Patents
Patents for H01J 37 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (46,866)
09/2008
09/30/2008US7430496 Method and apparatus for using a pressure control system to monitor a plasma processing system
09/30/2008US7429741 Faraday system and ion implantation apparatus comprising the faraday system
09/30/2008US7429733 Method and sample for radiation microscopy including a particle beam channel formed in the sample source
09/30/2008US7429543 Method for the production of a substrate
09/30/2008US7429306 Plasma processing system
09/25/2008WO2008115339A1 Open-ended electromagnetic corrector assembly and method for deflecting, focusing, and controlling the uniformity of a traveling ion beam
09/25/2008WO2008114684A1 Energy analyzer, 2-dimensional display type energy analyzer, and photoelectron microscope
09/25/2008WO2008114422A1 Beam drawing device
09/25/2008WO2008113571A1 Gas distribution system
09/25/2008WO2007109103A3 Method and system for optimizing alignment performance in a fleet of exposure tools
09/25/2008US20080233756 Particle-removing apparatus for a semiconductor device manufacturing apparatus and method of removing particles
09/25/2008US20080230725 Crystallization apparatus, crystallization method, device, and light modulation element
09/25/2008US20080230694 Beam Optical Component Having a Charged Particle Lens
09/25/2008DE19732093B4 Korpuskularstrahlgerät Charged particle beam
09/25/2008DE112004000057B4 Plasmabehandlungsapparat und Plasmabehandlungsverfahren Plasma processing apparatus and plasma processing method
09/25/2008DE102008002798A1 Device for heating, melting and/or vaporizing a material in the form of metal, metal oxide, organic materials and compounds comprises an inductor for producing atoms , molecules or clusters of materials
09/25/2008DE102004052580B4 Vorrichtung und Verfahren zum Zuführen von Vorstufengasen zu einer Implantationsanlage Apparatus and method for supplying precursor gases into a implanter
09/25/2008DE102004039468B4 Vorrichtung zur Erzeugung angeregter und/oder ionisierter Teilchen in einem Plasma An apparatus for generating excited and / or ionized particles in a plasma
09/24/2008EP1973146A2 Gas flow diffuser
09/24/2008EP1973141A1 Sputter cathode assembly and sputter coating device
09/24/2008EP1973140A2 Plasma species and uniformity control through pulsed VHF operation
09/24/2008EP1973139A2 Apparatus and method of temperature control during cleaving processes for manufacture of thick film materials
09/24/2008EP1972185A2 Side-specific treatment of textiles using plasmas
09/24/2008EP1971999A2 Excimer radiation lamp assembly, and source module and fluid treatment system containing same
09/24/2008EP1971448A1 Method and apparatus for treating a surface, in particular in order to free it of impurities
09/24/2008EP1866140A4 Device for treating surface of a polymolecular formed product
09/24/2008EP1825491B1 Ion source with substantially planar design
09/24/2008EP1678075A4 Etch masks based on template-assembled nanoclusters
09/24/2008EP1057202B1 Method and device for exposing a substrate to light
09/24/2008CN201122570Y Multi-example loading combination device of scanning electronic microscope
09/24/2008CN201122096Y Example bench for viewing silicon slice example section
09/24/2008CN101273431A A method to deposit a coating by sputtering
09/24/2008CN101273430A Apparatus for the removal of a set of byproducts from a substrate edge and methods therefor
09/24/2008CN100421214C Showerhead assembly and apparatus for manufacturing semiconductor device having the same
09/24/2008CN100421211C Apparatus for controlling gas flow in a semiconductor substrate processing chamber
09/24/2008CN100421207C Plasma processor coil
09/24/2008CN100421206C Ion beam irradiation apparatus and insulating spacer for the same
09/23/2008US7426900 Integrated electrostatic inductive coupling for plasma processing
09/18/2008WO2008111365A1 Scanning electron microscope having length measuring function and sample dimension length measuring method
09/18/2008WO2008110547A1 Novel plasma system for improved process capability
09/18/2008WO2008091729A3 Technique for improving the performance and extending the lifetime of an ion source with gas dilution
09/18/2008WO2008080002A3 Method of diffusion-bond powder metallurgy sputtering target
09/18/2008US20080224374 Sample holding mechanism and sample working/observing apparatus
09/18/2008US20080224159 shaping and crosslinking thermoplastic elastomers, to form lenses or reflectors having an increased heat deflection and distortion temperature, a lower coefficient of thermal expansion and improved mechanical properties
09/18/2008US20080223725 Process chamber component having electroplated yttrium containing coating
09/18/2008US20080223715 Coating of Optical Substrates Using Closed Field System
09/18/2008DE102008013753A1 Probenverschiebungsverfahren in Ladungsteilchenstrahlgerät und Ladungsteilchenstrahlgerät sowie Probe für Transmissionselektronenmikroskop Samples shift method in charged particle and charged particle beam and sample for transmission electron
09/18/2008DE102008013511A1 Vorrichtung zum Bearbeiten und Beobachten von Proben sowie Verfahren zum Bearbeiten und Beobachten von Querschnitten Apparatus for working and observing samples and method for processing and monitoring of cross-sections
09/18/2008DE102007010873A1 Objektivlinse Objective lens
09/18/2008DE102006043900B4 Vorrichtung und Verfahren zum Betrieb einer Plasmaanlage Apparatus and method for operating a plasma system
09/18/2008DE102005002537B4 Vorrichtung für einen Strahl geladener Teilchen zum Messen eines Abbildungsvergrösserungsfehlers Device for a charged particle beam for measuring an imaging magnification error
09/18/2008DE10157224B4 Parameterüberwachungsvorrichtung für eine Hochspannungskammer in einem Halbleiterwaferverarbeitungssystem Parameter monitoring device for a high-voltage chamber in a semiconductor wafer processing system
09/17/2008EP1970936A2 Image forming method and electron microscope
09/17/2008EP1970935A1 Lens coil cooling of a magnetic lens
09/17/2008EP1970465A2 Method and sputter-deposition system for depositing a layer composed of a mixture of materials and having a predetermined refractive index
09/17/2008EP1970464A1 Cathode evaporation machine
09/17/2008EP1969613A1 Method of manufacturing at least one sputter-coated substrate and sputter source
09/17/2008EP1711644A4 Compensation of spacing between magnetron and sputter target
09/17/2008EP1702344A4 Stabilizing plasma and generator interactions
09/17/2008EP1697556A4 Rotating sputtering magnetron
09/17/2008EP1609165B1 Ion beam incident angle detector for ion implant systems
09/17/2008EP1585999A4 Methods and apparatus for preparing specimens for microscopy
09/17/2008EP1356496B1 Apparatus for evaporation of materials for coating objects
09/17/2008EP1269803B1 Plasma accelerator arrangement
09/17/2008CN201117619Y Demountable arc-discharging chamber
09/17/2008CN101268538A Method and device for the plasma treatment of the interior of hollow bodies
09/17/2008CN101266909A Information acquisition apparatus, cross section evaluating apparatus and cross section evaluating method
09/17/2008CN100419944C Plasma treating coil
09/17/2008CN100419886C Pattern drawing apparatus, method of manufacturing a master disk for manufacturing information recording media, and method of manufacturing an information recording medium
09/17/2008CN100419411C Scanning device with buffer for tunnel scanning microscope
09/16/2008US7425716 Method and apparatus for reducing charge density on a dielectric coated substrate after exposure to a large area electron beam
09/16/2008US7425712 Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation
09/16/2008US7425708 Secondary electron detector unit for a scanning electron microscope
09/16/2008US7425704 Inspection method and apparatus using an electron beam
09/16/2008US7425703 Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method
09/16/2008US7425702 Charged particle beam apparatus
09/16/2008US7425701 Electron-beam device and detector system
09/16/2008US7425694 Time-resolved measurement apparatus
09/16/2008US7425093 Thermography test method and apparatus for bonding evaluation in sputtering targets
09/12/2008WO2008109406A1 Membrane supports with reinforcement features
09/12/2008WO2008107705A1 Apparatus
09/12/2008WO2008106956A2 Voltage supply for a sputtering system
09/12/2008WO2008071303A3 Particle-optical arrangement
09/12/2008WO2008067213A3 Techniques for low temperature ion implantation
09/12/2008WO2005084087A3 Methods and apparatus for generating high-density plasmas with ionizational instabilities
09/11/2008US20080220596 Delivery of Low Pressure Dopant Gas to a High Voltage Ion Source
09/11/2008US20080217554 Charged particle beam writing apparatus and charged particle beam writing method
09/11/2008US20080217535 Method of forming a sample image and charged particle beam apparatus
09/11/2008US20080217241 Corrugated substrate containing nonwoven, synthetic fabric; nanofibers deposited on one side of substrate by spinning
09/11/2008US20080217170 Sputtering system
09/11/2008DE102007011230A1 Magnetronplasmaanlage Magnetronplasmaanlage
09/10/2008EP1968188A1 Class D amplifier assembly
09/10/2008EP1968099A1 Thin film deposited on a substrate and deposition system for such thin film
09/10/2008EP1968098A1 Suction device for plasma coating chamber
09/10/2008EP1968094A2 Non-axisymmetric charged-particle beam system
09/10/2008EP1966815A2 Particle-optical component
09/10/2008EP1835347A4 Image producing methods and image producing devices
09/10/2008EP1497846B1 Device for treating surfaces of containers with plasma
09/10/2008EP1367609B1 High-voltage electric apparatus
09/10/2008CN201112360Y Reaction cavity