Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
05/2007
05/02/2007CN1313198C Method for carrying out homogeneous and heterogeneous chemical reactions using plasma
05/01/2007US7212078 Method and assembly for providing impedance matching network and network assembly
05/01/2007US7211811 Method for preventing wafer surface from bombardment by micro-dust particles during the ion implantation process
05/01/2007US7211810 Method for the protection of an optical element, lithographic apparatus, and device manufacturing method
05/01/2007US7211806 Particle beam apparatus
05/01/2007US7211805 Liquid metal ion gun
05/01/2007US7211804 Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the corrector
05/01/2007US7211797 Inspection method and inspection system using charged particle beam
05/01/2007US7211796 Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device
05/01/2007US7210424 High-density plasma processing apparatus
04/2007
04/26/2007WO2007045501A1 Charged particle system
04/26/2007WO2007022976A3 Method and device for the plasma treatment of the interior of hollow bodies
04/26/2007WO2006018840A3 Electron microscope array for inspection and lithography
04/26/2007WO2005098091B1 A method of plasma etch endpoint detection using a v-i probe diagnostics
04/26/2007US20070092748 Multilayer film for top-seal
04/26/2007US20070091535 Temperature controlled semiconductor processing chamber liner
04/26/2007US20070090303 Multilayer detector and method for sensing an electron beam
04/26/2007US20070090288 Method and system for enhancing resolution of a scanning electron microscope
04/26/2007US20070090032 Plasma treatment apparatus
04/26/2007US20070089980 Ion source control system
04/26/2007US20070089835 Method and apparatus for measuring electron density of plasma and plasma processing apparatus
04/26/2007DE19650680B4 Elektronenmikroskop mit Positronenzusatz Electron positron with additional
04/26/2007DE102006041436A1 Electron beam dosage computing method for e.g. electron beam lithographic device, involves utilizing parameter values to create illustration of basic dosages of beams and to prepare illustration of proximity effect correction coefficients
04/26/2007DE102005050810A1 Electron optics corrector of third order opening errors and anisotropic azimuthal components of the outer axial coma of the third order uses at least three coaxial hexapolar fields and spherical lenses
04/25/2007EP1777731A1 Corrosion resistant multilayer member
04/25/2007EP1777730A1 Arrangement and method for compensating emitter tip vibrations
04/25/2007EP1777729A1 Scanning type electron microscope
04/25/2007EP1777728A1 Lithography system
04/25/2007EP1776712A2 Device for producing excited and/or ionised particles in a plasma
04/25/2007EP1372897A4 Bipolar plasma source, plasma sheet source, and effusion cell utilizing a bipolar plasma source
04/25/2007EP1166319B1 Multi-electron -beam lithography apparatus with mutually different beam limiting apertures
04/25/2007CN2892882Y 真空锁系统 Vacuum lock system
04/25/2007CN1954403A In-situ monitoring on a spinning-disk ion implanter
04/25/2007CN1953129A Method of operating ion source and ion implanting apparatus
04/25/2007CN1312727C Apparatus and method for improving etch rate uniformity
04/25/2007CN1312534C Electvonic beam based pattern scanning method and scanning device
04/24/2007US7208878 Method of manufacturing a rotation-magnetron-in-magnetron (RMIM) electrode
04/24/2007US7208731 Charged particle beam apparatus
04/24/2007US7208730 Programmable molecular manipulating devices
04/24/2007US7208422 Plasma processing method
04/24/2007US7208421 Method and apparatus for production of metal film or the like
04/19/2007WO2007044344A2 Method and apparatus for cylindrical magnetron sputtering using multiple electron drift paths
04/19/2007WO2007042394A1 A method to deposit a coating by sputtering
04/19/2007WO2007025376A3 Ultraviolet radiation lamp and source module and treatment system containing same
04/19/2007WO2006136310A3 Powder-fiber adhesive
04/19/2007WO2006124075A3 System and methods for ion beam containment using localized electrostatic fields in an ion beam passageway
04/19/2007WO2006114228A3 Process and device for coating substrates
04/19/2007WO2006074050A3 Electrically enhancing the confinement of plasma
04/19/2007US20070086143 Plasma generator and plasma etching apparatus
04/19/2007US20070085242 E-beam active thermoplastic polyestercarbonate
04/19/2007US20070085038 Polymer based electrospray nozzle for mass spectrometry
04/19/2007US20070085037 Method, system, and apparatus for improving doping uniformity in high-tilt ion implantation
04/19/2007US20070085036 Ion generating device
04/19/2007US20070085020 Method for controlling charged particle beam, and charged particle beam apparatus
04/19/2007US20070084991 Neutral particle beam processing apparatus
04/19/2007US20070084715 Method for the production of a substrate
04/19/2007US20070084405 Adaptive plasma source for generating uniform plasma
04/19/2007DE202005019260U1 Vorrichtung zum Aussenden ionisierender Strahlung Device to emit ionizing radiation
04/19/2007DE102006048609A1 Electron discharge window manufacturing method, involves applying vapor depositing layer by vapor depositing process on substrate, and removing substrate with upper surface that is made up of flexible polymer material
04/19/2007DE102006048593A1 Electron outlet window for an electron beam accelerator, is formed by reducing the thickness of a titanium or glass film by etching
04/19/2007CA2624542A1 Method and apparatus for cylindrical magnetron sputtering using multiple electron drift paths
04/18/2007EP1775634A1 Electron beam drawing device
04/18/2007EP1775353A1 Coating apparatus and method for operating a coating apparatus
04/18/2007EP1775352A2 Arc ion plating apparatus
04/18/2007EP1774839A2 Method and means for generation of a plasma at atmospheric pressure
04/18/2007EP1774563A1 Cylindrical target with oscillating magnet from magnetron sputtering
04/18/2007EP1774562A1 System for low-energy plasma-enhanced chemical vapor deposition
04/18/2007EP1774561A1 Laser atom probe methods
04/18/2007EP1774560A1 Electronic beam device
04/18/2007EP1774559A2 Electrostatic lens for ion beams
04/18/2007EP1774538A2 Multiple gas injection system for charged particle beam instruments
04/18/2007EP1774055A2 Ion implanter operating in pulsed plasma mode
04/18/2007EP1774054A1 Variable quadruple electromagnet array, particularly used in a multi-step process for forming a metal barrier in a sputter reactor
04/18/2007EP1670968A4 Apparatus for low temperature semiconductor fabrication
04/18/2007CN2891271Y Wafer positioning and control system for ion implantation machine
04/18/2007CN2891270Y Heat-insulating and gas-supply apparatus in long-life ion source
04/18/2007CN2891269Y Apparatus for insulation between ion source cathode, heating electron gun, and arc chamber
04/18/2007CN2890080Y Wide range current detection automatic gearshift device of ion implantation machine
04/18/2007CN1950922A Apparatus for metal plasma vapor deposition and re-sputter with source and bias power frequencies applied through the workpiece
04/18/2007CN1950921A Method for the production of a disk-shaped workpiece based on a dielectric substrate, and vacuum processing system therefor
04/18/2007CN1950545A Apparatus including showerhead electrode and heater for plasma processing
04/18/2007CN1950538A Variable quadruple electromagnet array, particularly used in a multi-step process for forming a metal barrier in a sputter reactor
04/18/2007CN1950534A MSVD coating process
04/18/2007CN1948549A Capping technology for electron beam physical gaseous phase deposition coating using strong flow pulse ionic beam
04/18/2007CN1311717C Plasma surface treating method and apparatus therefor
04/18/2007CN1311531C Microwave plasma process device
04/18/2007CN1311509C Electrostatic trap for particles entrained in ion beam
04/18/2007CN1311508C Extraction and deceleration of low energy beam with low beam divergence
04/18/2007CN1311392C Method and apparatus for three-dimensional imaging in the Fourier domain
04/18/2007CN1311300C Charge beam exposure device, exposure method by charge beam, charge beam controlling method and method for mfg. semiconductor device
04/18/2007CN1311100C Method of cleaning the surface of a material coated with an organic substrate and a generator and device for carrying out said method
04/18/2007CN1310687C Ion beam irradiating device for irradiating tumour tissues
04/17/2007US7206184 Vacuum plasma processor and method of operating same
04/17/2007US7205560 Method and apparatus for processing a micro sample
04/17/2007US7205559 Electron beam apparatus and device manufacturing method using same
04/17/2007US7205556 Bellows liner for an ion beam implanter
04/17/2007US7205555 Defect inspection apparatus and defect inspection method
04/17/2007US7205554 Method and apparatus for processing a micro sample
04/17/2007US7205552 Monatomic boron ion source and method
04/17/2007US7205551 Method of correcting chromatic aberrations in charged-particle beam and charged-particle beam system