Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
11/2007
11/15/2007WO2006133309A3 Technique for ion beam angle spread control
11/15/2007US20070264441 Plasma Processing Apparatus and Plasma Processing Method
11/15/2007US20070263223 Time Resolution Measurement Device and Position Detection Election Multiplier
11/15/2007US20070262723 Plasma Processing Apparatus Control Method for Plasma Processing Apparatus and Evaluation Method for Plasma Processing Apparatus
11/15/2007US20070262272 Semiconductor mask correcting device and semiconductor mask correcting method
11/15/2007US20070262271 Ribbon beam ion implanter cluster tool
11/15/2007US20070262270 Insulator for high current ion implanters
11/15/2007US20070262262 Ion implantation ion source, system and method
11/15/2007US20070262255 Focussing Lens for Charged Particle Beams
11/15/2007US20070262254 Electron microscope, methods to determine the contact point and the contact of the probe
11/15/2007DE202007012796U1 Kammeranordnung für eine Elektronenstrahlbearbeitungsvorrichtung Chamber arrangement for an electron beam machining apparatus
11/14/2007EP1855305A1 Method for plating a substrate
11/14/2007EP1854907A2 Device for plasma-based chemical treatment of surfaces of substrates in a vacuum
11/14/2007EP1854122A1 A housing for a micro-column
11/14/2007EP1593142B1 Magnetically enhanced plasma processing installation for continuous material
11/14/2007EP1355341B1 Electron beam projector provided with a linear thermionic emitting cathode for electron beam heating.
11/14/2007EP1299898B1 Particle radiation device comprising a particle source that is operated in an ultrahigh vacuum and a cascade pump assembly for a particle radiation device of this type
11/14/2007EP0995086B1 Electron microscope and spectroscopy system
11/14/2007CN200976707Y Scaling channel structure based atmosphere pressure discharging cold plasma generators and array
11/14/2007CN200976340Y T-type RF plasma emitting set
11/14/2007CN101073085A Apparatus and methods for improving the stability of RF power delivery to a plasma load
11/14/2007CN101071752A High current ionic current implanted system and improved device and insulator thereof
11/14/2007CN100349261C Method and device for plasma CVD
11/14/2007CN100349249C Cold cathode Penning ion source capable of extracting low smelting point metallic ion
11/14/2007CN100349043C Processing apparatus and method for removing particles therefrom
11/13/2007US7296245 Combined e-beam and optical exposure semiconductor lithography
11/13/2007US7294835 Scanning electron microscope
11/13/2007US7294833 Method of alignment for efficient defect review
11/13/2007US7294563 Semiconductor on insulator vertical transistor fabrication and doping process
11/13/2007US7294283 Penning discharge plasma source
11/13/2007US7294245 Cover ring and shield supporting a wafer ring in a plasma reactor
11/13/2007US7294224 Magnet assembly for plasma containment
11/08/2007WO2007127084A1 Dose uniformity correction technique
11/08/2007WO2007126966A2 Insulator system for a terminal structure of an ion implantation system
11/08/2007WO2007125652A1 Electron microscope and method for measuring aberration characteristic of objective lens system thereof
11/08/2007WO2007125333A1 Front plate for an ion source
11/08/2007WO2007111876A3 Determining ion beam parallelism using refraction method
11/08/2007WO2007109784A3 Surface treatments for spiral bevel gear sets
11/08/2007WO2007041444A3 Electron beam column for writing shaped electron beams
11/08/2007WO2007035182A3 Field enhanced electrodes for additive-injection non-thermal plasma (ntp) processor
11/08/2007WO2006074200A3 Ion beam scanning methods and system for ion implantation
11/08/2007WO2005059960A3 Segmented radio frequency electrode apparatus and method for uniformity control
11/08/2007US20070259130 System for Low-Energy Plasma-Enhanced Chemical Vapor Deposition
11/08/2007US20070257212 Digital parallel electron beam lithography stamp
11/08/2007US20070257211 Implant Optimization Scheme
11/08/2007US20070257210 Preventing dosage drift with duplicate dose integrators
11/08/2007US20070257207 Charged Particle Beam Device with Aperture
11/08/2007US20070257200 Liquid metal ion gun
11/08/2007US20070257191 Contact opening metrology
11/08/2007US20070256927 Coating Apparatus for the Coating of a Substrate and also Method for Coating
11/08/2007US20070256926 Hollow cathode sputtering apparatus and related method
11/08/2007DE10240337B4 Vorrichtung und Verfahren zur Separation von Partikeln aus einem von einem Target zur Beschichtung eines Substrates erzeugten Plasma im Vakuum Device and method for separating particles from a generated from a target for coating a substrate plasma in the vacuum
11/08/2007DE102006020290A1 Plasma source, has metal block that is electrically connected with anode and by insulator opposite to housing, where block has coupling device for electrical connection with high frequency generator
11/07/2007EP1852891A2 Bi-directional filtered arc plasma source
11/07/2007EP1852890A1 Electron microscope and composite irradiation lens
11/07/2007EP1852889A2 Particle-optical apparatus with temperature switch
11/07/2007EP1852888A1 Particle-optical apparatus with temperature switch
11/07/2007EP1852694A2 Monitoring substrate processing using reflected radiation
11/07/2007EP1852691A2 Monitoring substrate processing using reflected radiation
11/07/2007EP1851784A1 Charged-particle exposure apparatus with electrostatic zone plate
11/07/2007EP1851356A1 Tubular target comprising a connecting layer that is situated between the tubular target and the tubular support
11/07/2007CN101069261A Bellows liner for an ion beam implanter
11/07/2007CN101069260A Ion beam milling of a work piece and determining and controlling extent thereof
11/07/2007CN101068614A Methods and apparatus for downstream dissociation of gases
11/07/2007CN101067993A Particle-optical apparatus with temperature switch
11/07/2007CN101067992A Apparatus for operating gas and providing for observing under vacuum or low-voltage environment
11/07/2007CN100348078C Ecr等离子体源和ecr等离子体装置 Ecr plasma source and ecr plasma device
11/07/2007CN100348077C Plasma treatment device and substrate surface treatment device
11/07/2007CN100347817C Plasma processing apparatus
11/07/2007CN100347229C Process and apparatus for depositing plasma coating onto a container
11/07/2007CN100347115C Holding device for a screen
11/06/2007US7291847 Specimen tip and tip holder assembly
11/06/2007US7291566 Barrier layer for a processing element and a method of forming the same
11/06/2007US7291545 Plasma immersion ion implantation process using a capacitively couple plasma source having low dissociation and low minimum plasma voltage
11/01/2007WO2007106449A3 Technique for monitoring and controlling a plasma process
11/01/2007WO2007100873A9 Hybrid wafer -holding pin
11/01/2007WO2007041530A3 Writing a circuit design pattern with shaped particle beam flashes
11/01/2007WO2006084143A3 Wafer-scanning ion implanter having fast beam deflection apparatus for beam glitch recovery
11/01/2007US20070254113 Plasma processing apparatus having an evacuating arrangement to evacuate gas from gas-introducing part of a process chamber
11/01/2007US20070252969 Stage apparatus and exposure apparatus
11/01/2007US20070252092 Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment therefor
11/01/2007US20070251920 Method of operating a plasma reactor having an overhead electrode with a fixed impedance match element
11/01/2007US20070251453 Plasma processing apparatus having an evacuating arrangement to evacuate gas from a gas-introducing part of a process chamber
10/2007
10/31/2007EP1850370A1 Stage apparatus and exposure apparatus
10/31/2007EP1850367A1 Inductively coupled plasma reactor with multiple magnetic cores
10/31/2007EP1849180A2 Ac-excited microcavity discharge device and method
10/31/2007EP1849175A2 Charged-particle exposure apparatus
10/31/2007DE112005003045T5 Verfahren und Vorrichtung zum flussabwärtsdissoziieren von Gasen Method and apparatus for flussabwärtsdissoziieren of gases
10/31/2007DE102007014301A1 Electron beam radiation device, has deviation control that initiates deflector and deviates electron beam produced from electron gun based on deviation amount of electron beam, and deflector that diffracts electron beam
10/31/2007DE102006020291A1 Plasma source, has process gas supplying device formed as metallic block, in which gas channel with two channel areas runs, where channel areas flow under angle of specific degrees to one another
10/31/2007CN200969335Y Plasma source
10/31/2007CN101066000A Plasma nozzle array for providing uniform scalable microwave plasma generation
10/31/2007CN101065824A Vacuum processing chamber for very large area substrates
10/31/2007CN101065823A Controlled dose ion implantation
10/31/2007CN101064987A Plasma processing apparatus and apparatus for supplying RF power
10/31/2007CN101064265A Measuring device for ion beam
10/31/2007CN101064238A Plasma reactor apparatus with independent capacitive and toroidal plasma sources
10/31/2007CN101064234A Apparatus and method for ion implanatation leading to partial ion implant energy
10/30/2007US7289866 Plasma processing method and apparatus
10/30/2007US7288859 Wafer stage operable in a vacuum environment