Patents for G03F 9 - Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically (10,803)
03/1987
03/24/1987US4653008 Method of controlling platemaking positions and errors
03/24/1987US4652914 Method of recording register marks
03/24/1987US4652134 Mask alignment system
03/24/1987US4652118 Device for mounting film in-register for producing printing plates for small offset printing presses
03/17/1987US4650983 Focusing apparatus for projection optical system
03/10/1987US4648708 Pattern transfer apparatus
03/04/1987EP0212219A2 Visibility enhancement of first order alignment marks
03/03/1987CA1218763A1 Focal plane adjusted photomask and methods of projecting images onto photosensitized workpiece surfaces
02/1987
02/24/1987US4645924 Observation apparatus with selective light diffusion
02/24/1987US4645338 Optical system for focus correction for a lithographic tool
02/24/1987US4645336 Method and apparatus for determining the trimmed images of originals for reproduction on printing technology
02/17/1987US4643579 Aligning method
02/12/1987WO1987000968A1 Positioning table
02/10/1987US4642468 Position detecting method for detecting the relative positions of the first and second members
02/10/1987US4641921 Optical adjusting process
02/03/1987US4641257 Measurement method and apparatus for alignment
02/03/1987US4641244 Method and apparatus for registering color separation film
02/03/1987US4641035 Apparatus and a method for position detection of an object stepped portion
02/03/1987US4640888 Etching a slit reflecting light as one peak
02/03/1987US4640619 Microlithographic calibration scheme
01/1987
01/27/1987CA1217224A1 Electro-magnetic alignment apparatus
01/27/1987CA1217223A1 Electro-magnetic alignment assemblies
01/27/1987CA1217088A1 Displacement device, particularly for the photolithographic treatment of a substrate
01/20/1987CA1216876A1 Electro-magnetic alignment device
01/14/1987EP0078323B1 Apparatus for projecting a series of images onto dies of a semiconductor wafer
01/13/1987US4636968 Method of positioning a beam to a specific portion of a semiconductor wafer
01/13/1987US4636626 Apparatus for aligning mask and wafer used in semiconductor circuit element fabrication
01/13/1987US4636080 Two-dimensional imaging with line arrays
01/13/1987US4636077 Aligning exposure method
01/13/1987US4636067 Photography pin board system
01/06/1987US4634876 Object position detecting apparatus using accumulation type sensor
01/06/1987US4634240 Optical apparatus using polarized light
12/1986
12/30/1986US4632724 Visibility enhancement of first order alignment marks
12/30/1986US4632557 Alignment target image enhancement for microlithography process
12/30/1986EP0205571A1 Establishing and/or evaluating alignment by means of alignment marks.
12/23/1986US4631416 Wafer/mask alignment system using diffraction gratings
12/23/1986CA1215570A1 Exposure device
12/17/1986EP0204901A2 Process and device for printing an electronic circuit in an exact relation to the reference holes in a circuit board
12/16/1986US4629313 Exposure apparatus
12/16/1986CA1215412A1 Suction device for holding plates
12/04/1986WO1986007169A1 Device for automatically determining the deviation between the structures of a pattern and those of an object compared therewith
12/02/1986US4627010 Method and device for discriminating stillness of a step exposure apparatus
12/02/1986US4627005 Equal density distribution process
12/02/1986US4626907 Method and apparatus for mutually aligning objects
11/1986
11/26/1986EP0202961A1 Apparatus for projecting and exposing a photomask pattern onto re-exposing substrates
11/20/1986WO1986006852A1 Method and device for aligning, controlling and/or measuring bidimensional objects
11/18/1986US4623257 Alignment marks for fine-line device fabrication
11/12/1986EP0200814A1 Method and apparatus for registering color separation film
11/11/1986US4621922 Device for the projection copying of masks onto a workpiece
11/04/1986US4620785 Sheet-like member having alignment marks and an alignment apparatus for the same
10/1986
10/29/1986EP0199014A2 Apparatus and method for determining focus correction for a lithographic tool
10/28/1986US4619524 Device for the projection copying of masks
10/22/1986EP0198571A2 Method and system for patching original and extracting original-trimming data in scanner
10/21/1986US4618261 Optical gap measuring
10/15/1986EP0197221A1 Device for measuring the position of an object
10/15/1986EP0197161A1 Press plate positioning apparatus for automatic drawing machine
10/14/1986US4617469 Alignment apparatus
10/14/1986US4616908 For projecting a reduced image of a reticle
10/09/1986WO1986005895A1 Device for the alignment, testing and/or measurement of two-dimensional objects
10/07/1986US4616130 Projection exposure apparatus
10/07/1986US4615621 Auto-focus alignment and measurement system and method
10/07/1986US4615614 Optical exposure apparatus
10/07/1986US4615515 For use in a semiconductor circuit manufacturing apparatus
10/01/1986CN85107228A Method and apparatus for registering color separation film
09/1986
09/30/1986US4614864 Apparatus for detecting defocus
09/30/1986US4614433 Mask-to-wafer alignment utilizing zone plates
09/30/1986US4614432 Pattern detector
09/30/1986US4614431 Alignment apparatus with optical length-varying optical system
09/30/1986US4614415 Illumination signal processing system
09/25/1986WO1986005587A1 Laser-based wafer measuring system
09/23/1986CA1211869A1 Continuous alignment target pattern and signal processing
09/09/1986US4611122 Signal detection apparatus with plural elongate beams corresponding
09/09/1986US4610940 Method for fabricating a photomask pattern
09/09/1986US4610442 Positioning table
08/1986
08/19/1986US4607213 Shielded capacitive mask aligner
08/19/1986US4606643 Fine alignment system
08/06/1986EP0189869A2 Improved step-and-repeat aligment and exposure system and method therefore
08/06/1986EP0189435A1 Mask-to-wafer alignment utilizing zone plates.
08/05/1986US4603473 Method of fabricating integrated semiconductor circuit
07/1986
07/23/1986EP0188234A2 Improved step-and-repeat alignment and exposure system
07/22/1986US4601560 Focus adjustment in an alignment and exposure apparatus
07/17/1986WO1986004158A1 Establishing and/or evaluating alignment by means of alignment marks
07/15/1986US4600309 Process and apparatus for theoptical alignment of patterns in two close-up planes in an exposure means incorporating a divergent radiation source
07/15/1986US4600282 For aligning an object with an imaging plane of an optical system
07/08/1986US4599657 Image pick-up device
07/08/1986US4599122 Method of taping separation films for photoengraving and apparatus therefor
07/08/1986US4599000 Position detection signal processing apparatus
07/01/1986US4598242 Mask feed method and apparatus for exposure replicate systems
07/01/1986US4597669 Pattern detector
07/01/1986US4597664 Step-and-repeat projection alignment and exposure system with auxiliary optical unit
06/1986
06/25/1986EP0185263A1 Apparatus for imaging two objects placed in different object planes
06/24/1986US4596467 Dissimilar superimposed grating precision alignment and gap measurement systems
06/24/1986CA1206629A1 Device for photolithographically treating a thin substrate
06/17/1986US4595295 Alignment system for lithographic proximity printing
06/17/1986US4595282 Recording apparatus
06/17/1986US4594868 System and plate bending machine for registering in an offset printing press
06/17/1986CA1206030A1 Bore-sighted step-and-repeat projection alignment and exposure system
06/11/1986EP0184063A2 Method of positioning printing plates before cutting registration holes as well as device for carrying out the method
06/03/1986US4592650 Apparatus for projecting a pattern on a semiconductor substrate
06/03/1986US4592648 Device for projection copying of masks onto a workpiece