Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
05/2007
05/15/2007US7217925 Scanning electron microscope
05/15/2007US7217924 Holey mirror arrangement for dual-energy e-beam inspector
05/15/2007US7217649 System and method for stress free conductor removal
05/15/2007US7217371 Optical control interface between controller and process chamber
05/15/2007US7217337 Plasma process chamber and system
05/15/2007US7217336 Directed gas injection apparatus for semiconductor processing
05/10/2007WO2007053269A2 Method and system for forming a nitrided germanium-containing layer using plasma processing
05/10/2007WO2007052723A1 Phase plate for electron microscope, and its manufacturing method
05/10/2007WO2007051917A1 Method and installation for the vacuum colouring of a metal strip by means of magnetron sputtering
05/10/2007WO2007051916A1 Method and installation for the vacuum colouring of a metal strip by means of magnetron sputtering
05/10/2007WO2007051461A1 Redundant anode sputtering method and assembly
05/10/2007WO2007051313A1 Methods for performing circuit edit operations with low landing energy electron beams
05/10/2007WO2007051312A1 Apparatus and method for surface modification using charged particle beams
05/10/2007WO2007024614A3 Selection of wavelenghts for end point in a time division multiplexed process
05/10/2007US20070105325 Method of manufacturing CMOS devices by the implantation of N- and P-type cluster ions
05/10/2007US20070102652 Ion implanter with contaminant collecting surface
05/10/2007US20070102651 includes semiconductor substrate and bottom coupled die
05/10/2007US20070102291 Plasma-enhanced film deposition
05/10/2007US20070102287 Method and apparatus for an improved optical window deposition shield in a plasma processing system
05/10/2007US20070102284 Small Scanned Magentron
05/10/2007US20070102119 Plasma processing system and plasma processing method
05/10/2007US20070101938 Inductively coupled plasma processing apparatus having internal linear antenna for large area processing
05/10/2007DE19848861B4 Herstellungsprozeß einer Halbleitervorrichtung durch Elektronenstrahllithographie Manufacturing process of a semiconductor device by electron beam lithography
05/10/2007DE102005020815B4 Anordnung für die Regelung der Elektronenstrahlleistung einer Elektronenstrahlkanone Arrangement for controlling the electron beam power of an electron gun
05/10/2007CA2628589A1 Method and installation for the vacuum colouring of a metal strip by means of magnetron sputtering
05/10/2007CA2628586A1 Method and installation for the vacuum colouring of a metal strip by means of magnetron sputtering
05/09/2007EP1783904A1 HF plasma supply system
05/09/2007EP1783815A1 Method and arrangement for etching a metallic strip by vacuum magnetron sputtering
05/09/2007EP1783814A1 Process and device for magnetron sputtering cleaning a metal strip
05/09/2007EP1783813A1 Frequency based controlling of microwave plasma process
05/09/2007EP1783812A2 Corrector for the correction of chromatic aberrations in a particle-optical apparatus.
05/09/2007EP1783811A2 Corrector for the correction of chromatic aberrations in a particle-optical apparatus
05/09/2007EP1783810A2 Electron Gun
05/09/2007EP1376669B1 Plasma processing device
05/09/2007CN1961402A Plasma processor responsive to multiple RF frequencies
05/09/2007CN1961401A Reciprocating drive for scanning a workpiece through an ion beam
05/09/2007CN1961400A 离子注入装置 Ion implantation apparatus
05/09/2007CN1959416A Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating sample
05/09/2007CN1315150C Apparatus for plasma pulse injection
05/09/2007CN1314826C Plasma treatment container internal member, and plasma treatment device having same
05/08/2007US7216311 System and method for evaluating a semiconductor device pattern, method for controlling process of forming a semiconductor device pattern and method for monitoring a semiconductor device manufacturing process
05/08/2007US7216067 Non-linear test load and method of calibrating a plasma system
05/08/2007US7214951 Charged-particle multi-beam exposure apparatus
05/08/2007US7214938 Sample observation method and transmission electron microscope
05/08/2007US7214937 Electron microscope
05/08/2007US7214936 Charged particle beam apparatus and dimension measuring method
05/08/2007US7214289 Method and apparatus for wall film monitoring
05/08/2007US7214282 Electromagnetic-wave shielding and light transmitting plate, manufacturing method thereof and display panel
05/08/2007US7214280 Plasma-assisted decrystallization
05/08/2007US7214117 Deflector of a micro-column electron beam apparatus and method for fabricating the same
05/08/2007CA2303897C Dual face shower head electrode for a magnetron plasma generating apparatus
05/03/2007WO2007050305A1 Sputtering target and means for cooling the target
05/03/2007WO2007050304A1 Sputtering target and means for cooling the target
05/03/2007WO2007049492A1 Graphite member for beam-line internal member of ion implantation apparatus
05/03/2007WO2007048937A1 Method for monitoring a plasma, device for carrying out this method, use of this method for depositing a film onto a pet hollow body
05/03/2007WO2007048433A1 Charged particle beam exposure system
05/03/2007WO2007022862A3 Method for the production of a multilayer electrostatic lens array
05/03/2007WO2007021521A3 Two-piece dome with separate rf coils for inductively coupled plasma reactors
05/03/2007WO2006113170A3 Sputtering system
05/03/2007WO2006109039A3 Gas bearing spindle
05/03/2007WO2006101558A3 Laser atom probes
05/03/2007WO2006076740A3 Synchronous raster scanning lithographic system
05/03/2007US20070098980 Highly Tetrahedral Amorphous Carbon Coatings and Systems and Methods for Their Production
05/03/2007US20070098979 Diamond-like carbon coating supported one a glass substrate; coating has a first tetrahedral amorphous carbon layer having at least 35% sp3 bonds including subplanted carbon bonds and an average density of at least 2.5 gm/cm3; magnetic recording media
05/03/2007US20070096658 Method and apparatus for an improved upper electrode plate in a plasma processing system
05/03/2007US20070095789 Method for automatic determination of semiconductor plasma chamber matching and source of fault by comprehensive plasma monitoring
05/03/2007US20070095788 Method of controlling a chamber based upon predetermined concurrent behavoir of selected plasma parameters as a function of selected chamber paramenters
05/03/2007US20070095654 Controlled multi-step magnetron sputtering process
05/03/2007US20070095477 Plasma processing apparatus
05/03/2007US20070095285 Apparatus for cyclical depositing of thin films
05/03/2007DE112005001299T5 Magnetron-Sputterverfahren und Magnetron-Sputtervorrichtung Magnetron sputtering and magnetron sputtering apparatus
05/03/2007DE112004002810T5 Dünnschichterzeugungsverfahren und Dünnschichterzeugungsvorrichtung Thin film forming method and thin film forming apparatus
05/03/2007DE10335718B4 Anodenbauteil für Delayline-Detektoren und Delayline-Detektor Anode component for delay line detectors and delay line detector
05/03/2007DE10234859B4 Einrichtung und Verfahren zum Beschichten von Substraten Apparatus and method for coating substrates
05/03/2007DE102006050600A1 Spektrometer zur Oberflächenanalyse und Verfahren dafür Spectrometer for surface analysis and method therefor
05/03/2007DE102006048974A1 Irradiation process using charged particles for sampling and irradiating using a charged particle beam for observing or treating workpieces
05/03/2007DE102006046951A1 Charge carrier beam used for masking uses a measurement of a defective position and a correction is applied
05/03/2007DE102004031528B4 Vorrichtung zur Bereitstellung einer Sonderatmosphäre mit einem Medienanschluss An apparatus for providing a special atmosphere with a media connection
05/03/2007CA2627407A1 Method for monitoring a plasma, device for carrying out this method, use of this method for depositing a film onto a pet hollow body
05/02/2007EP1780777A1 Plasma processing device amd method
05/02/2007EP1780766A1 Improved magnetron sputtering system for large-area substrates having removable anodes
05/02/2007EP1780765A2 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
05/02/2007EP1780764A1 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
05/02/2007EP1780763A2 Charged particle beam system with higher-order aberration corrector
05/02/2007EP1780762A1 Magnetic energy filter
05/02/2007EP1780304A2 PECVD method with modulation of power
05/02/2007EP1780303A2 System and method for power function ramping of microwave linear discharge sources
05/02/2007EP1779405A2 Cylinder magnetron with self cleaning target and collar
05/02/2007EP1779404A2 Ion beam measurement systems and methods for ion implant dose and uniformity control
05/02/2007EP1442153A4 Gcib processing to improve interconnection vias and improved interconnection via
05/02/2007EP1300057B1 Coil for vacuum plasma processor
05/02/2007EP1147242A4 Large area plasma source
05/02/2007EP1147241A4 Diffusion bonded sputter target assembly and method of making same
05/02/2007EP1119030B1 Plasma reactor
05/02/2007EP1027475A4 Large area microwave plasma apparatus with adaptable applicator
05/02/2007CN1957437A Vacuum plasma processor including control in response to DC bias voltage
05/02/2007CN1956138A Adjustable electrode assembly for use in processing substrates of differing widths in a plasma processing system
05/02/2007CN1314085C Plasma device
05/02/2007CN1314075C Shielding system for plasma chamber
05/02/2007CN1314072C Merie plasma reactor with showerhead RF electrode tuned to the plasma with arcing suppression