Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
09/2001
09/06/2001DE10014493A1 Polymers, useful for the production of resist compositions for electronic component fabrication contain at least one pericyclic protective group
09/06/2001DE10011548A1 Thermally stable layer system used for reflecting extreme UV rays consists of layer pairs made up of a barrier layer of molybdenum silicide between a molybdenum layer and a silicon layer
09/06/2001DE10011547A1 Thermally stable layer system used for reflecting extreme UV rays consists of layer pairs made up of a barrier layer of molybdenum carbide between molybdenum layer and a silicon layer
09/06/2001DE10010131A1 Microlithography projection exposure with tangential polarization involves using light with preferred direction of polarization oriented perpendicularly with respect to plane of incidence
09/05/2001EP1130632A2 Electrically insulating crosslinked thin-film-forming organic resin composition
09/05/2001EP1130473A2 A system, method and article of manufacture for direct image processing of printed circuit boards
09/05/2001EP1130472A2 Exposure method, method of production of density filter, and exposure apparatus
09/05/2001EP1130471A2 Exposure apparatus for printing plates
09/05/2001EP1130470A2 Microlithographic projection illumination with tangential polarisation
09/05/2001EP1130469A1 A radiation-sensitive resist material and a process for device fabrication using the same
09/05/2001EP1130468A2 Polymer and photoresist compositions
09/05/2001EP1130467A2 Photo mask pattern designing method, resist pattern fabricating method and semiconductor device manufacturing method
09/05/2001EP1130423A1 Color filter composition and color filter made therefrom
09/05/2001EP1130421A2 Light diffusing plate and display apparatus
09/05/2001EP1130419A2 Optical member for vacuum ultraviolet, and aligner and device manufacture method using same
09/05/2001EP1130036A2 Composition for bulkhead of thin display panel
09/05/2001EP1129861A1 Image-forming material and planographic printing original plate using same
09/05/2001EP1129390A1 Priming composition for bonding photoresists on substrates
09/05/2001EP1129145A1 Non-corrosive stripping and cleaning composition
09/05/2001EP0765493B1 Self-contained imaging assembly and method for forming images therein
09/05/2001EP0674342B1 Method for evaluating focal point
09/05/2001CN1311718A Disc master drying cover assembly
09/05/2001CN1311525A Exposure mask and its mfg. method
09/05/2001CN1311459A Chemical amplifying type positive photolithographic gelatin composition
09/05/2001CN1311458A 感光性树脂组成物 The photosensitive resin composition
09/05/2001CN1311141A Flat-bed printing platen slip sheet, flat-bed printing platen adjoining elements and flat-bed printing platen packaging structure
09/04/2001USRE37352 Projection optical apparatus
09/04/2001US6285855 Illumination system and exposure apparatus having the same
09/04/2001US6285817 Holographic patterning method and tool for production environments
09/04/2001US6285743 Method and apparatus for soft X-ray generation
09/04/2001US6285737 Condenser for extreme-UV lithography with discharge source
09/04/2001US6285512 Lens barrel having deformed optical element, and projection including same
09/04/2001US6285497 Diffractive element in extreme-UV lithography condenser
09/04/2001US6285496 Optical mount with UV adhesive and protective layer
09/04/2001US6285488 Pattern generator for avoiding stitching errors
09/04/2001US6285457 Exposure apparatus and device manufacturing method including measuring position and/or displacement of each of a base and a stage with respect to a support
09/04/2001US6285444 Positioning system and position measuring method for use in exposure apparatus
09/04/2001US6285443 Illuminating arrangement for a projection microlithographic apparatus
09/04/2001US6285442 Exposure apparatus and device manufacturing method using the exposure apparatus
09/04/2001US6285440 Illumination system and projection exposure apparatus using the same
09/04/2001US6285438 Scanning exposure method with reduced time between scans
09/04/2001US6285437 Method for controlling stages, apparatus therefor, and scanning type exposure apparatus
09/04/2001US6285097 Planar electric motor and positioning device having transverse magnets
09/04/2001US6285001 Method and apparatus for step and repeat exposures
09/04/2001US6284863 Reacted with unsaturated amides that may be cyclic, e.g., n-vinyl-2-pyrrolidone
09/04/2001US6284813 Alkylphenylbisacylphosphine oxides and photoinitiator mixtures
09/04/2001US6284676 Prewetting wafer with diacetone alcohol
09/04/2001US6284443 Method and apparatus for image adjustment
09/04/2001US6284440 As developing solution
09/04/2001US6284439 Selecting an enhanced positive photoresist and depositing onto substrate; exposing selected portions of positive photoresist layer to light, wherein the exposed portions are soluble in aqueous base; developing exposed portions
09/04/2001US6284438 Providing semiconductor substrate; forming material film to be patterned on semiconductor substrate; forming a photoresist film on the material film by coating photoresist; patterning photoresist film reducing size of opening by thermal flow
09/04/2001US6284432 Coat property, has not special color unevenness and contrast
09/04/2001US6284430 Positive-working chemical-amplification photoresist composition and method for forming a resist pattern using the same
09/04/2001US6284429 For formulating photoresists having sensitivity, resolution, etching resistance
09/04/2001US6284428 For forming of antireflection undercoating layer to intervene between surface of substrate and photoresist layer to be patterned in manufacturing process of semiconductor devices
09/04/2001US6284427 Reacting alkali-soluble polymer having phenolic hydroxyl or carboxyl groups with vinyl ether compound in aprotic solvent; suspending by adding base and adding photoacid generator to solution to prepare resist without isolation and purification
09/04/2001US6284426 Information-wise exposing an imaging element; developing aqueous alkaline processing solution presence of developing agent; removing silver halide emulsion layer on top of silver image to expose silver image by washing with rinsing water
09/04/2001US6284419 Methods of reducing proximity effects in lithographic processes
09/04/2001US6284416 Photo mask and exposure method using same
09/04/2001US6284415 Charged-particle-beam transfer masks and methods of making
09/04/2001US6284414 Preparing mask substrate having light-shielding film pattern over including integrated circuit pattern and alignment mark; forming resist film; aligning position of phase-shifting pattern; electron beam exposure to form phase-shifting pattern
09/04/2001US6284413 Selecting reticle primitives containing patterns corresponding to portions of a layer to be created by semicustom reticle; exposing to create image; employing semicustom reticle to create an image of patterns on integrated circuit
09/04/2001US6284345 Designer particles of micron and submicron dimension
09/04/2001US6284072 Multifunctional microstructures and preparation thereof
09/04/2001US6284044 Film forming method and film forming apparatus
09/04/2001US6283997 Photocurable polymer dispersion; laser scanning; orthopedic bone transplantation
09/04/2001US6283134 Apparatus for removing photo-resist
09/04/2001US6283030 Imaging a lithographic printing plate
08/2001
08/30/2001WO2001063732A2 Methods and apparatus for selectively tailored electromagnetic fields of linear motors
08/30/2001WO2001063662A2 Resistor arrays for mask-alignment detection
08/30/2001WO2001063653A1 Semiconductor integrated circuit device and method of producing the same, and method of producing masks
08/30/2001WO2001063607A1 Method for producing recording medium, method for producing stamper of recording medium, apparatus for producing recording medium, and apparatus for producing stamper of recording medium
08/30/2001WO2001063365A1 Method of reducing defects
08/30/2001WO2001063364A1 Laser imaged printing plates comprising a multi-layer slip film
08/30/2001WO2001063363A2 Photoacid generators and photoresists comprising same
08/30/2001WO2001063362A2 Resist materials for 157-nm lithography
08/30/2001WO2001063361A1 Device for homogeneous heating of an object
08/30/2001WO2001063360A2 Encapsulated inorganic resists
08/30/2001WO2001063359A2 Thin layer imaging process for microlithography using radiation at strongly attenuated wavelengths
08/30/2001WO2001063358A1 Organic polymeric antireflective coatings deposited by chemical vapor deposition
08/30/2001WO2001063342A1 Ultraviolet polarization beam splitter for microlithography
08/30/2001WO2001063325A1 Method of making phase mask for machining optical fiber and optical fiber having bragg diffraction grating produced using the phase mask for machining optical fiber
08/30/2001WO2001063233A2 Device for detecting wave fronts
08/30/2001WO2001062511A2 Dual-layer self-contained recording paper incorporating hollow microspheres
08/30/2001WO2001062400A2 Precision fabrication of diverse polymer microstructures by use of the hydrophobic effect
08/30/2001WO2001007506A3 Microfabricated devices and method of manufacturing the same
08/30/2001US20010018642 Method and system for providing a probe array chip design database
08/30/2001US20010018497 Novolak resin
08/30/2001US20010018168 Resist development method
08/30/2001US20010018167 Method of and apparatus for developing exposed photoresist to prevent impurity from being attached to wafer surface
08/30/2001US20010018166 Organic solvent developer
08/30/2001US20010018165 Protective coating for silicon nitride spacer
08/30/2001US20010018164 Lithography printing plates
08/30/2001US20010018163 Undercoating composition for photolithographic resist
08/30/2001US20010018162 Novel polymers, chemical amplification resist compositions and patterning process
08/30/2001US20010018161 Resist compositions
08/30/2001US20010018160 Novolak resin containing naphthoqiononediazidosulfonyl group; phenolic compound
08/30/2001US20010018153 Photolithography
08/30/2001US20010017939 Position detecting method, position detecting apparatus, exposure method, exposure apparatus and making method thereof, computer readable recording medium and device manufacturing method
08/30/2001US20010017693 Image displacement test reticle for measuring aberration characteristics of projection optics