Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2000
05/18/2000WO2000028798A1 Method of manufacturing an interlayer via and a laminate precursor useful for same
05/18/2000WO2000028604A1 Indirect laser patterning of resist
05/18/2000WO2000028572A1 Apparatus for producing charged particle beam
05/18/2000WO2000028385A2 Method and device for aligning two photo masks with each other and optionally, an unexposed printed circuit board blank, and for subsequent simultaneous exposure in the production of double-sided printed circuit boards
05/18/2000WO2000028384A1 Wafer chamber having a gas curtain for extreme-uv lithography
05/18/2000WO2000028383A1 Radiation-sensitive resin composition
05/18/2000WO2000028382A1 Photosensitive compounds, photosensitive resin compositions, and pattern formation method making use of the compounds or compositions
05/18/2000WO2000028381A1 Method for producing microcomponents having flow channels
05/18/2000WO2000028380A1 Exposure method and exposure apparatus
05/18/2000WO2000027891A1 Preparation of partially cross-linked polymers and their use in pattern formation
05/18/2000WO2000027644A1 Computerized cutting method and apparatus for use in printing operations
05/18/2000WO1999049346A8 High na system for multiple mode imaging
05/18/2000DE19940749A1 Integrated synthesis and analysis method e.g. for polymers, comprises a carrier body provided with immobilized receptors to provide respective channels before contact with sample and subsequent analysis
05/18/2000DE19852258A1 Strahlungsempfindliches Aufzeichnungsmaterial zur Herstellung von Wasserlos-Offsetdruckplatten A radiation-sensitive recording material for the production of waterless offset printing plates
05/18/2000CA2350075A1 Method of manufacturing an interlayer via and a laminate precursor useful for same
05/17/2000EP1001512A2 Actuator and transducer
05/17/2000EP1001315A2 Method and device for exposing both sides of a sheet
05/17/2000EP1001314A2 Durable optical system for projection exposure apparatus and method of manufacturing the same
05/17/2000EP1001313A1 Scan type projection exposure apparatus and device manufacturing method using the same
05/17/2000EP1001312A1 Radiation sensitive recording material for the production of dry offset printing plates
05/17/2000EP1001311A1 Patterning device
05/17/2000EP1001295A1 Objective with polarisation effects compensation
05/17/2000EP1000924A1 Acid-sensitive compound and resin composition for photoresist
05/17/2000EP1000768A2 Production of lithographic printing plate support
05/17/2000EP1000434A1 Method for obtaining self-aligned openings, in particular for microtip flat display focusing electrode
05/17/2000EP1000387A1 Overcoat for light-sensitive materials comprising a (1-vinylimidazole) polymer or copolymer
05/17/2000EP1000386A1 Rubber-based aqueous developable photopolymers and photocurable elements comprising same
05/17/2000EP1000385A1 Method and composition for producing activating light absorbing lenses
05/17/2000EP1000384A1 Latex-based, aqueous developable photopolymers and use thereof in printing plates
05/17/2000EP1000371A2 Ultra-broadband uv microscope imaging system with wide range zoom capability
05/17/2000EP1000090A1 Novel photoinitiators and applications therefor
05/17/2000EP0808477B1 Fabrication and use of a sub-micron dimensional standard
05/17/2000CN1253639A Antireflective coating compositions for photoresist compositions and use thereof
05/17/2000CN1253638A Light absorbing polymers
05/17/2000CN1253311A Printing sub photo etching image by using shadow arbor and eccentric shaft exposure
05/16/2000US6064517 High NA system for multiple mode imaging
05/16/2000US6064485 Method of optical proximity correction
05/16/2000US6064475 Real time local defocus monitor system using maximum and mean angles of focus correction
05/16/2000US6064467 Alignment apparatus, and exposure apparatus with the alignment apparatus
05/16/2000US6064466 Planarization method and system using variable exposure
05/16/2000US6064072 Plasma focus high energy photon source
05/16/2000US6063953 Chemical-sensitization photoresist composition
05/16/2000US6063896 Acrylic acid/ester-maleimide derivative copolymer having improved etch and heat resistance; high resolution submicrolithography
05/16/2000US6063888 Polydimethylsiloxane compound which has at least two urethane bonds in one molecule, an unreactive organic group on at least end, and a radical curable ethylenically unsaturated group at other end; shelf life; optical fiber coatings bundles
05/16/2000US6063653 Method of fabricating a TFT-LCD
05/16/2000US6063554 Decoating of a silver halide diffusion transfer printing plate by treating with aqueous solution containing at least one nonionic surfactant
05/16/2000US6063550 Using an anionic surfactant in the alkaline aqueous developer as an antideposit agent to prevent scum build-up, the surfactant comprising a polyoxyethylene glycol having a phosphate end group and a hydrophobic hydrocarbon end group
05/16/2000US6063549 Comprising an acid-generating compound, a film-forming binder having groups cleavable by acid catalysis, a compound with latent aromatic groups and a film-forming binder with latent aromatic groups
05/16/2000US6063547 Allows easier bottom antireflective coating photoresist removal and better planarization and line width control over topography; heating the polymer in a vacuum to vaporize and deposit as a thin film of uniform thickness
05/16/2000US6063545 Comprising a sulfonated polyhydroxy-substited benzene to generate a strong acid using actinic radiation, a compound having two groups crosslinkable by means of acid and a binder insoluble in water or soluble/swellable in aqueous alkaline
05/16/2000US6063543 Radiation-sensitive mixture and its use
05/16/2000US6063542 Polymer for positive photoresist and chemical amplification positive photoresist composition comprising the same
05/16/2000US6063540 Method for making lithographic printing plate
05/16/2000US6063531 The test focus monitor structure includes densely packed parallel lines, an isolated line, an orthogonal line and rectangular islands and are approximately the critical dimension and is placed on a reticle or mask
05/16/2000US6063530 Control of critical dimensions through measurement of absorbed radiation
05/16/2000US6063529 Overlay accuracy measurement mark
05/16/2000US6063439 Casing, rotary table, supply mechanism
05/16/2000US6063200 Three-dimensional micro fabrication device for filamentary substrates
05/16/2000US6063190 Method of forming coating film and apparatus therefor
05/16/2000US6062551 Active vibration-isolating device
05/16/2000US6062240 Treatment device
05/16/2000US6062239 Fan blades on the rotor blow air over the wafers, to move any remaining fluid droplets away from the wafer centers, to allow centrifugal force to fling the fluid droplets off of the wafers.
05/16/2000CA2028541C Photosensitive mixture
05/11/2000WO2000026954A1 Method of reducing stop layer loss in a photoresist stripping process using hydrogen as a fluorine scavenger
05/11/2000WO2000026726A1 Method of forming pattern
05/11/2000WO2000026725A1 Photocurable and photopatternable hydrogel matrix based on azlactone copolymers
05/11/2000WO2000026724A1 Organic-solvent-based photosensitive resist composition and method of forming resist pattern
05/11/2000WO2000026703A1 Wavelength tuning of photo-induced gratings
05/11/2000WO2000026222A1 Substituted benzoylferrocene anionic photoinitiators
05/11/2000WO2000026219A1 Oxime derivatives and the use thereof as latent acids
05/11/2000DE19940810A1 Biochemical analysis instrument uses mixture of sample and smart reagent beads viewed by color CCD camera to perform chemical analysis of medical samples.
05/11/2000DE19851749A1 Polarisationsoptisch kompensiertes Objektiv Optical polarization compensated lens
05/11/2000DE19851575A1 Verfahren und Vorrichtung zum Ausrichten zweier Fotomasken zueinander und gegebenenfalls eines unbelichteten Leiterplatten-Rohlings und zum anschließenden simultanen Belichten bei der Herstellung von doppelseitigen Leiterplatten Method and apparatus for aligning two photomasks with each other and optionally an unexposed PCB blank and subsequent to simultaneous exposure in the production of double-sided printed circuit boards
05/11/2000CA2346475A1 Wavelength tuning of photo-induced gratings
05/10/2000EP0999475A2 Position detecting system and exposure apparatus using the same
05/10/2000EP0999474A1 Compounds for photoresist and resin composition for photoresist
05/10/2000EP0999473A1 Photosensitive resin composition and photosensitive element using the same
05/10/2000EP0999208A1 Nitrogenous heterocyclic compounds and hyperlipemia remedy containing the same
05/10/2000EP0999073A1 Lithographic plate
05/10/2000EP0998774A1 Wavelength shift correction technique for a laser
05/10/2000EP0998697A1 Method and system for providing a probe array chip design database
05/10/2000EP0998696A2 Viscosity stabilization of radiation-curable filled compositions
05/10/2000EP0998695A1 Sedimentation stabilized radiation-curable filled compositions
05/10/2000EP0821812B1 Method of determining the radiation dose in a lithographic apparatus, and test mask and apparatus for performing the method
05/10/2000EP0820384B1 Method and arrangement for the production of a stencil
05/10/2000EP0772800B1 Lithographic device with a three-dimensionally positionable mask holder
05/10/2000EP0678785B1 Dry lithographic plate
05/10/2000CN1252874A An illumination unit and a method for point illumination of a medium
05/10/2000CN1252873A An apparatus and a method for illuminating a light-sensitive medium
05/10/2000CN1052245C Epoxy acrylates containing carboxy and its preparing method and use
05/09/2000US6061606 Geometric phase analysis for mask alignment
05/09/2000US6061605 Methods of treating a semiconductor wafer
05/09/2000US6061376 Tangential fan for excimer laser
05/09/2000US6061188 Projecting printing apparatus, projection printing method, mask pattern for estimating amplitude aberrations, method of estimating the quantity of amplitude aberration, and amplitude-aberration estimating filter
05/09/2000US6061174 Image-focusing optical system for ultraviolet laser
05/09/2000US6061119 Method of measuring image-forming error of projection optical system, method of manufacturing exposure apparatus, and method of manufacturing semiconductor device
05/09/2000US6061118 Reflection system for imaging on a nonplanar substrate
05/09/2000US6061075 Non-systolic time delay and integration printing
05/09/2000US6060717 Charged particle beam exposure method and charged particle beam exposure apparatus therefor
05/09/2000US6060716 Electron beam lithography method