Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2001
06/27/2001EP1110628A1 Imaging method
06/27/2001EP1110437A1 Scanner system
06/27/2001EP1110124A1 Method of making optical replicas by stamping in photoresist and replicas formed thereby
06/27/2001EP1110054A1 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate
06/27/2001CN1300790A Organic anti-reflecting coating polymer and preparation thereof
06/27/2001CA2328017A1 Euv reticle thermal management
06/26/2001US6252758 Method for reducing particles from an electrostatic chuck and an equipment for manufacturing a semiconductor
06/26/2001US6252725 Semiconductor micro epi-optical components
06/26/2001US6252712 Optical system with polarization compensator
06/26/2001US6252676 System and method for proofing
06/26/2001US6252668 Systems and methods for quantifying nonlinearities in interferometry systems
06/26/2001US6252667 Interferometer having a dynamic beam steering assembly
06/26/2001US6252665 Lithography using quantum entangled particles
06/26/2001US6252662 Projection exposure apparatus and device manufacturing method using the same
06/26/2001US6252651 Exposure method and exposure apparatus using it
06/26/2001US6252650 Exposure apparatus, output control method for energy source, laser device using the control method, and method of producing microdevice
06/26/2001US6252649 Aligner
06/26/2001US6252648 Exposure apparatus and method of cleaning optical element of the same
06/26/2001US6252647 Projection exposure apparatus
06/26/2001US6252370 Electromagnetic alignment and scanning apparatus
06/26/2001US6252314 Linear motor and stage system, and scanning exposure apparatus using the same
06/26/2001US6252238 Micro-processing method using a probe
06/26/2001US6252234 Reaction force isolation system for a planar motor
06/26/2001US6252226 Nanometer scale data storage device and associated positioning system
06/26/2001US6251963 Orgaophosphorous compound containing ketone group
06/26/2001US6251745 Two-dimensional scaling method for determining the overlay error and overlay process window for integrated circuits
06/26/2001US6251570 Resist developer saving system using material to reduce surface tension and wet resist surface
06/26/2001US6251569 Forming a pattern of a negative photoresist
06/26/2001US6251568 Methods and apparatus for stripping photoresist and polymer layers from a semiconductor stack in a non-corrosive environment
06/26/2001US6251567 Process for manufacturing microstructured bodies
06/26/2001US6251565 Forming photoresist sensitive to x-rays; overcoating witth electroconductive layer; masking; exposur eto ultraviolet radiation
06/26/2001US6251564 Method for forming a pattern with both logic-type and memory-type circuit
06/26/2001US6251562 Antireflective polymer and method of use
06/26/2001US6251560 Photoresist compositions with cyclic olefin polymers having lactone moiety
06/26/2001US6251558 Mixture of polymer, active materials, quaternary ammonium compound and solvent
06/26/2001US6251557 Photosensitive resin composition for rapid prototyping and a process for the manufacture of 3-dimensional objects
06/26/2001US6251551 Adjustment in vertical plane; tilting
06/26/2001US6251550 Maskless photolithography system that digitally shifts mask data responsive to alignment data
06/26/2001US6251548 Transparent substrate; multicolor pacture elements on balck matrix; transparent electrode
06/26/2001US6251544 Positioning a mask; exposure to light; calibration of pattern
06/26/2001US6251487 Method for coating a resist film
06/26/2001US6250822 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer
06/26/2001US6250221 Imaging system having external drum and method for producing drum
06/26/2001US6249932 Apparatus and method for removing fine particles
06/21/2001WO2001045145A1 Exposure method and exposure apparatus
06/21/2001WO2001044875A2 Micromolds fabricated using mems technology and methods of use therefor
06/21/2001WO2001044874A1 Compositions, articles, methods for producing and processing these articles
06/21/2001WO2001044873A1 Photoinitiator system with acylphosphine oxide initiators
06/21/2001WO2001044430A1 Antimicrobial solutions
06/21/2001WO2001044375A1 Squarylium compounds and optical recording media made by using the same
06/21/2001WO2001043967A2 One side matte multilayer coversheet
06/21/2001US20010004765 Method of checking exposure patterns formed over photo-mask
06/21/2001US20010004633 Post chemical-mechanical planarization (CMP) cleaning composition
06/21/2001US20010004511 Comprising a binder resin which is a copolymer having carboxyl groups, an organo-solvent and a main pigment dissolved in the solvent
06/21/2001US20010004510 Refractory bilayer resist materials for lithography using highly attenuated radiation
06/21/2001US20010004508 Light exposure method, light exposure apparatus, pellicle and method for relieving warpage of pellicle membrane
06/21/2001US20010004472 Reducing coating defects caused by strikethrough when simultaneously slide coating at least a first fluid layer, a second fluid layer, and a third fluid layer; imaging, data storage media
06/21/2001US20010004467 Deposition method, deposition apparatus, and pressure-reduction drying apparatus
06/21/2001US20010004293 Multi-beam optical system
06/21/2001US20010004185 Charged-particle beam exposure apparatus, exposure system, control method therefor, and device manufacturing method
06/21/2001US20010004105 Crash prevention in positioning apparatus for use in lithographic projection apparatus
06/21/2001US20010004104 Radiation source for use in lithographic projection apparatus
06/21/2001US20010004066 Making surface of resist layer hydrophilic and removing resist layer using processing liquid; etching a semiconductor wfer and then removing a resist layer and a polymer layer on the substrate, for example
06/21/2001US20010003965 Coating processing apparatus
06/21/2001US20010003964 Coating film forming apparatus and coating unit
06/21/2001DE19961347A1 Photoinitiatorsystem mit Acylphosphinoxid-Initiatoren Photoinitiator system with acyl phosphine oxide initiators
06/21/2001DE19958201A1 Lithographic process for structuring layers during the manufacture of integrated circuits comprises guiding radiation emitted by a radiation source and lying in the extreme UV range onto photosensitive layers via a mask
06/21/2001DE19957034A1 Treating the surfaces of substrates, e.g. semiconductor substrates comprises producing reactive fragments, especially radicals or ions, using UV radiation from a UV radiator as discharge lamp
06/21/2001DE10062579A1 Optical integrator of wave front subdividing type used for photolithographic illuminating device comprises micro-optical elements arranged two-dimensionally to form light sources by subdividing wave front of falling light beam
06/21/2001DE10061948A1 Lichtempfindliche Harzzusammensetzung A photosensitive resin composition
06/21/2001DE10061947A1 Oximester-Photostarter Oxime ester photoinitiator
06/21/2001DE10050068A1 Method of analyzing factors responsible for errors in wafer patterns during the manufacture of semiconductor device, involves placing first and second masks in etching chamber to form an overlapping zone between the two masks
06/21/2001CA2392771A1 Photoinitiator system with acylphosphine oxide initiators
06/21/2001CA2362640A1 Squarylium compounds and optical recording media made by using the same
06/20/2001EP1109427A2 Radiation source for use in lithographic projection apparatus
06/20/2001EP1109314A1 Pulse power system for a gas discharge laser
06/20/2001EP1109067A2 Illuminator
06/20/2001EP1109066A1 Chemical amplification type negative-working resist composition for electron beams or x-rays
06/20/2001EP1109059A2 Oxonol infrared radiation sensitive compounds
06/20/2001EP1108723A1 Organosilyl radical generators and their applications
06/20/2001EP1108275A1 Tangential fan with cutoff assembly and vibration control for electric discharge laser
06/20/2001EP1108237A1 Polymers having silicon-containing acetal or ketal functional groups
06/20/2001EP1107859A1 Method for making optical masters using incoherent light
06/20/2001EP0858472B1 Photosensitive resin composition
06/20/2001CN1300384A Retaining device for photo blanks
06/20/2001CN1300383A Fast-etching, thermosetting anti-reflective coatings derived from cellulosic binders
06/20/2001CN1300097A Electronic-beam exposing method
06/20/2001CN1299989A Flat printed element capable of infrared laser imaging and making method for said printed element and imaging method thereof
06/20/2001CN1299812A Oximate light initiator
06/19/2001US6249904 Method and apparatus for submicron IC design using edge fragment tagging to correct edge placement distortion
06/19/2001US6249597 Method of correcting mask pattern and mask, method of exposure, apparatus thereof, and photomask and semiconductor device using the same
06/19/2001US6249452 Semiconductor device having offset twisted bit lines
06/19/2001US6249385 Laser irradiation apparatus
06/19/2001US6249382 Illumination optical system and projection exposure apparatus using same
06/19/2001US6249336 Projection exposure system
06/19/2001US6249335 Photo-mask and method of exposing and projection-exposing apparatus
06/19/2001US6249331 Methods for forming an orientation layer on LCD panels
06/19/2001US6249306 Multi-beam drawing method using partially damaged light emitting devices and including spiral correction
06/19/2001US6249036 Stepper alignment mark formation with dual field oxide process
06/19/2001US6248920 Reacting an aldehyde or ketone compound and an acid halide compound in a one pot reaction in the presence of an organometallic compound to directly form the esters without forming an intermediate alcohol