Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
08/2007
08/02/2007DE10358329B4 Vorrichtung zur Erzeugung angeregter und/oder ionisierter Teilchen in einem Plasma und Verfahren zur Erzeugung ionisierter Teilchen An apparatus for generating excited and / or ionized particles in a plasma and method for generating ionized particles
08/02/2007DE102004019835B4 Beleuchtungskondensor für ein Partikeloptik-Projektionssystem Illumination condenser for a particle optics projection system
08/01/2007EP1813695A1 Tubular sputtering target with improved stiffness
08/01/2007EP1813693A1 Sputtering target, sputtering target backing plate assembly and film deposition system
08/01/2007EP1812960A1 Dry etching apparatuses and methods of forming an electric device using the same
08/01/2007EP1812949A2 Impedance matching of a capacitively coupled rf plasma reactor suitable for large area substrates
08/01/2007EP1812948A1 Material deposition apparatus and method
08/01/2007EP1812947A1 Multi-beam modulator for a particle beam and use of the multi-beam modulator for the maskless structuring of a substrate
08/01/2007EP1812946A1 System and method for focused ion beam data analysis
08/01/2007EP1812945A2 Method and apparatus for the automated process of in-situ lift-out
08/01/2007EP1415322B1 Dual frequency plasma etch reactor with independent plasma density/chemistry and ion energy control
08/01/2007CN1330219C RF plasma reactor and method for manufacturing the substrate
08/01/2007CN1329962C Flat panel display manufacturing apparatus
08/01/2007CN1329961C Plasma processor electrode and plasma processor
08/01/2007CN1329957C Surface processing device
08/01/2007CN1329943C Secondary electron detector, especially in a scanning electron microscope
08/01/2007CN101010775A Portable electron microscope using micro-column
08/01/2007CN101010774A Motioning equipment for electron column
08/01/2007CN101009191A Ion implantation system having variable screen apertures and method of implanting ions using the same
07/2007
07/31/2007US7250617 Ion beam neutral detection
07/31/2007US7250601 Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring method
07/31/2007US7250599 Energy filter image generator for electrically charged particles and the use thereof
07/26/2007WO2007083756A1 Liquid medium for preventing charge-up in electron microscope and method of observing sample using the same
07/26/2007WO2007082380A1 Redeposition technique for membrane attachment
07/26/2007WO2007050307A3 Sputtering target and means for cooling the target
07/26/2007US20070170372 Dual mode ion source for ion implantation
07/26/2007US20070170369 Technique for Improving Uniformity of a Ribbon Beam
07/26/2007DE19838599B4 Chemische Ionisationsquelle für die Massenspektrometrie Chemical ionization source for mass spectrometry
07/26/2007DE19617155B4 Sputterbeschichtungsstation, Verfahren zur Herstellung sputterbeschichteter Werkstücke und Verwendung der Station oder des Verfahrens zur Beschichtung scheibenförmiger Substrate Sputterbeschichtungsstation, methods of making sputter-coated workpieces and use of the station or of the method for coating disk shaped substrates
07/25/2007EP1811553A1 Apparatus and method for depositing fine particles
07/25/2007EP1811540A2 Multipole lens and charged-particle beam instrument fitted with multiple lens
07/25/2007EP1810318A1 Substrate carrier for parallel wafer processing reactor
07/25/2007EP1810312A1 Method and apparatus for producing electric discharges
07/25/2007EP1810311A2 Improved dose uniformity during scanned ion implantation
07/25/2007CN2927603Y High-speed cold plasma array generator of atmosphere radio-frequency discharge
07/25/2007CN1328766C Process system and process method
07/25/2007CN1328755C Low contaminatino, high density plasma etch chamber and method for making the same
07/25/2007CN1328751C Device for coating of objects
07/25/2007CN1328411C Laser CVD apparatus and laser CVD method
07/25/2007CN101006565A Method for providing uniform removal of organic material
07/25/2007CN101006545A Method for reciprocating a workpiece through an ion beam
07/25/2007CN101006339A Integrated optic ionized sensor
07/25/2007CN101006198A In situ surface contaminant removal for ion implanting
07/25/2007CN101005011A 等离子体处理装置 Plasma processing apparatus
07/25/2007CN101005007A Plasma processing apparatus and plasma processing method
07/24/2007US7248353 Method and apparatus for inspecting samples, and method for manufacturing devices using method and apparatus for inspecting samples
07/24/2007US7247867 Ion implanter and method of manufacturing semiconductor device
07/24/2007US7247865 System and method of detecting, neutralizing, and containing suspected contaminated articles
07/24/2007US7247864 Charged particle beam apparatus
07/24/2007US7247863 System and method for rapidly controlling the output of an ion source for ion implantation
07/24/2007US7247848 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
07/24/2007US7247221 System and apparatus for control of sputter deposition process
07/24/2007US7247218 Plasma density, energy and etch rate measurements at bias power input and real time feedback control of plasma source and bias power
07/24/2007US7246800 Sealing mechanism for sealing a vacuum chamber
07/19/2007WO2007058925A3 Ion implanter with contaminant collecting surface
07/19/2007WO2007041057B1 Electrostatic deflection system with impedance matching for high positioning accuracy
07/19/2007US20070166477 Yttria-coated ceramic components of semiconductor material processing apparatuses and methods of manufacturing the components
07/19/2007US20070164680 Plasma generation and processing with multiple radiation sources
07/19/2007US20070164237 Application of digital frequency and phase synthesis for control of electrode voltage phase in a high-energy ion implantation machine, and a means for accurate calibration of electrode voltage phase
07/19/2007US20070164236 Method for retrieving signal from circuit
07/19/2007US20070164228 Aberration correction device and method for operating same
07/19/2007US20070164226 Electron beam apparatus and device manufacturing method using the same
07/19/2007US20070164218 SEM technique for imaging and measuring electronic transport in nanocomposites based on electric field induced contrast
07/19/2007US20070164217 Projection electron microscope, electron microscope, specimen surface observing method and micro device producing method
07/19/2007US20070163617 Method for cleaning treatment chamber iIn substrate treating apparatus and method for detecting endpoint of cleaning
07/19/2007US20070163502 Substrate processing apparatus
07/19/2007US20070163501 Plasma processing apparatus
07/19/2007DE102004055149B4 Vorrichtung und Verfahren zum Abbilden eines Mehrfach-Partikelstrahls auf ein Substrat Apparatus and method for imaging a multiple particle beam onto a substrate
07/18/2007EP1808882A2 Charged particle beam device
07/18/2007EP1807547A1 An elongated gas ditribution system
07/18/2007EP1807224A2 Novel methods for cleaning ion implanter components
07/18/2007EP1573795A4 A system and method for controlling plasma with an adjustable coupling to ground circuit
07/18/2007EP1506324A4 Replaceable target sidewall insert with texturing
07/18/2007EP1451849A4 Information acquisition apparatus, cross section evaluating apparatus, and cross section evaluating method
07/18/2007EP1444727A4 Process and apparatus for etching of thin, damage sensitive layers using high frequency pulsed plasma
07/18/2007EP1366209A4 Processing materials inside an atmospheric-pressure radiofrequency nonthermal plasma discharge
07/18/2007EP1204507A4 Arc-free electron gun
07/18/2007CN1327493C Mechanism and method for assembling processing device parts
07/18/2007CN1327475C Suspended gas distribution manifold for plasma chamber
07/18/2007CN101002295A Semiconductor device manufacturing apparatus and a method of controlling a semiconductor device manufacturing process
07/18/2007CN101002294A Ion beam scanning systems and methods for improved ion implantation uniformity
07/18/2007CN101001974A Single piece coil support assemblies, coil constructions and methods of assembling coil constructions
07/18/2007CN101000870A Method and device for controlling ion implantation
07/17/2007US7245696 Element-specific X-ray fluorescence microscope and method of operation
07/17/2007US7245084 Transformer ignition circuit for a transformer coupled plasma source
07/17/2007US7245068 Apparatus for controlled alignment of catalytically grown nanostructures
07/17/2007US7244953 Beam exposure writing strategy system and method
07/17/2007US7244949 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
07/17/2007US7244933 Electron beam apparatus, a pattern evaluation method and a device manufacturing method using the electron beam apparatus or pattern evaluation method
07/17/2007US7244932 Electron beam apparatus and device fabrication method using the electron beam apparatus
07/17/2007US7244475 Plasma treatment apparatus and control method thereof
07/17/2007US7244343 Sputtering apparatus
07/17/2007US7244336 Temperature controlled hot edge ring assembly for reducing plasma reactor etch rate drift
07/17/2007US7243610 Plasma device and plasma generating method
07/12/2007WO2007076793A1 Method and apparatus for producing a magnetic-field system
07/12/2007WO2007045110A3 Cleaning means for large area pecvd devices using a remote plasma source
07/12/2007WO2007021520A3 Substrate support for increasing substrate temperature in plasma reactors
07/12/2007WO2005081940A3 Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
07/12/2007US20070161044 Method for localizing and identifying isotopes
07/12/2007US20070160932 Electron beam lithography apparatus