Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
08/2007
08/16/2007CA2641764A1 Device for coupling between a plasma antenna and a power signal generator
08/16/2007CA2641561A1 Radio frequency ion guide
08/15/2007EP1819208A2 Device and method for creating activated and/or ionised particles in a plasma
08/15/2007EP1818970A2 Method for preparing a sample for electron microscopic investigation, the sample carrier and transport carrier used
08/15/2007EP1817557A2 Apparatus and method of detecting probe tip contact with a surface
08/15/2007EP1817265A2 Method of forming coated article using sputtering target(s) and ion source(s) and corresponding apparatus
08/15/2007EP1276356B1 Apparatus for plasma processing
08/15/2007EP1166323B1 Method and apparatus for compensating non-uniform wafer processing in plasma processing
08/15/2007CN2935709Y High voltage automatic discharge device for ion implantation apparatus
08/15/2007CN2935467Y Anti-corrosion aluminum element with multi-coating
08/15/2007CN2935461Y Discharging arc room of long life ion source
08/15/2007CN1332420C Preloaded plasma reactor device and its use
08/15/2007CN1332414C Ion beam irradiation device
08/15/2007CN101019203A 带电粒子束曝光系统 Charged particle beam exposure system
08/15/2007CN101019201A 带电粒子枪 Charged particle gun
08/15/2007CN101018884A Apparatus including gas distribution member supplying process gas and radio frequency (RF) power for plasma processing
08/15/2007CN101017771A Gas supply apparatus, substrate processing apparatus and gas supply method
08/15/2007CN101017769A Plasma processing apparatus and plasma processing method
08/15/2007CN101017761A Metal gas mixing ion injector
08/15/2007CN101017760A A measurement method for plasma dynamic sheath layer diagnosis
08/14/2007US7256407 Lithographic projection apparatus and reflector assembly for use therein
08/14/2007US7256406 Emitter for electron-beam projection lithography system, and method of manufacturing and operating the emitter
08/14/2007US7256405 Sample repairing apparatus, a sample repairing method and a device manufacturing method using the same method
08/14/2007US7256400 Electron beam inspection apparatus
08/14/2007US7255898 Zirconia toughened ceramic components and coatings in semiconductor processing equipment and method of manufacture thereof
08/14/2007US7255774 Process apparatus and method for improving plasma production of an inductively coupled plasma
08/14/2007US7255773 Plasma processing apparatus and evacuation ring
08/09/2007WO2007089468A2 Architecture for ribbon ion beam ion implanter system
08/09/2007WO2007089146A1 Method for surface treatment by plasma and surface treatment apparatus
08/09/2007WO2007089124A1 Device for sustaining differential vacuum degrees for electron column
08/09/2007WO2007087661A1 Method and device for the continuous plasma treatment of materials, in particular for the descaling of a metal strand
08/09/2007WO2007071043A3 Excimer radiation lamp assembly, and source module and fluid treatment system containing same
08/09/2007WO2007038580A3 Apparatus and methods to remove films on bevel edge and backside of wafer
08/09/2007WO2007038134A3 Method of aligning a particle-beam-generated pattern to a pattern on pre-patterned substrate
08/09/2007US20070184640 Method for producing solid element plasma and its plasma source
08/09/2007US20070184563 Apparatus and method for plasma etching
08/09/2007US20070184562 Plasma Processing Method And Plasma Processing Apparatus
08/09/2007US20070182844 Optical system for producing differently focused images
08/09/2007US20070181868 Silicon electrode plate for plasma etching with superior durability
08/09/2007US20070181832 Controlling the characteristics of implanter ion-beams
08/09/2007US20070181831 Method and apparatus for processing a micro sample
08/09/2007US20070181830 Ion implantation device and a method of semiconductor manufacturing by the implantation of boron hydride cluster ions
08/09/2007US20070181826 Laser atom probe methods
08/09/2007US20070181146 Plasma cvd apparatus and dry cleaning method of the same
08/09/2007US20070181145 Method for cleaning process chamber of substrate processing apparatus, substrate processing apparatus, and method for processing substrate
08/09/2007US20070181064 Plasma source assembly and method of manufacture
08/09/2007DE10223533B4 Ionenimplantiervorrichtung An ion implanter
08/09/2007DE102006047729A1 Focusing and positioning auxiliary device for particle-optical raster microscope has object and focusing comprises positioning auxiliary device, lighting device, which produces collimated beam or focused ray of light
08/09/2007DE102005005801B4 Elektrostatisches Ablenksystem für Korpuskularstrahlung An electrostatic deflection system for corpuscular
08/08/2007EP1816674A1 Anisotropic etching method
08/08/2007EP1816670A2 Predictive failure scheme for industrial power delivery system
08/08/2007EP1816669A2 Particle-optical apparatus with a predetermined final vacuum pressure
08/08/2007EP1816668A2 Particle-optical apparatus with a predetermined final vacuum pressure
08/08/2007EP1815494A1 Inductively coupled plasma processing apparatus
08/08/2007EP1815493A1 Vacuum processing chamber for very large area substrates
08/08/2007EP1643001A4 High velocity method for deposing diamond films from a gaseous phase in shf discharge plasma and device for carrying out said method
08/08/2007EP1586106A4 An extractor for a micro-column, an alignment method for an extractor aperture to an electon emitter, and a measuring method and an alignment method using thereof
08/08/2007EP1366647A4 Apparatus for generating low temperature plasma at atmospheric pressure
08/08/2007EP0976152B1 Pattern film repair using a gas assisted focused particle beam system
08/08/2007CN101015034A Faraday dose and uniformity monitor for plasma based ion implantion
08/08/2007CN101015033A Device and method for measurement of beam angle and divergence normal to plane of scanned beam or ribbon beam
08/08/2007CN101014222A Device for carrying out method of cleaning the surface of a material coated with an organic substance and a generator
08/08/2007CN101013649A Particle-optical apparatus with a predetermined final vacuum pressure
08/07/2007US7253645 Detection of defects in patterned substrates
08/07/2007US7253425 Method and apparatus for forming optical elements by inducing changes in the index of refraction by utilizing electron beam radiation
08/07/2007US7253424 Method of implanting a substrate and an ion implanter for performing the method
08/07/2007US7253423 Technique for uniformity tuning in an ion implanter system
08/07/2007US7253419 Apertured plate support mechanism and charged-particle beam instrument equipped therewith
08/07/2007US7253418 Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope
08/07/2007US7253417 Multi-axis compound lens, beam system making use of the compound lens, and method using the compound lens
08/07/2007US7253410 Charge-control pre-scanning for e-beam imaging
08/07/2007US7253117 Methods for use of pulsed voltage in a plasma reactor
08/07/2007US7252911 Implanting ions into a mask substrate with pattern-forming material with light-transmissive exposure regions; ions in the regions dissipate electrostatic charges, thus preventing the buildup of electrostatic charges which could otherwise attract image-distorting particles to the mask or damage the mask
08/07/2007US7252745 Filtered cathodic arc deposition method and apparatus
08/07/2007US7252738 Apparatus for reducing polymer deposition on a substrate and substrate support
08/07/2007US7252737 Pedestal with integral shield
08/07/2007CA2327741C Means for controlling target erosion and sputtering in a magnetron
08/02/2007WO2007087213A2 Methods of implanting ions and ion sources used for same
08/02/2007WO2007087212A1 Methods of implanting ions and ion sources used for same
08/02/2007WO2007087210A1 Plasma immersion ion source with low effective antenna voltage
08/02/2007WO2007087209A1 Methods and apparatus for ion beam angle measurement in two dimensions
08/02/2007WO2007087126A1 Cathode for a vacuum sputtering system
08/02/2007WO2007086875A1 Work processing system and plasma generating apparatus
08/02/2007WO2007086400A1 Method and apparatus for inspecting sample surface
08/02/2007WO2007086398A1 Apparatus and method for inspecting sample surface
08/02/2007WO2007086254A1 Charged particle beam equipment
08/02/2007WO2007059197A3 Technique for shaping a ribbon-shaped ion beam
08/02/2007WO2007059052A3 Systems and methods that mitigate contamination and modify surface characteristics during ion implantation processes through the introduction of gases
08/02/2007US20070178698 Substrate processing apparatus and fabrication process of a semiconductor device
08/02/2007US20070178679 Methods of implanting ions and ion sources used for same
08/02/2007US20070178402 Laser irradiation device and method of fabricating organic light emitting display device using the same
08/02/2007US20070177132 Method and Apparatus for Self-Referenced Dynamic Step and Scan Intra-Field Scanning Distortion
08/02/2007US20070176124 Plasma doping method and plasma doping apparatus
08/02/2007US20070176123 Ion implanter having a superconducting magnet
08/02/2007US20070176122 Architecture for ribbon ion beam ion implanter system
08/02/2007US20070176115 Ion implantation system and control method
08/02/2007US20070176114 Ion implantation system and control method
08/02/2007US20070176103 Method and device for observing a specimen in a field of view of an electron microscope
08/02/2007US20070175586 Plasma Processing Apparatus And Plasma Processing Method
08/02/2007US20070175396 Film-forming apparatus