Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
10/2001
10/31/2001EP1150139A2 Multilayer system with protecting layer system and production method
10/31/2001EP1149826A2 Ester compounds having alicyclic structure, and methods for preparing the same
10/31/2001EP1149825A2 Ester compounds, polymers, resist compositions and patterning process
10/31/2001EP1149328A1 Method and assembly for producing printing plates
10/31/2001EP1110054A4 Methods and apparatus for measuring the thickness of a film, particularly of a photoresist film on a semiconductor substrate
10/31/2001CN2457633Y Super high resolution radio super high speed laser holographic cutting and recording machine
10/31/2001CN1319882A Method for forming pattern
10/31/2001CN1319785A Exposure method and apparatus, method for making exposure apparatus and device
10/31/2001CN1319784A Optical polymerism composition
10/31/2001CN1074165C Optical mask with vernier
10/31/2001CN1074142C 曝光装置 Exposure device
10/31/2001CN1074141C Low metal ions p-cresol oligomers and photosensitive compositions
10/31/2001CN1074140C Precoating sensitive plate and its prodn. method
10/30/2001US6311319 Solving line-end shortening and corner rounding problems by using a simple checking rule
10/30/2001US6310996 Writing Bragg gratings in optical waveguides
10/30/2001US6310934 X-ray projection exposure apparatus and a device manufacturing method
10/30/2001US6310850 Method and apparatus for optical data storage and/or retrieval by selective alteration of a holographic storage medium
10/30/2001US6310689 Pattern reading apparatus
10/30/2001US6310684 Method of measuring spherical aberration in projection system
10/30/2001US6310680 Method of adjusting a scanning exposure apparatus and scanning exposure apparatus using the method
10/30/2001US6310679 Projection exposure method and apparatus
10/30/2001US6310189 Nucleotides and analogs having photoremoveable protecting groups
10/30/2001US6310135 Polyimide resin composition
10/30/2001US6310133 Antistatic coat, thermal transfer sheet having antistatic property and antistatic agent
10/30/2001US6310020 Polycarboxylic acid or a salt thereof, organic silicon compound, water
10/30/2001US6309991 Silica with low compaction under high energy irradiation
10/30/2001US6309973 Semiconductor processing methods of forming a conductive projection and methods of increasing alignment tolerances
10/30/2001US6309944 Overlay matching method which eliminates alignment induced errors and optimizes lens matching
10/30/2001US6309822 Detecting adjustments in nucleotide sequences; provide probes, mix probes with nucleic acids, detect binding of probes to preferential nucleotide sequences
10/30/2001US6309809 Multi-layer integrated imaging/image recording process with improved image tolerances
10/30/2001US6309806 Method of providing microscopic features
10/30/2001US6309804 Reducing contamination induced scumming, for semiconductor device, by acid treatment
10/30/2001US6309800 Irradiating a mask to enlarge circuit pattern
10/30/2001US6309799 Process for producing a printing form
10/30/2001US6309798 Forming films; exposure to electron beams; washing; annealing
10/30/2001US6309797 Containing oxidizer; exposure to actinic radiation
10/30/2001US6309796 High molecular weight silicone compounds resist compositions, and patterning method
10/30/2001US6309795 Resist composition
10/30/2001US6309793 Production of acetal derivatized hydroxyl aromatic polymers and their use in radiation sensitive formulations
10/30/2001US6309791 Polyimide precursor, polyimide and their use
10/30/2001US6309790 Organic anti-reflective coating material and its preparation
10/30/2001US6309789 Mixture of perfluoroalkylsulfonic acid, amine, water soluble polymer, perfluorosulfonamide and water
10/30/2001US6309781 Photomask provided with an ESD-precluding envelope
10/30/2001US6309705 Process for fabricating high reflectance-low stress Mo—Si multilayer reflective coatings
10/30/2001US6309698 Manufacturing process for a lead-frame forming material
10/30/2001US6309580 Release surfaces, particularly for use in nanoimprint lithography
10/30/2001US6309212 Substrate conveying system and device manufacturing method using the same
10/30/2001US6309163 Wafer positioning device with storage capability
10/30/2001US6309116 Substrate processing system
10/30/2001US6308776 Temperature control apparatus with recirculated coolant
10/25/2001WO2001080306A2 Automated process monitoring and analysis system for semiconductor processing
10/25/2001WO2001080292A1 Pattern drawing apparatus and pattern drawing method
10/25/2001WO2001079936A1 Mitigation of photoresist outgassing in vacuum lithography
10/25/2001WO2001079935A1 Pattern generation system using a spatial light modulator
10/25/2001WO2001079934A1 Chemically amplified resist and a resist composition
10/25/2001WO2001079933A1 A substrate for and a process in connection with the product of structures
10/25/2001WO2001079932A1 Method for measuring diffusion of photogenerated catalyst in chemically amplified resists
10/25/2001WO2001079374A2 Stabilized cationically polymerizable composition, and adhesive film and conductor circuit comprising the same
10/25/2001WO2001079324A1 Hydrogenated ring-opening metathesis copolymer and process for producing the same
10/25/2001WO2001078889A2 A method of fabricating coded particles
10/25/2001US20010034877 Photomask pattern shape correction method and corrected photomask
10/25/2001US20010034427 Organic anti-reflective coating polymer and preparation thereof
10/25/2001US20010034313 Solvent, alkanolamine, carboxylic acid, water; for photoresist
10/25/2001US20010034131 Method of forming a pattern
10/25/2001US20010034000 A pattern forming material comprising a copolymer including a first group for generating a base through irradiation with an energy beam and second group including a sulfonic acid group having an acidic property
10/25/2001US20010033999 A pattern formation material includes a copolymer of acrylic nitrile wherein an alkyl or chloro or an alkyl group including chlorine atom is substituted at the alpha position of the main chain and a vinyl alkoxylated phneol comonomer
10/25/2001US20010033998 Forming a photoresist layer of a positive type on a substrate, exposing to light and developing the photoresist layer using inversion mask having an opening at a site where a desired pattern to be formed, thus exposing the substrate
10/25/2001US20010033997 Semiconductor processing methods
10/25/2001US20010033996 Electronically controlled universal phase-shifting mask for stepper exposure method and system
10/25/2001US20010033995 Electron device manufacturing method, a pattern forming method, and a photomask used for those methods
10/25/2001US20010033994 Positive resist comprising a photoacid generator and a resin which changes its solubility in an alkali developer under the action of acid and has substituted by formula CYCLOHEXYL-(CH2)OCH(CH2CH3)- OR CYCLOHEXYL-OCH(CH2CH3)-
10/25/2001US20010033993 Comprising a resin having an acid-decomposing group which is decomposed by the action of an acid to increase alkali solubility, compounds generate acid by irriadiation of active light (one contributes decomposition other does not), solvent
10/25/2001US20010033992 Multilayer structure comprising ink receptive layer of an epoxy resin, a water receptive layer comprising colloidal particulate oxide or hydroxides of specific metal, and a layer containing a compound which changes light into heat
10/25/2001US20010033990 A chemically amplified, positive resist comprising a sulfonium salt compound as photoacid generator, a base resin containing a monomer having alicyclic structure, and a solvent; heat treatment and exposure
10/25/2001US20010033989 Fluoropolymer
10/25/2001US20010033987 Chemically amplified positive resist composition
10/25/2001US20010033981 Comprised of polyurethane; water developing properties; sensitivity, impact resilience, water resistance, and ink resistance
10/25/2001US20010033976 Mask used in reduction projection exposure in photolithography
10/25/2001US20010033895 Spreading and thining a coating supplied to center of a substrate by rotation, and supplying solbent vapor; low viscosity, uniformity, thinness; semiconductors
10/25/2001US20010033894 Spreading thin liquid film, semiconductors
10/25/2001US20010033796 Microfabricated elastomeric valve and pump sysems
10/25/2001US20010033664 Hearing aid format selector
10/25/2001US20010033634 High contrast ratio membrane mask
10/25/2001US20010033490 Optical apparatus, exposure apparatus, and exposure method
10/25/2001US20010033441 Color filter substrate, method of fabricating color filter substrate, liquid crystal device, method of fabricating liquid crystal device, and electronic apparatus
10/25/2001US20010033437 Apparatus, system, and method for precision positioning and alignment of a lens in an optical system
10/25/2001US20010033435 Optical element housing or mounting connector
10/25/2001US20010033433 Illumination optical system in exposure apparatus
10/25/2001US20010033421 Multi-layered mirror
10/25/2001US20010033369 Substrate holding device, semiconductor manufacturing apparatus and device manufacturing method
10/25/2001US20010033219 Photosensitive thick film composition and electronic device using the same
10/25/2001US20010032936 Ion beam processing position correction method
10/25/2001US20010032829 Hydroxylammonium salt
10/25/2001US20010032704 Vacuum loadlock ultra violet bake for plasma etch
10/25/2001US20010032665 Photovoltaic cell and solar cell utilizing the same
10/25/2001US20010032396 Substrate processing method and substrate processing apparatus
10/25/2001DE10019562A1 Vorrichtung zum Verbinden von Gehäusen oder Fassungen für optische Elemente A device for connecting casings or holders for optical elements
10/25/2001DE10018168A1 Verfahren zum Herstellen von organischen, Licht emittierenden Dioden A process for the manufacture of organic light emitting diodes
10/25/2001CA2406635A1 A method of fabricating coded particles
10/25/2001CA2406307A1 Method for measuring diffusion of photogenerated catalyst in chemically amplified resists