Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2001
01/23/2001US6177218 Lithographic process for device fabrication using electron beam imaging
01/23/2001US6177199 Forming a solution of a solvent and the organohydridosiloxane resin, dispensing the solution on a substrate, spinning the substrate, baking the substrate to remove the solvent, and curing the substrate to form the dielectric film
01/23/2001US6177133 Method and apparatus for adaptive process control of critical dimensions during spin coating process
01/23/2001US6176962 Methods for fabricating enclosed microchannel structures
01/23/2001US6176770 Grindstone having a vacuum system in a pin chuck stepper
01/23/2001US6176286 Film applying apparatus
01/23/2001US6176274 Method and system for measuring fluid volume in a photolithography track
01/23/2001US6176252 Apparatus for supplying liquid in semiconductor manufacturing process
01/23/2001CA2081961C Photoelectrochemical imaging system
01/18/2001WO2001004707A1 Photoresist removal process using forming gas plasma
01/18/2001WO2001004706A1 Chemical amplification resist composition
01/18/2001WO2001004705A1 Alkali development type photocurable composition and pattern of burned matter obtained from the same
01/18/2001WO2001004682A1 Broad band ultraviolet catadioptric imaging system
01/18/2001WO2001004638A1 Merged-mask micro-machining process
01/18/2001DE19929199A1 Verfahren und Vorrichtung zum Herstellen eines dreidimensionalen Objektes Method and apparatus for producing a three-dimensional object
01/18/2001DE10019704A1 Cleaning liquid for semiconductor device manufacturing includes phosphoric acid or orthophosphoric acid which has preset hydrogen ion concentration for removing resist scum adhered to wiring layer
01/18/2001CA2714788A1 Merged-mask micro-machining process
01/17/2001EP1069600A1 Illuminator, exposing method and apparatus, and device manufacturing method
01/17/2001EP1069478A2 Resist processing for integrated circuit manufacture
01/17/2001EP1069477A2 Exposure apparatus and device manufacturing method using the same
01/17/2001EP1069476A1 Apparatus and method for exposure
01/17/2001EP1069453A2 Device for reducing the peak output of a pulse laser light source
01/17/2001EP1069448A1 Catadioptric optical system and projection exposure apparatus equipped with the same
01/17/2001EP1068641A1 Stepper alignment mark formation with dual field oxide process
01/17/2001EP1068559A1 Negative-working, dry planographic printing plate
01/17/2001EP1068075A1 Improved photopolymer film and method for producing same
01/17/2001EP1068020A1 Fluid nozzle system , energy emission system for photolithography and its method of manufacture
01/17/2001EP1068019A1 Energy emission system for photolithography
01/17/2001EP1025462A4 Thermosetting polyester anti-reflective coatings for multilayer photoresist processes
01/17/2001CN1280384A Method and equipment for reducing non-uniform area influence in semiconductor device production
01/17/2001CN1280360A Exposure device and method optic disc driver and recording and/or reproducing method
01/17/2001CN1280316A Explosure device for double side printed circuit board
01/17/2001CN1280315A Method for forming photoetching offset plate figure
01/17/2001CN1280172A Composition for cleaning photoetching glue in integrated circuit production
01/16/2001US6175953 Method and apparatus for general systematic application of proximity correction
01/16/2001US6175422 Method and apparatus for the computer-controlled manufacture of three-dimensional objects from computer data
01/16/2001US6175418 Multiple alignment mechanism in close proximity to a shared processing device
01/16/2001US6175405 Projection exposure method and method of manufacturing a projection exposure apparatus
01/16/2001US6175404 Exposure apparatus having dynamically isolated reaction frame
01/16/2001US6175121 Block mask and charged particle beam exposure method and apparatus using the same
01/16/2001US6174801 E-beam direct writing to pattern step profiles of dielectric layers applied to fill poly via with poly line, contact with metal line, and metal via with metal line
01/16/2001US6174741 Method for quantifying proximity effect by measuring device performance
01/16/2001US6174651 Method for depositing atomized materials onto a substrate utilizing light exposure for heating
01/16/2001US6174650 Forming resist film in clean room by conducting surface treatment on semiconductor substrate with silane compound; coating semiconductor substrate with chemically amplified resist; exposing and developing
01/16/2001US6174647 Providing circuit layer comprising photoresist and via opening; roughening; adsorbing compound having ligand for palladium on photoresist; applying photoresist; catalyzing; metallized exposed palladium compound to form metal pad
01/16/2001US6174645 Biocompatibility; nontoxic; anticoagulants
01/16/2001US6174644 Semiconductor integrated circuits
01/16/2001US6174643 Process for developing lithographic printing plate
01/16/2001US6174642 Imaging system employing encapsulated radiation sensitive composition
01/16/2001US6174633 Method for correcting photocontiguous effect during manufacture of semiconductor device
01/16/2001US6174632 Coating wafer with resist, the wafer having first and second sections; exposing first section which provides area to attract developmenr residue, developing all of the resist in the first and second sections; inspecting wafer for defects
01/16/2001US6174630 Method of proximity correction with relative segmentation
01/16/2001US6174590 Isolation using an antireflective coating
01/16/2001US6174155 Apparatus for producing ultraviolet blocking lenses
01/16/2001CA2150689C Waterless lithographic plate
01/11/2001WO2001003173A1 Method for patterning a layer of a low dielectric constant material
01/11/2001WO2001003170A1 Exposure method and device
01/11/2001WO2001002909A1 Photosensitive resin composition and method for improving dry etching resistance of photosensitive resin composition
01/11/2001WO2001002908A1 Method for manufacturing semiconductor integrated circuit device, optical mask used therefor, method for manufacturing the same, and mask blanks used therefor
01/11/2001WO2001002907A1 Apparatus and method of image enhancement through spatial filtering
01/11/2001WO2000052528A3 Monograin membrane mask
01/11/2001DE19931848A1 Astigmatische Komponenten zur Reduzierung des Wabenaspektverhältnisses bei EUV-Beleuchtungssystemen Astigmatic components to reduce the honeycomb aspect ratio in EUV illumination systems
01/11/2001DE19931751A1 Vorrichtung zur Reduzierung der Peakleistung einer Pulslaser-Lichtquelle Apparatus for reducing the peak power of a pulse laser light source
01/11/2001DE19929448A1 Transparent film coating of stereo or similar images, especially 3D computer animations, by drawing film and image carrier into press chamber and sucking onto upper and position correcting plates
01/11/2001DE19919036C1 Production of an etching mask made of a polymeric material comprises initially applying the polymer mask material to a structured layer and then graphitizing the surface of the mask material
01/11/2001DE10030428A1 Positiv arbeitende Resistzusammensetzung The positive resist composition
01/10/2001EP1067536A2 Exposure apparatus and method, optical disc drive, and recording and/or reproducing method
01/10/2001EP1067438A1 Exposure device for double-sided printed circuit boards
01/10/2001EP1067437A2 Anamorphic components for reducing an aspect ratio in illumination systems
01/10/2001EP1067436A1 Image forming composition, image recording material comprising the same, and process of image formation
01/10/2001EP1067435A1 Positively photosensitive resin composition
01/10/2001EP1067112A2 Carboxylic acid derivatives and their synthesis method
01/10/2001EP1067096A2 Quartz glass members for excimer laser, and their method of manufacture
01/10/2001EP1066904A1 Planographic printing plate cutting device and method
01/10/2001EP1066506A1 Method and apparatus for synthesis of arrays of dna probes
01/10/2001EP1066365A1 Acidic composition containing fluoride for removal of photoresists and etch residues
01/10/2001EP1066252A1 A process of controlling particle size of naphthoquinone diazide esters
01/10/2001EP1066123A1 Improvement in aqueous stripping and cleaning compositions
01/10/2001CN1279777A Photoresist composition containing condensation polymer
01/10/2001CN1279776A Smart photolithography
01/10/2001CN1060570C Sculpture technology for composite containing polyurethane
01/09/2001US6172825 Catoptric reduction projection optical system and projection exposure apparatus and method using same
01/09/2001US6172740 Projection exposure apparatus and device manufacturing method
01/09/2001US6172739 Exposure apparatus and method
01/09/2001US6172738 Scanning exposure apparatus and device manufacturing method using the same
01/09/2001US6172409 Buffer grated structure for metrology mark and method for making the same
01/09/2001US6172373 Stage apparatus with improved positioning capability
01/09/2001US6172364 Charged particle beam irradiation apparatus
01/09/2001US6172325 Laser processing power output stabilization apparatus and method employing processing position feedback
01/09/2001US6171973 Process for etching the gate in MOS technology using a SiON-based hard mask
01/09/2001US6171766 Laser absorbable photobleachable compositions
01/09/2001US6171765 Patterning of organic light emitting diodes for use in matrix-addressed displays
01/09/2001US6171764 Method for reducing intensity of reflected rays encountered during process of photolithography
01/09/2001US6171763 Ultra-thin resist and oxide/nitride hard mask for metal etch
01/09/2001US6171761 Resist pattern forming method utilizing multiple baking and partial development steps
01/09/2001US6171760 Lithography method and system in which a photoresist film is irradiated with light while the charged particle beam is applied
01/09/2001US6171759 Photocurable composition
01/09/2001US6171758 Dimensionally stable flexographic printing plates
01/09/2001US6171757 Organometallic polymers and use thereof
01/09/2001US6171756 Photoactive materials applicable to imaging systems