Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2001
05/08/2001US6228512 Amorphous layer of molybdenum, ruthenium and crystalline beryllium; multilayer mirrors
05/08/2001US6227926 Construction of electrode for high pressure discharge lamp and process for producing the same
05/05/2001CA2324850A1 A machine for exposing a panel to laser radiation
05/03/2001WO2001031678A1 Method and radiation generating system using microtargets
05/03/2001WO2001031404A1 Using block copolymers as supercritical fluid developable photoresists
05/03/2001WO2001031403A1 Ionic lithography method, implementing equipment and reticle for such equipment
05/03/2001WO2001031402A1 Method for the production of nanometer range surface decorated substrates
05/03/2001WO2001031401A1 Self-processing of diffractive optical components in hybrid sol-gel glasses
05/03/2001WO2001030725A2 Diisopropylbenzene solvent for developing flexographic printing plates
05/03/2001US20010000744 Thermal transfer element and process for forming organic electroluminescent devices
05/03/2001DE10036867A1 Method for processing substrate, e.g. semiconductor wafer comprises arranging substrate in processing vessel, forming layer of solvent over surface of substrate, and dissolving an operating gas in layer of solvent
05/03/2001CA2324913A1 A device for measuring relative position error
05/03/2001CA2324893A1 A device for transferring and supporting panels
05/02/2001EP1096551A2 Method for making integrated circuits having features with reduced critical dimensions
05/02/2001EP1096321A1 Light exposure method
05/02/2001EP1096320A2 Contact exposure device provided with a mask and workpiece interval setting means
05/02/2001EP1096319A1 Positive-working photoresist composition
05/02/2001EP1096318A1 Resist composition and patterning process
05/02/2001EP1096317A1 Resist composition and patterning process
05/02/2001EP1096316A1 Positive resist composition
05/02/2001EP1096315A1 Negative-type image recording material and precursor for negative-type lithographic printing plate
05/02/2001EP1096314A1 Lithographic printing plate precursor
05/02/2001EP1096313A1 Active particle, photosensitive resin composition, and process for forming pattern
05/02/2001EP1095393A2 System and method to correct for distortion caused by bulk heating in a substrate
05/02/2001EP1095346A1 Two-dimensional to three-dimensional vlsi design
05/02/2001EP1095315A1 Method for decontaminating microlithography projection lighting devices
05/02/2001EP1095314A1 Method and apparatus for coating a solution onto a substrate
05/02/2001EP1095313A1 Photopolymerizable thermosetting resin compositions
05/02/2001EP1095310A1 A reflection system for imaging on a nonplanar substrate
05/02/2001EP1095304A1 Multiplexer for laser lithography
05/02/2001EP1078926A9 Pyran derivatives
05/02/2001EP0968458A4 Optical proximity correction method for intermediate-pitch features using sub-resolution scattering bars
05/02/2001EP0804753B1 Method of developing positive photoresist and developing compositions therefor
05/02/2001CN1293822A Projection optical system, method for producing the same, and projection exposure apparatus using the same
05/02/2001CN1293772A Positively photosensitive resin composition
05/02/2001CN1293534A Transmission belt type vacuum applicator and coating method of printing circuit board anti-corrosion drying film
05/02/2001CN1293451A Charged particle beam photoetching device and photoetching process of charged particle beam
05/02/2001CN1293450A Electron beam exposure method and mask used and electron beam exposure system
05/02/2001CN1293383A Water-dispersible negative photosensitive composition
05/02/2001CN1293221A Using N,N,N'-trialkylurea to reduce surface tension
05/02/2001CN1293218A Epoxy resin composition, adhesive film and preimpregnatel blank and multilayer printing circuit board
05/02/2001CN1065178C Process for producing three-dimensional object
05/02/2001CA2324910A1 "a device for generating a plurality of laser beams"
05/01/2001US6226781 Modifying a design layer of an integrated circuit using overlying and underlying design layers
05/01/2001US6226354 Short-wavelength electromagnetic-radiation generator
05/01/2001US6226346 Reflective optical imaging systems with balanced distortion
05/01/2001US6226133 Optical apparatus and a method of transporting the same
05/01/2001US6226131 Apparatus and method for fabricating a lenticular plate
05/01/2001US6226128 Light-transmitting optical member, manufacturing method thereof, evaluation method therefor, and optical lithography apparatus using the optical member
05/01/2001US6226110 Method and apparatus for holographically recording an essentially periodic pattern
05/01/2001US6226087 Method for measuring the positions of structures on a mask surface
05/01/2001US6226075 Supporting device provided with a gas spring with a gas bearing, and lithographic device provided with such supporting devices
05/01/2001US6226074 Exposure monitor mask, exposure adjusting method and method of manufacturing semiconductor devices
05/01/2001US6226073 Stage system with driving mechanism, and exposure apparatus having the same
05/01/2001US6226072 Stage system and exposure apparatus with the same
05/01/2001US6225625 Signal detection methods and apparatus
05/01/2001US6225476 Acrylic ester compound having alkoxycarbonyl group or group derived from molecule of lactone compound by removing hydrogen atom bonded to carbon atom; monomer of film-forming resin
05/01/2001US6225389 Includes an epoxy oligomer and/or urethane oligomer having at least two ethylenically unsaturated moieties, at least one alkoxylated polyol monomer capable of being copolymerized with the oligomer, sugar surfactant; water washable
05/01/2001US6225219 Method of stabilizing anti-reflection coating layer
05/01/2001US6225215 Method for enhancing anti-reflective coatings used in photolithography of electronic devices
05/01/2001US6225134 Method of controlling linewidth in photolithography suitable for use in fabricating integrated circuits
05/01/2001US6225034 Photoresist stripping liquid compositions and a method of stripping photoresists using the same
05/01/2001US6225033 In which slits having a rectangular cross section can be formed and the exposure dose and the focusing margin can be sufficiently large.
05/01/2001US6225031 That avoids introducing dimensional changes and does not adversely impact the dimensional stability
05/01/2001US6225030 Post-ashing treating method for substrates
05/01/2001US6225027 Ondenser collects radiation, here soft x-rays, and couples it to the ringfield of a camera designed for projection lithography.
05/01/2001US6225026 Printing stencil and a method for preparation thereof
05/01/2001US6225025 Fabrication process of a semiconductor device by electron-beam lithography
05/01/2001US6225020 Such as used in 4 g or 16 g dram semiconductor devices using a light source such as arf, an e-beam, euv, or an ion beam, photoresist for the top surface image (tsi) process using silylation, maleimide andnorbonene carboxylate comonomers,
05/01/2001US6225019 Photosensitive resin, resist based on the photosensitive resin, exposure apparatus and exposure method using the resist, and semiconductor device obtained by the exposure method
05/01/2001US6225013 Stitching design rules for forming interconnect layers
05/01/2001US6225012 Method for positioning substrate
05/01/2001US6225011 Method for manufacturing semiconductor devices utilizing plurality of exposure systems
05/01/2001US6224785 Aqueous ammonium fluoride and amine containing compositions for cleaning inorganic residues on semiconductor substrates
05/01/2001US6224735 Process for recording image
05/01/2001US6224730 Field emission display having black matrix material
05/01/2001US6224274 Semiconductor processing apparatus
05/01/2001US6224273 Process and device for the continuous separation of the constituents of an engraving bath
05/01/2001US6224248 Light-source device and exposure apparatus
05/01/2001CA2016547C Photocurable pigmented secondary optical fiber coatings
04/2001
04/26/2001WO2001030122A1 Production of a dense mist of micrometric droplets in particular for extreme uv lithography
04/26/2001WO2001029942A1 Energy stabilized gas discharge laser
04/26/2001WO2001029939A1 Single chamber gas discharge laser with line narrowed seed beam
04/26/2001WO2001029879A2 Systems and methods for photoresist strip and residue treatment in integrated circuit manufacturing
04/26/2001WO2001029845A1 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
04/26/2001WO2001029620A1 Apparatus and methods for development of resist patterns
04/26/2001WO2001029619A1 Reticle, wafer and method for determining an alignment error in a stepper
04/26/2001WO2001029618A1 Method for determining rotational error portion of total misali gnment error in a stepper
04/26/2001WO2001029617A1 Reticle, wafer, measuring stepper and methods for preventative maintenance
04/26/2001WO2001029616A1 Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern, resist pattern and substrate having the resist pattern laminated thereon
04/26/2001WO2001029615A1 Photomask original form having layer for protecting film surface and method for preparing the same, and protective layer-forming liquid for photomask original form
04/26/2001WO2001029284A1 Novel composition for selective etching of oxides over metals
04/26/2001WO2001029093A1 Photoinitiator formulations
04/26/2001WO2001028950A1 A method and apparatus for treating a substrate with an ozone-solvent solution
04/26/2001US20010000515 Forming planarization film on substrate that does not smoke or fume on heating by applying polymeric solution including novolac resin, a surfactant selected from nonfluorinated hydrocarbon, fluorinated hydrocarbon and combinations, heating
04/26/2001DE10045014A1 Verfahren zur Herstellung eines diffusions-resistenten Linsen-Elementes A process for the preparation of a diffusion-resistant lens element
04/26/2001DE10028019A1 Photo mask for semiconductor device manufacture, has comparison-on mask and test-on mask patterns of same shape, arranged adjacently on mask top photoengraving process test mask area of photo mask substrate
04/25/2001EP1094366A1 Method for optical proximity correction
04/25/2001EP1094365A1 Photoimageable composition containing flexible oligomer
04/25/2001EP1094364A1 Photoimageable composition having photopolymerizeable binder oligomer