potential
02/13/2007US7176459 Electron beam apparatus
02/13/2007US7176458 Method and apparatus for specimen fabrication
02/13/2007US7176403 Method and apparatus for the compensation of edge ring wear in a plasma processing chamber
02/13/2007US7175952 Method of generating mask distortion data, exposure method and method of producing semiconductor device
02/13/2007US7175875 Method and apparatus for plasma processing
02/13/2007US7175714 Electrode-built-in susceptor and a manufacturing method therefor
02/13/2007US7175713 Apparatus for cyclical deposition of thin films
02/08/2007WO2007015445A1 Plasma generator and film forming method employing same
02/08/2007WO2007015306A1 Charged particle beam plotting device and method
02/08/2007WO2007001321A8 Atom probe electrode treatments
02/08/2007WO2006130546A3 Plasma resistant seal assembly with replaceable barrier shield
02/08/2007US20070032090 Plasma rapid thermal process apparatus in which supply part of radical source is improved
02/08/2007US20070032048 Method for depositing thin film by controlling effective distance between showerhead and susceptor
02/08/2007US20070032045 Method for manufacturing semiconductor device and substrate processing apparatus
02/08/2007US20070029509 Apparatus for generating a plurality of beamlets
02/08/2007US20070029507 Reliability in a maskless lithography system
02/08/2007US20070029504 Vacuum conveying apparatus and charged particle beam equipment with the same
02/08/2007US20070029503 Grid structure for holding specimen of electron microscopy
02/08/2007US20070029499 Apparatus for generating a plurality of beamlets
02/08/2007US20070029481 Specimen tip and tip holder assembly
02/08/2007US20070029282 Method of processing a workpiece by controlling a set of plasma parameters through a set of chamber parameters using surfaces of constant value