| Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803) |
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| 06/26/1990 | US4936665 High resolution imagery systems and methods |
| 06/26/1990 | US4936175 Printing plate registering method and device |
| 06/19/1990 | US4935773 For holding a sensitive sheet of material in precise registration |
| 06/19/1990 | US4935334 Method for forming a photoresist pattern and apparatus applicable therewith |
| 06/12/1990 | US4933715 Method of detecting position of a mark |
| 06/12/1990 | US4932781 Gap measuring apparatus using interference fringes of reflected light |
| 06/06/1990 | EP0371897A1 Process for the decoration of a conformable model, use of this process and product obtained |
| 06/05/1990 | CA1269824A1 Device for aligning a photomask onto a printed wiring board |
| 05/30/1990 | EP0370834A2 Semiconductor device, and method of manufacture |
| 05/29/1990 | US4929083 Focus and overlay characterization and optimization for photolithographic exposure |
| 05/14/1990 | EP0349632A4 Gap sensing/adjustment apparatus and method for a lithography machine. |
| 05/08/1990 | US4924304 Video probe aligning of object to be acted upon |
| 05/08/1990 | US4923301 Alignment of lithographic system |
| 05/03/1990 | DE3836888A1 Copier for the exposure of printing plates |
| 04/24/1990 | CA1268264A1 Determination of best focus for step and repeat projection aligners |
| 04/18/1990 | EP0363884A2 Layout position designating sheet and method of mounting original using the same |
| 04/17/1990 | US4918320 Alignment method usable in a step-and-repeat type exposure apparatus for either global or dye-by-dye alignment |
| 04/17/1990 | US4918301 Position sensor having double focuses and utilizing a chromatic aberration |
| 04/11/1990 | EP0363164A2 X-ray exposure system |
| 04/10/1990 | US4916482 Apparatus for composing a plurality of original films on a base sheet |
| 04/04/1990 | EP0361934A2 Exposure method |
| 04/04/1990 | EP0361933A2 Alignment system |
| 04/04/1990 | EP0361818A2 Universal platen holddown apparatus |
| 03/22/1990 | WO1990002640A1 Apparatus for punching and/or cutting sheets of material |
| 03/21/1990 | EP0359170A2 Two-dimensional position detecting method and apparatus |
| 03/20/1990 | US4910706 Analog memory for storing digital information |
| 03/20/1990 | US4910679 Step-and-repeat alignment and exposure method and apparatus |
| 03/20/1990 | US4910606 Solid state pick-up having particular exposure and read-out control |
| 03/14/1990 | EP0358515A2 Device for detecting positional relationship between two objects |
| 03/14/1990 | EP0358514A2 Position detecting method and apparatus |
| 03/14/1990 | EP0358513A2 Position detecting method and apparatus |
| 03/14/1990 | EP0358512A2 Position detecting method and apparatus |
| 03/14/1990 | EP0358511A2 Device for detecting positional relationship between two objects |
| 03/14/1990 | EP0358425A2 Position detecting method and apparatus |
| 03/07/1990 | EP0357426A2 Light quantity controlling apparatus |
| 03/06/1990 | US4907035 Universal edged-based wafer alignment apparatus |
| 03/06/1990 | US4906852 Projection alignment method and apparatus |
| 02/28/1990 | EP0355496A2 Position detector employing a sector fresnel zone plate |
| 02/27/1990 | US4904087 Method for aligning photomasks |
| 02/20/1990 | US4902900 Device for detecting the levelling of the surface of an object |
| 02/20/1990 | US4902133 Method and an apparatus for aligning first and second objects with each other |
| 02/13/1990 | US4901109 Alignment and exposure apparatus |
| 02/07/1990 | EP0354148A2 Apparatus for projecting a series of images onto dies of a semiconductor wafer |
| 02/05/1990 | EP0334936A4 Method and apparatus for registering color separation film. |
| 01/30/1990 | US4897689 Photographic exposure apparatus including a means for the relative positioning of a photographic material and an original in sheet form |
| 01/30/1990 | US4897553 Projection exposure apparatus |
| 01/23/1990 | US4896260 Data processor having integrated circuit memory refresh |
| 01/23/1990 | US4895447 Phase-sensitive interferometric mask-wafer alignment |
| 01/17/1990 | EP0218613B1 Device for the alignment, testing and/or measurement of two-dimensional objects |
| 01/10/1990 | EP0349632A1 Gap sensing/adjustment apparatus and method for a lithography machine. |
| 01/09/1990 | US4893163 Semiconductor wafer |
| 01/03/1990 | EP0348908A2 Apparatus and method for forming an intermediate original sheet for printing a book |
| 12/27/1989 | EP0348022A1 Fastener for releasably securing together a plurality of sheet or plate members e.g. printing plates |
| 12/27/1989 | CN1038357A Mfg. method of original for exposed photographic printing |
| 12/19/1989 | US4888614 Observation system for a projection exposure apparatus |
| 12/12/1989 | US4886974 Mark detecting device for detecting the center of a mark by detecting its edges |
| 12/07/1989 | DE3915642A1 Ausricht- und belichtungsvorrichtung Alignment and exposure apparatus |
| 11/30/1989 | DE3816613A1 Device for producing dimensionally correct copies from originals which have form below the tolerance in terms of length |
| 11/29/1989 | EP0343856A2 Alignment of lithographic system |
| 11/29/1989 | EP0343609A2 Method of manufacturing main plates for exposure printing |
| 11/28/1989 | US4883359 Alignment method and pattern forming method using the same |
| 11/23/1989 | EP0342316A2 Method of electron beam lithography alignment |
| 11/15/1989 | EP0342061A2 Projection exposure apparatus |
| 11/15/1989 | EP0341848A2 Optical alignment system for use in photolithography and having reduced reflectance errors |
| 11/15/1989 | EP0341743A2 Alignment of mask and semiconductor wafer using linear fresnel zone plate |
| 11/14/1989 | US4881100 Alignment method |
| 11/14/1989 | US4880310 Optical device for alignment in a projection exposure apparatus |
| 11/14/1989 | US4880309 Dark field target design system for alignment of semiconductor wafers |
| 11/14/1989 | US4880308 Aligning apparatus |
| 11/02/1989 | WO1989010584A1 A method for making a reticle mask |
| 11/02/1989 | EP0339953A2 Lithographic mask structure and device for positioning the same |
| 10/25/1989 | EP0338200A2 Method and apparatus for characterization of optical systems |
| 10/25/1989 | EP0338110A1 Method for forming a photoresist pattern and apparatus applicable with said method |
| 10/24/1989 | US4876165 Coating substrate with soluble heat resistant dye in curable resin vehicle |
| 10/19/1989 | DE3814229C1 Device for the enlarged viewing of an original |
| 10/17/1989 | US4875076 Exposure apparatus |
| 10/17/1989 | US4874954 Projection exposure apparatus |
| 10/17/1989 | US4874282 Pallet stocker apparatus for printer |
| 10/11/1989 | EP0336537A1 Device for detecting positional relationship between two objects |
| 10/04/1989 | EP0335074A2 Alignment mark system |
| 10/04/1989 | EP0334936A1 Method and apparatus for registering color separation film |
| 10/03/1989 | US4871955 System for strictly positioning an object along an axis |
| 10/03/1989 | US4871919 Electron beam lithography alignment using electric field changes to achieve registration |
| 10/03/1989 | US4871257 Optical apparatus for observing patterned article |
| 09/26/1989 | US4870668 Gap sensing/adjustment apparatus and method for a lithography machine |
| 09/26/1989 | US4870559 Intelligent transducer |
| 09/26/1989 | US4870452 Projection exposure apparatus |
| 09/26/1989 | US4870289 Apparatus for controlling relation in position between a photomask and a wafer |
| 09/26/1989 | US4870288 Alignment method |
| 09/26/1989 | US4869481 Plate-like article holding device |
| 09/20/1989 | EP0333326A2 Position detecting method and apparatus |
| 09/19/1989 | US4867566 Method and apparatus for calibrating artwork from a direct imaging system |
| 09/13/1989 | EP0332300A2 Method and apparatus for measuring an interval between two objects |
| 09/12/1989 | US4866262 Optical imaging arrangement comprising an opto-electronic focussing-error detection system |
| 09/12/1989 | US4865455 Optical device having a variable geometry filter usable for aligning a mask or reticle with a wafer |
| 09/05/1989 | US4864123 Apparatus for detecting the level of an object surface |
| 08/29/1989 | US4862008 Method and apparatus for optical alignment of semiconductor by using a hologram |
| 08/29/1989 | US4861162 Alignment of an object |
| 08/23/1989 | EP0329433A2 Position detecting method and apparatus |
| 08/23/1989 | EP0329430A2 Position detecting device |