Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
08/2001
08/16/2001US20010013925 Lithographic projection apparatus having a temperature controlled heat shield
08/16/2001US20010013580 Cooling of voice coil motors in lithographic projection apparatus
08/16/2001US20010013554 Aperture plate and methods for its construction and use
08/16/2001US20010013502 For removing remaining resist layer film after etching without swelling the insulation film (acrylic or polyimide resin); semiconductors; liquid crystal displays
08/16/2001US20010013294 Stamp device for printing a pattern on a surface of a substrate
08/16/2001EP1124310A2 Two-dimensional electric motor, exposure apparatus and semiconductor fabrication method
08/16/2001EP1124162A2 Method of positioning an object in a lithographic projection apparatus
08/16/2001EP1124161A2 Lithographic projection apparatus having a temperature controlled heat shield
08/16/2001EP1124160A2 Cooling of oscillating linear motors in lithographic projection apparatus
08/16/2001EP1124159A1 Photocurable composition
08/16/2001EP1124158A1 Pattern forming material and pattern forming method
08/16/2001EP1124078A2 Active anti-vibration apparatus and exposure apparatus
08/16/2001EP1123954A1 Composition for polyimide electrodeposition and method of forming patterned polyimide film with the same
08/16/2001EP1123520A1 Wavelength tuning of photo-induced gratings
08/16/2001EP1123215A1 Three-dimensional microstructure
08/16/2001EP1123212A1 Method for manufacture of electronic parts
08/16/2001EP1123166A1 Method of removing organic materials from substrates
08/16/2001EP0953166B1 Pattern-forming methods
08/16/2001EP0654306B1 Method of and apparatus for application of liquid
08/16/2001DE10046911A1 Photo mask for manufacturing semiconductors has monitoring marking with coarse, high density and cross patterns on substrate for assuring dimensions of actual pattern and coincidence
08/16/2001DE10004391A1 Verfahren zur Durchführung eines Plasmaätzprozesses A method for performing a plasma etching process
08/16/2001CA2398160A1 Liquid, radiation-curable composition, especially for stereolithography
08/15/2001CN1308837A Scanner system
08/15/2001CN1308737A Composition for stripping photoresist and organic material from substrate surfaces
08/15/2001CN1308256A Anticorrosive additive stripper, anticorrosive additive stripping liquid controlling method and semiconductor equipment
08/15/2001CN1308255A Direct platemaking printing equipment and printing plate
08/15/2001CN1308254A Copolymer with nitrile and alcyl group and photoresist composite containing the copolymer
08/15/2001CN1308094A Polymer mixture and its preparation, photosensitive composite and pattern preparing method
08/15/2001CN1308089A Organic polymer for antireflective coating and its preparation
08/15/2001CN1308081A Organometallic acyl-aryl phosphine
08/14/2001US6275514 Laser repetition rate multiplier
08/14/2001US6274877 Electron beam exposure apparatus
08/14/2001US6274537 Mixture with attack inhibitor
08/14/2001US6274296 Stripper pretreatment
08/14/2001US6274295 Light-absorbing antireflective layers with improved performance due to refractive index optimization
08/14/2001US6274294 Cylindrical photolithography exposure process and apparatus
08/14/2001US6274292 Forming antireflective later containing silicon, oxygen and nitrogen, annealing, forming photoresist, exposing layer of photoresist to radiation waves, some of which are attenuated by antireflective material
08/14/2001US6274290 Raster scan gaussian beam writing strategy and method for pattern generation
08/14/2001US6274289 Chemical resist thickness reduction process
08/14/2001US6274288 Self-trapping and self-focusing of optical beams in photopolymers
08/14/2001US6274287 Positive resist compositions comprising a hydroxyphenyl ketone
08/14/2001US6274286 Resist compositions
08/14/2001US6274285 Radiation-sensitive recording material for the production of driographic offset printing plates
08/14/2001US6273985 Adhesion promoter is employed in microelectrical mechanical systems such as thermal ink jet printheads. particularly suitable for use with polyarylene photoresists.
08/14/2001US6273543 Aqueous developable high performance curable polymers
08/14/2001US6273104 Processing fluid is supplied to a surface of the substrate while supplying inert gas into a space between the substrate and a blocking plate; no turbulence is created at the surface of substrate preventing pollutant adherence
08/14/2001US6272763 Staging apparatus and method, and method for manufacturing the staging apparatus, and exposing apparatus using the staging apparatus
08/14/2001CA2298345A1 Near infrared sensitive photopolymer and holographic photopolymer dispersed liquid crystal materials made therewith
08/14/2001CA2254797C Photoimageable compositions containing photopolymerizable urethane oligomers and dibenzoate plasticizers
08/09/2001WO2001057911A1 Method for carrying out a plasma etching process
08/09/2001WO2001057598A1 Reticle stocking and sorting management system
08/09/2001WO2001057597A1 Polymeric compound for photoresist and resin composition for photoresist
08/09/2001WO2001057596A1 Active reticle, method for making and controlling same, ion projecting lithography using same and equipment therefor
08/09/2001WO2001057409A1 Hydrostatic gas bearing, hydrostatic gas bearing device for use in vacuum environment, and gas recovering method for the hydrostatic gas bearing device
08/09/2001WO2001056788A2 Device for exposing thermosensitive media
08/09/2001US20010012869 Attaching catalytic metal nuclei to the polysilane modified by a carbon-functional silane, immersing the substrate in an electroless plating bath to deposit a metal film on the patterned coating
08/09/2001US20010012696 Processing device and method of processing material with ultraviolet light or light of shorter wavelength than ultraviolet light
08/09/2001US20010012601 Surface treatment agent for resist pattern, and patterning process
08/09/2001US20010012599 Dimensionally stable solid, partly hollow or hollow cylinder and a photopolymerizable crosslinkable cylinder layer applied in part-layers by means of coaxial coating apparatus; uniform layers
08/09/2001US20010012598 High conformality antireflective coating compositions
08/09/2001US20010012597 Contain a water-soluble azide compound which serves as a photocrosslinking agent and poly(N-vinylacetamide) that is photocrosslinkable in the presence of the water-soluble azide compound
08/09/2001US20010012596 Oxime ester photoinitiators
08/09/2001US20010012593 Wafer alignment marks protected by photoresist
08/09/2001US20010012592 The plasma polymerized organosilicon film having an upper stratum overlying a lower stratum wherein the upper stratum is more photosensitive to ultraviolet radiation than is the lower stratum
08/09/2001US20010012457 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer
08/09/2001US20010012456 Developing method and developing apparatus
08/09/2001US20010012311 Method for determining life of laser light source
08/09/2001US20010012309 Laser gas replenishment method
08/09/2001US20010012154 Radial polarization-rotating optical arrangement and microlithographic projection exposure system incorporating said arrangement
08/09/2001US20010012139 Pattern reading apparatus
08/09/2001US20010012131 Drive system for a scanning or recording device for a reproduction appliance
08/09/2001US20010012101 Microlithography projection apparatus
08/09/2001US20010012100 Exposure apparatus and device manufacturing method
08/09/2001US20010012099 Projection exposure apparatus and method for manufacturing devices using the same
08/09/2001US20010012098 Scan type projection exposure apparatus and device manufacturing method using the same
08/09/2001US20010012079 Color liquid crystal display panel
08/09/2001US20010011712 Position detection system for use in lithographic apparatus
08/09/2001US20010011706 Inspection method, apparatus and system for circuit pattern
08/09/2001US20010011697 Active anti-vibration apparatus and exposure apparatus
08/09/2001DE19956353C1 Optische Anordnung Optical arrangement
08/09/2001DE10105046A1 Metallorganische Monoacyl-Aryl-Phosphine Organometallic monoacyl aryl phosphines
08/09/2001DE10035670A1 Semiconducting manufacturing system computes optimal exposure value from size of detected pattern produced by photolithography and detected exposure value
08/09/2001DE10005189A1 Projection exposure system has light source, illumination system, reflective reticle, beam divider cube in reduction objective that superimposes illumination and imaging beam paths
08/08/2001EP1122612A2 Position detection
08/08/2001EP1122611A2 Method of reducing surface defects of a patterned resist layer
08/08/2001EP1122610A2 Automatic developing apparatus and method for replenishing replenisher for developer for said apparatuses
08/08/2001EP1122609A2 Exposure method and apparatus and method for producing exposure apparatus
08/08/2001EP1122608A2 Projection exposure system with reflective reticle
08/08/2001EP1122607A1 High resolution photoresist compositions
08/08/2001EP1122606A2 Chemically amplified positive resist composition
08/08/2001EP1122605A2 Radiation-sensitive resin composition
08/08/2001EP1122604A2 Chemically amplified positive resist composition
08/08/2001EP1121715A1 METHOD FOR FORMING AN ANTIREFLECTING SiON FILM, NON-POLLUTING FOR LIGHT-SENSITIVE RESINS FOR FAR-ULTRAVIOLET RADIATION
08/08/2001EP1121623A1 Ionization radiation imageable photopolymer compositions
08/08/2001EP0985021A4 Non-corrosive stripping and cleaning composition
08/08/2001EP0892941B1 Photo-curable resin composition
08/08/2001CN1307694A Photocurable elastomeric compositions
08/08/2001CN1307693A Photopolymerizable thermosetting resin compositions
08/08/2001CN1307614A Photo-curable polymer composition and flexographic printing plates containing the same
08/08/2001CN1307603A Polycyclic copolymer compositions