Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2001
02/01/2001WO2001007885A2 Phase-shifting point diffraction interferometer focus-aid enhanced mask
02/01/2001WO2001007506A2 Microfabricated devices and method of manufacturing the same
02/01/2001WO2001007177A1 Process and apparatus for treating a workpiece such as a semiconductor wafer
02/01/2001WO2000072090A3 A method for error reduction in lithography
02/01/2001WO2000055690A3 A compact photoemission source, field and objective lens arrangement for high throughput electron beam lithography
02/01/2001DE19962160A1 Extreme UV and soft X-ray radiation source e.g. for extreme UV lithography, has auxiliary electrode behind opening in one main gas discharge electrode for increasing energy conversion efficiency
02/01/2001DE19935404A1 Beleuchtungssystem mit mehreren Lichtquellen A lighting system comprising a plurality of light sources
02/01/2001DE10036183A1 Verfahren und Gerät zum Erhitzen eines Wafers und Verfahren und Gerät zum Ausheizen eines Photoresistfilms auf einem Wafer Method and apparatus for heating a wafer, and method and apparatus for baking a photoresist film on a wafer
02/01/2001DE10028327A1 Vorrichtung und Verfahren für bildformende Strahlen aus geladenen Teilchen und Bestrahlungsvorrichtung mit Strahlen aus geladenen Teilchen Apparatus and method for image-forming beams of charged particles and radiation device with beams of charged particles
02/01/2001CA2377832A1 Narrow band gas discharge laser with gas additive
01/2001
01/31/2001EP1073097A2 Dot mark reading apparatus and reading method
01/31/2001EP1072958A2 Method for mounting multiple printing elements onto a cylindrical element
01/31/2001EP1072957A2 Illumination system with multiple light sources
01/31/2001EP1072956A2 Stable pigment dispersion and photosensitive recording material prepared therewith
01/31/2001EP1072955A2 Image forming material
01/31/2001EP1072954A2 Lithographic process for device fabrication
01/31/2001EP1072953A1 Flexographic printing plate precursor comprising an ink-jet receiving layer
01/31/2001EP1072927A2 Colour filter for a liquid crystal panel and process for producing it
01/31/2001EP1072658A1 Process for improving the adhesiveness of acrylate resins
01/31/2001EP1072432A2 Image forming material and method for forming thereof
01/31/2001EP1072403A2 A photosensitive lithographic printing plate
01/31/2001EP1072401A2 Method of manufacturing a planographic printing plate
01/31/2001CN2417489Y PVC back sprayed transparent film used for color ink jek printer
01/31/2001CN1282295A Direct electrostatic printing method and apparatus
01/31/2001CN1282005A Method for heating wafer and baking photoetch-resist film on wafer and its equipment
01/31/2001CN1282004A Photoresist composition, its preparation method and method for forming pattern by using it
01/31/2001CN1282003A Chip heating device and method for using heated chip
01/30/2001USRE37033 Photopolymerizable mixture curable to form pixels of transparent, smooth, uniform films on substrate; displays
01/30/2001US6181532 Stabilized MR sensor and flux/heat guide joined by contiguous junction
01/30/2001US6181469 Optical member for photolithography, method for evaluating optical member, and photolithography apparatus
01/30/2001US6181420 Interferometry system having reduced cyclic errors
01/30/2001US6180952 Holder assembly system and method in an emitted energy system for photolithography
01/30/2001US6180947 Multi-element deflection aberration correction for electron beam lithography
01/30/2001US6180531 Etching amorphous carbon fluoride film using resist as mask;applying negative bias
01/30/2001US6180528 Method for forming a minute resist pattern and method for forming a gate electrode
01/30/2001US6180498 Alignment targets having enhanced contrast
01/30/2001US6180325 Method for masking and exposing photosensitive printing plates
01/30/2001US6180323 Photopolymerizable compositions having improved sidewall geometry and development latitude
01/30/2001US6180322 Developing thin film, made from radiation sensitive composition comprising alkali-soluble resin and radiation sensitive compound and having latent image pattern, with alkaline developing solution to form thin film pattern wherein
01/30/2001US6180321 Preparing semiconductor substrate with thin film layer, intermediate layer and photoresist layer; exposing partial depth of photoresist layer to light beam; removing portion of photoresist layer exposed to light; patterning
01/30/2001US6180320 Resist pattern is formed on semiconductor substrate through use of acid catalyst chemically-amplified photoresist and forming organic film which includes acid or which produces acid on exposure to light; heat treating film to diffuse acid
01/30/2001US6180319 Applying aqueous-developable photoresist comprising photoinitiator to surface of substrate; imagewise exposing to actinic radiation to produce exposed and non-exposed areas in photoresist; treating with sample of alkaline solution
01/30/2001US6180316 Suitable for use as chemically amplified resist used in manufacturing of integrated circuits
01/30/2001US6180315 Compositions for making structured color images and application thereof
01/30/2001US6180313 Poly (disulfonyl diazomethane) compound and positive-working chemical-amplification photoresist composition containing the same
01/30/2001US6180294 Color filter having substrate and ink absorptive resin layer
01/30/2001US6180289 Projection-microlithography mask with separate mask substrates
01/30/2001US6180288 Gel sensors and method of use thereof
01/30/2001US6180239 Microcontact printing on surfaces and derivative articles
01/30/2001US6180226 Method of forming a monolayer of particles, and products formed thereby
01/30/2001US6180213 Heat sensitive planographic printing plate, its manufacturing method and image forming method employing the same
01/30/2001US6180186 Rapid prototyping technology capable of producing fully dense and functional parts directly from a computer-aided-design (cad) model, stereolithography,
01/30/2001US6180009 For reuse; ultrafiltration, reverse osmosis, pervaporization,distillation
01/30/2001US6179978 Mandrel for forming a nozzle plate having a non-wetting surface of uniform thickness and an orifice wall of tapered contour, and method of making the mandrel
01/30/2001US6179922 Chemical vapor deposition directly to a semiconductor substrate surface by heating a monomer in a gas chamber to vaporize and polymerize; passing polymer vapor to a connected processing chamber and depositing a thin uniform film
01/30/2001US6179915 On track coater unit cup set
01/30/2001US6179448 Automated light tuner
01/30/2001CA2314520A1 Composition sensitive to ir radiation and to heat and lithographic plate coated therewith
01/25/2001WO2001006548A1 Exposure method and system
01/25/2001WO2001006319A1 Holographic photopolymer data recording media and method of holographically reading, recording and storing data
01/25/2001WO2000074112A3 Exposure system and method using quasi-continuous wave laser
01/25/2001WO2000069216A3 Disposable modular hearing aid
01/25/2001WO2000060632A3 Electrostatically focused addressable field emission arraychips (afea's) for high-speed maskless digital e-beam direct write lithography and scanning electron microscopy
01/25/2001DE19933741A1 Verfahren zur Haftungsverbesserung von Acrylatharzen A method for improving adhesion of acrylic resins
01/25/2001DE19933139A1 Stabile Pigmentdispersion und damit hergestelltes strahlungsempfindliches Aufzeichnungsmaterial Stable pigment dispersion and thus produced radiation-sensitive recording material
01/25/2001DE19906564C2 Verfahren zur Herstellung von dreidimensionalen Gegenständen mittels Stereolithographie A process for producing three-dimensional objects by means of stereolithography
01/25/2001DE10032539A1 Diffraction grating finishing comprises forming photosensitive resist layer on base material, emitting near field light onto resist layer, forming diffraction grating pattern in the resist layer, and etching base material
01/25/2001DE10028345A1 Organisches,nicht-reflektierendes Polymer und Verfahren zu dessen Herstellung Organic, non-reflective polymer and process for its preparation
01/25/2001DE10028344A1 Organisches,nicht reflektierendes Überzugspolymer und dessen Herstellungsverfahren Organic, non-reflective coating polymer and its production method
01/24/2001EP1071122A1 Process for correcting the topography of microelectronic substrates
01/24/2001EP1071097A1 Stage positioning device
01/24/2001EP1070991A1 Alkaline aqueous solution and method for forming pattern of photosensitive resin composition using the same
01/24/2001EP1070990A1 Photosensitive composition and method of making lithographic printing plate
01/24/2001EP1070989A1 Flexographic printing plate precursor comprising a (photo)thermographic recording layer
01/24/2001EP1070984A1 Projector and display both comprising optical element for diffraction and scattering
01/24/2001EP1070345A1 Organic removal process
01/24/2001EP1070335A1 Raster shaped beam, electron beam exposure strategy using a two dimensional multipixel flash field
01/24/2001EP1070157A1 Method for removing photoresist and plasma etch residues
01/24/2001CN1281554A Amplitude mask, and apparatus and method for manufacturing long period grating filter using same
01/24/2001CN1281165A 曝光方法及其装置 Exposure method and device
01/23/2001US6178360 Methods and apparatus for determining optimum exposure threshold for a given photolithographic model
01/23/2001US6178256 Removal of reticle effect on critical dimension by reticle rotation
01/23/2001US6178221 Lithography reflective mask
01/23/2001US6178035 Optical device and method of manufacturing the same
01/23/2001US6178028 Multibeam scanning exposure device
01/23/2001US6178000 Monolithic symmetric interferometer for generation of variable-periodicity patterns for lithography
01/23/2001US6177980 High-throughput, maskless lithography system
01/23/2001US6177978 Stage device and exposure apparatus using the same
01/23/2001US6177578 Processless diacetylenic salt films capable of developing a black image
01/23/2001US6177357 Laminating a resist on a polymeric film, exposing a pattern into the resist, developing resist with a aqueous solution to form an image, etching portions of polymer film not covered by crosslinked resist with a base, then stripping the resist
01/23/2001US6177330 Method for correcting alignment, method for manufacturing a semiconductor device and a semiconductor device
01/23/2001US6177234 Applying radiation-sensitive recording layer, optionally containing a colorant or dye, to an image carrier wherein the image carrier has an image-side surface with a maximum average roughness of 0.25 to 0.37 mu.m, exposing, developing
01/23/2001US6177233 Method of forming resist pattern
01/23/2001US6177232 Irradiating layer of radiation-curable composition imagewise, which composition comprises a mixture of at least one radiation polymerizable compound, one filler material, one photoinitiator for polymerization, and silica
01/23/2001US6177231 Resist material and fabrication method thereof
01/23/2001US6177230 Compound having two or more sulfonic acid ester groups each capable of releasing sulfonic acid by the action of heat; recording material
01/23/2001US6177229 Photosensitive composition
01/23/2001US6177228 Photoresist composition and process for its use
01/23/2001US6177226 Positive photoresist composition and process for forming contact hole
01/23/2001US6177225 Comprising a capped polybenzoxazole precursor polymer, a photosensitive agent, and a solvent