Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2001
02/22/2001WO2000054882A8 Individually addressable micro-electromagnetic unit array chips
02/22/2001DE19939687A1 Large-area electron beam radiation exposure dose determination for microelectronics layout, involves dividing the total surface area into several disjunctive part-areas with different structural widths
02/22/2001DE19938463A1 Composition, curable by visible light, useful for dental inlays and rapid prototypes, comprises a compound having an acrylate, methacrylate, vinyl or oxetan group or polysiloxane resin
02/22/2001DE10036001A1 Vorrichtung und Verfahren zur Waferheizung Apparatus and method for wafer heating
02/22/2001DE10027091A1 Negativ arbeitende Resistzusammensetzungen des chemischen Verstärkungstyps Negative-working resist compositions of chemical amplification type
02/21/2001EP1077476A2 Oxygen free plasma stripping process
02/21/2001EP1077393A2 Substrate attracting and holding system for use in exposure apparatus
02/21/2001EP1077392A1 Photosensitive lithographic printing plate
02/21/2001EP1077391A1 Onium salts, photoacid generators for resist compositions, and patterning process
02/21/2001EP1076906A1 Lighting system, especially for extreme ultraviolet lithography
02/21/2001EP1076835A1 Broadband diffractive diffuser and associated methods
02/21/2001EP1076667A1 Preparation of co-and terpolymers of p-hydroxystyrene and alkyl acrylates
02/21/2001EP0863925B1 Metal ion reduction in photoresist compositions by chelating ion exchange resin
02/21/2001CN1284982A Liquid curable resin composition, coating, and cured coating therefrom
02/21/2001CN1284740A Method for electronic beam exposing and method for maaufacture of semiconductor device
02/21/2001CN1284730A Thermal transfer film and its using method
02/20/2001US6192510 Method of preparing a partial one-shot electron beam exposure mask and method of direct-writing patterns by use of a partial one-shot electron beam exposure mask
02/20/2001US6192290 System and method of manufacturing semicustom integrated circuits using reticle primitives from a library and interconnect reticles
02/20/2001US6192100 X-ray mask pellicles and their attachment in semiconductor manufacturing
02/20/2001US6192064 Narrow band laser with fine wavelength control
02/20/2001US6191880 Radial polarization-rotating optical arrangement and microlithographic projection exposure system incorporating said arrangement
02/20/2001US6191844 Scanning exposure apparatus in which light exposure is a function of the speed of the mask or substrate stage
02/20/2001US6191843 Exposure device, method of making and using same, and objects exposed by the exposure device
02/20/2001US6191829 Optical apparatus for optically rotating a portion of a polarization axis of a linearly polarized light
02/20/2001US6191429 Projection exposure apparatus and method with workpiece area detection
02/20/2001US6191397 Heating device, method for evaluating heating device and pattern forming method
02/20/2001US6191186 Insulating paste
02/20/2001US6191182 Subjecting p-halophenyl alkyl ketone to aminolysis with cyclic secondary amine to form cyclic amine-substituted phenyl alkyl ketone; halogination and reacting with amine compound; stevens rearrangement under basic condition
02/20/2001US6191086 Cleaning composition and method for removing residues
02/20/2001US6191053 High efficiency photoresist coating
02/20/2001US6191036 Use of photoresist focus exposure matrix array as via etch monitor
02/20/2001US6190989 Method for patterning cavities and enhanced cavity shapes for semiconductor devices
02/20/2001US6190928 Method for actually measuring misalignment of via
02/20/2001US6190841 Pattern forming process and a photosensitive composition
02/20/2001US6190840 Resist pattern forming method
02/20/2001US6190839 High conformality antireflective coating compositions
02/20/2001US6190837 Method for forming photoresist film pattern
02/20/2001US6190835 A coaxial shielding fluid is produced around the process fluid plume. a plasma is generated by providing an energy source that impinges on the process fluid plume.
02/20/2001US6190834 First resin being an epoxy resin, and a second epoxy resin having an n-substituted carbamic acid ester group and a radical polymeric unsaturated bond in its side chain
02/20/2001US6190833 Radiation-sensitive resin composition
02/20/2001US6190832 Preparation of photopolymeric gravure printing plates
02/20/2001US6190831 Processless direct write printing plate having heat sensitive positively-charged polymers and methods of imaging and printing
02/20/2001US6190830 Processless direct write printing plate having heat sensitive crosslinked vinyl polymer with organoonium group and methods of imaging and printing
02/20/2001US6190829 Allows for wider exposure dosage windows, therefore increasing the yield or performance and line density.
02/20/2001US6190826 For transferring medical diagnostic chemistry to a receptor.
02/20/2001US6190825 Polymers containing N-substituted maleimide units and their use in radiation-sensitive mixtures
02/20/2001US6190824 Photosensitive composition
02/20/2001US6190810 Mark focusing system for steppers
02/20/2001US6190808 X-ray mask and method of manufacturing the same
02/20/2001US6190807 Used in a semiconductor fabrication process, and more particularly, to a mask that is compatible with steppers of different manufacturers.
02/20/2001US6190748 Optical discs
02/20/2001US6190063 Developing method and apparatus
02/20/2001US6189875 Positioning device with H-drive having spring coupling between beams
02/20/2001US6189339 Method for producing silica glass used for photolithography
02/20/2001CA2224312C High resolution positive acting dry film photoresist
02/20/2001CA2007295C Photocurable compositions
02/20/2001CA2005283C Radiation-sensitive, ethylenically unsaturated, copolymerizable compounds and their preparation
02/15/2001WO2001011737A1 High electric field, high pressure light source
02/15/2001WO2001011733A1 High pulse rate pulse power system with fast rise time and low leakage current
02/15/2001WO2001011732A1 High pulse rate pulse power system with liquid cooling
02/15/2001WO2001011679A1 Method and apparatus for performing run-to-run control in a batch manufacturing environment
02/15/2001WO2001011678A1 Method and apparatus for run-to-run controlling of overlay registration
02/15/2001WO2001011666A2 Method of etching a wafer layer using multiple layers of the same photoresistant material and structure formed thereby
02/15/2001WO2001011665A1 Optical device for illumination, exposure device, container of optical part, method of assembling exposure device, method of evaluating material, and method and device for evaluating filter
02/15/2001WO2001011657A1 Correction for systematic, low spatial frequency critical dimension variations in lithography
02/15/2001WO2001011430A1 Transfer of a pattern with a high structural density by multiple exposure of less dense sub-patterns
02/15/2001WO2001011429A1 Antireflective coating for photoresist compositions
02/15/2001WO2001011426A1 Method of forming a masking pattern on a surface
02/15/2001WO2001011408A1 Device for focussing light onto an object
02/15/2001WO2001010964A1 Composition for polyimide electrodeposition and method of forming patterned polyimide film with the same
02/15/2001WO2001010916A1 Polymer for photoresists and resin compositions for photoresists
02/15/2001WO2001010872A1 Organo-silicon compounds and their use as photoinitiators
02/15/2001WO2001010635A2 Filmable material with characteristics selectively modifiable by administration of particular types of energy
02/15/2001WO2000062324A3 System and method to correct for distortion caused by bulk heating in a substrate
02/15/2001WO2000057235A3 Multi-beam scanner including a dove prism array
02/15/2001WO2000033140A8 Composition and method for removing probing ink and negative photoresist from silicon wafers
02/15/2001DE19936331A1 Copolymer useful in the production of radiation sensitive compositions comprises units of specified formulae
02/15/2001DE19935568A1 Illumination system for specified wavelengths used especially in EUV lithography includes raster-optical elements selected in number and form to predetermine uniformity of field illumination
02/15/2001DE10037173A1 Negativ arbeitende Resistzusammensetzung des chemischen Verstärkungstyps The negative-working resist composition of chemical amplification type
02/15/2001CA2375365A1 Method of forming a masking pattern on a surface
02/14/2001EP1076263A2 Method for forming a cylindrical photosensitive element
02/14/2001EP1076262A1 Photosensitive resin
02/14/2001EP1076261A1 Negative resist composition
02/14/2001EP1076071A2 Photosensitive ceramic compositions containing polycarbonate polymers
02/14/2001EP1076070A2 Highly stable resin, hardenable resin composition, production method therefor, color filter and liquid crystal panel
02/14/2001EP1076013A1 A method for stabilizing heat sensitive elements, developable by an aqueous solution
02/14/2001EP1075672A1 Protection of lithographic components from particle contamination
02/14/2001EP1075642A1 Device for measuring structures on a transparent substrate
02/14/2001EP0864119B1 Photosensitive composition
02/14/2001EP0723736B1 Bonding inner layers in printed circuit board manufacture
02/14/2001CN1062079C FM and AM netting method
02/13/2001US6189136 Design level optical proximity correction methods
02/13/2001US6188783 Method and system for providing a probe array chip design database
02/13/2001US6188710 Narrow band gas discharge laser with gas additive
02/13/2001US6188709 Aerodynamic electrode support bar
02/13/2001US6188519 Bigrating light valve
02/13/2001US6188513 High numerical aperture ring field projection system for extreme ultraviolet lithography
02/13/2001US6188467 Method and apparatus for fabricating semiconductor devices
02/13/2001US6188464 Exposure apparatus
02/13/2001US6188195 Exposure method, and method of making exposure apparatus having dynamically isolated support structure