Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803) |
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11/19/1987 | EP0245434A1 Device for aligning a photomask onto a printed wiring board. |
11/19/1987 | EP0245431A1 Photoimaging processes and compositions. |
11/10/1987 | US4705940 Focus detection in a projection optical system |
11/04/1987 | EP0243520A1 Interferometric mask-wafer alignment |
11/03/1987 | US4704033 Multiple wavelength linear zone plate alignment apparatus and method |
11/03/1987 | US4704027 Dark field alignment and alignment mark systems |
11/03/1987 | US4704020 Projection optical apparatus |
10/27/1987 | US4703434 Apparatus for measuring overlay error |
10/27/1987 | US4703185 Arrangement for optical imaging of two subjects located in different object planes |
10/27/1987 | US4702606 Position detecting system |
10/21/1987 | EP0242178A2 Laser beam generator for use with an X-ray lithography system |
10/20/1987 | US4701940 Linearly polarized X-ray patterning process |
10/20/1987 | US4701606 Projection optical apparatus |
10/20/1987 | US4701050 Semiconductor exposure apparatus and alignment method therefor |
10/13/1987 | US4699515 Process of transfer of mask pattern onto substrate and apparatus for alignment therebetween |
10/07/1987 | EP0240058A1 Positioning device comprising a Z-manipulator and a O-manipulator |
10/06/1987 | US4698834 X-ray mask membrane deflection compensator and method |
10/06/1987 | US4698513 Position detector by vibrating a light beam for averaging the reflected light |
10/06/1987 | US4698284 Device for aligning a photomask onto a printed wiring board |
09/29/1987 | US4697087 Reverse dark field alignment system for scanning lithographic aligner |
09/16/1987 | EP0237109A1 Method of aligning a mask and a substrate relative to each other and arrangementfor carrying out the method |
09/16/1987 | EP0237102A1 Arrangement for aligning a mask and a substrate relative to each other |
09/15/1987 | US4694477 Flexure stage alignment apparatus |
09/15/1987 | US4694186 System for photoelectric detection |
09/10/1987 | DE3614678C1 Register hole punch |
09/09/1987 | EP0235861A1 Device for detecting a centring error |
09/08/1987 | US4692648 Rotating collector assembly for electrical machines |
09/08/1987 | CA1226682A1 Method of adjusting relative positions of two objects by using diffraction grating and control apparatus |
09/02/1987 | EP0234591A2 An apparatus for composing a plurality of original films on a base sheet |
09/01/1987 | US4690880 Coating, photoresists, images, exposure, development, etching |
09/01/1987 | US4690529 Optical exposer |
08/19/1987 | EP0233089A2 Method for aligning first and second objects relative to each other, and apparatus for practicing this method |
08/19/1987 | EP0233056A2 Light absorbing coating |
08/18/1987 | US4688088 For detecting a mark having edges |
08/18/1987 | US4687980 X-Y addressable workpiece positioner and mask aligner using same |
08/18/1987 | US4687322 Projection optical apparatus |
08/13/1987 | WO1987004791A1 Automatic printed circuit board imaging system |
08/12/1987 | EP0231977A1 Optical imaging arrangement comprising an opto-electric focussing-error detection system |
08/11/1987 | US4686655 Filtering system for processing signature signals |
08/11/1987 | US4686622 Computer system architecture using serial communication |
08/11/1987 | US4686531 Capacitance height gage applied in reticle position detection system for electron beam lithography apparatus |
08/11/1987 | US4685807 Optical microlithography apparatus with a local alignment system |
08/11/1987 | US4685805 Small gap measuring apparatus |
08/05/1987 | EP0231067A2 Photography pin board system |
08/05/1987 | EP0230648A2 Method of forming an alignment mark |
07/21/1987 | US4682277 Movable light source type exposure apparatus |
07/21/1987 | US4682037 Projection exposure apparatus having an alignment light of a wavelength other than that of the exposure light |
07/21/1987 | US4681430 Method for focusing projection printer |
07/15/1987 | CN86107270A Device for positioning optical mask onto printed-circuit boards |
07/14/1987 | US4679942 Method of aligning a semiconductor substrate and a photomask |
07/07/1987 | US4679071 Method of recording register marks |
07/01/1987 | EP0226905A2 A method for facilitating the alignment of a photomask with individual fields on the surfaces of a number of wafers |
07/01/1987 | EP0226893A1 Process for the high-precision measuring of bi-dimensional structures, and reference mask for carrying out the process |
06/30/1987 | US4677303 Automatic printed circuit board imaging system |
06/30/1987 | US4677301 Alignment apparatus |
06/30/1987 | US4677043 Stepper process for VLSI circuit manufacture utilizing radiation absorbing dyestuff for registration of alignment markers and reticle |
06/16/1987 | EP0225457A1 Exposure apparatus for photosensitive layered materials |
06/11/1987 | DE3605498A1 Device for aligning and stamping image carriers |
06/09/1987 | US4672676 Method and apparatus for automatically aligning an object with respect to a reference pattern |
06/09/1987 | US4672557 Automatic accurate alignment system |
06/09/1987 | US4672457 Scanner system |
06/03/1987 | EP0224458A2 Method and apparatus for adjusting the binding back margins, especially for sew-stitched, wire-stitched and block stitched magazines |
06/02/1987 | US4669885 Apparatus for inspecting negatives |
06/02/1987 | US4669884 Variable wavelength optical alignment system |
06/02/1987 | US4669883 Method and apparatus for alignment |
06/02/1987 | US4669867 Alignment and exposure apparatus |
06/02/1987 | US4669866 Step-and-repeat alignment and exposure system and method therefore |
06/02/1987 | US4669842 Projection optical device |
05/27/1987 | EP0222787A1 Method and device for aligning, controlling and/or measuring bidimensional objects. |
05/26/1987 | US4668089 Exposure apparatus and method of aligning exposure mask with workpiece |
05/20/1987 | EP0221916A1 Device for automatically determining the deviation between the structures of a pattern and those of an object compared therewith. |
05/19/1987 | US4667109 Alignment device |
05/19/1987 | US4666291 Light-exposure apparatus |
05/12/1987 | US4664524 Optical self-alignment system |
05/07/1987 | WO1987002791A1 Photoimaging processes and compositions |
05/07/1987 | WO1987002790A1 Device for aligning a photomask onto a printed wiring board |
05/06/1987 | EP0220571A1 Method and apparatus for alignment |
05/05/1987 | US4663534 Position detecting device utilizing selective outputs of the photodetector for accurate alignment |
05/05/1987 | US4662754 Method for facilitating the alignment of a photomask with individual fields on the surfaces of a number of wafers |
05/05/1987 | US4662753 Apparatus and method for aligning objects |
04/28/1987 | US4660966 Optical alignment apparatus |
04/22/1987 | EP0218613A1 Device for the alignment, testing and/or measurement of two-dimensional objects. |
04/21/1987 | US4659228 Aligning apparatus |
04/21/1987 | US4659227 Alignment apparatus |
04/21/1987 | US4659225 Pattern exposure apparatus with distance measuring system |
04/14/1987 | US4657379 Photomask and exposure apparatus using the same |
04/09/1987 | WO1987002178A1 Optical exposure apparatus |
04/07/1987 | US4656358 Laser-based wafer measuring system |
04/07/1987 | US4656347 Diffraction grating position adjuster using a grating and a reflector |
04/07/1987 | US4655601 Observation device and an aligner using same |
04/07/1987 | US4655600 Alignment method |
04/07/1987 | US4655599 Mask aligner having a photo-mask setting device |
04/07/1987 | US4655598 Position detection method and apparatus |
04/07/1987 | US4655594 Displacement device, particularly for the photolithographic treatment of a substrate |
04/02/1987 | DE3534609A1 Method for the automated adjustment, performed with the use of adjusting marks, of a plurality of masks in a projection-printing method |
04/01/1987 | EP0216305A2 Film checking apparatus |
03/31/1987 | US4654581 Capacitive mask aligner |
03/31/1987 | US4653369 Flexographic printing plate mounting method and apparatus |
03/31/1987 | CA1219893A1 Electro-magnetic apparatus |
03/25/1987 | EP0215055A1 Laser-based wafer measuring system |