Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
09/2001
09/20/2001WO2001068360A1 Flame retardant optical films
09/20/2001WO2001068277A1 Processes and apparatus for treating electronic components
09/20/2001WO2001018604A3 Method and apparatus for thermal processing a photosensitive element
09/20/2001WO2001018603A3 Polymer for chemically amplified resist and a resist composition using the same
09/20/2001WO2001016998A3 Ultra high resolution lithographic imaging and printing and defect reduction by exposure near the critical condition
09/20/2001US20010023137 Repairing photolithographic exposure masks by etching, extending over a length and a width equal of line pattern; repair accuracy
09/20/2001US20010023052 Patterning using mask by reduction projection
09/20/2001US20010023050 Chemical amplified photoresist
09/20/2001US20010023045 Transferring integrated circuit pattern from amask to semiconductor substarte
09/20/2001US20010023043 Dynamic random access memory
09/20/2001US20010023042 Test object for detecting aberrations of an optical imaging system
09/20/2001US20010022897 Substrate processing method and substrate processing apparatus
09/20/2001US20010022693 Pattern reading apparatus
09/20/2001US20010022691 Projection exposure system having a reflective reticle
09/20/2001US20010022687 Reflection and refraction optical system and projection exposure apparatus using the same
09/20/2001US20010022660 Method of conveying recording material and device for controlling conveying of recording material
09/20/2001US20010022658 Apparatus for and method of recording image
09/20/2001US20010022652 Substrate holder for lithographic apparatus
09/20/2001US20010022611 Multiple-beam, diode-pumped imaging system
09/20/2001US20010022425 Sheet material positioning method and apparatus
09/20/2001US20010022405 Stepper alignment mark formation with dual field oxide process
09/20/2001US20010022347 Electron emitters for lithography tools
09/20/2001US20010022145 Printing plate automatic exposing device
09/20/2001DE10007750A1 Process for enlarging the surface covering a relief-like polymer film used in semiconductor technology for the local modification of surfaces comprises subjecting the film to elevated temperature for a defined time
09/20/2001CA2440992A1 Ultra-high resolution imaging devices
09/20/2001CA2429702A1 Disposable modular hearing aid
09/20/2001CA2391042A1 Exposure device and method for compensating optical defects
09/19/2001EP1134793A1 Exposure method and exposure apparatus
09/19/2001EP1134618A2 Alignment for lithography
09/19/2001EP1134617A2 Pattern formation material and method
09/19/2001EP1134077A2 Heat-sensitive lithographic printing plate precursor
09/19/2001EP1133788A1 Silane-based oxide anti-reflective coating for patterning of metal features in semiconductor manufacturing
09/19/2001EP1133715A2 Preparation of fractionated novolak resins by a novel extraction technique
09/19/2001EP1133440A1 Automated opening and closing of ultra clean storage containers
09/19/2001EP1000384A4 Latex-based, aqueous developable photopolymers and use thereof in printing plates
09/19/2001EP0944708A4 Non-corrosive cleaning composition for removing plasma etching residues
09/19/2001EP0917508B1 Lithographic plates
09/19/2001EP0901650B1 Optical system for integrated circuit fabrication
09/19/2001EP0830640B1 Stabilizers for use with photoacid precursor formulations
09/19/2001CN2449258Y Multi-beam formation system for interference photoetching
09/19/2001CN2449257Y Projection photoetching imaging filter
09/19/2001CN1313962A Photosensitive resin composition and method of improving dry etching resistance of photosensitive resin composition
09/19/2001CN1313850A New unsaturated oxime derivatives and the use thereof as latent acids
09/19/2001CN1313633A Substrate protecting device and exposoure device therewith
09/19/2001CN1313630A Method for forming thin pattern on semiconductor device
09/18/2001US6292255 Dose correction for along scan linewidth variation
09/18/2001US6292254 Projection exposure method and apparatus
09/18/2001US6291800 Heat treatment apparatus and substrate processing system
09/18/2001US6291619 Heat resistance
09/18/2001US6291540 Iodonium salt with low toxicity; e.g., (ch(ch3)2-c6h4)2-i+
09/18/2001US6291410 Compositions for the stripping of photoresists in the fabrication of integrated circuits
09/18/2001US6291377 Silica glass and its manufacturing method
09/18/2001US6291363 Surface treatment of DARC films to reduce defects in subsequent cap layers
09/18/2001US6291183 A plurality of oligonucleotide linker molecules are attached on a planar solid support, photoremovable groups react with terminal ends of oligonucleotides, substrates exposed to light activate binding at selected areas; peptide synthesis
09/18/2001US6291145 Image formation method with photosensitive material
09/18/2001US6291143 Laser absorbable photobleachable compositions
09/18/2001US6291142 Stripping photoresists, hydroxylamine, water, mono and diethanolamine, dimethyl sulfoxide and aromatic hydroxy compound
09/18/2001US6291141 Washing solvent designed to remove the unpolymerised part of a layer of photopolymer exposed to light
09/18/2001US6291140 Low-cost photoplastic cantilever
09/18/2001US6291139 Process for fabricating three-dimensional polymer layer structures
09/18/2001US6291136 Pixel electrodes and counter electrodes for tft array substrates
09/18/2001US6291135 Semiconductor with photoresists, exposure to plasma and masking then development
09/18/2001US6291134 Lithographic plate precursor
09/18/2001US6291133 Photosensitive resin composition and flexographic resin plate
09/18/2001US6291131 Monomers for photoresist, polymers thereof, and photoresist compositions using the same
09/18/2001US6291130 Light sensitive composition. polymer, solubility, alkaline developers and silicon surfaces
09/18/2001US6291129 Light sensitive element with unsaturated polymers
09/18/2001US6291126 Thermal transfer element and process for forming organic electroluminescent devices
09/18/2001US6291119 Exposure to rescattered electron beams, compensation exposure dosage
09/18/2001US6291118 Elimination of proximity effect in photoresist
09/18/2001US6291116 Thermal transfer element and process for forming organic electroluminescent devices
09/18/2001US6291110 Exposing wafers, masking with programmable photolithography, controlling active electron distribution
09/18/2001US6291060 Water-developable plate package
09/18/2001US6291059 Foam core layer with surfaces and thermosetting seal layers of photopolymerization composition
09/18/2001US6290881 Ultraviolet curable silver composition and related method
09/18/2001US6290858 Manufacturing method for a micromechanical device
09/13/2001WO2001067181A1 Wafer alignment
09/13/2001WO2001067180A1 Method for forming resist pattern in reverse-tapered shape
09/13/2001WO2001067179A2 Use of carboxyl group-containing acetal polymers in light-sensitive compositions and lithographic printing plates
09/13/2001WO2001067178A1 Solder resist ink
09/13/2001WO2001067176A1 Three dimensional optical memory storage
09/13/2001WO2001066645A1 Resin composition, heat-resistant resin paste and semiconductor device using them and method for manufacture thereof
09/13/2001WO2001066619A1 Polybenzoxazole precursors
09/13/2001WO2001066272A1 Laser discharge chamber passivation by plasma
09/13/2001WO1997007986A3 Water-less lithographic plates
09/13/2001US20010021750 Polymer compound, method of producing the same, photosensitive composition, and pattern formation method
09/13/2001US20010021586 Method of manufacturing semiconductor device
09/13/2001US20010021577 Method for forming sidewall spacers using frequency doubling hybrid resist and device formed thereby
09/13/2001US20010021548 Alignment mark set and method of measuring alignment accuracy
09/13/2001US20010021546 Mask, exposure method, line width measuring method, and method for manufacturing semiconductor devices
09/13/2001US20010021490 Photomask having small pitch images of openings for fabricating openings in a semiconductor memory device and a photolithographic method for fabricating the same
09/13/2001US20010021489 Photoresist stripping solution and a method of stripping photoresists using the same
09/13/2001US20010021488 Cyclic urea
09/13/2001US20010021487 Fine etching
09/13/2001US20010021486 Substrate processing method and substrate processing apparatus
09/13/2001US20010021484 Forming structures in photosensitive layer
09/13/2001US20010021482 Acrylic polymer
09/13/2001US20010021481 Heating to vaporize aromatic resin; conformation coating
09/13/2001US20010021479 Positive photoresist composition
09/13/2001US20010021475 Patterned layers; integraed circuits