Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803)
12/1993
12/29/1993EP0576185A2 Exposure drum mask
12/28/1993US5272980 Alignment method for transfer and alignment device
12/22/1993EP0574459A1 Registration system
12/21/1993US5272517 Height measurement apparatus using laser light beam
12/21/1993US5272501 Projection exposure apparatus
12/16/1993DE4219004A1 Punch for stamping mounting holes in reproduction film esp. for multi-colour e.g. offset printing - consisting of stamping table and support plate with stamping system having several punching tools for the prodn. of holes controlled across processor unit.
12/14/1993US5270771 Aligner and exposure method for manufacturing semiconductor device
12/08/1993EP0573299A1 Position detection method using an optical interference signal and electronic filtering of this signal in the spatial frequency domain
12/07/1993US5268744 Method of positioning a wafer with respect to a focal plane of an optical system
12/02/1993DE4217430A1 Pick=up arrangement for detecting and representing objects for comparison - has electronic camera and prismatic deflection devices forming partial images of simultaneously detected object regions
11/1993
11/30/1993US5266790 Focusing technique suitable for use with an unpatterned specular substrate
11/30/1993US5266425 Self-aligned process for applying color filters to electronic output color image intensifiers
11/24/1993EP0570807A1 Method and apparatus for aligning depth images
11/23/1993US5264310 Semiconductors
11/16/1993US5262822 Exposure method and apparatus
11/16/1993US5262257 Forming circuit and alignment pattern areas with different materials irradiation with electron beam, multilayer
11/11/1993WO1993022143A1 Method and apparatus for mounting of colour separation films upon preparing of printing plates
11/09/1993US5260771 Method of making semiconductor integrated circuit, pattern detecting method, and system for semiconductor alignment and reduced stepping exposure for use in same
11/09/1993US5260580 Stage device for an exposure apparatus and semiconductor device manufacturing method which uses said stage device
11/03/1993EP0568478A1 Darkfield alignment system using a confocal spatial filter
11/02/1993US5257444 Plate making apparatus
10/1993
10/26/1993US5255607 Method and apparatus for maintaining registration when making a printing plate
10/19/1993US5254209 Method of making micromechanical components
10/06/1993EP0564255A2 Stage device and pattern transfer system using the same
10/05/1993US5250983 Photo reticle for fabricating a semiconductor device
09/1993
09/28/1993US5249016 Semiconductor device manufacturing system
09/22/1993EP0561302A1 Manufacture of alignment marks for holographic lithography
09/21/1993US5247329 Projection type exposure method and apparatus
09/16/1993DE4208103A1 Auto-correlation of measuring inaccuracies in lithography system - forming superimposed images of linear and strip grids on high resolution film, subjecting to effect for set time, and observing using microscopic
09/14/1993US5245470 Polarizing exposure apparatus using a polarizer and method for fabrication of a polarizing mask by using a polarizing exposure apparatus
09/08/1993EP0559397A2 Precision positioning apparatus
09/08/1993EP0558781A1 Method and apparatus for exposure of substrates
09/07/1993US5243379 Exposure drum mask
09/07/1993US5243195 Projection exposure apparatus having an off-axis alignment system and method of alignment therefor
09/07/1993US5242770 Improved resolution, reduced proximity effects
09/02/1993WO1993017369A1 Multiple assembly register system
08/1993
08/31/1993US5241361 Pattern shift measuring method
08/31/1993US5241188 Apparatus for detecting a focussing position
08/26/1993DE4205944A1 Method of adjusting relative positions of mask film and circuit board - involves adjusting positions of film and board with absolute coordination systems so each can be moved in same plane independently
08/26/1993DE4205301A1 Mehrfach-montage-registersystem Multiple-montage-register system
08/25/1993EP0556669A1 Proximity mask alignment using a stored video image
08/18/1993EP0555213A1 Proximity alignment using polarized illumination and double conjugate projection lens
08/17/1993US5237393 Reticle for a reduced projection exposure apparatus
08/17/1993CA1321298C Alignment of lithographic system
08/12/1993DE4203699A1 Offset printing plate mfr. on copying machines - secures copy documents on mounting further apart than after illumination for suction together by copying frame
08/10/1993US5235408 Position detecting method and apparatus
08/03/1993US5233669 Device for and method of detecting positioning marks for cutting ceramic laminated body
08/03/1993US5233536 Method and apparatus for perforating a printed circuit board
08/03/1993CA1320828C Aligning
07/1993
07/27/1993US5231467 Reflective alignment position signal producing apparatus
07/22/1993WO1993014445A1 Improved mask for photolithography
07/22/1993CA2124077A1 Improved mask for photolithography
07/20/1993US5229617 Position detecting method having reflectively scattered light prevented from impinging on a detector
07/13/1993US5227862 Projection exposure apparatus and projection exposure method
07/13/1993US5227838 Exposure system
07/13/1993US5227626 Lithography apparatus using scanning tunneling microscopy
07/13/1993US5227268 X-ray mask and its fabricating method-comprising a first and second alignment pattern
07/13/1993US5226362 Pallet alignment assembly
07/07/1993EP0549633A1 Improved memory system
07/06/1993US5225892 Positional deviation detecting method
07/06/1993US5225686 Positioning method and positioning mechanism for use in exposure apparatus
06/1993
06/29/1993US5222293 System for placing an object on a carrier and method
06/15/1993US5220176 Apparatus and method for detecting alignment marks having alignment optical systems' driving means
06/08/1993US5218415 Device for optically detecting inclination of a surface
06/08/1993US5218193 Double-focus measurement apparatus utilizing chromatic aberration by having first and second bodies illuminated respectively by a single wavelength ray and a ray having a plurality of wavelengths
06/08/1993US5217550 Alignment transfer method
06/01/1993US5216257 Method and apparatus for alignment and overlay of submicron lithographic features
05/1993
05/25/1993US5214493 Reduction exposure apparatus with correction for alignment light having inhomogeneous intensity distribution
05/25/1993US5214489 Aligning device for exposure apparatus
05/25/1993US5213916 Photolithography, integrated circuits, layers with different optical transmissivities
05/19/1993EP0222787B1 Method and device for aligning, controlling and/or measuring bidimensional objects
05/19/1993CN1072273A Point-to-point photoetch method and system used for producing circular optical grating code disk
05/13/1993WO1993009467A1 Method and apparatus for transfer of a reticle pattern onto a substrate by scanning
05/05/1993EP0539757A1 Optical type encoder
05/05/1993EP0539384A1 Process for producing a marker indicating the orientation of the crystal lattice of a wafer
05/04/1993US5208680 Layout position designating sheet and method of mounting original using the same
05/04/1993US5207414 Media handling system for photoplotter and method of use
04/1993
04/27/1993US5205039 Method for registering multiple printing plates
04/20/1993US5204739 Proximity mask alignment using a stored video image
04/20/1993US5204535 For use in an exposure apparatus
04/14/1993EP0536842A1 X-ray alignment system
04/14/1993EP0536655A1 Measuring method and measuring apparatus
04/13/1993US5202748 In situ process control system for steppers
04/13/1993US5202275 Forming insulation films, doping gate electrodes of random memory cells
04/06/1993US5200800 Position detecting method and apparatus
04/06/1993US5200798 Method of position detection and the method and apparatus of printing patterns by use of the position detection method
03/1993
03/31/1993EP0534759A1 Position detector
03/31/1993EP0534758A1 Method and device for measuring positional deviation
03/31/1993EP0534757A1 Method and device for measuring displacement
03/31/1993EP0534720A1 Register marks
03/30/1993US5198857 Film exposure apparatus and method of exposure using the same
03/28/1993CA2078732A1 Displacement measuring device and displacement measuring method
03/28/1993CA2078726A1 Position detector
03/23/1993US5197089 Pin chuck for lithography system
03/23/1993US5196711 Deviation measuring device including a mask having a grating pattern and a zone plate pattern
03/23/1993US5195417 Registration of artwork panels in the manufacture of printed circuit boards
03/17/1993EP0531779A1 X-ray mask containing a cantilevered tip for gap control and alignment
03/16/1993US5194744 Compact reticle/wafer alignment system
03/16/1993US5193690 Method of and apparatus for automatically inspecting an exposed and bent lithographic plate
03/10/1993EP0531102A1 Aligner and exposure method for manufacturing semiconductor device