Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2002
02/14/2002US20020017616 Exposure apparatus and method
02/14/2002US20020017209 Method and device for clearing a re-imageable printing form
02/14/2002DE10133718A1 Novel compounds containing glycidylalkylacrylate and anthracene containing side groups are useful for the production of antireflective coatings in semiconductor device manufacture
02/14/2002DE10131123A1 Photoresistzusammensetzung, die einen Photoradikalbildner und einen Photosäurebildner enthält A photoresist composition containing a photoradical generator and a photoacid
02/14/2002DE10049296A1 Optical arrangement for producing light beams, e.g. for scanning microscopy, has correction device adaptive optical arrangement for radiation errors caused by deflector
02/14/2002DE10037998A1 Verfahren und Vorrichtung zum Löschen einer wiederbebilderbaren Druckform Method and apparatus for canceling a print form wiederbebilderbaren
02/14/2002DE10037870A1 6-Spiegel-Mikrolithographie-Projektionsobjektiv 6 levels microlithography projection lens
02/13/2002EP1179750A1 Positive photosensitive composition
02/13/2002EP1179749A1 Resist composition and method for manufacturing semiconductor device using the resist composition
02/13/2002EP1179746A2 Kinematic optical mounting
02/13/2002EP1179427A2 Planographic printing original plate
02/13/2002EP1179422A1 Method for making a lithographic printing plate by inkjet printing
02/13/2002EP1179028A1 Solvent resistant photosensitive compositions
02/13/2002EP1023634A4 Improved thermosetting anti-reflective coatings at deep ultraviolet
02/13/2002EP0949985B1 Powder blasting method using a non-metal blasting mask
02/13/2002EP0894154A4 RECOVERY OF Mo/Si MULTILAYER COATED OPTICAL SUBSTRATES
02/13/2002EP0638180B1 Production of 2d-arrays
02/13/2002EP0616701B1 Photocurable cyclobutarene compositions
02/13/2002CN1335945A Composition for antireflection coating
02/13/2002CN1335659A Fine electrospark process of forming electrode
02/12/2002US6347163 System for reading two-dimensional images using ambient and/or projected light
02/12/2002US6346992 Drive system for a scanning or recording device for a reproduction appliance
02/12/2002US6346979 Process and apparatus to adjust exposure dose in lithography systems
02/12/2002US6346961 Device for producing a printing form
02/12/2002US6346564 Paste comprising mixture of organic binder having acidic functional group, at least one polyvalent metal or polyvalent metallic compound, anion-adsorptive substance which adsorbs anion of binder
02/12/2002US6346418 Efficient process using nitric acid solution and microwave heating to digest non-metals, hydrogen peroxide solution and heating to digest photoresist, evaporating, adding solution, analyzing using inductively coupled plasma mass spectrometry
02/12/2002US6346413 Polymer arrays
02/12/2002US6346363 Positive photoresist composition
02/12/2002US6346362 Grafted with organosilicon,-germanium, or -tin compound and having protective group; resistance to reactive ion etching; photoresists
02/12/2002US6346361 Method for synthesizing polymeric AZO dyes
02/12/2002US6346354 Dividing a region to-be-exposed into smaller regions; shifting coordinates; computing optimum dose; accurate correction
02/12/2002US6346183 Utilization of bottom antireflective coating to eliminate deleterious effects of unwanted reflected light during photo exposure step of photolithographic process
02/12/2002CA2058391C Aqueous, developable photocurable composition, photosensitive articles having layers made therefrom and methods of improving those articles
02/10/2002CA2354784A1 One base photosensitive imaging system
02/07/2002WO2002011499A1 Method and apparatus for generating x-ray or euv radiation
02/07/2002WO2002011193A2 Process for photoresist descumming and stripping in semiconductor applications by nh3 plasma
02/07/2002WO2002011191A2 Near critical and supercritical ozone substrate treatment and apparatus for same
02/07/2002WO2002011175A1 Methods to predict and correct resist heating during lithography
02/07/2002WO2002011159A1 Pinhole-free dielectric films
02/07/2002WO2002010859A1 Radiation-sensitive composition, insulating film and organic el display element
02/07/2002WO2002010858A2 Process for manufacturing a microelectronic device
02/07/2002WO2002010857A2 Process for making a periodic profile
02/07/2002WO2002010721A2 Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
02/07/2002WO2002010480A2 Etching composition and use thereof with feedback control of hf in beol clean
02/07/2002WO2002009890A1 Method of forming protective film
02/07/2002WO2002009884A2 Methods for the lithographic deposition of materials containing nanoparticles
02/07/2002US20020016646 Method of aligning dies of wafer(s) with exposure equipment in the fabricating of semiconductor devices
02/07/2002US20020016477 Novel lactone compounds having alicyclic structure and their manufacturing method
02/07/2002US20020016431 Monomer having diol structure, polymer thereof, and negative photoresist composition and pattern forming method using the same background of the invention
02/07/2002US20020016015 Microelectronic-device fabrication method
02/07/2002US20020015918 Method of fabricating liquid crystal display device having shorting bars
02/07/2002US20020015917 Multi-oxygen containing compound for preventing acid diffusion, and photoresist composition containing the same
02/07/2002US20020015916 Containing acid generator
02/07/2002US20020015913 Containing acid generator
02/07/2002US20020015912 Photoresist monomers, polymers thereof and photoresist compositions containing the same
02/07/2002US20020015911 Image-formation material and infrared absorber
02/07/2002US20020015910 Semiconductor substrates
02/07/2002US20020015909 Mixture of polymer and dye
02/07/2002US20020015908 Multilayer; heat sensitive elements; melting; adhesion
02/07/2002US20020015907 Solvent patterning coating layers
02/07/2002US20020015906 Micropatterns
02/07/2002US20020015904 Pattern forming method using photolithography
02/07/2002US20020015901 Mixture of pigment, binder polymer, radiation sensitive compound and acid
02/07/2002US20020015899 Optically transferring lithography patterns
02/07/2002US20020015838 Photosensitive transfer sheet and method of forming photosensitive transfer sheet
02/07/2002US20020015826 Zwitterionic iodonium compounds and methods of application
02/07/2002US20020015633 Smif pod including independently supported wafer cassette
02/07/2002US20020015595 Image-recording device
02/07/2002US20020015506 Remote programming and control means for a hearing aid
02/07/2002US20020015158 Focus measurement in projection exposure apparatus
02/07/2002US20020015156 Position detecting method and system for use in exposure apparatus
02/07/2002US20020015142 Illumination optical system and exposure apparatus having the same
02/07/2002US20020015141 Exposure apparatus with a pulsed laser
02/07/2002US20020015140 Stage device and exposure apparatus, and method of manufacturing a device
02/07/2002US20020015139 A stage control method using a temperature
02/07/2002US20020015088 Imaging device, imaging method, and printing device
02/07/2002US20020014673 Method of making membrane integrated circuits
02/07/2002US20020014600 Scanning exposure method
02/07/2002US20020014599 Plasma focus light source with tandem ellipsoidal mirror units
02/07/2002US20020014598 Plasma focus light source with active and buffer gas control
02/07/2002US20020014577 Circuit for machine-vision system
02/07/2002US20020014174 Input nip roller system for external drum imaging system
02/07/2002US20020014084 Substrate-processing apparatus
02/07/2002DE10133719A1 Organic anti-reflective polymer, for fabricating ultrafine patterns of semiconductor devices, has specific composition
02/07/2002DE10133716A1 Organic anti-reflective polymer, for fabricating ultrafine patterns and 4G DRAM semiconductor devices as it eliminates standing waves caused by optical properties of lower layers on the wafer and by thickness changes of the photoresist
02/07/2002DE10128813A1 Image forming device e.g. for printer, generates laser radiation having ultra short pulses with duration less than one nanosecond
02/07/2002DE10128706A1 Production of print carrier in printing machine involves unrolling ready-made carrier material onto printing cylinder and coating contact surface of this material with layer of influenceable polymer
02/07/2002DE10035430A1 Verfahren und Vorrichtung zur thermischen Behandlung einer Fotolackschicht auf einem Schaltungssubstrat, insbesondere Halbleiterwafer Method and apparatus for thermal treatment of a photoresist layer on a circuit substrate, in particular semiconductor wafers
02/06/2002EP1178359A2 Stripping composition
02/06/2002EP1178358A2 Stripper
02/06/2002EP1178357A1 Lithographic apparatus
02/06/2002EP1178356A2 6 mirror microlithography projection system
02/06/2002EP1178355A2 Control system for photolithographic processes
02/06/2002EP1178354A1 Antireflective coating compositions
02/06/2002EP1177914A2 Method and apparatus to reclaim a reusable printing plate
02/06/2002EP1177713A1 System and method for providing a lithographic light source for a semiconductor manufacturing process
02/06/2002EP1177574A1 Anti-reflective coatings and methods regarding same
02/06/2002EP1177479A1 Streamlined ic mask layout optical and process correction through correction reuse
02/06/2002EP1177478A1 Photosensitive composition
02/06/2002EP1177468A1 Methods of photosensitizing glasses with hydrogen or deuterium and waveguides resulting therefrom