Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803)
07/1991
07/02/1991US5028797 An alignment system for align first and second objects using alignment marks
06/1991
06/25/1991US5027225 Apparatus for fabricating pre-press masking film
06/25/1991US5026976 Double-focus detector utilizing chromatic aberration
06/25/1991US5026166 Apparatus for pre-aligning substrate preparatory to fine alignment
06/18/1991US5025168 Alignment apparatus including three beams and three gratings
06/18/1991US5025165 Method for producing a semiconductor device using an electron beam exposure tool and apparatus for producing the device
06/11/1991US5023815 Method and apparatus for registering color film separations
06/04/1991US5021821 Film circuit substrate exposure apparatus
05/1991
05/28/1991US5020006 Method for finding a reference point
05/21/1991US5017514 Method of manufacturing a semiconductor device using a main vernier pattern formed at a right angle to a subsidiary vernier pattern
05/15/1991EP0426868A1 Positioning table
05/15/1991EP0426866A1 Projection/exposure device and projection/exposure method
05/14/1991US5015866 Stage apparatus in exposing apparatus
05/14/1991US5014413 Method and apparatus for facilitating loading of a panel processing machine and positioning of artwork on a work surface thereon
05/08/1991EP0425739A1 Alignment apparatus and SOR X-ray exposure apparatus having same
04/1991
04/30/1991US5012345 Film registration apparatus and method
04/23/1991US5010418 Image pick-up device
04/17/1991CN1012406B Optical receptor
04/16/1991US5008705 Autofocus system for microlithography
04/10/1991EP0421645A2 Apparatus for and method of optical inspection in a total internal reflection holographic imaging system
04/03/1991EP0420700A2 Exposure apparatus
04/03/1991EP0420574A2 Alignment system
04/03/1991EP0245431A4 Photoimaging processes and compositions
04/02/1991US5005046 Pattern forming method
04/02/1991US5004348 Alignment device
03/1991
03/27/1991EP0419240A2 Exposure apparatus
03/26/1991US5003345 Apparatus and method for aligning and focusing an image of a reticle onto a semiconductor wafer
03/26/1991US5003342 Exposure apparatus
03/19/1991US5000573 Method of alignment with the use of diffraction gratings and an apparatus therefor
03/12/1991US4999669 Levelling device in an exposure apparatus
03/12/1991US4999487 Dual focus
03/12/1991US4998823 Two-dimensional position detecting method and apparatus
03/06/1991EP0415724A2 Alignment system
03/05/1991US4996763 Method of locating work in automatic exposing apparatus
02/1991
02/19/1991US4993837 Method and apparatus for pattern detection
02/13/1991EP0412756A2 Exposure apparatus
02/12/1991US4991962 High precision alignment system for microlithography
02/06/1991EP0411966A2 Position detection method and apparatus
01/1991
01/30/1991EP0410802A2 Position detecting method
01/29/1991US4988197 Method and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objects
01/29/1991US4987686 Step and repeat apparatus
01/23/1991EP0409573A2 Method of detecting positional deviation
01/23/1991EP0409572A2 Position detecting system
01/16/1991EP0408393A2 Screen printing method
01/16/1991EP0408381A2 Position signal producing apparatus
01/16/1991EP0408349A2 Mask for lithography
01/16/1991EP0221916B1 Device for automatically determining the deviation between the structures of a pattern and those of an object compared therewith
01/15/1991US4984890 Method and an apparatus for aligning first and second objects with each other
01/09/1991CN2069127U Optical and automatic photomechanical production arrangement
01/01/1991US4982227 Photolithographic exposure apparatus with multiple alignment modes
01/01/1991US4981529 Semiconductor substrate provided with marks for alignment even under a resist film
01/01/1991US4981385 Releasable fastener
12/1990
12/25/1990US4980718 Registration method in photolithography and equipment for carrying out this method
12/19/1990EP0403227A1 Registration apparatus
12/18/1990US4978841 Automatic leveling system and a method of leveling a workpiece based on focus detection
12/18/1990US4977683 Image control board
12/12/1990EP0401691A2 Method and device for detecting registration marks in a multicolour printing press
12/11/1990US4977361 X-Y addressable workpiece positioner and mask aligner using same
12/11/1990US4977048 Actinic alignment to CEM coated resist films
11/1990
11/22/1990EP0398566A2 Support apparatus for panels
11/22/1990EP0398006A2 Vacuum blanket
11/20/1990US4971444 Method and apparatus for detecting the position of an object
11/20/1990US4971443 Optical position detecting method and apparatus therefor
11/15/1990WO1990013790A1 Positioning table
11/14/1990EP0397530A2 Alignment apparatus
11/13/1990US4970587 Alignment table for automatic exposing apparatus
11/01/1990WO1990013000A1 Projection/exposure device and projection/exposure method
10/1990
10/31/1990EP0394568A1 Video probe aligning of object to be acted upon
10/30/1990US4967088 Method and apparatus for image alignment in ion lithography
10/24/1990EP0393775A1 Apparatus for projecting a mask pattern on a substrate
10/16/1990US4964146 Pattern transistor mask and method of using the same
10/09/1990US4962423 Mark detecting method and apparatus
10/09/1990US4962318 Alignment system for exposure apparatus
09/1990
09/26/1990EP0389209A2 Pattern forming method
09/20/1990WO1990010891A1 Method and apparatus for automation of the working step of composing in a process reproduction plant
09/20/1990DE3905093A1 Method and device for the production of printing plates
09/18/1990US4958082 Position measuring apparatus
09/18/1990US4956906 Method of preparing pre-distorted images for decorating a shaped blank
09/11/1990US4955780 Wafer positioning apparatus
09/05/1990EP0385272A2 Double-focus detector utilizing chromatic aberration
09/04/1990US4955062 Pattern detecting method and apparatus
09/04/1990US4954951 System and method for increasing memory performance
08/1990
08/30/1990DE3910048A1 Method for producing or inspecting microstructures on large-area substrates
08/28/1990US4952970 Autofocusing system for a projecting exposure apparatus
08/28/1990US4952815 Focusing device for projection exposure apparatus
08/28/1990US4952060 Alignment method and a projection exposure apparatus using the same
08/21/1990US4950910 For depicting a pattern on a sample
08/16/1990EP0381985A2 Method for printing non-absorbing materials and printing plate for realizing the method
08/14/1990US4948983 Alignment of mask and semiconductor wafer using linear fresnel zone plate
07/1990
07/24/1990US4944036 Signature filter system
07/24/1990US4943733 Projection optical apparatus capable of measurement and compensation of distortion affecting reticle/wafer alignment
07/18/1990EP0378033A1 Process for setting up a photolithographic exposure machine
07/17/1990US4942516 Single chip integrated circuit computer architecture
07/17/1990US4941745 Projection aligner for fabricating semiconductor device having projection optics
07/10/1990CA1271313A1 Reticle transporter
07/04/1990EP0245434B1 Device for aligning a photomask onto a printed wiring board
07/03/1990US4938598 Method and apparatus for position detection on reduction-projection system
06/1990
06/26/1990US4937618 Alignment and exposure apparatus and method for manufacture of integrated circuits
06/26/1990US4937459 Alignment signal detecting device
06/26/1990US4937162 Method of obtaining relatively aligned patterns on two opposite surfaces of an opaque slice