Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2002
01/10/2002US20020004179 Protective coatings
01/10/2002US20020004178 Photosensitivity, resolution, chemical resistance
01/10/2002US20020004177 Photosensitive resin composition
01/10/2002US20020003855 X-ray illumination optical system and x-ray reduction exposure apparatus
01/10/2002US20020003629 Positioning stage system and position measuring method
01/10/2002US20020003626 Apparatus for detecting optical positional deviation
01/10/2002US20020003616 Stage system for exposure apparatus and device manufacturing method using the same
01/10/2002US20020003615 Alignment system and projection exposure apparatus
01/10/2002US20020003613 Image recording device
01/10/2002US20020003569 Forming an image on a printing plate using ultrashort laser pulses
01/10/2002US20020003216 Exposure apparatus, surface position adjustment unit, mask, and device manufacturing method
01/10/2002US20020003211 Nanometer scale data storage device and associated positioning system
01/10/2002US20020003130 Laser system and method for processing a memory link with a burst of laser pulses having ultrashort pulse widths
01/10/2002US20020002946 Processing apparatus for processing sample in predetermined atmosphere
01/10/2002DE19963588C2 Optische Anordnung Optical arrangement
01/10/2002DE10129019A1 Targetmarke, Verfahren zu deren Herstellung und Elektronenstrahl-Belichtungsvorrichtung Target mark, to processes for their preparation and to electron beam exposure apparatus
01/10/2002DE10063621A1 Production of a fine pattern used in the production of a semiconductor device and a liquid crystal display comprises producing a hard mask pattern by etching a hard mask film formed on working film on a substrate
01/10/2002DE10031915A1 Kompakte Mehrstrahllaserlichtquelle und Interleafrasterscanlinien-Verfahren zur Belichtung von Druckplatten Compact multi-beam laser light source and interleaving method for exposing printing plates
01/10/2002DE10031719A1 Beleuchtungseinrichtung und Koordinaten-Meßgerät mit einer Beleuchtungseinrichtung Illumination device and coordinate measuring instrument with a lighting device
01/10/2002DE10031162A1 System for exposing print form moves image information fed to light switch array in parallel manner to hold image points on print form fixed while illumination head is moved at uniform speed
01/09/2002EP1170982A1 Radiation source, lithographic apparatus, device manufacturing method, and device manufactured thereby
01/09/2002EP1170755A1 Integral lens for high energy particle flow, method for producing such lenses and use thereof in analysis devices and devices for radiation therapy and lithography
01/09/2002EP1170636A2 Exposure apparatus and surface position adjustment unit
01/09/2002EP1170635A2 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/09/2002EP1170634A1 Exposure apparatus and device manufacturing method using the same
01/09/2002EP1170633A1 Exposure apparatus and device manufacturing method using the same
01/09/2002EP1170632A1 Photosensitive resin composition for roll coating and method of roll coating
01/09/2002EP1170603A2 Method of fabricating silica microstructures
01/09/2002EP1170343A1 Infrared sensitive coating liquid
01/09/2002EP1170315A1 Urethane oligomer, resin compositions thereof, and cured article thereof
01/09/2002EP1170123A2 Negative-working planographic printing plate
01/09/2002EP1170121A1 Direct-to-plate flexographic printing plate precursor
01/09/2002EP1169670A2 Photolithography method and apparatus configuration for performing photolithography
01/09/2002EP1169613A1 Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry
01/09/2002EP1169401A1 Radiation curable coating composition comprising a secondary curing agent
01/09/2002EP1169357A1 Hydroxy-epoxide thermally cured undercoat for 193 nm lithography
01/09/2002EP1137968A4 Novel photosensitive resin compositions
01/09/2002EP0853613B1 Light-sensitive resist which can be developed in an aqueous-alkali manner and operates negatively
01/09/2002CN1330779A Antireflective composition for deep ultraviolet photoresist
01/09/2002CN1330778A Preparation of fractionated novolac resins by novel extraction technique
01/09/2002CN1330402A Method for manufacturing semiconductor device
01/09/2002CN1330394A Substrate treatment method
01/09/2002CN1330292A Exposure device, substrate processing unit and photoetching system and device manufacture method
01/09/2002CN1330291A Miniature multi-beam laser source and interlacing raster scanning line method for expossure printing plate
01/09/2002CN1330290A Lamp box type ink-jet colour film
01/09/2002CN1330289A Optical enhancement right photoetching rubber composite and sulfonium salt
01/09/2002CN1330288A Photoresist composite with optical acid-generating agent containing optical free radical generating agent
01/09/2002CN1330287A Attenuating phase shift mask and its preparing process
01/09/2002CN1329987A Method fr making lithographic printing plate
01/08/2002US6337735 Exposure apparatus for photoengraving stamps
01/08/2002US6337734 Exposure control method, exposure apparatus and device manufacturing method
01/08/2002US6337733 Apparatus including a motor-driven stage for exposing a photosensitive substrate, and method of making such apparatus
01/08/2002US6337732 Exposure apparatus and device manufacturing method using the same in which a door lock mechanism is controlled on the basis of temperature and an operation sequence
01/08/2002US6337486 Electron beam drawing process and electron beam drawing apparatus
01/08/2002US6337484 Positioning device and lithographic projection apparatus comprising such a device
01/08/2002US6337479 Object inspection and/or modification system and method
01/08/2002US6337217 Method and apparatus for improved focus in optical processing
01/08/2002US6337175 Performing a first exposure of the resist formed on the substrate with a given mask pattern; developing; supplying denaturing agent; exposure to form pattern
01/08/2002US6337174 Method of stripping a photoresist from a semiconductor substrate dimethylacetamide or a combination of monoethanolamine and dimethylsulfoxide
01/08/2002US6337172 Applying photoresist to insulating layer of semiconductor device structure; exposing photoresists at differfent areas of the semiconductor device to radiation; removing photoresist and insulating layer
01/08/2002US6337171 As a resist applicable to far ultraviolet rays such as a krf excimer laser, charged particle rays such as electron beams, and x-rays
01/08/2002US6337164 Charged-particle-beam microlithography methods exhibiting improved pattern-feature accuracy, and device manufacturing methods comprising same
01/08/2002US6337163 Forming underlying film on work film; forming resist film; exposing to first energy beam of a pattern; forming resist pattern by subjecting resist film to a developing treatment; exposing a region of underlying film; dry-etching
01/08/2002US6337162 Method of exposure, photomask, method of production of photomask, microdevice, and method of production of microdevice
01/08/2002US6337161 Semiconductor
01/08/2002US6337028 Process of forming a pattern on a substrate
01/08/2002CA2056302C Method for preparing lithographic printing plate
01/07/2002CA2349912A1 Setting an image on a printing plate using ultrashort laser pulses
01/03/2002WO2002001922A1 Display
01/03/2002WO2002001685A1 Extreme repetition rate gas discharge laser with improved blower motor
01/03/2002WO2002001621A2 Method to restore hydrophobicity in dielectric films and materials
01/03/2002WO2002001300A1 Stripping agent composition and method of stripping
01/03/2002WO2002001299A1 Development defect preventing process and material
01/03/2002WO2002001298A1 Multi-beam pattern generator
01/03/2002WO2002001297A2 Method for photochemically structuring surfaces and articles structured by said method
01/03/2002WO2002001296A2 Strongly water-soluble photoacid generator resist compositions
01/03/2002WO2002001295A1 Apparatus and method for forming photoresist pattern with target critical dimension
01/03/2002WO2002001294A1 Apparatus and method for compensating critical dimension deviations across photomask
01/03/2002WO2002001292A1 Device and method for cleaning articles used in the production of semiconductor components
01/03/2002WO2002001291A1 Lithographic plate having a conformal radiation-sensitive layer on a rough substrate
01/03/2002WO2002000758A1 Accelerators useful for energy polymerizable compositions
01/03/2002WO2002000757A1 Accelerators for cationic polymerization catalyzed by iron-based catalysts
01/03/2002WO2002000735A1 Novel photoinitiators and applications therefor
01/03/2002WO2001070502A3 Planographic thermal processless imaging member and methods of use
01/03/2002WO2001048811A3 A method for efficiently computing a number of integrated circuit dies
01/03/2002WO2001043967A3 One side matte multilayer coversheet
01/03/2002WO2001040425A3 Post chemical-mechanical planarization (cmp) cleaning composition
01/03/2002WO2001031402A8 Method for the production of nanometer range surface decorated substrates
01/03/2002US20020002265 Novolac polymer planarization films with high temperature stability
01/03/2002US20020002212 Epoxides, cycloepoxides, aromatic epoxides, having 1-18 carbon ateoms, wherein one or more carbon atoms can be replaced by ether, carbonyl, ester, silane, or amine
01/03/2002US20020001978 Method for manufacturing double-faced semiconductor circuits
01/03/2002US20020001975 Method of generating a circuit pattern used for fabricating a semiconductor device
01/03/2002US20020001957 Method for forming fine patterns by thinning developed photoresist patterns using oxygen radicals
01/03/2002US20020001915 Step & scan projection exposure apparatus, maintenance method therefor, and semiconductor device manufacturing method and semiconductor manufacturing factory using the apparatus
01/03/2002US20020001781 Method for cleaning the surface of substrate to which residues of resist stick
01/03/2002US20020001780 Method of reducing defects
01/03/2002US20020001779 Method for performing photolithography
01/03/2002US20020001778 Photolithography scheme using a silicon containing resist
01/03/2002US20020001777 Multilaye rlaminate; dielectric substrate, patterned photoresist mask
01/03/2002US20020001776 Controlled heating; applying activating radiation